BEJ42PX3DBVUCPlasma Display Panel

FCC ID : BEJ42PX3DBVUC POWER OF ATTORNEY To whom it may concern: We the undersigned LG Electronics Inc. hereby authorize ESTECH Co., Ltd.(EST) of Korea to act on our behalf in all matters relating to all processes required in the FCC Part 15C approval and any communication needed with the national authority. Any and all acts carried out by EST on our behalf shall have the same effects as acts of our own. If you have any questions regarding the authorization, please don’t hesitate to contact us. Sincerely yours, Sign: Sang-Wook Lee/Manager Engineer Tel:82-54-470-4537 Fax: 82-54-470-4534

INTERNAL PHOTO 1. MAIN 1.1 Front 1.2 Rear 2. POWER 2.1 Front 2.2 Rear 3. CTRL_LVDS 3.1 Front 3.2 Rear 4.PDP 4.1 Front 4.2 Rear 5. RGB 5.1 Front 5.2 Rear 6. YSUS 6.1 Front 6.2 Rear 7. Z SUS 7.1 Front 7.2 Rear

LG Electronics Inc. FCC ID BEJ42PX3DBVUC -Operational description- A plasma display panel is the latest display technology. It is currently the best way to achieve flat panel displays with excellent image quality and large screen sizes, that are easily viewable. The PDP can be thought of as a descendant of the neon lamp an dit can be also be viewed as a series of fluorescent lamps. PDP is an array of cells, known as pixels, which are comprised of 3 sub pixels, corresponding to the colors red, green, and blue. Gas in a plasma state is used to react with phosphors in each sub-pixel to produce colored light (red, green, or blue). These phos-phors are the same types used in Cathode Ray Tube (CRT) devices such as televisions and common computer monitors. You get the rich, dynamic colors that you expect. Each sub-pixel is individually controlled by advanced electronics to produce over16 million different colors. All of this means that you get perfect images that are easily viewable in a display that is less than 5inches thick.

Compliance Test Report for FCC Company name Address Telephone Product name Model No. Serial No. Test date Testing location Standard □ Class A ■ Class B Test resultOK □ Class A ■ Class B Test resultOK Tested by Reviewed by Abbreviation * Note - This test report is not permitted to copy partly without our permission - This test result is dependent on only equipment to be used - This test result based on a single evaluation of one sample of the above mentioned - 42PX3DBV-UC and 42PX3DBV, 42PX3DLV-UC,42PX3DLV are same product. ONLY Model name is different OK, Pass = Passed, Fail = Failed, N/A = not applicable LG Electronics USA 2000 Millbrook Dr Lincolnshire, IL 60069 United states 847-941-8373 Measurement facility registration number Engineer J.H.Kim Manager Engineer J.M.Yang 94696 (Signature) (Signature) Date of issue ESTECH. Co., Ltd. 97-1 Hoiuk-Ri Majang-Myon, Icheon-city, KyungKi-Do, Korea Test item ■ Conducted Emission ■ Radiated Emission FCC PART 15 2002 , ANSI C 63.4 2003 2005-06-30 ~2005-07-05 42PX3DBV-UC, 42PX3DBV, 42PX3DLV-UC,42PX3DLV NONE LG Electronics Inc. KOREA Report Number : ESTF150507-001 , Web : www. estech. co. kr Page 1 of 14 Report NumberESTF150507-001 Manufacturer Country of origin Applicant Product 2005-07-05 PLASMA MONITOR 3 4 5 6 8 8 8 9 10 10 10 11 12 14 Appendix 1. Spectral diagram Appendix 2. Phorographs of EUT in side PCB Appendix 3. Block diagram of EUT Appendix 4. Circuit Diagram 7. Photogra phs of test setup ........................................................................... 8. Photogra phs of EUT .................................................................................... 6. Measurement of conducted emission ............................................................ 6.1 Measurement e quipment ........................................................................... 6.2 Environmental conditions ........................................................................... 6.3 Test data ................................................................................................ Report Number : ESTF150507-001 , Web : www. estech. co. kr Page 2 of 14 5. Measurement of radiated emission ............................................................... 5.1 Measurement e quipment ........................................................................... Contents 1. Laboratory Information ................................................................................. 2. Description of EUT ....................................................................................... 3. Test Standards ............................................................................................. 4. Measurement condition ................................................................................. 5.2 Environmental conditions ........................................................................ 5.3 Test data ............................................................................................. ... 1. Laboratory Information 1.1 General 1.2 Test Lab. Corporation Name : ESTECH Co. Ltd Head Office : Rm 1015, World Venture Center II, 426-5, Gasan-dong, Geumcheon-gu, Seoul, Kor e (Safety & Telecom. Test Lab) EMC Test Lab : 58-1 Osan-Ri, GaNam-Myon, YeoJoo-Gun, KyungKi-Do, Korea 97-1 Hoiuk-Ri Majang-Myon, Icheon-city, KyungKi-Do, Korea 1.3 Official Qualification(s) MIC : Granted Accreditation from Ministry of Information & Communication for EMC, Safety and Telecommunication KOLAS : Accredited Lab By Korea Laboratory Accreditation Schema base on CENELEC requirements FCC : Filed Laboratory at Federal Communications Commission VCCI : Granted Accreditation from Voluntary Control Council for Interference from ITE This EUT (Equipment Under Test) has been shown to be capable of compliance with the applicable technical standards and is tested in accordance with the measurement procedures as indicated in this report. ESTECH Lab attests to accuracy of test data. All measurement reported herein were performed by ESTECH Co., Ltd. ESTECH Lab assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. Report Number : ESTF150507-001 , Web : www. estech. co. kr Page 3 of 14 2. Description of EUT 2.1 Summary of Equipment Under Test NONE: Model Number : 42PX3DBV-UC, 42PX3DBV, 42PX3DLV-UC,42PX3DLV Serial Number : Manufacturer : Country of origin : Rating : Receipt Date : 2.2 General descriptions of EUT Using Freq. : 4.0MHz(2EA)/25MHz/18.432MHz/20MHz/20.25MHz/10MHz(2EA)/27MHz(2EA) Report Number : ESTF150507-001 , Web : www. estech. co. kr Page 4 of 14 PLASMA MONITOR NONE LG Electronics Inc. KOREA INPUT:AC120V / 60Hz 2005-06-30 3. Test Standards Test Standard : FCC PART 15 (2002) Test Method : ANSI C 63.4 (2003) This standard sets forth uniform methods of measurement of radio-frequency (RF) signals and noise emitted from both unintentional and intentional emitters of RF energy in the frequency range 9 kHz to 40 GHz. Methods for the measurement of radiated and AC power-line conducted radio noise are covered and may be applied to any such equipment unless otherwise specified by individual equipment requirements. These methods cover measurement of certain decides that deliberately radiate energy, such as intentional emitters, but does not cover licensed transmitters. This standard is not intended for certification/approval of avionic equipment or for industrial, scientific, and medical (ISM) equipment These method apply to the measurement of individual units or systems comprised of multiple units This Standard sets out the regulations under which an intentional, unintentional, or incidental radiator may be operated without an individual license. It also contains the technical specifications, administrative requirements and other conditions relating to the marketing of Part 15 devices. Report Number : ESTF150507-001 , Web : www. estech. co. kr Page 5 of 14 4. Measurement Condition 4.1 EUT Operation. 4.2 …

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TEST SETUP PHOTO 1. Conducted Emission setup photo 1.1. Front 1.2. Rear 2. Radiated Emission setup photo 2.1 Front 2.2. Rear