2ASBG-YH8320CMassage Chair

FUJIANYIHEELECTRONICSCO.,LTD. JIAN ROAD, QINXIYANG INDUSTRIAL PARK, FUAN, FUJIAN 355000,China Date: 2023-05-04 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: 2ASBG-YH8320C US Agent – Attestation Statement / Part 2.911(d)(7) FUJIANYIHEELECTRONICSCO.,LTD.certifiesthat, asof 2023-05-04, we havedesignated FCCUSAgent,LLCto accept serviceof processonour behalf forFCCID:2ASBG-YH8320C. FUJIANYIHEELECTRONICSCO.,LTD.,acceptstomaintainanagentofserviceofprocessin theUnitedStatesfornolessthanoneyearaftereitherthegranteehaspermanentlyterminated allmarketingandimportationof the applicableequipmentwithinthe U.S.,orthe conclusionof anyCommission-relatedadministrativeor judicialproceedinginvolving theequipment, whicheverislater. FCCUSAgent,LLC, accepts asof thedateofthe filingof thisapplication, theobligationof beingthe designatedagentforthe purposeof acceptingserviceof process onbehalf of FUJIANYIHEELECTRONICSCO.,LTD.forFCC ID: 2ASBG-YH8320C. Designated Agent Information: CompanyName: FCC US Agent,LLC FRN: 0033402884 Address:3722IllinoisAvenue, Saint Charles, IL, 60174, USA ContactPerson: Tim Payne Phone: 708-571-3148 Email: [email protected] Sincerely, Company:FUJIANYIHE ELECTRONICSCO., LTD. DesignatedAgent:FCCUS Agent,LLC CompanyRepresentative: YUAN RAODesignatedAgentRepresentative: TimPayne Signature:Signature:

Reference No.: WTX23X04074615W001 Page 2 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX23X04074615W001 Page 3 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX23X04074615W001 Page 4 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX23X04074615W001 Page 5 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7 EUT View 8 Reference No.: WTX23X04074615W001 Page 6 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 9 EUT View 10 Reference No.: WTX23X04074615W001 Page 7 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 11 EUT View 12 Reference No.: WTX23X04074615W001 Page 8 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 13 EUT View 14 Reference No.: WTX23X04074615W001 Page 9 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 15

ReferenceNo.:WTX23X04074615W001Page1of18 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT1-PRODUCTLABELING ProposedFCCIDLabelFormat Specifications:Thelabelshallbesecurelyaffixedtoapermanentlyattachedpartofthedevice,inalocation whereitisvisibleoreasilyaccessibletotheuser,andshallnotbereadilydetachable.Thelabelshallbe sufficientlydurabletoremainfullylegibleandintactonthedeviceinallnormalconditionsofusethroughout thedevice’sexpectedlifetime. ProposedLabelLocationonEUT FCCIDLabel Location

1. RF Exposure Requirements 1.1 General Information Client Information Applicant: FUJIAN YIHE ELECTRONICS CO., LTD Address of applicant: JIAN ROAD, QINXIYANG INDUSTRIAL PARK,FUAN, FUJIAN 355000, China Manufacturer: FUJIAN YIHE ELECTRONICS CO., LTD Address of manufacturer: JIAN ROAD, QINXIYANG INDUSTRIAL PARK,FUAN, FUJIAN 355000, China General Description of EUT: Product Name: Massage Chair Trade Name Mazzup Model No.: MU-C211 Adding Model(s): MU-C212, MU-C311, MU-C313, YH-8320C Rated Voltage: AC110V/60Hz Battery Capacity: / Adapter Model: / Software Version: V1.0 Hardware Version: V1.0 FCC ID: 2ASBG-YH8320C Equipment Type: Portable device Technical Characteristics of EUT: Bluetooth Bluetooth Version: V5.0 (BR/EDR mode) Frequency Range: 2402-2480MHz RF Output Power: -0.17dBm (Conducted) Data Rate: 1Mbps, 2Mbps, 3Mbps Modulation: GFSK, π/4 DQPSK, 8DPSK Quantity of Channels: 79 Channel Separation: 1MHz Type of Antenna: PCB Antenna Antenna Gain: 1.7dBi 1.2 RF Exposure Exemption According to §1.1307(b)(3) and KDB 447498 D04 Interim General RF Exposure Guidance v01, system operating under the provisions of this section shall be operating in a manner that the public is not exposed to radio frequency energy level in excess limit for maximum permissible exposure. Option A: FCC Rule Part 1.1307 (b)(3)(i)(A):The available maximum time-averaged power is no more than 1mW, regardless of separation distance. Option B: FCC Rule Part 1.1307 (b)(3)(i)(B): The available maximum time-averaged power or effective radiated power (ERP), whichever is greater, is less than or equal to the threshold P th (mW) described in the following formula. P th is given by: Option C: FCC Rule Part 1.1307 (b)(3)(i)(C): The minimum separation distance (R in meters) from the body of a nearby person for the frequency (f in MHz) at which the source operates, the ERP (watts) is no more than the calculated value prescribed for that frequency. R must be at least λ/2π, where λ is the free-space operating wavelength in meters. Single RF Sources Subject to Routine Environmental Evaluation RF Source frequency (MHz) Threshold ERP (watts) 0.3-1.34 1,920 R 2 1.34-30 3,450 R 2 /f 2 30-300 3.83 R 2 300-1,500 0.0128 R 2 f 1,500-100,000 19.2R 2 For Multiple RF sources: FCC Rule Part 1.1307(b)(3)(ii): (A) The available maximum time-averaged power of each source is no more than 1 mW and there is a separation distance of two centimeters between any portion of a radiating structure operating and the nearest portion of any other radiating structure in the same device, except if the sum of multiple sources is less than 1 mW during the time-averaging period, in which case they may be treated as a single source (separation is not required). (B) In the case of fixed RF sources operating in the same time-averaging period, or of multiple mobile or portable RF sources within a device operating in the same time averaging period, if the sum of the fractional contributions to the applicable thresholds is less than or equal to 1 as indicated in the following equation. 1.3 Calculated Result Radio Access Technology Prediction Frequency Output Power Antenna Gain Duty Cycle Tune-Up Time-Averaged Power ERP (MHz) (dBm) (dBi) (%) (dBm) (dBm) Bluetooth 2402 -0.17 1.7 100 0.00 -0.45 Frequency Option Min. Distance Max. Power Exposure Limit Ratio Result (MHz) (cm) (dBm) (mW) (mW) Pass/Fail 2402 B 0.5 0.00 1.00 2.788 0.36 Pass Note: 1. Time-Averaged Power=Output Power * Duty Cycle; ERP= Time-Averaged Power+ Antenna gain-2.15dB 2. Option A, B and C refers as clause 1.2. 3. For option B, Max (time-averaged power, effective radiated power (ERP)) converts to Max. Power. For option C, ERP converts to Max. Power; 4. For option B, P th (mW) converts to Exposure Limit (mW); For option C, ERP (W) converts to Exposure Limit (mW). 5. Ratio= Tune-Up ERP (mW)/ Exposure Limit (mW) Mode for Simultaneous Multi-band Transmission: Radio Access Technology Ratio 1 Ratio 2 Simultaneous Ratio Limit Result Pass/Fail -- -- -- -- -- -- Result: Pass

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 63 TEST REPORT Reference No. .................... : WTX23X04074615W001 FCC ID ................................ : 2ASBG-YH8320C Applicant ........................... : FUJIAN YIHE ELECTRONICS CO., LTD Address ............................. : JIAN ROAD, QINXIYANG INDUSTRIAL PARK,FUAN, FUJIAN 355000, China Manufacturer ..................... : The same as Applicant Address ............................. : The same as Applicant Product Name ................... : Massage Chair Model No... ......................... : MU-C211 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : 2023-04-10 Date of Test........................ : 2023-04-10 to 2023-04-21 Date of Issue ..................... : 2023-04-21 Test Report Form No. ....... : WTX_Part 15_247W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Gala Wang Silin Chen Reference No.: WTX23X04074615W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 63 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................. 6 1.3 TEST METHODOLOGY ........................................................................................................................................... 6 1.4 TEST FACILITY ...................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................. 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. ANTENNA REQUIREMENT ................................................................................................................................. 13 3.1 STANDARD APPLICABLE ..................................................................................................................................... 13 3.2 EVALUATION INFORMATION ................................................................................................................................ 13 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS .................................................................................... 14 4.1 STANDARD APPLICABLE ..................................................................................................................................... 14 4.2 FREQUENCY HOPPING SYSTEM ......................................................................................................................... 14 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE ............................................................................... 15 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION .................................................... 16 5.1 STANDARD APPLICABLE ..................................................................................................................................... 16 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 16 5.3 TEST PROCEDURE .............................................................................................................................................. 16 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 17 6. DWELL TIME OF HOPPING CHANNEL ........................................................................................................... 18 6.1 STANDARD APPLICABLE ..................................................................................................................................... 18 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 18 6.3 TEST PROCEDURE .............................................................................................................................................. 18 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 19 7. 20DB BANDWIDTH ............................................................................................................................................... 20 7.1 STANDARD APPLICABLE ..................................................................................................................................... 20 7.2 TEST SETUP BLOCK DIAGRAM ........................................…

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ReferenceNo.:WTX23X04074615W001Page16of18 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT4-TESTSETUPPHOTOGRAPHS ConductedEmissionTest Setup RadiationEmissionTest Setup(Below30MHz) ReferenceNo.:WTX23X04074615W001Page17of18 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(30MHzto1GHz) RadiationEmissionTest Setup(1GHzto18GHz) ReferenceNo.:WTX23X04074615W001Page18of18 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(Above18GHz) *****ENDOFREPORT*****