2AOAF-650Sabre

TYLT SABRE USER GUIDE FN MECHANICAL DATE: 05/27/21 PREPARED FOR: TYLT AT TN: AMIR PARSTABAR PROJECT: 2189_SABRE_USER GUIDE_FN SIZE: 6” X 3.5” MATERIAL: TBD COLOR: BLACK PROPRIETARY AND CONFIDENTIAL TYLT SABRE - USER GUIDE WIRELESS CHARGING Place phone and AirPods™ on any bay to charge sabre Dual Wireless Charging Mat LIGHT INDICATION White – Charging Blinking White – Error IC3867 / 05/27/21 / 2189_SABRE_USER GUIDE_FN / 2 DIELINE 6” 3.5” ATTN: TYLT, INC.DIMENSIONS: 6 in x 3.5 in DATE: PRODUCT: Sabre User GuideMATERIAL: 05/27/21 please proofread all copy | not a color proof | 1.877.524.2525 | www.blakinc.com BLACK Mechanical RF exposure statement This equipment complies with the FCC RF radiation exposure limits set forth for an uncontrolled environment. This equipment should be installed and operated with a minimum distance of 20cm between the radiator and any part of your body. FCC Warning This device complies with Part 18 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. NOTE : Any changes or modifications to this unit not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment. These designs are representative of information architecture, indicating priority and layout of page components. 7KH\GRQRWFRQVWLWXWHWKHƓQDOORRN or feel of the design. PREPARED FOR TYLT CONTACT Pawnie Farshi [email protected] 877-524-2525 Ext. 701 2189_Sabre_User Guide_fn 05/27/21 / © 2021 Blak Inc. / www.blakinc.com3URSULHWDU\DQG&RQƓGHQWLDO

Reference No.: WTX21X06057858W Page 2 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX21X06057858W Page 3 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX21X06057858W Page 4 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX21X06057858W Page 5 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7

Reference No.: WTX21X06057858W Page 1 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 1- PRODUCT LABELING Proposed FCCID Label Format Specifications: Text is Black in color and justified. Labels are printed in indelible ink on permanent adhesive silk-screened onto the EUT or shall be affixed at a conspicuous location on the EUT. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX21X06057858W Page 6 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTX21X06057858W Page 7 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View2 Solder Board-Component View3 Reference No.: WTX21X06057858W Page 8 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View4 Solder Board-Component View5 Reference No.: WTX21X06057858W Page 9 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View6 Antenna View

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 11 TEST REPORT Reference No. .................... : WTX21X06057858W-2 FCC ID ................................ : 2AOAF-650 Applicant ........................... : TYLT,INC. Address.............................. : 685 Cochran St.Suite 200 Simi Valley CA93065 US Product Name ................... : Sabre Test Model. ........................ : QISBRBK-T Standards .......................... : KDB 680106 D01 V03 Date of Receipt sample .... : Jun. 15, 2021 Date of Test........................ : Jun. 15, 2021 to Jun. 22, 2021 Date of Issue ..................... : Jun. 22, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X06057858W-2 Page 2 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 11 TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................5 2. RF EXPOSURE TEST REPORT.............................................................................................................................6 2.1 STANDARD APPLICABLE .........................................................................................................................................6 2.2 TEST CONDITIONS ..................................................................................................................................................6 2.3 TEST PROCEDURE ...................................................................................................................................................7 2.4 TEST RESULT..........................................................................................................................................................7 2.5 TEST PHOTOS ....................................................................................................................................................... 10 APPENDIX PHOTOGRAPHS ................................................................................................................................... 11 Reference No.: WTX21X06057858W-2 Page 3 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 3 of 11 Report version Version No. Date of issue Description Rev.00 Jun. 22, 2021 Original / / / Reference No.: WTX21X06057858W-2 Page 4 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 4 of 11 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: TYLT,INC. Address of applicant: 685 Cochran St.Suite 200 Simi Valley CA93065 US Manufacturer: Shenzhen Goodwin Technology Co., Ltd. Address of manufacturer: 4/F,Building A,Huayuan Industrial Park,Fenghuang NO.1 Industrail Area,Fuyong,Bao'an Dist, Shenzhen, China General Description of EUT Product Name: Sabre Trade Name: / Model No.: QISBRBK-T Adding Model(s): QISAB15WBK, QISBRXX-T（XX means different colors） Note: The test data is gathered from a production sample, provided by the manufacturer. The appearance of others models listed in the report is different from main-test model QISBRBK-T, but the circuit and the electronic construction do not change, declared by the manufacturer. Technical Characteristics of EUT Frequency Range: 120~130KHz Modulation Type: ASK Antenna Type: Coil Antenna Rated Voltage: Input: DC5V / DC9V /DC12V Rated Current: Input:2A Rated Power: Output: 5W / 10W / 15W Reference No.: WTX21X06057858W-2 Page 5 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 5 of 11 1.2 Test Equipment List and Details Description Manufacturer Model Serial No. Cal Date Due Date MPE Measuring Instrument Narda ELT-400 M-0155/M-0170 2020-07-15 2021-07-14 Broadband Field Meter Narda NBM-520 D-1699 2020-06-21 2021-06-20 Reference No.: WTX21X06057858W-2 Page 6 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 6 of 11 2. RF Exposure Test Report 2.1 Standard Applicable According to §1.1310 system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. 2.2 Test Conditions Test Mode Description Remark TM1 Wireless Charging Input DC12V4A; Output 1:5W; Output 2:5W TM2 Wireless Charging Input DC12V4A; Output 1:10W; Output 2:10W TM3 Wireless Charging Input DC12V4A; Output 1:15W; Output 2:15W Measurement Distance: 15 cm Reference No.: WTX21X06057858W-2 Page 7 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 7 of 11 2.3 Test Procedure a. The measurement probe was placed at test distance(15 cm for A,B,C,D,F and 20 cm for E) which is between the edge of the charger and the geometric center of probe. b. The highest emission level was recorded at the measurement points(A, B, C, D, E, F). c. The EUT was measured according to the distance of KDB 680106 D01 V03. 2.4 Test Result The EUT dose comply with item 5.2 of KDB 6801…

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cnPage 1 of 29 TEST REPORT Reference No. .................... : WTX21X06057858W-1 FCC ID ................................ : 2AOAF-650 Applicant ........................... : TYLT,INC. Address.............................. : 685 Cochran St.Suite 200 Simi Valley CA93065 US Product Name ................... : Sabre Test Model. ........................ : QISBRBK-T Standards .......................... : FCC Part 18 Date of Receipt sample .... : Jun. 15, 2021 Date of Test........................ : Jun. 15, 2021 to Jun. 22, 2021 Date of Issue ..................... : Jun. 22, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: WaltekTesting Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X06057858W-1 Page 2 of 29 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND OPERATION MODE ......................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................6 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................7 2. SUMMARY OF TEST RESULTS ...........................................................................................................................8 3. CONDUCTED EMISSIONS ....................................................................................................................................9 3.1 STANDARD APPLICABLE .........................................................................................................................................9 3.2 TEST PROCEDURE ...................................................................................................................................................9 3.3BASIC TEST SETUP BLOCK DIAGRAM .....................................................................................................................9 3.4 ENVIRONMENTAL CONDITIONS ..............................................................................................................................9 3.5 TEST RECEIVER SETUP ......................................................................................................................................... 10 3.6 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 10 4. RADIATED EMISSIONS ....................................................................................................................................... 17 4.1 TEST PROCEDURE ................................................................................................................................................. 17 4.2 TEST RECEIVER SETUP ......................................................................................................................................... 19 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 19 4.4 ENVIRONMENTAL CONDITIONS ............................................................................................................................ 19 4.5 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 19 APPENDIXPHOTOGRAPHS .................................................................................................................................... 29 Reference No.: WTX21X06057858W-1 Page 3 of 29 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Report version Version No. Date of issue Description Rev.00 Jun. 22, 2021 Original / / / Reference No.: WTX21X06057858W-1 Page 4 of 29 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: TYLT,INC. Address of applicant: 685 Cochran St.Suite 200 Simi Valley CA93065 US Manufacturer: Shenzhen Goodwin Technology Co., Ltd. Address of manufacturer: 4/F,BuildingA,Huayuan Industrial Park,Fenghuang NO.1 IndustrailArea,Fuyong,Bao'anDist, Shenzhen, China General Description of EUT Product Name: Sabre Trade Name: / Model No.: QISBRBK-T Adding Model(s): QISAB15WBK, QISBRXX-T（XX means different colors） Note: The test data is gathered from a production sample,provided…

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Reference No.: WTX21X06057858W Page 10 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission View (Below 30MHz) Reference No.: WTX21X06057858W Page 11 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission View (30MHz to 1GHz)