2ACGT-ODE001Tablet PC

ReferenceNo.:WTX24X03047639W001/002/003/004/005Page2of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT2-EUTEXTERNALPHOTOGRAPHS EUTView1 EUTView2 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page3of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView3 EUTView4 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page4of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView5 EUTView6 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page5of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView7

ReferenceNo.:WTX24X03047639W001/002/003/004/005Page1of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT1-PRODUCTLABELING ProposedFCCIDLabelFormat FCCID:2ACGT-ODE001 Specifications:Thelabelshallbesecurelyaffixedtoapermanentlyattachedpartofthedevice,inalocation whereitisvisibleoreasilyaccessibletotheuser,andshallnotbereadilydetachable.Thelabelshallbe sufficientlydurabletoremainfullylegibleandintactonthedeviceinallnormalconditionsofusethroughout thedevice’sexpectedlifetime. ProposedLabelLocationonEUT FCCIDLabel Location

ReferenceNo.:WTX24X03047639W001/002/003/004/005Page6of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT3-EUTINTERNALPHOTOGRAPHS EUTHousingand BoardView1 EUTHousingand BoardView2 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page7of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View1 Solder Board-Component View2 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page8of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View3 Solder Board-Component View4 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page9of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View5 Solder Board-Component View6 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page10of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View7 Solder Board-Component View8 ReferenceNo.:WTX24X03047639W001/002/003/004/005Page11of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn AntennaView WIFI/BT/GPSAnt.

COMOSAR E-Field Probe Calibration Report Ref: ACR.197.12.23.BES.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD 1庙、.，ROOM 101, BUILDING 1, HONGWEI INDUSTRIAL PARK‘LIUXIAN 2ND ROAD‘BLOCK70 BAO' AN DISTRICT, SHENZHEN, GUANGDONG , CIDNA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: SN 18/21 EPG0356 Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Il'oise -295 avenue Alexis de Rocholl 29280 PLOUZANE -FRANCE Calibration date: 07/07/2023 dI;;2%ωkω 二三〉七二乞3三-τ......吃Z ~事三五2句P L。τ二号飞~..;~型L...... 〈久/，飞.\.~，.~ .".... "，川AJZ丽丽在 Accreditations #2-6789 Scope available 011 ~坠应些丘坐立 Thc usc of thc Cofl'l1c bl'and and thc acc，'εditation I'CfCl'fnCfS is pl'ohibited fl'om ally "Clll'oductioll, SU111111αry: This document presents the method and results from an accredited COMOSAR E-Field Probe calibration performed at MVG, using the CALIPROBE t巳stbench, for use with a MVG COMOSAR system only. The test results covered by accreditation are traceable to the International System of Units (SI), Pαge: 1/11 Prepαred by.' Checked by.' Approved by : Issue A COMOSAR E-FIELD PROBE CALIllRATION REPORT Nαme Function Jérδme Le Gall Measurement Responsible Jérôme Luc Yann Toutain Distribution .' Technical Manager Laboratory Director Customer Name Waltek Testing Group (Shenzhen) Co. , Ltd Dafe 7/7/2023 7 /7/2023 7 /7/2023 Ref: ACR.197.12.23.BES.A SÌJ!l1ature < ?若7 7山市ιmtrlAl Signature Ya n n numérique de Yann Toutain ID Toutain ID Date:2023.07.07 08:53:35 +01 '00' Name Date Modi[ìcafiol1s JérδmeLuc 7/7/2023 lnitial release Page: 2/11 TellψlrtttLA CR.DDD.N.YXAJVCB.ISSUE-COAIOSAR Probe vI ηlis doc1Imel1l slwlll10l be repl'Od1lced.由cepl川f1l1101' il1 parl. lI'ilh01l1lhe lI'rillel1 appl'Ovall叭.fVG.The il1formaliol1 cOl1lail1ed hereil1 isωbe 1Ised ol1ly f or Ihe pwpose.for lI'hich il is s1lb川ifledal1d is 110110 be released川lI'holeorparl川的oulll'rillel1appl'Ol'all扩MVG COMOSAR E-FIELD PROBE CALlBRA TION REPORT Ref: ACR.197.12.23.BES.A TABLE OF CONTENTS Oevice Under Test ........................................ .............................................................4 2 Product Description ............ .......................................................................................4 2.1 General Information 4 3 Measurement Method ........川..... 川.......川........ .......川.......川.......川........ ...... .. .......川.......川.......川........ ...... .. .......川.......川........ .......川........ .......川........ .......川.......川.......川........ .......川........ ...... .. ...... .. .......川........ ...... .. ...... .. .......川.......川........ ...... .. ...... .. .......川........ .......川.......川........ ...... .. ...... .. .......川........ .......川.......川........ ...... .. ...... .. ...... .. ...... .. .......川........ .......川........ ...... .. .......川.......川.......川........ .......川.......川........ .......川........ .......川.......川........ ...... .. ...... .. ...... .. .......川........ ...... .. .......川.......川.......川........ ...... .. .......川........ .......川.......川.......川........ ...... .. .......川........ ...... .. .....4 3.1 Linearity 4 3.2 Sensitivity 5 3.3 Lower Detection Limit 5 3 .4 Isotropy 5 3.1 Boundary Effect 5 4 Measurement Uncertainty....... . ..................................................................................6 5 Calibration Measurement Reslllts .. ............................................................................ 6 5.1 Sensitivity in air 5.2 Linearity 5.3 Sensitivity in liqllid 5.4 Isotropy rO 叮 foony 6 List ofEqllipn1ent ..................................... ...............................................................10 Pα'ge: 3/ /1 TemplalιACR.DDD.N. Y}~II1VGB.ISSUιCOilIOSAR Prabe 1'1 This dOClflllell1 shallllOl be reprodllced. excepl ill f llll Or ill parl. lI'ilholll Ihe川.illellapprol'Ol 0/ MVG. The iliforlllalioll cOlllailled hereill is 10 be IIsed olll)'for Ihe pwpose/or lI'hich it is SlIblllitted alld is 1101 1 0 be released ill1l'h ole o r parl 1I'ilholll 11'川Ilellapprol'ol (扩MVG. COMO SAR E-FIELD PROBE C ALIBRATION REPORT Ref: ACR. 197. 12.23.BES.A 1 DEVICE UNDER TEST Oevice Under Test Device Type COMOSAR DOSI1\咀~TRICE FIELD PROBE Manu也cturer MVG Model SSE2 Serial Number SN 18/21 EPG0356 Product Condition (new / used) New Frequency Range of Probe 0.15 GHz-6GHz Resistance ofThree Dipoles at Connector Dipole 1: Rl=0.221 MQ Dipole 2: R2=0.197 MQ Dipole 3: R3=0.195 MQ 2 PRODUCT DESCRIPTION 2.1 GENERAL INFOR.r..ι生TION MVG's COMOSAR E fteld Probes are built in accordance to the IEEE 1528, FCC KDB865664 DO 1, CENELEC EN62209 and CEI/IEC 62209 standards. Figure 1 -JvIVG COMOSA R Dosimel.ric E卢eldDipole Probe Length 330mm Length of Individual Dipoles 2mm Maximum external diameter 8mm Probe Tip External Diameter 2.5mm Distance between dipoles / probe extremity lmm 3 MEASUREMENT METHOD The IEEE 1528, FCC KDB865664 DOI, CENELEC EN62209 and CEIIIEC 62209 standards provide recommended practices for the probe calibrations , including the performance characteristics of interest and methods by which to assess their affect. All calibrations / measurements performed meet the fore mentioned standards. 3.1 LlNEARITY The evaluation of the linearity was done in白.'eespace using the waveguide, performing a power sweep to cover the SAR range 0. 01 W /kg to I OOW /kg. Page: 4/11 Tel1lplatιACR.DDD.N. YY.fI1VGB.lSSUE二COiHOSARProbe叶 This doclIlllel1l sholll1ol be reprodllced. excepl ill[1I11 01' il1 parl. 11'ilhollllhe lI'r i/lel1 opp ro1'O/ o[ MVG. The il1[orlllOliol1 COI1Iαilled hereil1 is 10 be IIsed 0 11/)'[01' Ihe plllpose[orll'hich il is Sl削li/ledal1d is 110110 be 阿/easedil1l1'ho/e 01' parlll'il/101I1呐illel1apprOl'a / o[MVG COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.197. 12.23.BES.A 3.2 SENSITIVITY The sensitiv川it印yt臼actorsof the th阳ueedi怡po叶le臼swe町redete创rm and tiss饥sues剑1mη111川l川la创川tingliqu川id均)u山singwavegu山idesas outlined in the standards. 3 .3 LOWER DETECTION LIMIT The lower detection limit was assessed using the same measurement set up as used for the linearity measurem…

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 65 TEST REPORT Reference No. ....................: WTX24X03047639W008 FCC ID ............................... .: 2ACGT-ODE001 Applicant .......................... .: GUANGZHOU SHANGKE INFORMATION TECHNOLOGY CO., LTD Address ............................ .: Room 1205-1212, R&F To-Win Building, No.30 Huaxia Road, Tianhe District, Guangzhou, Guangdong Province, China Manufacturer .................... . The same as Applicant Address ............................ . The same as Applicant Product Name .................. .: Tablet PC Model No. .......................... .: ODE001 Standards ......................... .: FCC Part 2.1093 IEEE Std C95.1: 2019 IEEE Std C95.3: 2002 + Rev. 2008 IEC/IEEE 62209-1528 Ed. 1.0 (2020-10) Date of Receipt sample ... .: 2024-03-11 Date of Test....................... .: 2024-03-18 to 2024-03-29 Date of Issue .................... .: 2024-03-29 Test Report Form No. ...... . : WTX_IEEE_1528W Test Result ........................ .: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jack Sun Jason Su Reference No.: WTX24X03047639W Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 65 TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 4 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 4 1.2 Test Standards .................................................................................................................................................... 7 1.3 Test Methodology ................................................................................................................................................ 7 1.4 Test Facility ......................................................................................................................................................... 7 2. Summary of Test Results .......................................................................................................................................... 8 3. Specific Absorption Rate (SAR) ................................................................................................................................ 9 3.1 Introduction .......................................................................................................................................................... 9 3.2 SAR Definition ..................................................................................................................................................... 9 4. SAR Measurement System ...................................................................................................................................... 10 4.1 The Measurement System ................................................................................................................................ 10 4.2 Probe ................................................................................................................................................................. 10 4.3 Probe Calibration Process ................................................................................................................................. 12 4.4 Phantom ............................................................................................................................................................ 13 4.5 Device Holder .................................................................................................................................................... 13 4.6 Test Equipment List ........................................................................................................................................... 14 5. Tissue Simulating Liquids ....................................................................................................................................... 15 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 15 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 16 5.3 Tissue Calibration Result ................................................................................................................................... 17 6. SAR Measurement Evaluation ................................................................................................................................ 18 6.1 Purpose of System Performance Check ............................................................................................................ 18 6.2 System Setup .................................................................................................................................................... 18 6.3 Validation Results .............................................................................................................................................. 20 7. EUT Testing Position ............................................................................................................................................... 21 7.1 Body Position ......................................................................................…

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WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 59 TESTREPORT ReferenceNo.......................:WTX24X03047639W004 FCCID....................................:2ACGT-ODE001 Applicant...............................:GUANGZHOUSHANGKEINFORMATIONTECHNOLOGYCO.,LTD Address.................................: Room1205-1212,R&FTo-WinBuilding,No.30HuaxiaRoad,Tianhe District,Guangzhou,GuangdongProvince,China Manufacturer........................:ThesameasApplicant Address.................................:ThesameasApplicant ProductName......................:TabletPC ModelNo... ............................: ODE001 Standards..............................:FCCPart15.247 DateofReceiptsample.....:2024-03-11 DateofTest ...........................: 2024-03-20to2024-03-29 DateofIssue........................:2024-03-29 TestReportFormNo. ......... : WTX_Part15_247W TestResult ............................: Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbe reproduced,exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithout specificstampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-755-33663308Fax.:+86-755-33663309Email:[email protected] Testedby:Approvedby: MikeShiJasonSu ReferenceNo.:WTX24X03047639W004 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 2 of 59 TABLEOFCONTENTS 1.GENERALINFORMATION.....................................................................................................................................4 1.1PRODUCTDESCRIPTIONFOREQUIPMENTUNDERTEST(EUT)........................................................................4 1.2TESTSTANDARDS.................................................................................................................................................5 1.3TESTMETHODOLOGY...........................................................................................................................................5 1.4TESTFACILITY.......................................................................................................................................................5 1.5EUTSETUPANDTESTMODE..............................................................................................................................6 1.6MEASUREMENTUNCERTAINTY.............................................................................................................................7 1.7TESTEQUIPMENTLISTANDDETAILS..................................................................................................................8 2.SUMMARYOFTESTRESULTS.........................................................................................................................11 3.ANTENNAREQUIREMENT.................................................................................................................................12 3.1STANDARDAPPLICABLE......................................................................................................................................12 3.2EVALUATIONINFORMATION................................................................................................................................12 4.POWERSPECTRALDENSITY...........................................................................................................................13 4.1STANDARDAPPLICABLE......................................................................................................................................13 4.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................13 4.3TESTPROCEDURE..............................................................................................................................................13 4.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................13 5.DTSBANDWIDTH..................................................................................................................................................14 5.1STANDARDAPPLICABLE......................................................................................................................................14 5.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................14 5.3TESTPROCEDURE..............................................................................................................................................14 5.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................14 6.RFOUTPUTPOWER............................................................................................................................................15 6.1STANDARDAPPLICABLE......................................................................................................................................15 6.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................15 6.3TESTPROCEDURE..............................................................................................................................................15 6.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................15 7.FIELDSTRENGTHOFSPURIOUSEMISSIONS.............................................................................................16 7.1STANDARDAPPLICABLE......................................................................................................................................16 7.2TESTPROCEDURE.........…

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ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 AcknowledgmentLetter SPECIFICATIONFORAPPROVAL ApprovalustomerApproval PreparedByCheckedByApprovalByCheckedByApprovalBy Signature Huang Zongbao FuXuerongXiaChenglei Date2024.03.162024.03.162024.03.16 hangeLog VersionChangeDescriptionPersoninChargeApprovalByDate CustomerNameTaiDian CustomerProject Name T50PlusProjectNameT50Plus AntennatypeFourinoneantennaSDCP/N WG5555B-0814R-65 Band WiFi2.4G/5.8G/BT/GPS Version A0 DesignerInformation RFEngineerR&DDiretor MEEngineer ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 Catalogue No.ItemPageNo. 1DrawingorProductImage3 2DimensionsTestReport4 3RFPerformanceTestReport5-7 4ReliabilityTestReport18 5PackageDocument9 6RoHSControllistforSample10 7InstallWizardorOther10 ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 DrawingorProductImage L i Y a o N a W G 5 5 5 5 B - 0 8 1 4 R - 6 5 T 5 0 P L U S X . X ± 0 . 5 X . X X ± 0 . 2 X X X . ± 1 0 . 0 X X . ± 5 . 0 X . ± 2 . 0 1 6 5 1 N o t e : F o r w i r e s w i t h i n 6 0 m m , i f n o t r e q u i r e d b y t h e c u s t o m e r , t h e t e r m i n a l s f a c e d o w n b y d e f a u l t C u s t o m e r m o d e F i n i s h e d m a t e r i a l n u m b e r p r o p o r t i o n E d i t i o n U n i t V i e w C h a n g e c o n t e n t P a g e n u m b e r 1 S D C T 5 0 P L U S W G H a n d a H a n d a     ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 SampleDimensionsTestReport TestDate2024.03.16SampleQty.3Inspector XuYanfang DimensionNo.StandardSample1Sample2Sample3Pass/NG ①length19.17±0.2mm19.219.319.2 Pass ②width21.79±0.2mm21.821.921.8 Pass ③ thickness 0.1±0.03mm0.10.10.1 Pass ④Linelength65±2mm656665 Pass ConclusionPASS Inspector&Date XuYanfang2024.03.16 Approval&Date ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 RFPerformanceTestReport AntennaTestEquipmentIntroduction TestofantennainputcharacteristicsusingAgilentE5071CandAgilent5062Avectornetwork analyzer;Theradiationpatternoftheantennaaretestedusingtheguangping3DnearfieldAnechoicChamber, andtheinstrumentisusedtoagilent8960E5515andAgilentE4438C.Thetestcoordinatesofthedarkroom areasfollows: 1. S11Parameter-VSWR MeasuringMethodisa50 Ω coaxialcableisconnectedtotheantenna.Thenthiscableisconnectedtoanetworkanalyzerto measuretheS11parameter,Keepingthisfixtureawayfrommetalatleast20cm. ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 S11Parameter-VSWR Frequency( MHz) 157015751580240024502500515057205850 VSWR1.541.531.572.121.101.981.521.361.59 2.AntennaMatchingNetwork ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 3.Electricalparameter ： 4.Gain&Efficiency Electricalparameter （Frequencyrange） 1575-5850Mhz PolarizationmodeHorizontalandverticalpolarization Measurementprogram Widescreen Testequipment Agilent(5071B）/Agilent（8960） /ROHDE&SCHWARZ(CMW500) TestSettings Insertthetestingwhitecard,fixtheentire machineonthetestingturntable,openthe testingsoftware,andselectthecorresponding testingfrequencyband TestinglocationOTAmicrowaveanechoicchamber AntennamanufacturerShenzhenShundachengTechnologyCo.,Ltd DebuggingmodePIFA AntennamaterialFPC+coaxialline ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 5.OTAdata 6.GPSmeasurementmap ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 ReliabilityTestReport TestDate2024.03.16SampleQty.3Inspector XuYanfang TestItemRequirement testing equipment Sample1Sample2Sample3PASS/NG high temperature storage Exposeto+85°Cfor 24hours,recoverfor 2hours,andconduct testing Constant temperature andhumidity box OKOKOKPass low temperature storage Exposeto-40°Cfor 24hours,recoverfor 2hours,andperform testing Constant temperature andhumidity box OKOKOKPass High temperature operation Poweredonfor24 hoursat+60°C Constant temperature andhumidity box OKOKOKPass Low temperature operation Poweredonfor24 hoursat-20°C Constant temperature andhumidity box OKOKOKPass Saltspray test (5士0．5)%sodium chloride、pHValue is6.5～7.2， Temperatureof experimental chamber(35±2)°C □24H☑48H Saltspray testing machine OKOKOKPass Connector rivetingand pulling force 1.13Wirediameter≥ 10N 0.81Wirediameter≥ 8N RG174≥60N RG178≥50N Push-pull forcegauge ≥10N≥10N≥10NPass Conclusion Pass Inspector& Date XuYanfang2024.03.16 Approval&D ate ShenzhenShundachengTechnologyCo.,Ltd CompanyAddress:4thFloor,BuildingB5,XinfuIndustrialPark,ChongqingRoad,FuyongTown,Bao'anDistrict, ShenzhenTEL:0755-27211658FAX:0755-29485750 ProductROHSCompositionDeclarationForm InstallWizard orOther setupscript： Take1PCSofproduct,tearoffthereleasepaperonthebackoftheFPCbyhand,and thenaligntheFPCpositio…

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ReferenceNo.:WTX24X03047639W001/002/003/004/005Page12of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT4-TESTSETUPPHOTOGRAPHS ConductedEmissionTest Setup RadiationEmissionTest Setup(Below30MHz) ReferenceNo.:WTX24X03047639W001/002/003/004/005Page13of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(30MHzto1GHz) RadiationEmissionTest Setup(1GHzto18GHz) ReferenceNo.:WTX24X03047639W001/002/003/004/005Page14of14 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(Above18GHz) *****ENDOFREPORT*****