PWX-S66GSM 850/1800/1900 Mobile with BT

S66 Front View S66 Back View S66 Side View S66 Side View

S66 Label DIS 90969 DIS 92567

S66 Open Battery Cover (Final label: See extra exhibit) S66 Disassembly Step 1 S66 Disassembly Step 2 S66 Disassembly Step 3 S66 PCB Front View Shields Removed S66 PCB Back View Shields Removed S66 Tri-Band Antenna

TTI-P-G 081/94-A0 Accredited according to ISO/IEC 17025 Bluetooth Qualification Test Facility (BQTF) FCC listed # 101450 IC recognized # 3925 CETECOM Inc. 411 Dixon Landing Road Š Milpitas, CA 95035 Š U.S.A. Phone: + 1 (408) 586 6200 Š Fax: + 1 (408) 586 6299 Š E-mail: [email protected] Š http://www.cetecom.com CETECOM Inc. is a Delaware Corporation with Corporation number: 2113686 Board of Directors: Dr. Harald Ansorge, Dr. Klaus Matkey, Hans Peter May V1.1 2003-03-01 The BLUETOOTH trademarks are owned by Bluetooth SIG, Inc., U.S.A. and licensed to CETECOM Inc. © Copyright by CETECOM FCC Test Report Test report no.: EMC_735FCC15.247_2004_S66 FCC Part 15.247 for FHSS systems / CANADA RSS-210 Model: S66 FCC ID: PWX-S66 IC: 267E-S66 Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 2 (49) Table of Contents 1 General information 1.1 Notes 1.2 Testing laboratory 1.3 Details of applicant 1.4 Application details 1.5 Test item 1.6 Test standards 2 Technical test 2.1 Summary of test results 2.2 Test report 1 General information 1.1 Notes The test results of this test report relate exclusively to the test item specified in 1.5. The CETECOM Inc. USA does not assume responsibility for any conclusions and generalizations drawn from the test results with regard to other specimens or samples of the type of the equipment represented by the test item. The test report may only be reproduced or published in full. Reproduction or publication of extracts from the report requires the prior written approval of the CETECOM Inc USA. TEST REPORT PREPARED BY: EMC Engineer: Harpreet Sidhu 1.2 Testing laboratory CETECOM Inc. 411 Dixon Landing Road, Milpitas, CA-95035, USA Phone: +1 408 586 6200 Fax: +1 408 586 6299 E-mail: [email protected] Internet: www.cetecom.com Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 3 (49) 1.3 Details of applicant Name : SIEMENS ICM Street : 16745 West Bernardo Drive City / Zip Code : San Diego CA 92127 Country : U.S.A Contact : Kevin Wolentarski Telephone : +1 858-521-3352 Tele-fax : +1 858-521-3105 e-mail : [email protected] 1.4 Application details Date of receipt test item : 2004-09-12 Date of test : 2004-09-28 1.5 Test item Manufacturer : SIEMENS Street Address : Suedstr. 9 City / Zip Code : 47475 Kamp-Lintfort Country : Germany Marketing Name : S66 Model No. : S66 Description : GSM 1900 Mobile Phone with BT FCC-ID : PWX-S66 IC ID : 267E-S66 Additional information Test Sample for BT : IMEI: 00-1002-00-048376-3 Frequency : 2402MHz – 2480MHz for BT Type of modulation : GFSK Number of channels : 79 Antenna : Internal Power supply : Battery or Charger (AC Adaptor) Output power : -0.76dBm (0.84mW) max. conducted peak power Extreme vol. Limits : 3.6VDC to 4.5VDC (nominal: 3.7VDC) Extreme temp. Tolerance : -30°C to +50°C 1.6 Test standards: FCC Part 15 §15.247 (DA00-705) / RSS 210 Note: All radiated measurements were made in all three orthogonal planes. The values reported are the maximum values. Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 4 (49) 2 Technical test 2.1 Summary of test results No deviations from the technical specification(s) were ascertained in the course of the tests Performed Final Verdict: (only “passed” if all single measurements are “passed”) Passed Technical responsibility for area of testing: 2004-09-30 EMC & Radio Lothar Schmidt (Manager) Date Section Name Signature Responsible for test report and project leader: 2004-09-30 EMC & Radio Harpreet Sidhu (EMC Engineer) Date Section Name Signature Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 5 (49) 2.2 Test report TEST REPORT Test report no.: EMC_735FCC15.247_2004_S66 Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 6 (49) TEST REPORT REFERENCE LIST OF MEASUREMENTS PAGE CARRIER FREQUENCY SEPERATION §15.247(a) 7 NUMBER OF HOPPING CHANNELS §15.247(a) 8 TIME OF OCCUPANCY (DWELL TIME) §15.247(a) 9 SPECTRUM BANDWIDTH OF FHSS SYSTEM §15.247(a) 12 MAXIMUM PEAK OUTPUT POWER § 15.247 (b) (1) 16 BAND EDGE COMPLIANCE §15.247 (c) 21 EMISSION LIMITATIONS § 15.247 (c) (1) 25 CONDUCTED EMISSIONS § 15.107/207 40 RECEIVER SPURIOUS RADIATION § 15.209 42 TEST EQUIPMENT AND ANCILLARIES USED FOR TESTS 47 BLOCK DIAGRAMS 48 Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 7 (49) A Unit dBm 16 dB Offset RBW 30 kHz SWT 8.5 ms VBW 100 kHz IN1 1MAX1MA RF Att 20 dB Ref Lvl 26 dBm Ref Lvl 26 dBm 300 kHz/Center 2.441 GHzSpan 3 MHz -70 -60 -50 -40 -30 -20 -10 0 10 20 -74 26 1 2 3 Marker 3 [T1] -5.61 dBm 2.44200000 GHz 3 [T1] -5.61 dBm 2.44200000 GHz 1 [T1] -3.83 dBm 2.44000000 GHz 2 [T1] -6.51 dBm 2.44100000 GHz Date: 28.SEP.2004 20:59:53 CARRIER FREQUENCY SEPERATION §15.247(a) Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 8 (49) A Unit dBm 16 dB Offset 1MAX1MA Start 2.4 GHzStop 2.4835 GHz8.35 MHz/ Ref Lvl 26 dBm Ref Lvl 26 dBm RBW 30 kHz VBW 100 kHz SWT 235 ms RF Att 20 dB IN1 -70 -60 -50 -40 -30 -20 -10 0 10 20 -74 26 Date: 28.SEP.2004 21:08:18 NUMBER OF HOPPING CHANNELS §15.247(a) The number of hopping channels is 79 Test report no.: EMC_735FCC15.247_2004_S66 Issue date: 2004-09-30 Page 9 (49) 1MAX Ref Lvl 26 dBm Ref Lvl 26 dBm RF Att 20 dB 16 dB Offset A 1MA Unit dBm RBW 1 MHz VBW 1 MHz IN1 TRG SWT 960 Ì s Center 2.441 GHz96 Ì s/ -70 -60 -50 -40 -30 -20 -10 0 10 20 -74 26 1 1 Delta 1 [T1] 4.85 dB 417.474950 Ì s TR Date: 28.SEP.2004 21:12:48 TIME OF OCCUPANCY (DWELL TIME) §15.247(a) DH1 – Packet The system makes worst case 1600 hops per second or 1 time slot has a length of 625μs with 79 channels. A DH1 Packet need 1 time slot for transmitting and 1 time slot for receiving. Then the system makes worst case 800 hops per second with 79 channels. So you have each channel 10.13 times per second and so for 31.6 seconds you have 320.108 times of appearance. Each Tx-time per appearance is 417.47μs. So we have 320.108 * 417.47μs = 133.63ms per 31.6 seconds. Test repo…

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Test setup photos S66 Test setup – Radiated Emissions Test setup photos S66 Test setup – Conducted Measurements Test setup photos S66 Test setup – AC Line Conducted Emissions