2AGA6-OONTZBTAD2Bluetooth Adapter

Shenzhen AngSi Technology Co., LTD 6/F, Block B, Ding Xin Science Park. Hong Lang North No.2 Road , Bao An District, ShenZhen PRC --------------------------------------------------------------------------------------------------------------------- Date: 2020-11-25 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: 2AGA6-OONTZBTAD2 Confidentiality Request To whom it may concern, Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of the information accompanying this application as outlined below: ☒ Block Diagram ☐ Tune-Up Information ☒Operational Description☐Security Information ☒ Schematics ☐ Software Defined Radio (SDR) Information ☐Parts List The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, Shenzhen AngSi Technology Co., LTD ------------------------------- (Andy Zhang) (R&D Management)

Shenzhen AngSi Technology Co., LTD 6/F, Block B, Ding Xin Science Park. Hong Lang North No.2 Road , Bao An District, ShenZhen PRC -------------------------------------------------------------------------------- (FCC ID ： 2AGA6-OONTZBTAD2) POWER OF ATTORNEY DATE: 2020-11-25 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Testing Group (Shenzhen) Co., Ltd. Jandy So on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Testing Group (Shenzhen) Co., Ltd. Jandy So on our behalf shall have the same effect as acts of our own. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, Shenzhen AngSi Technology Co., LTD are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, Shenzhen AngSi Technology Co., LTD ------------------------------- (Andy Zhang) (R&D Management)

Reference No.: WTX20X10077597W-1/2 Page 2 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX20X10077597W-1/2 Page 3 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX20X10077597W-1/2 Page 4 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTX20X10077597W-1/2 Page 5 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7

Reference No.: WTX20X10077597W-1/2 Page 1 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AGA6-OONTZBTAD2 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX20X10077597W-1/2 Page 6 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTX20X10077597W-1/2 Page 7 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 2 Reference No.: WTX20X10077597W-1/2 Page 8 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View Antenna View

RF Exposure Requirements Product Description: Bluetooth Adapter Model No.: OontZ Bluetooth Adapter FCC ID: 2AGA6-OONTZBTAD2 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation17 - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: -0.11dBm Tune-Up output power: 0dBm RF channel transmit frequency: 2402MHz Result: 0.3 Limit: 3.0 The exclusion thresholds is 0.3 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 59 TEST REPORT Reference No. .................... : WTX20X10077597W-1 FCC ID ................................ : 2AGA6-OONTZBTAD2 Applicant ........................... : Shenzhen AngSi Technology Co., Ltd. Address.............................. : 6/F, Block B, Ding Xin Science Park, Hong Lang North No.2 Road, Bao An District, ShenZhen PRC Product Name ................... : Bluetooth Adapter Test Model. ........................ : OontZ Bluetooth Adapter Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Oct.23, 2020 Date of Test........................ : Oct.23, 2020 to Nov.12, 2020 Date of Issue ..................... : Nov.12, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang/ Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X10077597W-1 Page 2 of 59 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION................................................................................................................................. 11 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS.................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 12 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 13 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 14 5.1 STANDARD APPLICABLE ....................................................................................................................................... 14 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 14 5.3 TEST PROCEDURE ................................................................................................................................................. 14 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 16 6.1 STANDARD APPLICABLE ....................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 6.3 TEST PROCEDURE ................................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 7. 20DB BANDWIDTH ............................................................................................................................................... 18 7.1 STANDARD APPLICABLE ....................................................................................................................................... 18 8.2 TEST SETUP BLOCK DIAGRAM ..........................................…

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Reference No.: WTX20X10077597W-1/2 Page 9 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX20X10077597W-1/2 Page 10 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX20X10077597W-1/2 Page 11 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****