
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
RDI Technology (Shenzhen) Co., Ltd Date: Mar. 28, 2015 Federal Communications Commission Authorization and Evaluation Division Confidentiality Request regarding application for certification of FCC ID: SJ8-CA641 Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below: Exhibit Type File Name Schematics Block Diagram Operational Description SCH.pdf BlockDiagram.pdf CircuitDescription.pdf The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, RDI Technology (Shenzhen) Co., Ltd ................................................... Signature Tony. zhou / Manager ................................................... Typed name and Title
RDI Technology (Shenzhen) Co., Ltd FCC ID: SJ8-CA641 POWER OF ATTORNEY Date: Mar. 28, 2015 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf shall have the same effect as acts of our own. This authorization expires on Mar. 27, 2016. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, RDI Technology (Shenzhen) Co., Ltd, are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, RDI Technology (Shenzhen) Co., Ltd ................................................................................. Signature Tony. zhou / Manager ................................................................................. Typed name and Title
Page 1 of 6 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs - Constructional Details M odel CA641 – External View Page 2 of 6 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Page 3 of 6 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Page 4 of 6 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn External antenna with RP-SMA connector Page 5 of 6 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Page 6 of 6 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn
FCC and IC and IC Label This device complies with part 15 of the fcc rules and industry Canada license-exempt rss standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Proposed Label Location on EUT EUT Back View/ proposed IC Label Location RDI Technology (Shenzhen)Co., Ltd. FCC ID: SJ8-CA641 IC: 7644A-CA641 Model: CA641 This device complies with part 15 of the FCC rules and Industry Canada license-exempt RSS standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.
FCC and IC and IC Label This device complies with part 15 of the fcc rules and industry Canada license-exempt rss standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. Proposed Label Location on EUT EUT Back View/ proposed IC Label Location RDI Technology (Shenzhen)Co., Ltd. FCC ID: SJ8-CA641 IC: 7644A-CA641 Model: CA641 This device complies with part 15 of the FCC rules and Industry Canada license-exempt RSS standard(s). Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.
Model CA641 - Internal View
TEST REPORT Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Reference No. .................... : WTS15S0323860E FCC ID ................................ : SJ8-CA641 Applicant ............................ : RDI Technology ShenzhenCo., Ltd. Address .............................. : Building C1, Xintang Industrial Park East Baishixia, Fuyong, Baoan, Shenzhen, PRC. Manufacturer .................... : The same as above Address .............................. : The same as above Product Name .................... : Digital Wireless Camera Model No. ........................... : CA641 Standards........................... : FCC CFR47 Part 15 Section 15.247:2013 Date of Receipt sample .... : Mar.19, 2015 Date of Test ....................... : Mar. 20 - 24, 2015 Date of Issue ...................... : Mar. 27, 2015 Test Result ......................... : Pass Remarks: The result s shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Services (Shenzhen) Co., Ltd. Address: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Tel :+86-755-83551033 Fax:+86-755-83552400 Compiled by: Approved by: Zero Zhou / Project Engineer Philo Zhong / Manager Reference No.: WTS15S0323860E Page 2 of 45 Waltek Services (Shenzhen) Co.,Ltd. http://www.wa ltek.com.cn 2 Test Summary Test Items Test Requirement Result Radiated Emissions 15.205(a) 15.209(a) PASS Conducted Emissions 15.207(a) PASS 6dB Bandwidth 15.247(a)(2)PASS Maximum Peak Output Power15.247(b)(3),(4)PASS Power Spectral Density 15.247(e) PASS Band Edge 15.247(d) PASS Antenna Requirement 15.203 PASS Maximum Permissible Exposure (Exposure of Humans to RF Fields) 1.1307(b)(1)PASS Reference No.: WTS15S0323860E Page 3 of 45 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 3 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 TEST SUMMARY .................................................................................................................................................. 2 3 CONTENTS ............................................................................................................................................................ 3 4 GENERAL INFORMATION .................................................................................................................................. 5 4.1 GENERAL DESCRIPTION OF E.U.T. ................................................................................................................ 5 4.2 DETAILS OF E.U.T. ......................................................................................................................................... 5 4.3 CHANNEL LIST ................................................................................................................................................. 5 4.4 TEST MODE ..................................................................................................................................................... 5 4.5 TEST FACILITY ................................................................................................................................................. 6 5 EQUIPMENT USED DURING TEST .................................................................................................................. 7 5.1 EQUIPMENTS LIST ........................................................................................................................................... 7 5.2 MEASUREMENT UNCERTAINTY ....................................................................................................................... 8 5.3 TEST EQUIPMENT CALIBRATION ..................................................................................................................... 8 6 CONDUCTED EMISSIONS .................................................................................................................................. 9 6.1 E.U.T. OPERATION ......................................................................................................................................... 9 6.2 EUT SETUP ..................................................................................................................................................... 9 6.3 MEASUREMENT DESCRIPTION ........................................................................................................................ 9 6.4 CONDUCTED EMISSION TEST RESULT ......................................................................................................... 10 7 RADIATED EMISSIONS..................................................................................................................................... 12 7.1 EUT OPERATION ........................................................................................................................................... 12 7.2 TEST SETUP .................................................................................................................................................. 13 7.3 SPECTRUM ANALYZER SETUP ...................................................................................................................... 14 7.4 TEST PROCEDURE ........................................................................................................................................ 15 7.5 SUMMARY OF TEST RESULTS ....................................................................................................................... 16 8 BAND EDGE MEASUREMENT ........................................................................................................................ 19 8.1 TEST PR…
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Page 1 of 3 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs – Model CA641 Test Setup Radiated Emission Test frequency below 30MHz at test site 2# Tes t frequency from 30MHz to 1GHz at test site 2# Page 2 of 3 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Test frequency above 1GHz at test site 1# Page 3 of 3 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Conducted Emission test site 2#
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 2.41 GHz - 2.47 GHz | 52.00 mW |
Wireless Camera
Equipment Class
NII - Unlicensed National Information Infrastructure TXWireless Monitor
Equipment Class
NII - Unlicensed National Information Infrastructure TXWireless Camera
Equipment Class
DTS - Digital Transmission System
Wireless Monitor
Equipment Class
DTS - Digital Transmission System
Wireless 5 LCD Monitor
Equipment Class
DTS - Digital Transmission System