2ALNA-BTS56MWireless Microphone

客户名称 工程设计图纸： QA -B T S56M 话筒尾贴 生产指令 制 图 审 核 客户型号发文日期 订单数量修改版次 工厂型号图纸比例 1：1 Shenzhen XXD Technology Co; Ltd. 要 求 2025-05-12 H unk.H o A 新品打样 X X D B T S56M H 21 打样1 00PC S 1.尺寸：直径2 0.8*H 0.3M M 2.材质：P C透明贴，注意充电口左右居中。 3.工艺：黑底白字，背胶， 1:1 图纸 20.8 mm DC IN 5V /1A

Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E02 TRF No.: RT-4-E-006Page 1 of 6 RF EXPOSURE REPORT Applicant : Shenzhen Thousandshores Technology Co., Ltd. Address of Applicant : Room 1101, Building B, Lotus Plaza, No. 3186 Nanshan Avenue, Majialong Community, Nantou Street, Nanshan District, Shenzhen, China Manufacturer : Shenzhen Thousandshores Technology Co., Ltd. Address of Manufacturer : Room 1101, Building B, Lotus Plaza, No. 3186 Nanshan Avenue, Majialong Community, Nantou Street, Nanshan District, Shenzhen, China Equipment under Test : Wireless Microphone Model No. : BTS56M FCC ID : 2ALNA-BTS56M Test Standard(s) : KDB447498 D01 General RF Exposure Guidance v06 Report No. : DDT-RE25112531-1E02 Issue Date : 2025/12/09 Issue By : Guangdong Dongdian Testing Service Co., Ltd. Unit 2, Building 1, No. 17, Zongbu 2nd Road, Songshan Lake Park, Dongguan, Guangdong, China, 523808 Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E02 TRF No.: RT-4-E-006Page 2 of 6 Table of Contents 1.General Test Information..............................................................................................5 1.1.Description of EUT .......................................................................................................5 1.2.Accessories of EUT......................................................................................................5 1.3.Test laboratory .............................................................................................................5 2.RF Exposure evaluation for FCC .................................................................................6 2.1.Assessment procedure.................................................................................................6 2.2.Assess result ................................................................................................................6 Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E02 TRF:RT-4-E-006Page 3 of 6 $!CeMetaLims!digital$ Test Report Declare Applicant : Shenzhen Thousandshores Technology Co., Ltd. Address of Applicant : Room 1101, Building B, Lotus Plaza, No. 3186 Nanshan Avenue, Majialong Community, Nantou Street, Nanshan District, Shenzhen, China Equipment under Test : Wireless Microphone Model No. : BTS56M Manufacturer : Shenzhen Thousandshores Technology Co., Ltd. Address of Manufacturer : Room 1101, Building B, Lotus Plaza, No. 3186 Nanshan Avenue, Majialong Community, Nantou Street, Nanshan District, Shenzhen, China Test Standard Used: KDB447498 D01 General RF Exposure Guidance v06 We Declare: The equipment described above is tested by Guangdong Dongdian Testing Service Co., Ltd. and in the configuration tested the equipment complied with the standards specified above. The test results are contained in this test report and Guangdong Dongdian Testing Service Co., Ltd. is assumed of full responsibility for the accuracy and completeness of these tests. Report No.:DDT-RE25112531-1E02 Date of Receipt:2025/12/05Date of Test:2025/12/05~2025/12/05 Note: This report applies to above tested sample only. This report shall not be reproduced in parts without written approval of Guangdong Dongdian Testing Service Co., Ltd. Created: Chen Ziqin Reviewed: Zoe PengApproved: Damon Hu 2025/12/032025/12/092025/12/09 Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E02 TRF:RT-4-E-006Page 4 of 6 Revision History VersionRevision ContentIssue DateApproved V0Initial issue2025/12/09Damon Hu Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E02 TRF:RT-4-E-006Page 5 of 6 1. General Test Information 1.1. Description of EUT EUT Name:Wireless Microphone Model Number:BTS56M Difference of model number:/ EUT Function Description:Please reference user manual of this device Power Supply:DC 5V from USB cable or DC 3.7V built-in battery Note: The above EUT information is declared by manufacturer and for more detailed features description please refer to the manufacturer's specifications or User's Manual. 1.2. Accessories of EUT AccessoriesManufacturerModel numberDescription //// 1.3. Test laboratory Guangdong Dongdian Testing Service Co., Ltd. Add.: Unit 2, Building 1, No. 17, Zongbu 2nd Road, Songshan Lake Park, Dongguan, Guangdong, China, 523808. Tel.: +86-0769-38826678, http://www.dgddt.com, Email: [email protected]. CNAS Accreditation No. L6451; A2LA Accreditation Number: 3870.01 FCC Designation Number: CN1182, Test Firm Registration Number: 540522 Innovation, Science and Economic Development Canada Site Registration Number: 10288A Conformity Assessment Body identifier: CN0048 VCCI facility registration number: C-20087, T-20088, R-20123, R-20240, G-20118 Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E02 TRF:RT-4-E-006Page 6 of 6 2. RF Exposure evaluation for FCC 2.1. Assessment procedure According to 447498 D01 General RF Exposure Guidance v06 The 1-g and 10-g SAR test exclusion thresholds for 100 MHz to 6 GHz at test separation distances ≤ 50 mm are determined by: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] ·[√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where: f(GHz) is the RF channel transmit frequency in GHz Power and distance are rounded to the nearest mW and mm before calculation The result is rounded to one decimal place for comparison 2.2. Assess result Manufacturing Tolerance: Bluetooth LE: ModeAntenna Frequency [MHz] Target (dBm)Tolerance ±(dB) 24023.01 24404.01 Bluetooth LE 1M (Peak) Ant1 24803.51 24043.01 24404.01 Bluetooth LE 2M (Peak) Ant1 24783.51 Estimtion Result: Worse case is as below: [2440 MHz, 5 dBm, (3.16 mW) output power] (3.16/5) ·[√2.440(GHz)] = 0.996 < 3.0 for 1-g SAR Then SAR evaluation is not required. -----------------------End Report----------------------

2.4GHz 3216 Chip Antenna: RANT3216F245X07 _ Application: WLAN,802.11b/g,Bluetooth,WLAN,etc... Features SMD,highreliability,ultraImpact,Omni-directional... PartnumberInformation RANT3216F24507 (A)(B)(C)(D)(F X (E)) ElectricalSpecification DimensionandTerminalConfiguration No.TerminalName 1Feeding/GNG 2GND/Feeding (A)ProductTypeChipAntenna (B)SizeCode 3.2x1.6mm( ± 0.2mm) (C)MaterialHighKmaterial (D)Frequency2.4~2.5GHz (E)FeedingmodePIFA&SingleFeeding (F)AntennatypeType=07 WorkingFrequencyRange2400~2500MHz Bandwidth120MHz(Min.) PeakGain2.7 dBi (Typ.) Impedance50Ohm Returnloss10dB(Min) PolarizationLinear AzimuthBeamwidthOmni-directional OperationTemperature( °C )-40~85 °C ResistancetoSolderingHeats 10sec.(@280 °C ) TerminationNi/Au(Leadless) Dimension(mm) L 3.20±0.20 W 1.60±0.20 T 0.85±0.20 Room 707, Building F, Tongan Zhichuangyuan, xixiang street, Baoan District, Shenzhen. 2.4GHz 3216 Chip Antenna: RANT3216F245X07 _ 1 EvaluationBoardReference PCBDimensionAntennaLayoutReference Unit:mm ElectricalCharacteristics ReturnLoss&Radiation ReturnLoss Frequency(MHz) S11(dB) 2400-10.50 2450-30.62 2500-11.47 Radiation 2400MHz2450MHz2500MHz Efficiency82.52%85.26%83.01% X Y Z Room 707, Building F, Tongan Zhichuangyuan, xixiang street, Baoan District, Shenzhen. 2.4GHz 3216 Chip Antenna: RANT3216F245X07 _ TapingSpecifications ReelandTapingSpecification ReelSpecification TYPESIZEABCD 32167”4K/Reel 9.0±0.5 60±213.5±0.5178±2 TappingSpecification PackagingTypeABWEFGHTψDP PaperType3216 1.90±0.203.50±0.208.0±0.201.75±0.103.5±0.054.0±0.102.0±0.050.75±0.10 1.50±0.10 4.0±0.1 Room 707, Building F, Tongan Zhichuangyuan, xixiang street, Baoan District, Shenzhen. _ 2.4GHz 3216 Chip Antenna: RANT3216F245X07 Reliability Table TestItemProcedure Requirements CeramicType Remark (Reference) Electrical Characterization Fulfilltheelectrical specification UserSpec. Thermal Shock 1.Preconditioning: 50±10°C/1hr,thenkeepfor24±1hrsatroomtemp. 2.Initialmeasure:Spec:referInitialspec. 3.Rapidchangeoftemperaturetest: -30°Cto+85°C;100cycles; 15minutesatLowercategorytemperature; 15minutesatUppercategorytemperature. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 107 Temperature Cycling 1.Initialmeasure:Spec:referInitialspec. 2.100Cycles(-30°Cto+85°C),SoakMode=1(2Cycle/hours). 3.Measurementat24±2Hoursaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. JESD22 JA104 HighTemperature Exposure 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered;500hours@T=+85°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 LowTemperature Storage 1.Initialmeasure:Spec:referInitialspec. 2.Unpowered:500hours@T=-30°C. 3.Measurementat24±2hoursaftertest. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 108 Solderability (SMDBottomSide) Dippingmethod: a.Temperature:235±5°C b.Dippingtime:3±0.5s Thesoldershouldcover over95%ofthecritical areaofbottomside. IEC60384-21/22 4.10 SolderingHeat Resistance (RSH) Preheatingtemperature:150±10°C. Preheatingtime:1~2min. Soldertemperature:260±5°C. Dippingtime:5±0.5s NoVisibleDamage.IEC60384-21/22 4.10 Vibration5g'sfor20min.,12cycleseachof3orientations Note:Use8"X5"PCB.031"thick7securepointson,onelong sideand2securepointsatcornersofoppositesides.Parts mountedwithin2"fromanysecurepoint.Testfrom10-2000 Hz. NoVisibleDamage.MIL-STD-202 Method204 Mechanical Shock Threeshocksineachdirectionshallbeappliedalongthethree mutuallyperpendicularaxesofthetestspecimen(18shocks) Peakvalue:1,500g’s Duration:0.5ms Velocitychange:15.4ft/s Waveform:Half-sine NoVisibleDamage.MIL-STD-202 Method213 Humidity Bias 1.Humidity:85%R.H.,Temperature:85±2°C. 2.Time:500±24hours. 3.Measurementat24±2hrsaftertestcondition. NoVisibleDamage. Fulfilltheelectrical specification. MIL-STD-202 Method106 Room 707, Building F, Tongan Zhichuangyuan, xixiang street, Baoan District, Shenzhen. 2.4GHz 3216 Chip Antenna: RANT3216F245X07 _ Board Flex (SMD) 1.Mountingmethod: IR-Reflow.PCBSize(L:100×W:40×T:1.6mm) 2.Applytheloadindirectionofthearrowuntilbendingreaches 2mm. NoVisibleDamage.AEC-Q200 005 AdhesionForceof1.8Kgfor60seconds.NoVisibleDamage Magnificationof20Xor greatermaybeemployed forinspectionofthe mechanicalintegrityofthe devicebodyterminalsand body/terminaljunction. AEC-Q200 006 Physical Dimension Anyapplicablemethodusingx10magnification,micrometers, calipers,gauges,contourprojectors,orothermeasuring equipment,capableofdeterminingtheactualspecimen dimensions. Inaccordancewith specification. JESD22 JB100 RevisionHistory RevisionDateContent 12019/03/01NewDatasheet 2Add2Dradiationcharacteristi2022/02/22c Room 707, Building F, Tongan Zhichuangyuan, xixiang street, Baoan District, Shenzhen.

Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E01 TRF: RT-4-E-005Page 1 of 86 RADIO TEST REPORT Applicant : Shenzhen Thousandshores Technology Co., Ltd. Address of Applicant : Room 1101, Building B, Lotus Plaza, No. 3186 Nanshan Avenue, Majialong Community, Nantou Street, Nanshan District, Shenzhen, China Manufacturer : Shenzhen Thousandshores Technology Co., Ltd. Address of Manufacturer : Room 1101, Building B, Lotus Plaza, No. 3186 Nanshan Avenue, Majialong Community, Nantou Street, Nanshan District, Shenzhen, China Equipment under Test : Wireless Microphone Model No. : BTS56M FCC ID : 2ALNA-BTS56M Test Standard(s) : FCC Rules and Regulations Part 15 Subpart C, ANSI C63.10-2020 Report No. : DDT-RE25112531-1E01 Issue Date : 2025/12/10 Issue By : Guangdong Dongdian Testing Service Co., Ltd. Unit 2, Building 1, No. 17, Zongbu 2nd Road, Songshan Lake Park, Dongguan, Guangdong, China, 523808 Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E01 TRF: RT-4-E-005Page 2 of 86 Table of Contents 1.Summary of Test Results .............................................................................................7 2.General Test Information..............................................................................................8 2.1.Description of EUT .......................................................................................................8 2.2.Accessories of EUT......................................................................................................9 2.3.Block diagram of EUT configuration for test.................................................................9 2.4.Decision of final test mode .........................................................................................10 2.5.Deviations of test standard.........................................................................................10 2.6.Test environment conditions ......................................................................................10 2.7.Test laboratory ...........................................................................................................10 2.8.Measurement uncertainty...........................................................................................11 3.Equipment Used During Conductive Test ..................................................................12 4.6 dB Bandwidth ..........................................................................................................13 4.1.Block diagram of test setup ........................................................................................13 4.2.Limits ..........................................................................................................................13 4.3.Test procedure ...........................................................................................................13 4.4.Test result...................................................................................................................14 4.5.Test graphs ................................................................................................................15 5.99% Bandwidth ..........................................................................................................17 5.1.Block diagram of test setup ........................................................................................17 5.2.Limits ..........................................................................................................................17 5.3.Test procedure ...........................................................................................................17 5.4.Test result...................................................................................................................18 5.5.Test graphs ................................................................................................................19 6.Maximum Peak Output Power....................................................................................21 6.1.Block diagram of test setup ........................................................................................21 6.2.Limits ..........................................................................................................................21 6.3.Test procedure ...........................................................................................................21 6.4.Test result...................................................................................................................22 6.5.Test graphs ................................................................................................................23 7.Power Spectral Density ..............................................................................................25 7.1.Block diagram of test setup ........................................................................................25 7.2.Limits ..........................................................................................................................25 7.3.Test procedure ...........................................................................................................25 7.4.Test result...................................................................................................................26 7.5.Test graphs ................................................................................................................27 8.Band Edge Compliance (Conducted Method)............................................................29 Guangdong Dongdian Testing Service Co., Ltd. Report No.:DDT-RE25112531-1E01 TRF: RT-4-E-005Page 3 of 86 8.1.Block diagram of test setup ........................................................................................29 8.2.Limits ..........................................................................................................................29 8.3.Test procedure ..............................…

Text truncated - open the document above for the full version.