2ADIW-HL8800HL-8800

FCC ID: 2ADIW-HL8800 Page 1 of 3 External Picture FCC ID: 2ADIW-HL8800 Page 2 of 3 EUT FCC ID: 2ADIW-HL8800 Page 3 of 3

要求：黑底白字 材质：消银龙 数量：1只/套 绘 制 变更版次 日期 变更原因及内容 HL-8800 适 用 机 种 技术要求 检查事项 浙江恒林椅业股份有限公司 <25 第一角 A4 >100 NO SCALE 绘 制 幅 面 部品材料 部品编号 尺寸范围 开始 以下 B级 ± 3 36 630 30 120 120315 3151000 1000 2000 0.10 0.10 0.20 0.30 0.50 0.80 1.20 - 部品名称 （中文） 部品名称 （英文） 华继超 批 准 单 位 比 例 数 量 画 法 MM 1 50～100 25～50 批准 5.05.03.042 HL-8800蓝牙警告标（英文） 2014-11-14 外观尺寸，印刷内容 出口美国用 70.00 mm 3 0 . 0 0 m m This
device
complies
with
part
15
of
the
FCC
Rules.
Operation
is
subject
to
the
following
two
conditions:
(1)
This
device
may
not
cause
harmful
interference,
and
(2)
this
device
must
accept
any
interference
received,
including
interference
that
may
cause
undesired
operation. FCC
ID:2ADIW-HL8800 Label

FCC ID: 2ADIW-HL8800 Page 1 of 9 Internal Picture FCC ID: 2ADIW-HL8800 Page 2 of 9 FCC ID: 2ADIW-HL8800 Page 3 of 9 FCC ID: 2ADIW-HL8800 Page 4 of 9 FCC ID: 2ADIW-HL8800 Page 5 of 9 FCC ID: 2ADIW-HL8800 Page 6 of 9 FCC ID: 2ADIW-HL8800 Page 7 of 9 FCC ID: 2ADIW-HL8800 Page 8 of 9 FCC ID: 2ADIW-HL8800 Page 9 of 9

FCC ID: 2ADIW-HL8800 Page 1 of 1 Statement of compliance to SAR Applicant : ZHEJIANG HENGLIN CHAIR INDUSTRY CO., LTD. 3 Block, Sunlight Industry Zone, Anji County, Zhejiang Province, China Manufacturer : ZHEJIANG HENGLIN CHAIR INDUSTRY CO., LTD. 3 Block, Sunlight Industry Zone, Anji County, Zhejiang Province, China Equipment : Massager Chair Type/Model : HL-8800 According to KDB 447498, if [the max output power / min test separation distance]* [f(GHz)] ≤ 3.0, it can follow the test exclusion procedure. As we can see from the test report 141000645SHA-001 and 141000645SHA-002: The maximum P = 5.0dBm G = 1.0dBi EIRP = PG = 6.0dBm = 3.98mW Min test separation distance = 5mm The test exclusion limit = [3.98/5]*[2.5] = 0.50 ≤ 3.0 It is found the EIRP of EUT is lower than the test exclusion limit. Therefore, the EUT complies the requirement of 15.247(I) without test. Date of issue: November 20, 2014 Prepared by: Reviewed by: Nemo Li (Project Engineer) Daniel Zhao (Reviewer)

FCC ID: 2ADIW-HL8800 Page 1 of 42 EMC TEST REPORT for Intentional Radiator No. 141000645SHA-001 Applicant : ZHEJIANG HENGLIN CHAIR INDUSTRY CO., LTD. 3 Block, Sunlight Industry Zone, Anji County, Zhejiang Province, China Manufacturer : ZHEJIANG HENGLIN CHAIR INDUSTRY CO., LTD. 3 Block, Sunlight Industry Zone, Anji County, Zhejiang Province, China Product name : Massage chair Type/Model : HL-8800 TEST RESULT : PASS SUMMARY The equipment complies with the requirements according to the following standard(s): 47CFR Part 15 (2013): Radio Frequency Devices ANSI C63.4 (2003): American National Standard for Methods of Measurement of Radio- Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz Date of issue: November 21, 2014 Prepared by: Reviewed by: Nemo Li (Project Engineer) Daniel Zhao (Reviewer) FCC ID: 2ADIW-HL8800 Page 2 of 42 Description of Test Facility Name: Intertek Testing Services Limited Shanghai Address: Building No.86, 1198 Qinzhou Road(North), Shanghai 200233, P.R. China FCC Registration Number: 236597 IC Assigned Code: 2042B-1 Name of contact: Jonny Jing Tel: +86 21 64956565 ext. 271 Fax: +86 21 54262335 ext. 271 FCC ID: 2ADIW-HL8800 Page 3 of 42 Content SUMMARY .......................................................................................................................................................... 1 DESCRIPTION OF TEST FACILITY ......................................................................................................................... 2 1. GENERAL INFORMATION ............................................................................................................................ 5 1.1 Applicant Information ..................................................................................................... 5 1.2 Identification of the EUT ................................................................................................ 5 1.3 Technical specification ................................................................................................... 6 1.4 Mode of operation during the test / Test peripherals used .............................................. 6 2. TEST SPECIFICATION .................................................................................................................................. 7 2.1 Instrument list ................................................................................................................. 7 2.2 Test Standard ................................................................................................................ 10 2.3 Test Summary ............................................................................................................... 11 3. 20 DB BANDWIDTH .................................................................................................................................... 12 3.1 Limit .............................................................................................................................. 12 3.2 Test Configuration ........................................................................................................ 12 3.3 Test Procedure and test setup ........................................................................................ 12 3.4 Test Protocol ................................................................................................................. 13 4. CARRIER FREQUENCY SEPARATION ........................................................................................................ 17 4.1 Limit .............................................................................................................................. 17 4.2 Test Configuration ........................................................................................................ 17 4.3 Test Procedure and test setup ........................................................................................ 17 4.4 Test Protocol ................................................................................................................. 18 5. MAXIMUM PEAK OUTPUT POWER ............................................................................................................. 22 5.1 Test limit ....................................................................................................................... 22 5.2 Test Configuration ........................................................................................................ 22 5.3 Test procedure and test setup ........................................................................................ 22 5.4 Test protocol ................................................................................................................. 23 6. RADIATED SPURIOUS EMISSIONS.............................................................................................................. 24 6.1 Test limit ....................................................................................................................... 24 6.2 Test Configuration ........................................................................................................ 24 6.3 Test procedure and test setup ........................................................................................ 25 6.4 Test protocol ................................................................................................................. 26 7. CONDUCTED SPURIOUS EMISSIONS & BAND EDGE ................................................................................. 29 7.1 Limit .............................................................................................................................. 29 7.2 Test Configuration ........................................................................................................ 29 7.3 Test procedure and test setup ........................................................................................ 29 7.4 Test protoc…

Text truncated - open the document above for the full version.

FCC ID: 2ADIW-HL8800 Page 1 of 31 EMC TEST REPORT for Intentional Radiator No. 141000645SHA-002 Applicant : ZHEJIANG HENGLIN CHAIR INDUSTRY CO., LTD. 3 Block, Sunlight Industry Zone, Anji County, Zhejiang Province, China Manufacturer : ZHEJIANG HENGLIN CHAIR INDUSTRY CO., LTD. 3 Block, Sunlight Industry Zone, Anji County, Zhejiang Province, China Product name : Massage chair Type/Model : HL-8800 TEST RESULT : PASS SUMMARY The equipment complies with the requirements according to the following standard(s): 47CFR Part 15 (2013): Radio Frequency Devices ANSI C63.4 (2003): American National Standard for Methods of Measurement of Radio- Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz Date of issue: November 20, 2014 Prepared by: Reviewed by: Nemo Li (Project Engineer) Daniel Zhao (Reviewer) FCC ID: 2ADIW-HL8800 Page 2 of 31 Description of Test Facility Name: Intertek Testing Services Limited Shanghai Address: Building No.86, 1198 Qinzhou Road(North), Shanghai 200233, P.R. China FCC Registration Number: 236597 IC Assigned Code: 2042B-1 Name of contact: Jonny Jing Tel: +86 21 64956565 ext. 271 Fax: +86 21 54262335 ext. 271 FCC ID: 2ADIW-HL8800 Page 3 of 31 Content SUMMARY .......................................................................................................................................................... 1 DESCRIPTION OF TEST FACILITY ......................................................................................................................... 2 1. GENERAL INFORMATION ............................................................................................................................ 4 1.1 Applicant Information ..................................................................................................... 4 1.2 Identification of the EUT ................................................................................................ 4 1.3 Technical specification ................................................................................................... 5 1.4 Mode of operation during the test / Test peripherals used .............................................. 5 2. TEST SPECIFICATION .................................................................................................................................. 6 2.1 Instrument list ................................................................................................................. 6 2.2 Test Standard .................................................................................................................. 9 2.3 Test Summary ............................................................................................................... 10 3. MINIMUM 6DB BANDWIDTH ..................................................................................................................... 11 3.1 Limit .............................................................................................................................. 11 3.2 Test Configuration ........................................................................................................ 11 3.3 Test Procedure and test setup ........................................................................................ 11 3.4 Test Protocol ................................................................................................................. 12 4. MAXIMUM PEAK OUTPUT POWER ............................................................................................................. 14 4.1 Test limit ....................................................................................................................... 14 4.2 Test Configuration ........................................................................................................ 14 4.3 Test procedure and test setup ........................................................................................ 14 4.4 Test protocol ................................................................................................................. 15 5. POWER SPECTRUM DENSITY ..................................................................................................................... 16 5.1 Test limit ....................................................................................................................... 16 5.2 Test Configuration ........................................................................................................ 16 5.3 Test procedure and test setup ........................................................................................ 16 5.4 Test Protocol ................................................................................................................. 17 6. RADIATED EMISSION ................................................................................................................................. 19 6.1 Test limit ....................................................................................................................... 19 6.2 Test Configuration ........................................................................................................ 19 6.3 Test procedure and test setup ........................................................................................ 20 6.4 Test protocol ................................................................................................................. 21 7. EMISSION OUTSIDE THE FREQUENCY BAND ............................................................................................. 23 7.1 Limit .............................................................................................................................. 23 7.2 Test Configuration ........................................................................................................ 23 7.3 Test procedure and test setup ........................................................................................ 23 7…

Text truncated - open the document above for the full version.

FCC ID: 2ADIW-HL8800 Page 1 of 3 Test Setup FCC ID: 2ADIW-HL8800 Page 2 of 3 Radiated Emission 30-1000MHz Above 1GHz FCC ID: 2ADIW-HL8800 Page 3 of 3 Conducted Emission