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2A482-A0010JBaseus True Wireless Earbuds

Shenzhen Baseus Technology Co., Ltd.

Application Details

Equipment Class
DTS - Digital Transmission System
Date of Grant
Jun 05, 2026
Application Purpose
Original Equipment
Equipment Note
Baseus True Wireless Earbuds
Frequency Range
2402.00000000 - 2480.00000000
Company
Shenzhen Baseus Technology Co., Ltd.
Country
China

Documents & Files

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Attestation Statements

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Cover Letter(s)

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ID Label/Location Info

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RF Exposure Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Attestation Statements

Shenzhen Baseus Technology Co., Ltd. 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Attestation Statements Not Covered Entity Applicant & Not Covered Equipment To: Federal Communications Commission Date:May 11, 2026 7435 Oakland Mills Road, Columbia, MD 21046, USA Ref: Information Required by Section 2.911(d)(5)(i) & (ii) FCC ID: 2A482-A0010J FRN: 0032035966 Shenzhen Baseus Technology Co., Ltd. (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List, established pursuant to § 1.50002 of reference chapter, as an entity producing “covered” communication equipment. The equipment for which authorization is sought is not “covered” telecommunications equipment and video surveillance equipment produced by entities identified on the Commission’s Covered List that prohibited from receiving an equipment authorization pursuant to section § 2.903 of the FCC rules. Sincerely yours, Applicant Signature Printed Name: Tiffany Luo Title: Certified Engineer Address: 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Tel.: +86-13480668369 Email: [email protected]

Attestation Statements

Shenzhen Baseus Technology Co., Ltd. 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Attestation Statements Not Covered Entity Applicant & Not Covered Equipment To: Federal Communications Commission Date:May 11, 2026 7435 Oakland Mills Road, Columbia, MD 21046, USA Ref: Information Required by Section 2.911(d)(5)(i) & (ii) FCC ID: 2A482-A0010J FRN: 0032035966 Shenzhen Baseus Technology Co., Ltd. (“the applicant”) certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List, established pursuant to § 1.50002 of reference chapter, as an entity producing “covered” communication equipment. The equipment for which authorization is sought is not “covered” telecommunications equipment and video surveillance equipment produced by entities identified on the Commission’s Covered List that prohibited from receiving an equipment authorization pursuant to section § 2.903 of the FCC rules. Sincerely yours, Applicant Signature Printed Name: Tiffany Luo Title: Certified Engineer Address: 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Tel.: +86-13480668369 Email: [email protected]

Attestation Statements

2.911 (d)(7)USA Agent v1.2 Section 2.911(d)(7) USA Agent for Service of Process Company name: Shenzhen Baseus Technology Co., Ltd. Address: 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China FCC ID: 2A482-A0010J Date: May 11, 2026 2.911(d)(7) USA Designated Agent for Service of Process We, [Shenzhen Baseus Technology Co., Ltd.] (“the applicant”) designate [Wedo Group] NOTE1 for the purpose of accepting service of process on behalf of the applicant. Applicant consent: We Acknowledge our consent to accept service of process in the United States for matters related to the applicable equipment, and at the physical U.S. address and email address of the designated agent and acknowledge our acceptance of our obligation to maintain an agent for service of process in the United States for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. Agent obligation: We Acknowledge our obligation to accept service of process in the United States for matters related to the applicable equipment at our physical U.S. address and email address for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. USA Agent Company name: Wedo Group Address: 710 Arabian Ln Walnut, CA 91789, United States FRN:0037730611 Contact Name: Jeffrey Chen Telephone No: (323) 528-1888 Email: jeffrey@ wedogroup.com.cn Applicant Company name: Shenzhen Baseus Technology Co., Ltd. Address: 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China FRN: 0032035966 Contact Name: Tiffany Luo Telephone No: +86-13480668369 Email: [email protected] Signature: Signature:

Cover Letter(s)

Shenzhen Baseus Technology Co., Ltd. 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China May 11, 2026 Office of Engineering Technology Federal Communications Commission 7435 Oakland Mills Road Columbia, MD 21046 USA Subject: Explanation of differences between product types FCC ID: 2A482-A0010J Models: A0010J, A0010H To Whom It May Concern: We, The Shenzhen Baseus Technology Co., Ltd. hereby declare that the model : A0010J is identical with the model : A0010H, All the same except for the model name and charging case color and the upper cover appearance. Except for the different above, no other modification is performed. Sincerely, Shenzhen Baseus Technology Co., Ltd. Signature: [Tiffany Luo, Certified Engineer]

Cover Letter(s)

ShenzhenBaseusTechnologyCo.,Ltd. 2ndFloor,BuildingB,BaseusIntelligencePark,No.2008,XuegangRd,Gangtou Community,BantianStreet,LonggangDistrict,Shenzhen,China OfficeofEngineeringTechnology FederalCommunicationsCommission 7435OaklandMillsRoad Columbia,MD21046 USA Date:May11,2026 Subject;RequestforConfidentiality FCCID:2A482-A0010J ToWhomItMayConcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,we arerequestingtheCommissiontowithholdthefollowingattachment(s)asconfidential documentsfrompublicdisclosureindefinitely. Thesedocumentscontaindetailedsystemandequipmentdescriptionsandareconsideredas proprietaryinformationinoperationoftheequipment.Thepublicdisclosureofthesedocuments mightbeharmfultoourcompanyandwouldgivecompetitorsanunfairadvantageinthemarket. SchematicDiagram BlockDiagram OperationalDescription Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulations inTitle47CFR§2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthat businesssensitiveinformationremainsconfidentialuntiltheactualmarketingofnewly authorizeddevices,werequestShortTermConfidentialityofthefollowingattachment(s); ExternalPhotos TestSetupPhotos InternalPhotos UserManual For45days,pursuanttoPublicNoticeDA04-1705. OR For180dayspursuanttoKDB726920D01. Itisourunderstandingthatallmeasurementtestreports,FCCIDlabelformatand correspondenceduringthecertificationreviewprocesscannotbegrantedasconfidential documentsandthisinformationwillbeavailableforpublicreviewoncethegrantofequipment authorizationisissued. Sincerely, Signature: Name:TiffanyLuo Title:CertifiedEngineer

Cover Letter(s)

Shenzhen Baseus Technology Co., Ltd. 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Letter of Authorization Company: Shenzhen Baseus Technology Co., Ltd. Address: 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Product Name: Baseus True Wireless Earbuds Model Number(s): A0010J, A0010H Product Description: Baseus True Wireless Earbuds We authorize MiCOM Labs Inc., 575 Boulder Court, Pleasanton, California 94566, USA, to act on our behalf on all matters concerning the certification of above named equipment. We declare that MiCOM Labs Inc. is allowed to forward all information related to the approval and certification of equipment to the regulatory agencies as required and to discuss any issues concerning the approval application. Any and all acts carried out by MiCOM Labs on our behalf shall have the same effect as acts of our own. Signature: Date: May 11, 2026 Name: Tiffany Luo Title: Certified Engineer Company: Shenzhen Baseus Technology Co., Ltd.

ID Label/Location Info

FCC ID Label Location The product does not have enough space to place the label, and FCC ID is reflected in the user manual and package. User manual as below: Package as below:

RF Exposure Info

CALIBRATION DATA PROBE CALIBRATION DATA DIPOLE CALIBRATION DATA

RF Exposure Info

Page 1 of 38 SAR Test Report Report No.: AGC11758260210FH01 FCC ID : 2A482-A0010J APPLICATION PURPOSE : Original Equipment PRODUCT DESIGNATION : Baseus True Wireless Earbuds BRAND NAME : (baseus) MODEL NAME : A0010J, A0010H APPLICANT : Shenzhen Baseus Technology Co., Ltd. DATE OF ISSUE : May 11, 2026 STANDARD(S) : IEEE Std. 1528:2013 FCC 47 CFR Part 2§2.1093 IEEE Std C95.1 ™-2019 REPORT VERSION : V1.0 Attestation of Global Compliance(Shenzhen) Co., Ltd. Report No.: AGC11758260210FH01 Page 2 of 38 Report Revise Record Report Version Revise Time Issued Date Valid Version Notes V1.0 / May 11, 2026 Valid Initial Release Report No.: AGC11758260210FH01 Page 3 of 38 Test Report Applicant Name Shenzhen Baseus Technology Co., Ltd. Applicant Address 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Manufacturer Name Shenzhen Baseus Technology Co., Ltd. Manufacturer Address 2nd Floor, Building B, Baseus Intelligence Park, No.2008, Xuegang Rd, Gangtou Community, Bantian Street, Longgang District, Shenzhen, China Factory Name N/A Factory Address N/A Product Designation Baseus True Wireless Earbuds Brand Name (baseus) Model Name A0010J Series Model A0010H Different Description All the same except for the model name and charging case color and the upper cover appearance. EUT Voltage DC 3.7V by battery Applicable Standard IEEE Std. 1528:2013 FCC 47 CFR Part 2§2.1093 IEEE Std C95.1 ™-2019 Date of receipt of test item Mar. 20, 2026 Test Date Apr. 30, 2026 Report Template AGCRT-US-2.4GHz BT/SAR (2021-04-20) Note: The results of testing in this report apply to the product/system which was tested only. Prepared By Jack Gui (Project Engineer) May 11, 2026 Reviewed By Bibo Zhang (Reviewer) May 11, 2026 Approved By Angela Li (Authorized Officer) May 11, 2026 Report No.: AGC11758260210FH01 Page 4 of 38 TABLE OF CONTENTS 1. SUMMARY OF MAXIMUM SAR VALUE ......................................................................................................... 5 2. GENERAL INFORMATION ............................................................................................................................... 6 2.1. EUT DESCRIPTION......................................................................................................................................... 6 3. SAR MEASUREMENT SYSTEM ........................................................................................................................ 7 3.1. THE SATIMO SYSTEM USED FOR PERFORMING COMPLIANCE TESTS CONSISTS OF FOLLOWING ITEMS .................. 7 3.2. COMOSAR E-FIELD PROBE .......................................................................................................................... 8 3.3. ROBOT .......................................................................................................................................................... 8 3.4. VIDEO POSITIONING SYSTEM .......................................................................................................................... 9 3.5. DEVICE HOLDER ............................................................................................................................................ 9 3.6. SAM TWIN PHANTOM ................................................................................................................................... 10 4. SAR MEASUREMENT PROCEDURE .............................................................................................................. 11 4.1. SPECIFIC ABSORPTION RATE (SAR) .............................................................................................................. 11 4.2. SAR MEASUREMENT PROCEDURE ................................................................................................................ 12 4.3. RF EXPOSURE CONDITIONS ......................................................................................................................... 14 5. TISSUE SIMULATING LIQUID ......................................................................................................................... 16 5.1. THE COMPOSITION OF THE TISSUE SIMULATING LIQUID..................................................................................... 16 5.2. TISSUE DIELECTRIC PARAMETERS FOR HEAD AND BODY PHANTOMS ............................................................... 16 5.3. TISSUE CALIBRATION RESULT ....................................................................................................................... 17 6. SAR SYSTEM CHECK PROCEDURE ........................................................................................................... 18 6.1. SAR SYSTEM CHECK PROCEDURES ............................................................................................................. 18 6.2. SAR SYSTEM CHECK ................................................................................................................................... 19 7. EUT TEST POSITION ...................................................................................................................................... 21 7.1. TEST POSITION ............................................................................................................................................ 21 8. SAR EXPOSURE LIMITS ............................................................................................................................... 22 9. TEST FACILITY .............................................................................................................................................. 23 10. TEST EQUIPMENT LIST .............................................................................................................................. 24 11. MEASUREMENT UNCERTAINTY ................................................................................................................ 25 12. CONDUCTED POWER MEASUREM…

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Test Report

SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 1 Version:A1ATN-PAS-QD-249 SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. SPECIFICATIONFORAPPROVL CUSTOMER: SixingIntelligentEquipment ManufacturingCo.,Ltd. CUSTOMERPRJ: BD1lite(R) CUSTOMERP/N: 1000065999 OURPRJ: ATN79030(R) SPECIFICATIONS: 2.4~2.48GHz Q’TY: 1PCS DATE: 2026.4.17 ATNCUSTOMER makerreviewerApproverStructurerElectronicerApprover Address:504-505,SummerValley,MeishengChuangguScienceandTechnologyInnovationPark, LongchangRoad,Xin'anStreet,BaoanDistrict,Shenzhen. Tel:0755-29308863Fax:0755-29308861 SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 2 Version:A1ATN-PAS-QD-249 No.Contents Page Cover ...... 1 Catalog ...... 2 1.TestEquipment&Conditions ...... 3 2.ProductSpecification ...... 3 3.Matchingcircuit ...... 4 4.TestDataReport ...... 4 5.Assemblyrequirements ...... 5 6.ProductDrawing ...... 6 7. DimensionalInspectionReport ...... 6 8.reliabilitytestreport ...... 7 9.PackagingInformation ...... 8 changerecord DateVersion VersionContent Notes 2026.3.23A0 Initialrelease 2026.4.17A1 DVT2prototypedebugging,updatingdrawingsanddata。 SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 3 Version:A1ATN-PAS-QD-249 1、TestEquipment&Conditions 1.1NetworkAnalyzers AgilentTechnologiesE5071B 1.2CommunicationsTestSet CMW500 1.3TestSystem 2 、 ProductSpecification 2.1、Material&MechanicalCharacteristics MaterialFPC Antennatypemonopoleantenna 2.2 、 Storageconditions StorageTemperature 22°C±5°C relativehumidity 35-65% Storagelife 360day SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 4 Version:A1ATN-PAS-QD-249 3、Matchingcircuit 4、测试数据报告TestDataReport 4.1S11Parameter4.2Gain&Efficiency 4.3Radiationpattern SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 5 Version:A1ATN-PAS-QD-249 4.4OTATestData 4.5PCBA 5、Assemblyrequirements 1 2 SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 6 Version:A1ATN-PAS-QD-249 6、工程图纸ProductDrawing 7、DimensionalInspectionReport DimensionalInspectionReport project:BD1liteProductName:FPCantennaR category:FPCQuantity:5pcsDate:2026.04.17 Inspectionbasisand standard ■Engineeringdrawings □Standardtemplate □Other Measurementequipment &accuracy Verniercaliper&0.02mm Inspectionitems testvalue determine 12345 SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 7 Version:A1ATN-PAS-QD-249 Dimensiona linspection 1.7.1±0.157.167.147.187.107.14OK 2.11.72±0.1511.7811.7211.7611.7411.76OK 3.0.13±0.030.120.120.120.120.12OK 4./ 5. 6. 7. 8. 9. 10. 11. 12. 8 、 reliabilitytestreport reliabilitytestreport project:BD1lite Product Name: FPCantennaR Test quantity 5pcspertestitem No. Test item esting equipment Testingprocedure Acceptance criteria Test results notes 1 24 hours salt spray test Saltspray tester 1.Testenvironment:Brinetank temperature:35°CSaturatedair barreltemperature: 47°CPressure:1kg/cm² 2.Placethetestsamplesinto saltspraytesterwith5%±1 NaClsolution.Positionsamples at30°inclination,testfor24 hours. 3.Takeoutsamplesaftertest, cleananddrythembefore inspection No delamination, peelingorrust onproduct plating;no coatingpeeling offsurface spraying, judgedasOK.。 OK SHENZHENATNCOMMUNICATIONTECHNOLOGYCO.,LTD. Page 8 Version:A1ATN-PAS-QD-249 2 H/L Temp Test Temperature &Humidity Chamber 1.Placetheproductsinan environmentof80±2°Cfor24 hours. 2.Placeatroomtemperaturefor 2hourstocooldown,thenstore inlow-temperatureenvironment of-40±2°Cfor24hours. 3.Afterthetest,placeatroom temperaturefor2hoursthen proceedwithinspection.。 Nocrack, deformationor sheddingon products, electrical performance testpassed, judgedasOK. OK notes: 9、Mannerofpacking Productpackaging Mannerofpacking edition::A0Page:1/1 1.Layerpaperprotectionproduc2.PutintoPEbag 3.Cartonsealingeffect

Test Report

Page 1 of 62 FCCTestReport ReportNo.:AGC11758260210FR02 FCCID: 2A482-A0010J APPLICATIONPURPOSE: OriginalEquipment PRODUCTDESIGNATION: BaseusTrueWirelessEarbuds BRANDNAME: (baseus) MODELNAME:A0010J,A0010H APPLICANT:ShenzhenBaseusTechnologyCo.,Ltd. DATEOFISSUE:May11,2026 STANDARD(S):FCCPart15SubpartC§15.247 REPORTVERSION:V1.0 AttestationOfGlobalCompliance(Shenzhen)Co.,Ltd ReportNo.:AGC11758260210FR02 Page2of62 ReportReviseRecord ReportVersionReviseTimeIssuedDateValidVersionNotes V1.0/May11,2026ValidInitialRelease ReportNo.:AGC11758260210FR02 Page3of62 TableofContents 1.GeneralInformation..........................................................................................................................................5 2.ProductInformation..........................................................................................................................................6 2.1ProductTechnicalDescription....................................................................................................................6 2.2TestFrequencyList.....................................................................................................................................6 2.3RelatedSubmittal(S)/Grant(S).................................................................................................................7 2.4TestMethodology........................................................................................................................................7 2.5SpecialAccessories....................................................................................................................................7 2.6EquipmentModifications.............................................................................................................................7 2.7AntennaRequirement.................................................................................................................................7 3.TestEnvironment..............................................................................................................................................8 3.1AddressoftheTestLaboratory...................................................................................................................8 3.2TestFacility..................................................................................................................................................8 3.3EnvironmentalConditions...........................................................................................................................9 3.4MeasurementUncertainty...........................................................................................................................9 3.5ListofEquipmentUse...............................................................................................................................10 4.SystemTestConfiguration............................................................................................................................12 4.1EUTConfiguration....................................................................................................................................12 4.2EUTExercise............................................................................................................................................12 4.3ConfigurationofTestedSystem................................................................................................................12 4.4EquipmentUsedInTestedSystem..........................................................................................................13 4.5SummaryofTestResults..........................................................................................................................14 5.DescriptionofTestModes.............................................................................................................................15 6.DutyCycleMeasurement...............................................................................................................................16 7.RFOutputPowerMeasurement....................................................................................................................17 7.1ProvisionsApplicable................................................................................................................................17 7.2MeasurementProcedure..........................................................................................................................17 7.3MeasurementSetup(BlockDiagramofConfiguration)...........................................................................17 7.4MeasurementResult.................................................................................................................................17 8.6dBBandwidthMeasurement.......................................................................................................................21 8.1ProvisionsApplicable................................................................................................................................21 8.2MeasurementProcedure..........................................................................................................................21 8.3MeasurementSetup(BlockDiagramofConfiguration)...........................................................................21 8.4MeasurementResults...............................................................................................................................22 9.PowerSpectralDensityMeasurement.........................................................................................................29 9.1ProvisionsApplicable................................................................................................................................29 9.2MeasurementProcedure..........................................................................................................................29 9.3MeasurementSetup(BlockDiag…

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Test Report

ReportNo.:AGC11758260210FR02 Page39of62 Test_Graph_LE1M_ANT1_2480_1Mbps_HigherBandEmissions Test_Graph_LE2M_ANT1_2402_2Mbps_ReferenceLevel ReportNo.:AGC11758260210FR02 Page40of62 Test_Graph_LE2M_ANT1_2402_2Mbps_LowerBandEmissions Test_Graph_LE2M_ANT1_2402_2Mbps_HigherBandEmissions ReportNo.:AGC11758260210FR02 Page41of62 Test_Graph_LE2M_ANT1_2440_2Mbps_ReferenceLevel Test_Graph_LE2M_ANT1_2440_2Mbps_LowerBandEmissions ReportNo.:AGC11758260210FR02 Page42of62 Test_Graph_LE2M_ANT1_2440_2Mbps_HigherBandEmissions Test_Graph_LE2M_ANT1_2480_2Mbps_ReferenceLevel ReportNo.:AGC11758260210FR02 Page43of62 Test_Graph_LE2M_ANT1_2480_2Mbps_LowerBandEmissions Test_Graph_LE2M_ANT1_2480_2Mbps_HigherBandEmissions ReportNo.:AGC11758260210FR02 Page44of62 TestGraphsofBandEdgeEmissionsinNon-RestrictedFrequencyBands Test_Graph_LE1M_ANT1_2402_1Mbps_LowerBandEdgeEmissions Test_Graph_LE1M_ANT1_2480_1Mbps_HigherBandEdgeEmissions ReportNo.:AGC11758260210FR02 Page45of62 Test_Graph_LE2M_ANT1_2402_2Mbps_LowerBandEdgeEmissions Test_Graph_LE2M_ANT1_2480_2Mbps_HigherBandEdgeEmissions ReportNo.:AGC11758260210FR02 Page46of62 11.RadiatedSpuriousEmission 11.1MeasurementLimit  FCCPart15.209Limitinthebelowtabletobefollowed Frequencies (MHz) FieldStrength (microvolts/meter) MeasurementDistance (meters) 0.009~0.4902400/F(kHz)300 0.490~1.70524000/F(kHz)30 1.705~30.03030 30~881003 88~2161503 216~9602003 Above9605003 Note:Allmodesweretestedforrestrictedbandradiatedemission,thetestrecordsreportedbelowaretheworst resultcomparedtoothermodes. 11.2MeasurementProcedure 1.TheEUTwasplacedonthetopoftheturntable0.8or1.5meteraboveground.Thephasecenterofthe receivingantennamountedonthetopofaheight-variableantennatowerwasplaced3metersfaraway fromtheturntable. 2.PowerontheEUTandallthesupportingunits.Theturntablewasrotatedby360degreestodeterminethe positionofthehighestradiation. 3.Theheightofthebroadbandreceivingantennawasvariedbetweenonemeterandfourmetersabove groundtofindthemaximumemissionsfieldstrengthofbothhorizontalandverticalpolarization. 4.Foreachsuspectedemission,theantennatowerwasscan(from1Mto4M)andthentheturntablewas rotated(from0degreeto360degrees)tofindthemaximumreading. 5.Setthetest-receiversystemtoPeakorCISPRquasi-peakDetectFunctionwithspecifiedbandwidthunder MaximumHoldMode. 6.Foremissionsabove1GHz,insertthe2.4GfilterbetweenthereceivingantennaandthePre-amplifier(only forRadiatedSpuriousEmission).Use1MHzRBWand3MHzVBWforpeakreading.Placethe measurementantennaawayfromeachareaoftheEUTdeterminedtobeasourceofemissionsatthe specifiedmeasurementdistance,whilekeepingthemeasurementantennaaimedatthesourceof emissionsateachfrequencyofsignificantemissions,withpolarizationorientedformaximumresponse. ThemeasurementantennamayhavetobehigherorlowerthantheEUT,dependingontheradiation patternoftheemissionandstayingaimedattheemissionsourceforreceivingthemaximumsignal.The finalmeasurementantennaelevationshallbethatwhichmaximizestheemissions.Themeasurement antennaelevationformaximumemissionsshallberestrictedtoarangeofheightsoffrom1mto4m abovethegroundorreferencegroundplane. ReportNo.:AGC11758260210FR02 Page47of62 7.Whentheradiatedemissionslimitsareexpressedintermsoftheaveragevalueoftheemissions,and pulsedoperationisemployed,themeasurementfieldstrengthshallbedeterminedbyaveragingoverone completepulsetrain,includingblankingintervals,aslongasthepulsetraindoesnotexceed0.1seconds. 8.Asanalternative(providedthetransmitteroperatesforlongerthan0.1seconds)orincaseswherethe pulsetrainexceeds0.1seconds,themeasuredfieldstrengthshallbedeterminedfromtheaverage absolutevoltageduringa0.1secondintervalduringwhichthefieldstrengthisatitsmaximumvalues. 9.IftheemissionsleveloftheEUTinpeakmodewas3dBlowerthantheaveragelimitspecified,then testingwillbestoppedandpeakvaluesofEUTwillbereported,otherwise,theemissionswhichdonot have3dBmarginwillberepeatedonebyoneusingthequasi-peakmethodforbelow1GHz. 10.Fortestingabove1GHz,theemissionsleveloftheEUTinpeakmodewaslowerthanaveragelimit(that meanstheemissionslevelinpeakmodealsocomplieswiththelimitinaveragemode),thentestingwillbe stoppedandpeakvaluesofEUTwillbereported,otherwise,theemissionswillbemeasuredinaverage modeagainandreported. 11.Incasetheemissionislowerthan30MHz,loopantennahastobeusedformeasurementandtherecorded datashouldbeQPmeasuredbyreceiver.High-Lowscanisnotrequiredinthiscase. Thefollowingtableisthesettingofspectrumanalyzerandreceiver. SpectrumParameterSetting Start~StopFrequency9kHz~150kHz/RB200HzforQP Start~StopFrequency150kHz~30MHz/RB9kHzforQP Start~StopFrequency30MHz~1000MHz/RB120kHzforQP Start~StopFrequency 1GHz~26.5GHz 1MHz/3MHzforPeak,1MHz/3MHzforAverage ReceiverParameterSetting Start~StopFrequency9kHz~150kHz/RB200HzforQP Start~StopFrequency150kHz~30MHz/RB9kHzforQP Start~StopFrequency30MHz~1000MHz/RB120kHzforQP ReportNo.:AGC11758260210FR02 Page48of62 Quasi-PeakMeasurementsbelow1GHz 1.Analyzercenterfrequencywassettothefrequencyoftheradiatedspuriousemissionofinterest 2.Spanwassetgreaterthan1MHz 3.RBW=asshowninthetableabove 4.Detector=CISPRquasi-peak 5.Sweeptime=autocouple 6.Tracewasallowedtostabilize PeakMeasurementsabove1GHz 1.Analyzercenterfrequencywassettothefrequencyoftheradiatedspuriousemissionofinterest 2.RBW=1MHz 3.VBW=3MHz 4.Detector=peak 5.Sweeptime=autocouple 6.Tracemode=maxhold 7.Tracewasallowedtostabilize AverageMeasurementsabove1GHz 1.Analyzercenterfrequencywassettothefrequencyoftheradiatedspuriousemissionofinterest 2.RBW=1MHz 3.VBW≥[3×RBW] 4.Detector=Poweraveraging(rms) 5.Averagingtype=power(i.e.,rms) 6.Sweeptime=auto 7.Performatraceaverageofatleast100traces. 8.Theapplicablecorrectionfactoris[10*log(1/D)],whereDisthedutycycle.Thefactorhadbeeneditedin the“InputCorrection”oftheSpectrumAnalyzer. ReportNo.:AGC11758260210FR02 Page49of62 11.3MeasurementSetup(BlockDiagra…

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Contact Information

Applicant

Tiffany Luo(Certified Engineer)
[email protected]Fax: +86-18098946792

Technical Contact

Wedo GroupJeffrey Chen
[email protected]

710 Arabian Ln · Walnut, California, 91789 · United States

Test Firm

Attestation of Global Compliance (Shenzhen) Co., LDoris Li
[email protected]

Technical Specifications

#Rule PartsFrequency RangePower Output
115C2.40 GHz - 2.48 GHz2.20 mW
Confidentiality
Long Term
Grant Notes
Output power listed is conducted power.

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