2ASBG-YH9720LSMassage Chair

Reference No.: WTX22X10215778W Page 2 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX22X10215778W Page 3 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX22X10215778W Page 4 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX22X10215778W Page 5 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7 EUT View 8 Reference No.: WTX22X10215778W Page 6 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 9 EUT View 10

Reference No.: WTX22X10215778W Page 7 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 11 EUT View 12 Reference No.: WTX22X10215778W Page 8 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 13 EUT View 14

Reference No.: WTX22X10215778W Page 1 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX22X10215778W Page 9 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX22X10215778W Page 10 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT Housing and Board View 3 Solder Board-Component View 1 Reference No.: WTX22X10215778W Page 11 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 2 Solder Board-Component View 3 Reference No.: WTX22X10215778W Page 12 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 4 Solder Board-Component View 5

Reference No.: WTX22X10215778W Page 13 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 6 Solder Board-Component View 7 Reference No.: WTX22X10215778W Page 14 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 8 Solder Board-Component View 9 Reference No.: WTX22X10215778W Page 15 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 10 Solder Board-Component View 11 Reference No.: WTX22X10215778W Page 16 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Antenna View

RF Exposure Requirements Product Description: Massage Chair Model No.: OG6300 FCC ID: 2ASBG-YH9720LS According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 4.95dBm Tune-Up output power: 5.0dBm RF channel transmit frequency: 2402MHz Result: 1.0 Limit: 3.0 The exclusion thresholds is 1.0 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

CustomerName:SHENZHENSHIXINZHONGXINTECHNOLOGY.CO.,LTD ProductName:BTAntenna SampleModel:F-6988 ReferenceStandard:GB/T9410-2008;ANSI/IEEEStd149-1979 IssueDate:2022.9.27 Engineer: Date:2022.09.27 Auditor: Date:2022.09.27 Approver: Date:2022.09.27 AntennaSpecification 1.GeneralInformation 1.1GeneralInformationoftestinginstitutions Name ShenzhenHetuoTechnologyCo.,Ltd. Addres s Room1202B,BuildingC6,HengfengIndustrialCity,Xixia ng,BaoanDistrict,Shenzhen Tel 18665849001 E-mail [email protected] Equip ment Agilent5071C 1.2Testingprinciple Multi-probeOTAMeasurementSystem 1.3Testequipment EquipmentModelNo.SerialNo.Manufacturer Calibration date Next calibration date 24probe microwave chamber 4*3*3NAFEITU2022.07.292022.10.31 Network Analyzer 5071CNA Agilent 2022.07.292022.10.31 1.4Testenvironment Temperature 24°C±1.5°C Humidity 45%RH Pressure 101kPa 1.5 AntennaPhoto&Lenght(mm) 2.SampleInformation 2.1Clientinformation Name SHENZHENSHIXINZHONGXINTECHNOLOGY.CO.,LTD Address A1,ShajingDonghuanIndustrialZone,Bao'anDistrict,Shenzhen Contacts MaChao Tel 18218809918 E-mail [email protected] 2.2DescriptionofEUT(S) ProductName BTAntenna SampleModel F-6988 AntennaSize 4.6*10.4mm AntennaType PCBantenna SerialNo. / TestItem AntennaGain,Radiationpattern FrequencyRange 2400-2500MHz ReceivedDate 2022.09.25 TestDate 2022.09.27 Remark ThelengthoftheRFcableis50mm TestPhotos Testdata Frequency (MHz) 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 Gain(dBi) -1.82-1.63-2.22-2.15-1.57-1.61-1.39-1.23-1.28-1.57-1.23

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 64 TEST REPORT Reference No. .................... : WTX22X10215778W001 FCC ID ................................ : 2ASBG-YH9720LS Applicant ........................... : FUJIAN YIHE ELECTRONICS CO., LTD Address.............................. : JIAN ROAD, QINXIYANG INDUSTRIAL PARK, FUAN, FUJIAN 355000, China Manufacturer ..................... : The same as Applicant Address.............................. : The same as Applicant Product Name ................... : Massage Chair Model No... ......................... : OG6300 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : 2022-10-28 Date of Test........................ : 2022-10-28 to 2022-11-26 Date of Issue ..................... : 2022-11-26 Test Report Form No. ....... : WTX_Part 15_247W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Gala Wang Silin Chen Reference No.: WTX22X10215778W001 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 64 TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) .........................................................................5 1.2 TEST STANDARDS .................................................................................................................................................6 1.3 TEST METHODOLOGY ...........................................................................................................................................6 1.4 TEST FACILITY ......................................................................................................................................................6 1.5 EUT SETUP AND TEST MODE ..............................................................................................................................7 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................. 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 13 3. ANTENNA REQUIREMENT ................................................................................................................................ 14 3.1 STANDARD APPLICABLE ..................................................................................................................................... 14 3.2 EVALUATION INFORMATION ................................................................................................................................ 14 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS.................................................................................... 15 4.1 STANDARD APPLICABLE ..................................................................................................................................... 15 4.2 FREQUENCY HOPPING SYSTEM ......................................................................................................................... 15 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE ............................................................................... 16 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 17 5.1 STANDARD APPLICABLE ..................................................................................................................................... 17 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 17 5.3 TEST PROCEDURE .............................................................................................................................................. 17 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 18 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 19 6.1 STANDARD APPLICABLE ..................................................................................................................................... 19 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 19 6.3 TEST PROCEDURE .............................................................................................................................................. 19 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 20 7. 20DB BANDWIDTH ............................................................................................................................................... 21 7.1 STANDARD APPLICABLE ..................................................................................................................................... 21 7.2 TEST SETUP BLOCK DIAGRAM ...................................................…

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Reference No.: WTX22X10215778W Page 17 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX22X10215778W Page 18 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX22X10215778W Page 19 of 19 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****