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2ARO3-W6LITESmartPhone

Worldwide telecom limited
SmartPhone - FCC ID 2ARO3-W6LITE - Worldwide telecom limited
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Application Details

Equipment Class
DTS - Digital Transmission System
Date of Grant
Dec 28, 2020
Application Purpose
Original Equipment
Date of Application
Dec 28, 2020
Equipment Note
SmartPhone
Frequency Range
2412.00000000 - 2462.00000000
Company
Worldwide telecom limited
Country
China

Documents & Files

Select a file to view

Users Manual

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Attestation Statements

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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Internal Photos

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RF Exposure Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Attestation Statements

Worldwidetelecomlimited 2FBlockCShenFangbuildingzhenhualufutiandist,Shenzhen,China. FederalCommunicationsCommission AuthorizationandEvaluationDivision 1435OaklandMillsRoad Columbia,MD21046 Date:2020-12-24 SUBJECT:FCCApplicationforFCCID:2ARO3-W6LITE ToWhomItMayConcern: I,theundersigned,herebystatesthisequipmenthasbeentestedandfoundtocomply withthelimitsforaClassBdigitaldevice,pursuanttopart15oftheFCCRules,and willapplytheSupplier'sDeclarationofConformityproceduretotheclassB computerperipheralportionandreceiversthatoperateintherangebetween30and 960MHzofthiscompositedevice.IunderstandthefollowingFCCrequirements: 1.DevicessubjecttotheSDoCprocedurearerequiredtobetestedtoshow compliancewiththeFCCtechnicalregulationsbyarecognizedaccreditedtesting laboratory.ThetestinglaboratorymustbeaccreditedbyaCommissionapproved accreditationbodyordesignatedunderthetermsofagovernment-to-government MutualRecognitionAgreement(MRA).Alistingofthoseaccreditedtesting laboratoriesthathavebeenrecognizedbytheCommissionispublishedontheFCC Webpage:https://apps.fcc.gov/oetcf/eas/reports/TestFirmSearch.cfm(Selectthe "accredited"optiontosearchforFCCrecognizedaccreditedtestfirms.) 2.Pt2.1077containsthelistofinformationthatmustbeincludedintheSupplier's DeclarationofConformity,whichmustbesuppliedwitheachproductsold.The SDoCcomplianceinfoshallbeincludedintheUser’sManualorasaseparate sheet.Theinfomustcontainthename,address,andphonenumberofthe responsibleparty,whichmustbelocatedwithintheUnitedStates.Accordingto 2.909(b),theresponsiblepartyiseithertheManufactureroriftheproductis importedtheImporter. Regards, Worldwidetelecomlimited ------------------------------- (EdgarAguilarMendoza) (ProjectDirector)

Cover Letter(s)

Worldwidetelecomlimited 2FBlockCShenFangbuildingzhenhualufutiandist,Shenzhen,China --------------------------------------------------------------------------------------------------------------------- Date:2020-12-24 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 FCCID:2ARO3-W6LITE ConfidentialityRequest Towhomitmayconcern, PursuanttoSections0.457and0.459oftheCommission’sRules,weherebyrequestconfidential treatmentoftheinformationaccompanyingthisapplicationasoutlinedbelow: ☒BlockDiagram☒Tune-UpInformation ☒ OperationalDescription ☐ SecurityInformation ☒Schematics☐SoftwareDefinedRadio(SDR)Information ☒PartsList Theabovematerialscontaintradesecretsandproprietaryinformationnotcustomarilyreleasedto thepublic.Thepublicdisclosureofthesematerialsmaybeharmfultotheapplicantandprovide unjustifiedbenefitstoitscompetitors. TheapplicantunderstandsthatpursuanttoSection0.457oftheRules,disclosureofthis applicationandallaccompanyingdocumentationwillnotbemadebeforethedateoftheGrantfor thisapplication. Sincerely, Worldwidetelecomlimited ------------------------------- (EdgarAguilarMendoza) (ProjectDirector)

Cover Letter(s)

Worldwidetelecomlimited 2FBlockCShenFangbuildingzhenhualufutiandist,Shenzhen,China. -------------------------------------------------------------------------------- (FCCID:2ARO3-W6LITE) POWEROFATTORNEY DATE:2020-12-24 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 ToWhomItMayConcern: We,theundersigned,herebyauthorizeWaltekTestingGroup(Shenzhen)Co.,Ltd. JandySoonourbehalf,toapplytotheFederalCommunicationsCommissiononour equipment.AnyandallactscarriedoutbyWaltekTestingGroup(Shenzhen)Co., Ltd.JandySoonourbehalfshallhavethesameeffectasactsofourown. ThisistoadvisethatweareinfullcompliancewiththeAnti-DrugAbuseAct. We,Worldwidetelecomlimitedarenotsubjecttoadenialoffederalbenefits pursuanttoSection5301oftheAnti-DrugActof1988,21USC853a,andnoparty totheapplicationissubjecttoadenialoffederalbenefitspursuanttothat section. Sincerely, Worldwidetelecomlimited ------------------------- (EdgarAguilarMendoza) (ProjectDirector)

External Photos

Reference No.: WTX20X12093686W-1/2/3/4 Page 2 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX20X12093686W-1/2/3/4 Page 3 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX20X12093686W-1/2/3/4 Page 4 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTX20X12093686W-1/2/3/4 Page 5 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7

ID Label/Location Info

Worldwidetelecomlimited 2F,BlockC,ShenFangbuilding,zhenhualu,futiandistrict,shenzhen,china. -------------------------------------------------------------------------------- December24,2020 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCID:2ARO3-W6LITE TOWHOMITMAYCONCERN: WeplacetheFCClabelinthebatterycompartmentduetobelowreasons: 1.TheFCClabelisvisiblewhenuseropenthebatterydoorandinstallthe batteries,otherwise,theequipmentdoesn’twork. 2.FCCIDwillbeplacedonthepackingbox;userscanreadtheFCCID informationatthetimeofpurchase. 3.Labelplacedontheexterioroftheequipmentaffecttheappearanceaccording todesignrequirements;otherwise,itwouldbeeasilyremovedordamaged. BESTREGARDS, Worldwidetelecomlimited ------------------------------- (EdgarAguilarMendoza) (ProjectDirector)

ID Label/Location Info

Reference No.: WTX20X12093686W-1/2/3/4 Page 1 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Internal Photos

Reference No.: WTX20X12093686W-1/2/3/4 Page 6 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX20X12093686W-1/2/3/4 Page 7 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT Housing and Board View 2 Solder Board-Component View 1 Reference No.: WTX20X12093686W-1/2/3/4 Page 8 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 2 Solder Board-Component View 3 Reference No.: WTX20X12093686W-1/2/3/4 Page 9 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 4 Solder Board-Component View 5 Reference No.: WTX20X12093686W-1/2/3/4 Page 10 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Reference No.: WTX20X12093686W-1/2/3/4 Page 11 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View

RF Exposure Info

Ref : ACR.154.4.15.SATU.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD. 1/F, BUILDING A, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD BAO'AN DISTRICT SHENZHEN (518101), CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: SN 09/13 EP168 Calibrated at MVG US 2105 Barrett Park Dr. - Kennesaw, GA 30144 05/22/2020 Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed in MVG USA using the CALISAR / CALIBAIR test bench, for use with a COMOSAR system only. All calibration results are traceable to national metrology institutions. COMOSAR E-Field Probe Calibration Report COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 2/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. NameFunction DateSignature Prepared by : Jérôme LUC Product Manager 5/22/2020 Checked by : Jérôme LUC Product Manager 5/22/2020 Approved by : Kim RUTKOWSKI Quality Manager 5/22/2020 Customer Name Distribution : Waltek Testing Group (Shenzhen) Co., Ltd. IssueDateModifications A 5/22/2020 Initial release COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 3/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Linearity ________________________________________________________________ 4 3.2 Sensitivity _______________________________________________________________ 5 3.3 Lower Detection Limit _____________________________________________________ 5 3.4 Isotropy _________________________________________________________________ 5 3.5 Boundary Effect __________________________________________________________ 5 4 Measurement Uncertainty .......................................................................................... 5 5 Calibration Measurement Results .............................................................................. 6 5.1 Sensitivity in air __________________________________________________________ 6 5.2 Linearity ________________________________________________________________ 7 5.3 Sensitivity in liquid ________________________________________________________ 7 5.4 Isotropy _________________________________________________________________ 8 6 List of Equipment ...................................................................................................... 9 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 4/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE ManufacturerMVG ModelSSE5 Serial Number SN 09/13 EP168 Product Condition (new / used) Used Frequency Range of Probe 0.7 GHz-3GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.224 M: Dipole 2: R2=0.234 M: Dipole 3: R3=0.229 M: A yearly calibration interval is recommended. 2PRODUCT DESCRIPTION 2.1GENERAL INFORMATION MVG¶V&2026$5(ILHOG3UREHVDUHEXLOWLQDFFRUGDQFHWRWKH,(((OET 65 Bulletin C and CEI/IEC 62209 standards. Figure 1±MVG COMOSAR Dosimetric E field Dipole Probe Length 330 mm Length of Individual Dipoles 4.5 mm Maximum external diameter 8 mm Probe Tip External Diameter 5 mm Distance between dipoles / probe extremity 2.7 mm 3MEASUREMENT METHOD The IEEE 1528, OET 65 Bulletin C, CENELEC EN50361 and CEI/IEC 62209 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their affect. All calibrations / measurements performed meet the fore mentioned standards. 3.1LINEARITY The evaluation of the linearity was done in free space using the waveguide, performing a power sweep to cover the SAR range 0.01W/kg to 100W/kg. COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 5/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 3.2SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards. 3.3LOWER DETECTION LIMIT The lower detection limit was assessed using the same measurement set up as used for the linearity measurement. The required lower detection limit is 10 mW/kg. 3.4ISOTROPY The axial isotropy was evaluated by exposing the probe to a reference wave from a standard dipole with the dipole mounted under the flat phantom in the test configuration suggested for system validations and checks. The probe was rotated along its main axis from 0 - 360 degrees in 15 degree steps. The hemispherical isotropy is determined by inserting the probe in a thin plastic box filled with tissue-equivalent liquid, with the plastic box illuminated with the fields …

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RF Exposure Info

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 81 TEST REPORT Reference No....................: WTX20X12093686W FCC ID ..............................: 2ARO3-W6LITE Applicant ..........................: Worldwide telecom limited Address ............................: 2F Block C; Shenfang Building, Zhen Hualu, Futian, Shenzhen. Product Name ..................: SmartPhone Test Model. .......................: W6 LITE Standards .........................: FCC Part 2.1093 ANSI / IEEE C95.1 : 2005+A1:2010 ANSI / IEEE C95.3 : 2002(R2008) IEEE 1528 :2013 Date of Receipt sample ....: Dec.04, 2020 Date of Test ......................: Dec.07, 2020 to Dec.22, 2020 Date of Issue ....................: Dec.23, 2020 Test Result .......................: Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Hubrey Cai / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X12093686W Page 2 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. General Information ............................................................................................................................................ 3 1.1 Product Description for Equipment Under Test (EUT) .................................................................................... 3 1.2 Test Standards ............................................................................................................................................. 6 1.3 Test Methodology ......................................................................................................................................... 6 1.4 Test Facility .................................................................................................................................................. 6 2. Summary of Test Results ................................................................................................................................... 7 3. Specific Absorption Rate (SAR) ......................................................................................................................... 8 3.1 Introduction .................................................................................................................................................. 8 3.2 SAR Definition .............................................................................................................................................. 8 4. SAR Measurement System ................................................................................................................................. 9 4.1 The Measurement System ............................................................................................................................ 9 4.2 Probe ........................................................................................................................................................... 9 4.3 Probe Calibration Process .......................................................................................................................... 11 4.4 Phantom .................................................................................................................................................... 12 4.5 Device Holder............................................................................................................................................. 12 4.6 Test Equipment List .................................................................................................................................... 13 5. Tissue Simulating Liquids ................................................................................................................................ 14 5.1 Composition of Tissue Simulating Liquid ..................................................................................................... 14 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ......................................................................... 15 5.3 Tissue Calibration Result ............................................................................................................................ 16 6. SAR Measurement Evaluation .......................................................................................................................... 17 6.1 Purpose of System Performance Check ...................................................................................................... 17 6.2 System Setup ............................................................................................................................................. 17 6.3 Validation Results ....................................................................................................................................... 18 7. EUT Testing Position ........................................................................................................................................ 19 7.1 Define Two Imaginary Lines on The Handset............................................................................................... 19 7.2 Cheek Position ........................................................................................................................................... 20 7.3 Tilted Position............................................................................................................................................. …

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RF Exposure Info

Reference No.: WTX20X12093686W Page 74 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Annex C. EUT Photos EUT View Front EUT View Back Reference No.: WTX20X12093686W Page 75 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View GSM /WCDMA Ant. GPS Ant WIFI/BT Ant. Reference No.: WTX20X12093686W Page 76 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Annex D. Test Setup Photos Head Exposure Conditions Right Cheek Tilt Reference No.: WTX20X12093686W Page 77 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Left Cheek Tilt Reference No.: WTX20X12093686W Page 78 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Body mode Exposure Conditions Test distance: 10mm Body Front Body Back Reference No.: WTX20X12093686W Page 79 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Body Right Body Left Reference No.: WTX20X12093686W Page 80 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Body Top Body Bottom Reference No.: WTX20X12093686W Page 81 of 81 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Annex E. Calibration Certificate Please refer to the exhibit for the calibration certificate ***** END OF REPORT *****

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 41 TEST REPORT Reference No. .................... : WTX20X12093686W-4 FCC ID ................................ : 2ARO3-W6LITE Applicant ........................... : Worldwide telecom limited Address.............................. : 2F Block C; Shenfang Building, Zhen Hualu, Futian, Shenzhen. Product Name ................... : SmartPhone Test Model. ........................ : W6 LITE Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Dec.04, 2020 Date of Test........................ : Dec.04, 2020 to Dec.21, 2020 Date of Issue ..................... : Dec.21, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X12093686W-4 Page 2 of 41 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................5 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION................................................................................................................................. 11 4. POWER SPECTRAL DENSITY ........................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 12 4.3 TEST PROCEDURE ................................................................................................................................................. 12 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 5. DTS BANDWIDTH ................................................................................................................................................. 13 5.1 STANDARD APPLICABLE ....................................................................................................................................... 13 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 13 5.3 TEST PROCEDURE ................................................................................................................................................. 13 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 6. RF OUTPUT POWER ............................................................................................................................................ 14 6.1 STANDARD APPLICABLE ....................................................................................................................................... 14 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 14 6.3 TEST PROCEDURE ................................................................................................................................................. 14 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 14 7. FIELD STRENGTH OF SPURIOUS EMISSIONS ............................................................................................. 15 7.1 STANDARD APPLICABLE .....................…

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Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 63 TEST REPORT Reference No. .................... : WTX20X12093686W-2 FCC ID ................................ : 2ARO3-W6LITE Applicant ........................... : Worldwide telecom limited Address.............................. : 2F Block C; Shenfang Building, Zhen Hualu, Futian, Shenzhen. Product Name ................... : SmartPhone Test Model. ........................ : W6 LITE Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Dec.04, 2020 Date of Test........................ : Dec.04, 2020 to Dec.21, 2020 Date of Issue ..................... : Dec.21, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X12093686W-2 Page 2 of 63 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION................................................................................................................................. 11 4. POWER SPECTRAL DENSITY ........................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST SETUP BLOCK DIAGRAM .........................................................…

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Contact Information

Applicant

Edgar Mauricio Aguilar Mendoza(Project Director)
[email protected]008675583659729Fax: 008675583659730

Test Firm

Waltek Testing Group (Shenzhen) Co., Ltd.Jandy So
[email protected]86 755 33663308Fax: 86-755-33663309

Technical Specifications

#Rule PartsFrequency RangePower Output
215C2.41 GHz - 2.46 GHz38.30 mW
Confidentiality
Long Term
Grant Notes
Output Power listed is the maximum conducted output power. SAR compliance for body-worn operating configurations is limited to belt-clips and holsters that have no metallic components in the assembly and cause the device to operate with the minimum separation distance of 1.0 cm, as described in this filing. End-users must be informed of the body-worn operating requirements for satisfying RF exposure compliance. The highest reported SAR for head, body-worn accessory, product specific (wireless router), and simultaneous transmission exposure conditions are 0.09 W/kg, 0.16 W/kg, 0.16 W/kg and 1.29 W/kg, respectively. This device supports 20 and 40 MHz bandwidth modes.

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