XRQELITEIRIR-TX
Efergy Technologies Limited
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Application Details
- Equipment Class
- DSC - Part 15 Security/Remote Control Transmitter
- Date of Grant
- Oct 11, 2012
- Application Purpose
- Original Equipment
- Date of Application
- Oct 11, 2012
- Equipment Note
- IR-TX
- Frequency Range
- 433.50000000 - 433.50000000
- Company
- Efergy Technologies Limited
- Country
- China
Documents & Files
Document Text
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
Users Manual
*All values shown in this manual are only examples. Actual figures will vary depending on your consumption. 10 / 15 / 20s ELECTRICITY MONITORING TRANSMITTER + -- + - + - +- + + - Monitor link button Hold for 2 seconds Transmitter link button history backward forward mode/set
Block Diagram
4M A/D4 TX IC(A7302) 13.25M XI FSK -SW 4.5V REGULATOR (HT7225) MCU(HT46RU232) DATACE 13.264M 8M 32.768K RX IC(A7201) DATA CE 4.5V REGULATOR (HT7225) LOW VOLAGE CHECK LOW VOLAGE CHECK MCU(HT46RU66) Elite IR TX P ART temp eratu re/h u mid ity sens o r Elie IR RX PART LCD RTC (ISL12058) 32.768K INT0 IR SENS OR(6PT204-6B)
External Photos
Page 21 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 12 Photographs - Constructional Details 12.1 EUT βAppearance View Page 22 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn
ID Label/Location Info
Page 28 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn FCC Label Location for model: ELITE IR-Tx The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable. FCC ID: XRQELIT EIR T his device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.
ID Label/Location Info
Page 27 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 13 FCC Label FCC Label Sample for model: Elite IR-Tx, E2 IR-Tx,WPM120 Tx, WPM220 Tx FCC ID: XRQELITEIR This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause interference, and (2) this device must accept any interference, including interference that may cause undesired operation of the device.
Internal Photos
Page 24 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 12.3 EUT β PCB View Page 25 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 12.4 Sensor β PCB View Page 26 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn
Operational Description
Circuit Description This product uses IR sensor to read the measurement info from electric meter and send the data to MCU(HT46RU232 utili zes 4MHz OSC) to process. The MCU get exactly time via External timer IC (12058 utilizes 32.768KHz OSC). The data will be sent to RF IC (A7302 utilizes 13.25MHz OSC) per 30 seconds. Finally, the RF IC transmits the data to space by 433.5MHz carrier signal with FSK modulation.
Schematics
1 2 3 4 56 ABCD 6 5 4 3 2 1 D CBA Titl e Number Revision Size B Dat e: 1 7-Aug -20 1 0 Sheet o f File: D:\ δΊ§εθ΅ζ \d tv 1 00 \WPM2 00 .d db Drawn By: Vin 1 GND 2 Vo ut 3 U3HT72 2 5 C30100UF Y113.547M C1015P R260 L633NH C2727P R271M S1 VCC E1 OSCI 1 OSCO 2 /INT 3 GND 4 SDA 5 SCL 6 CLKOUT 7 VDD 8 U2PCF8563 Y232.768K C2815P C2915P SCL SDA CLKOUT VCC C20104 CRY14M C620PC720P PB5/ AN5 1 PB4/ AN4 2 PA3/PDF 3 PA2 4 PA1 5 PA0 6 PB3/ AN3 7 PB2/ AN2 8 PB1/ AN1 9 PB0/ AN0 10 VSS 11 PC0/TX 12 PC1/RX 13 PC2 14 PB6/ AN6 28 PB7/ AN7 27 PA4 26 PA5/INT 25 PA6/SDA 24 PA7/SCL 23 OSC2 22 OSC1 21 VDD 20 /RES 19 PD1/PWM1 18 PD0/PWM0 17 PC4 16 PC3 15 C5 HT46 RU2 32 R20100K Q39014 R21100K C15104 CH1CH2 BAT-L LINK SW2SW1 CLKOUT SCL SDA 7201-CE 7201-DATA BAT-SW R231K R24330R 1 D7LED BT31.5VBT21.5VBT11.5V R32200KR281M C31100UF C21104 Q7AO3407 R332.2M Q59014 R352.2M R342.2M AD-SW C22104C23104 7201-CE 7201-DATA VCC C17104 C16104 LINK R314.7M R30100K BCH1 BCH2 TMR1 AD-SW L518NH ch1-swch2-sw R39100K R404.7M ch1- sw ch2- sw C143.6P C307.5P R201K MODE 1 TX-DATA 2 CE 3 VDD-D 4 VDD-A 5 PA-OUT 6 GND 7 XI 8 FSK-SW 9 SPIS 10 U1 A7 30 2 R1815R R14100 C4100P C312PF Q4 TMR1 204CL 204DA R19330RR2233K Q9NPN1 R25200K VCC
Test Report
TEST REPORT Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn FCC ID : XRQELITEIR Applicant : Efergy Technologies Limited Address : Suit 1108-1109, Junction Building, 3820 Nanhuan Road, Binjiang district, Hangzhou, Zhejiang, China Manufacturer : DongGuan Protronic Electonics Ltd. Address : Protronic Industrial Park, Xiangxi Village, Shipai Town, Dongguan, Guangdong China Equipment Under Test (EUT) : Product Name : IR-Tx Model No. : Elite IR-Tx, E2 IR-Tx,WPM120 Tx, WPM220 Tx Rule : FCC CFR47 Part 15 Section 15.231:2010 Date of Test : August 18~24,2012 Date of Issue : August 24,2012 Test Result : PASS* Remark: * The sample described above has been tested to be in compliance with the requirements of the rule listed above. PERPARED BY: Waltek Services (Shenzhen) Co., Ltd. 1/F, Fukangtai Building, West of Baima Road., Songgang Street, Baoβan District, Shenzhen, China Tel: +86-755-83551033 Fax: +86-755-83552400 Compiled by: Approved by: Zero Zhou / Project Engineer Philo Zhong / Manager Page 2 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Content Page 1 COVER PAGE ................................................................................................................................ 1 2 CONTENT ....................................................................................................................................................................................2 3 TEST SUMMARY ......................................................................................................................................................................3 4 GENERAL INFORMATION.....................................................................................................................................................4 4.1 GENERAL DESCRIPTION OF E.U.T. ........................................................................................................................................ 4 4.2 DETAILS OF E.U.T................................................................................................................................................................... 4 4.3 TEST FACILITY .......................................................................................................................................................................... 4 4.4 TEST LOCATION ........................................................................................................................................................................ 4 4.5 GENERAL CONDITION................................................................................................................................................................ 5 4.5.1 Environmental condition of test site ........................................................................................................................5 4.5.2 Test Mode ......................................................................................................................................................................5 5 EQUIPMENT USED DURING TEST ....................................................................................................................................6 5.1 EQUIPMENTS LIST ..................................................................................................................................................................... 6 5.2 MEASUREMENT UNCERTAINTY................................................................................................................................................ 7 5.3 TEST EQUIPMENT CALIBRATION.............................................................................................................................................. 7 6 CONDUCTED EMISSION TEST ...........................................................................................................................................8 7 RADIATION EMISSION TEST ..............................................................................................................................................9 7.1 TEST PROCEDURE .................................................................................................................................................................... 9 7.2 RADIATED TEST SETUP.......................................................................................................................................................... 10 7.3 SPECTRUM ANALYZER SETUP .............................................................................................................................................. 11 7.4 CORRECTED AMPLITUDE & MARGIN CALCULATION ........................................................................................................... 11 7.5 RADIATED EMISSIONS LIMIT .................................................................................................................................................. 12 7.6 RADIATED EMISSIONS TEST RESULT ................................................................................................................................... 13 8 ACTIVATION TIME................................................................................................................................................................ 14 8.1 TEST PROCEDURE .................................................................................................................................................................. 14 8.2 TEST RESULT .......................................................................................................................................................................... 14 9 BANDWIDTH ........................................................................................................................................................................... 17 9.1 TEST PROCEDURE ....................................................................β¦
Text truncated - open the document above for the full version.
Test Setup Photos
Page 19 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 11 Photographs of Testing 11.1 Photographs β Spurious Radiated Emission Test Setup TX Above 1 GHz TX From 30MHz to 1GHz Page 20 of 28 Report No. WT12096200-D-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn TX Below 30 MHz
Contact Information
Applicant
Munro Don(Director)
Test Firm
Waltek Services(Shenzhen) Co., Ltd.Philo zhong
Technical Specifications
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15.231 | 433.5 MHz - 433.5 MHz | - |
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