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2AMRO-CHWRIO107GLiON wireless Duo

iOttie, Inc.
iON wireless Duo - FCC ID 2AMRO-CHWRIO107GL - iOttie, Inc.
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Application Details

Equipment Class
8CC - Part 18 Consumer Device
Date of Grant
Sep 22, 2020
Application Purpose
Original Equipment
Date of Application
Sep 22, 2020
Equipment Note
iON wireless Duo
Frequency Range
0.11000000 - 0.14800000
Company
iOttie, Inc.
Country
United States

Documents & Files

Select a file to view

Users Manual

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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Internal Photos

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RF Exposure Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

15W FAST 5W STANDARD ITEMDESCRIPTION INPUT19V 1.8A OUTPUT (TOTAL)20W OUTPUT (STAND / PAD)15W / 5W LENGTH3.15” WIDTH5.90” HEIGHT4.77” WEIGHT6.2 oz INPUTOUTPUT 110V-240VAC 0.8A19V 1.8A ARTICLEDESCRIPTION ENTRÉE19V 1.8A SORTIE (TOTALE)20W SORTIE (SUPPORT/TAPIS)15W / 5W LONGUEUR3.15” LARGEUR5.90” TAILLE4.77” POIDS6.2 oz ENTRÉESORTIE 110V-240VAC 0.8A19V 1.8A ! ! ! ! ! ! ! ! RF exposure statement This equipment complies with the FCC RF radiation exposure limits set forth for an uncontrolled environment. This equipment should be installed and operated with a minimum distance of 20cm between the radiator and any part of your body. FCC Warning This device complies with Part 18 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.

External Photos

Reference Waltek Tes http://www EXHIBI EUT View 1 EUT View 2 e No.: WTS20 sting Group w.semtest.co T 2 - EUT 1 2 0X08055638 (Shenzhen) m.cn T EXTER 8W Co., Ltd. RNAL PH HOTOGR APHS Reference Waltek Tes http://www EUT View 3 EUT View 4 e No.: WTS20 sting Group w.semtest.co 3 4 0X08055638 (Shenzhen) m.cn 8W Co., Ltd. Reference Waltek Tes http://www EUT View 5 EUT View 6 e No.: WTS20 sting Group w.semtest.co 5 6 0X08055638 (Shenzhen) m.cn 8W Co., Ltd.

ID Label/Location Info

Reference Waltek Tes http://www EXHIBI Proposed Specificatio n silk-screened Proposed e No.: WTS20 sting Group w.semtest.co T 1 - PRO FCC ID La ns: Text is B d onto the EU Label Loca 0X08055638 (Shenzhen) m.cn ODUCT L abel Forma Black in colo UT or shall be ation on EU 8W Co., Ltd. LABELIN at or and justifie e affixed at a UT FCC L NG ed. Labels ar conspicuous Label Location re printed in location on t n indelible in k the EUT. k on perman nent adhesivee

Internal Photos

Reference Waltek Tes http://www EXHIBI EUT Housi n EUT Housi n e No.: WTS20 sting Group w.semtest.co T 3 - EUT ng and Boar ng and Boar 0X08055638 (Shenzhen) m.cn T INTER rd View 1 rd View 2 8W Co., Ltd. NAL PHO OTOGRA APHS Reference Waltek Tes http://www Solder Bo a Solder Boar e No.: WTS20 sting Group w.semtest.co ard-Compon rd-Compone 0X08055638 (Shenzhen) m.cn nent View 1 ent View 2 Wirele 8W Co., Ltd. ess Charger A Antenna Wirelesss Charger Anntenna

RF Exposure Info

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 9 TEST REPORT Reference No. .................... : WTS20X08055638W-2 FCC ID ................................ : 2AMRO-CHWRIO107GL Applicant ........................... : iOttie Inc Address ............................. : 20 West 37th Street 6th FL New York, New York 10018, United States Product Name ................... : iON wireless Duo Test Model. ........................ : CHWRIO107GL Standards .......................... : KDB 680106 D01 V03 Date of Receipt sample .... : Aug.14, 2020 Date of Test........................ : Aug.14, 2020 to Sept.02, 2020 Date of Issue ..................... : Sept.02, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTS20X08055638W-2 Page 2 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 2 of 9 TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 5 2. RF EXPOSURE TEST REPORT ............................................................................................................................ 6 2.1 STANDARD APPLICABLE ......................................................................................................................................... 6 2.2 TEST CONDITIONS .................................................................................................................................................. 6 2.3 TEST PROCEDURE ................................................................................................................................................... 7 2.4 TEST RESULT.......................................................................................................................................................... 7 Reference No.: WTS20X08055638W-2 Page 3 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 3 of 9 Report version Version No. Date of issue Description Rev.00 Sept.02, 2020 Original / / / Reference No.: WTS20X08055638W-2 Page 4 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 4 of 9 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: iOttie Inc Address of applicant: 20 West 37th Street 6th FL New York, New York 10018, United States Manufacturer: NuVolta Technologies (Hefei) Co., Ltd Address of manufacturer: Room 605/606, No. 2800, Building F-1, Innovation Industrial Park Phase 2, Innovation Avenue, High-tech Zone, Hefei Factory#1: Shenzhen Hengtaiying Technology CO.,Ltd Address of factory: 2F,11 Block,Kaetat Industrial Park,liaokeng Village,Shiyan Street,Bao'an District,Shenzhen, Guangdong,China. General Description of EUT Product Name: iON wireless Duo Trade Name: / Model No.: CHWRIO107GL Adding Model(s): / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Frequency Range: 110~148kHz Antenna Type: Coil Antenna Rated Voltage: Stand: DC5V/DC9V/DC12V Pad: DC5V Rated Current: Stand: 1A/1.1A/1.25A Pad: 1A Rated Power: Stand: 5W/10W/15W Pad: 5W Reference No.: WTS20X08055638W-2 Page 5 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 5 of 9 1.2 Test Equipment List and Details Description Manufacturer Model Serial No. Cal Date Due Date MPE Measuring Instrument Narda ELT-400 M-0155/M-0170 2020-07-15 2021-07-14 Broadband Field Meter Narda NBM-520 D-1699 2020-06-21 2021-06-20 Reference No.: WTS20X08055638W-2 Page 6 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 6 of 9 2. RF Exposure Test Report 2.1 Standard Applicable According to §1.1310 system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. 2.2 Test Conditions Test Mode Description Remark TM1 Wireless Charging Input DC19V/1.8A; Output: Pad DC5V/1A And Stand DC5V1A TM2 Wireless Charging Input DC19V/1.8A; Output: Pad DC5V/1A And Stand DC9V1.1A TM3 Wireless Charging Input DC19V/1.8A; Output: Pad DC5V/1A And Stand DC12V1.25A Measurement Distance: 15 cm Reference No.: WTS20X08055638W-2 Page 7 of 9 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 7 of 9 2.3 Test Procedure a. The measurement probe was placed at test distance(15 cm for A,B,C,D,F and 20 cm for E) which is between the edge of the charger and the geometric center of probe. b. The highest emission level was recorded at the measurement points(A, B, C, D, E, F). c. The EUT was measured according to the distance of KDB 680106 D01 V03. 2.4 Test Result The EUT dose comply with item 5.2 of KDB 680106 D01V03 1. Power transfer frequency is less that 1 MHz Yes, the device operate in the frequency range from 110~148kHz. 2. 2. Output power from each primary coil is less than or equal to 15 watts Yes, the maximum output power of the primary coil…

Text truncated - open the document above for the full version.

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 28 TEST REPORT Reference No. .................... : WTS20X08055638W-1 FCC ID ................................ : 2AMRO-CHWRIO107GL Applicant ........................... : iOttie Inc Address ............................. : 20 West 37th Street 6th FL New York, New York 10018, United States Product Name ................... : iON wireless Duo Test Model. ........................ : CHWRIO107GL Standards .......................... : FCC Part 18 Date of Receipt sample .... : Aug.14, 2020 Date of Test........................ : Aug.14, 2020 to Sept.02, 2020 Date of Issue ..................... : Sept.02, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTS20X08055638W-1 Page 2 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND OPERATION MODE ...................................................................................................................... 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 6 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 7 2. SUMMARY OF TEST RESULTS ........................................................................................................................... 8 3. CONDUCTED EMISSIONS .................................................................................................................................... 9 3.1 STANDARD APPLICABLE ......................................................................................................................................... 9 3.2 TEST PROCEDURE ................................................................................................................................................... 9 3.3 BASIC TEST SETUP BLOCK DIAGRAM ..................................................................................................................... 9 3.4 ENVIRONMENTAL CONDITIONS .............................................................................................................................. 9 3.5 TEST RECEIVER SETUP ......................................................................................................................................... 10 3.6 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 10 4. RADIATED EMISSIONS ....................................................................................................................................... 17 4.1 TEST PROCEDURE ................................................................................................................................................. 17 4.2 TEST RECEIVER SETUP ......................................................................................................................................... 19 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 19 4.4 ENVIRONMENTAL CONDITIONS ............................................................................................................................ 19 4.5 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 19 Reference No.: WTS20X08055638W-1 Page 3 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Report version Version No. Date of issue Description Rev.00 Sept.02, 2020 Original / / / Reference No.: WTS20X08055638W-1 Page 4 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: iOttie Inc Address of applicant: 20 West 37th Street 6th FL New York, New York 10018, United States Manufacturer: NuVolta Technologies (Hefei) Co., Ltd Address of manufacturer: Room 605/606, No. 2800, Building F-1, Innovation Industrial Park Phase 2, Innovation Avenue, High-tech Zone, Hefei Factory#1: Shenzhen Hengtaiying Technology CO.,Ltd Address of factory: 2F,11 Block,Kaetat Industrial Park,liaokeng Village,Shiyan Street,Bao'an District,Shenzhen, Guangdong,China. General Description of EUT Product Name: iON wireless Duo Trade Name: / Model No.: CHWRIO107GL Ad…

Text truncated - open the document above for the full version.

Test Setup Photos

Reference Waltek Tes http://www EXHIBI Conducted Radiation E e No.: WTS20 sting Group w.semtest.co T 4 - TES Emission Te Emission Vie 0X08055638 (Shenzhen) m.cn ST SETUP est Setup ew (Below 30 8W Co., Ltd. P PHOTO 0MHz) OGRAPH HS Reference Waltek Tes http://www Radiation E e No.: WTS20 sting Group w.semtest.co Emission Vie 0X08055638 (Shenzhen) m.cn ew (30MHz t 8W Co., Ltd. o 1GHz)

Contact Information

Applicant

caleb cho
[email protected]201-580-2685Fax: 0755-23004002

Test Firm

WALTEK TESTING GROUP CO., LTD.Joy Zhou
[email protected]0769-22676998

Technical Specifications

#Rule PartsFrequency RangePower Output
1180.11 MHz - 0.148 MHz-
Confidentiality
Long Term
Grant Notes
Device must be installed and operated to provide a separation distance of at least 20cm from all persons and must not transmit simultaneously with any other antenna or transmitter, except in accordance with FCC multi-transmitter product procedures. Users and installers must be provided with antenna installation instructions and transmitter operating conditions for satisfying RF exposure compliance.

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