2ASBG-YH8372LMassage Chair

FUJIAN YIHE ELECTRONICS CO., LTD.

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Application Details

Equipment Class: DSS - Part 15 Spread Spectrum Transmitter
Date of Grant: Jul 08, 2024
Application Purpose: Original Equipment
Date of Application: Jul 08, 2024
Equipment Note: Massage Chair
Frequency Range: 2402.00000000 - 2480.00000000
Company: FUJIAN YIHE ELECTRONICS CO., LTD.
Country: China

Documents & Files

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

?Double check to make sure there are no people, pets or anything within the range of backrest and footrest.

Attestation Statements

FUJIANYIHEELECTRONICSCO.,LTD. JIANROAD,QINXIYANGINDUSTRIALPARK,FUAN,FUJIAN355000,China Date:2024-01-30 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 USA Ref:AttestationStatementsPart2.911(d)(7)Filing GranteeCode:2ASBG ApplicantFRN:0028156800 FUJIANYIHEELECTRONICSCO.,LTD.certifiesthat,asofthedateofthefilingoftheapplication,OTA WorldLLCisourdesignatedU.S.agentforserviceofprocessfortheabovereferencedGranteeCode. FUJIANYIHEELECTRONICSCO.,LTD.acceptstomaintainanagentfornolessthanoneyearafterthe granteehasterminatedallmarketingandimportationortheconclusionofanyCommission-relatedproceeding involvingtheequipment. OTAWorldLLCaccepts,asofthedateofthefilingoftheapplication,theobligationofthedesignatedU.S. agentforserviceofprocessfortheabovereferencedGranteeCode. DesignatedU.S.AgentInformation: Name:OTAWorldLLC U.S.AgentFRN:0033426693 Address:1001WCROSBYRD.,CARROLLTON,TX75006,UnitedStates ContactPerson:MichaelCha Tel.:972-881-2700 Email:[email protected] Sincerely, SignedonbehalfofFUJIANYIHE ELECTRONICSCO.,LTD. SignedonbehalfofOTAWorldLLC Name:YUANRAOName:MichaelCha Title:SALESMANAGERTitle:GeneralManager Date:2024-01-30Date:2024-01-30

External Photos

ReferenceNo.:WTX24X05113512W001/003Page2of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT2-EUTEXTERNALPHOTOGRAPHS EUTView1 EUTView2 ReferenceNo.:WTX24X05113512W001/003Page3of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView3 EUTView4 ReferenceNo.:WTX24X05113512W001/003Page4of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView5 EUTView6 ReferenceNo.:WTX24X05113512W001/003Page5of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView7 EUTView8 ReferenceNo.:WTX24X05113512W001/003Page6of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView9 EUTView10 ReferenceNo.:WTX24X05113512W001/003Page7of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView11 EUTView12 ReferenceNo.:WTX24X05113512W001/003Page8of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView14 EUTView14 ReferenceNo.:WTX24X05113512W001/003Page9of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView15

ID Label/Location Info

ReferenceNo.:WTX24X05113512W001/003Page1of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT1-PRODUCTLABELING ProposedFCCIDLabelFormat Specifications:Thelabelshallbesecurelyaffixedtoapermanentlyattachedpartofthedevice,inalocation whereitisvisibleoreasilyaccessibletotheuser,andshallnotbereadilydetachable.Thelabelshallbe sufficientlydurabletoremainfullylegibleandintactonthedeviceinallnormalconditionsofusethroughout thedevice’sexpectedlifetime. ProposedLabelLocationonEUT FCCIDLabel Location

Internal Photos

ReferenceNo.:WTX24X05113512W001/003Page10of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT3-EUTINTERNALPHOTOGRAPHS EUTHousingand BoardView1 EUTHousingand BoardView2 ReferenceNo.:WTX24X05113512W001/003Page11of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTHousingand BoardView3 EUTHousingand BoardView4 ReferenceNo.:WTX24X05113512W001/003Page12of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View1 Solder Board-Component View2 ReferenceNo.:WTX24X05113512W001/003Page13of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View3 Solder Board-Component View4 ReferenceNo.:WTX24X05113512W001/003Page14of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View5 Solder Board-Component View6 ReferenceNo.:WTX24X05113512W001/003Page15of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View7 Solder Board-Component View8 ReferenceNo.:WTX24X05113512W001/003Page16of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View9 Solder Board-Component View10 ReferenceNo.:WTX24X05113512W001/003Page17of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View11 Solder Board-Component View12 ReferenceNo.:WTX24X05113512W001/003Page18of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn Solder Board-Component View13 Solder Board-Component View14 ReferenceNo.:WTX24X05113512W001/003Page19of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn AntennaView1 AntennaView2 BTAntenna WirelessChargingAntenna

RF Exposure Info

RFExposureRequirements ProductDescription:MassageChair ModelNo.:MC1810B,MC1810A,YH8372L FCCID:2ASBG-YH8372L AccordingtotheKDB447498D01v06section4.3.1,for100MHzto6GHzandtestseparation distances≤50mm,the1-gand10-gSARtestexclusionthresholdsaredeterminedbythe following: [(max.powerofchannel,includingtune-uptolerance,mW)/(min.testseparationdistance, mm)]·[√f(GHz)]≤3.0for1-gSARand≤7.5for10-gextremitySAR,where -f(GHz)istheRFchanneltransmitfrequencyinGHz -PoweranddistanceareroundedtothenearestmWandmmbeforecalculation -Theresultisroundedtoonedecimalplaceforcomparison CalculationResult: Txfrequencyrange:2402-2480MHz Min.testseparationdistance:5mm MaximumConductedOutputPower:5.437dBm Tune-Upoutputpower:6.0dBm RFchanneltransmitfrequency:2480MHz Result:1.2 Limit:3.0 Theexclusionthresholdsis1.2<3,sothetransmittercomplieswiththeRFexposure requirementsandtheSARisnotrequired.

Test Report

TestingReport CustomerName:SHENZHENSHIXINZHONGXINTECHNOLOGY.CO.,LTD ProductName:BTAntenna SampleModel:F-6988 ReferenceStandard:GB/T9410-2008;ANSI/IEEEStd149-1979 IssueDate:2019.07.10 Engineer: Date: Auditor: Date: Approver: Date: 2019.07.10 2019.07.10 2019.07.10 1.GeneralInformation 1 . 1GeneralInformationoftestinginstitutions Name ShenzhenHetuoTechnologyCo.,Ltd. Address Room1202B,BuildingC6,HengfengIndustrialCity,Xixiang,Baoan District,Shenzhen Tel 18665849001 E-mail [email protected] Equipm ent Agilent5071C 1.2Testingprinciple Multi-probe OTA Measurement System AntennaPhoto&Lenght(mm) Brief summary of Procedure 1.3Testequipment Equipment ModelNo.SerialNo.Manufacturer Calibration date Next calibration date 24probe microwave chamber 4*3*3NA2019.05.2SATIMO92019.08.31 Network Analyzer 5071CNA Agilent 1.4Testenvironment Temperature 24C±1.5C Humidity 45%RH Pressure 101kPa 1.5 2019.05.29 2019.08.31 1. SATIMO turn on the Upper Computer Software, Name: VeryView99.exe, Version No.: V1.10; 2. VeryView99 via GPIB (General Purpose Interface Bus) to control the shielding room (darkroom)'s SATIMO; 3. Meanwhiel, GPIB control the Agilent 5071C to read the Antenna data by 24 Probe; 4. Agilent 5071C will analyse the data and generate the result; 5. Agilent 5071C will feedback to VeryView99 software to generate the test report. upper computer software Agilent Darkroom Probe 2.SampleInformation 2.1Clientinformation Name SHENZHENSHIXINZHONGXINTECHNOLOGY.CO.,LTD Address A1,ShajingDonghuanIndustrialZone,Bao'anDistrict,Shenzhen Contacts MaChao Tel 18218809918 E-mail [email protected] 2.2DescriptionofEUT(S) ProductName BTAntenna SampleModel F-6988 AntennaSize 4.6*10.4mm AntennaType PCBantenna SerialNo. / TestItem AntennaGain,Radiationpattern FrequencyRange 2400-2500MHz ReceivedDate 2019.07.08 TestDate 2019.07.10 Remark ThelengthoftheRFcableis50mm Thetestphotos Frequency I Shenzhen Hetuo Technology Co., LTD D1234567891011 Fre quency (MHz)2400.0 2410.0 2420.0 2430.0 2440.0 2450.0 2460.0 2470.0 2480.0 2490.0 2500.0 Efficienc y (dBi)-6.12-6.19-6.13-6.21-6.11-5.93-5.80-5.59-5.40-5.03-4.75 Gain (dBi)-1.80 -2.22 -1.62 -1.87 -2.01 -1.77 -1.56 -1.48 -1.11 -0.73 -0.25 Efficienc y (%)24.45 24.07 24.35 23.94 24.49 25.55 26.30 27.58 28.81 31.38 33.46 Directivit y (dB)4.32 3.96 4.52 4.34 4.10 4.15 4.24 4.11 4.29 4.30 4.50 Peak Gain Position (Theta)126.00 124.00 124.00 124.00 123.00 119.00 123.00 122.00 126.00 124.00 31.00 Peak Gain Position (Phi)80.00 82.00 80.00 83.00 79.00 76.00 249.00 243.00 78.00 240.00 252.00 Efficienc y ThetaPol (%)6.59 6.62 6.65 6.60 6.86 7.18 7.29 7.55 7.55 8.15 8.58 Efficienc y PhiPol (%)17.86 17.45 17.71 17.33 17.63 18.36 19.01 20.02 21.26 23.23 24.88 U pper Hem. Efficiency (%)13.42 13.21 13.18 12.93 12.82 12.70 12.75 12.96 13.79 15.10 16.41 Lower Hem. Efficienc y (%)11.03 10.86 11.18 11.01 11.67 12.85 13.55 14.62 15.02 16.28 17.05 VER7 T90(H)Roundness 10.94 11.30 11.56 12.29 11.61 13.99 13.46 15.24 14.72 12.13 10.10 Gain 15de g (dBi) E1(XZ)Lobe width 61.00 91.00 85.00 93.00 87.00 84.00 85.00 81.00 80.00 84.00 83.00 E1 (XZ)Ratio 3.91 3.29 3.90 3.39 3.00 2.29 1.77 1.98 2.16 2.64 2.49 E2 (YZ)Lobe width 37.00 35.00 34.00 35.00 219.00 208.00 160.00 160.00 199.00 57.00 84.00 E2 (YZ)Ratio 3.61 3.36 3.64 3.20 2.33 2.41 2.32 2.20 2.29 2.32 3.05 Maximum benefit axis ratio (P) 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 Elevation 10 degrees worst (large) axis 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 Hc (XY) Lobe width 94.00 92.00 96.00 100.00 109.00 112.00 118.00 135.00 119.00 116.00 126.00 Hc (XY)Ratio 0.00 0.00 0.00 0.00 0.00 0.00 0.00 0.00 0.00 0.00 0.00 Empty max33.46 min23.94 23.94 33.46 0.00 10.00 20.00 30.00 40.00 50.00 60.00 70.00 80.00 90.00 100.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 Efficiency (%)Max-Min -0.25 -2.22 -7.00 -6.00 -5.00 -4.00 -3.00 -2.00 -1.00 0.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 0.00 10.00 20.00 30.00 40.00 50.00 60.00 70.00 80.00 90.00 100.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 Efficiency ThetaPol (%)Efficiency PhiPol (%) 0.00 10.00 20.00 30.00 40.00 50.00 60.00 70.00 80.00 90.00 100.00 2400.02410.02420.02430.02440.02450.02460.02470.02480.02490.02500.0 Upper Hem. Efficiency (%)Lower Hem. Efficiency (%) Test data 2400.0MHz H+V, Eff: 24.5%Back View2400.0MHz Total(E1-XZ), Max= -2.65dBi2400.0MHz Total(E2-YZ), Max= -2.52dBiTotal(H-XY), Max= -3.15dBi, CirD=10.94 -1.8 -3.64 -5.48 -7.32 -9.17 -11.01 -12.85 -14.69 -16.53 -18.38 -20.22 -22.06 -23.9 -25.75 -27.59 -29.43 -31.27 -33.11 2410.0MHz H+V, Eff: 24.1%Back View2410.0MHz Total(E1-XZ), Max= -3.21dBi2410.0MHz Total(E2-YZ), Max= -2.61dBiTotal(H-XY), Max= -3.23dBi, CirD=11.30 -2.22 -4.07 -5.91 -7.75 -9.59 -11.44 -13.28 -15.12 -16.96 -18.8 -20.65 -22.49 -24.33 -26.17 -28.01 -29.86 -31.7 -33.54 2420.0MHz H+V, Eff: 24.4%Back View2420.0MHz Total(E1-XZ), Max= -3.23dBi2420.0MHz Total(E2-YZ), Max= -2.25dBiTotal(H-XY), Max= -2.70dBi, CirD=11.56 -1.62 -3.46 -5.3 -7.15 -8.99 -10.83 -12.67 -14.51 -16.36 -18.2 -20.04 -21.88 -23.72 -25.57 -27.41 -29.25 -31.09 -32.93 2430.0MHz H+V, Eff: 23.9%Back View2430.0MHz Total(E1-XZ), Max= -3.56dBi2430.0MHz Total(E2-YZ), Max= -2.30dBiTotal(H-XY), Max= -2.53dBi, CirD=12.29 -1.87 -3.71 -5.55 -7.39 -9.24 -11.08 -12.92 -14.76 -16.6 -18.45 -20.29 -22.13 -23.97 -25.81 -27.66 -29.5 -31.34 -33.18 2440.0MHz H+V, Eff: 24.5%Back View2440.0MHz Total(E1-XZ), Max= -3.56dBi2440.0MHz Total(E2-YZ), Max= -2.54dBiTotal(H-XY), Max= -2.65dBi, CirD=11.61 -2.01 -3.85 -5.69 -7.53 -9.38 -11.22 -13.06 -14.9 -16.74 -18.59 -20.43 -22.27 -24.11 -25.95 -27.8 -29.64 -31.48 -33.32 2450.0MHz H+V, Eff: 25.5%Back View2450.0MHz Total(E1-XZ), Max= -3.97dBi2450.0MHz Total(E2-YZ), Max= -2.08dBiTotal(H-XY), Max= -2.55dBi, CirD=13.99 -1.77 -3.62 -5.46 -7.3 -9.14 -10.99 -12.83 -14.67 -16.51 -18.35 -20.2 -22.04 -23.88 -25.72 -27.56 -29.41 -31.25 -33.09 2460.0MHz H+V, Eff: 26.3%Back View2460.0MHz Total(E1-XZ), Max= -4.06dBi2460.0MHz T…

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Test Report

WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 64 TESTREPORT ReferenceNo.......................:WTX24X05113512W001 FCCID....................................:2ASBG-YH8372L Applicant...............................:FUJIANYIHEELECTRONICSCO.,LTD Address.................................: JIANROAD,QINXIYANGINDUSTRIALPARK,FUAN,FUJIAN355000, China Manufacturer........................:ThesameasApplicant Address.................................:ThesameasApplicant ProductName......................:MassageChair ModelNo... ............................: MC1810B Standards..............................:FCCPart15.247 DateofReceiptsample.....:2024-05-17 DateofTest ...........................: 2024-05-17to2024-06-13 DateofIssue........................:2024-06-13 TestReportFormNo. ......... : WTX_Part15_247W TestResult ............................: Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbe reproduced,exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithout specificstampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-755-33663308Fax.:+86-755-33663309Email:[email protected] Testedby:Approvedby: GalaWangJasonSu ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 2 of 64 TABLEOFCONTENTS 1.GENERALINFORMATION.....................................................................................................................................5 1.1PRODUCTDESCRIPTIONFOREQUIPMENTUNDERTEST(EUT)........................................................................5 1.2TESTSTANDARDS.................................................................................................................................................6 1.3TESTMETHODOLOGY...........................................................................................................................................6 1.4TESTFACILITY.......................................................................................................................................................6 1.5EUTSETUPANDTESTMODE..............................................................................................................................7 1.6MEASUREMENTUNCERTAINTY.............................................................................................................................9 1.7TESTEQUIPMENTLISTANDDETAILS................................................................................................................10 2.SUMMARYOFTESTRESULTS.........................................................................................................................13 3.ANTENNAREQUIREMENT.................................................................................................................................14 3.1STANDARDAPPLICABLE......................................................................................................................................14 3.2EVALUATIONINFORMATION................................................................................................................................14 4.FREQUENCYHOPPINGSYSTEMREQUIREMENTS....................................................................................15 4.1STANDARDAPPLICABLE......................................................................................................................................15 4.2FREQUENCYHOPPINGSYSTEM.........................................................................................................................15 4.3EUTPSEUDORANDOMFREQUENCYHOPPINGSEQUENCE..............................................................................16 5.QUANTITYOFHOPPINGCHANNELSANDCHANNELSEPARATION....................................................17 5.1STANDARDAPPLICABLE......................................................................................................................................17 5.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................17 5.3TESTPROCEDURE..............................................................................................................................................17 5.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................18 6.DWELLTIMEOFHOPPINGCHANNEL............................................................................................................19 6.1STANDARDAPPLICABLE......................................................................................................................................19 6.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................19 6.3TESTPROCEDURE..............................................................................................................................................19 6.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................20 7.20DBBANDWIDTH................................................................................................................................................21 7.1STANDARDAPPLICABLE......................................................................................................................................21 7.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................21 7.3TESTPROCEDURE..............................................................................................................................................21 7.4SUMMARYOFTESTRESUL…

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Test Report

ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 54 of 64 8DPSK-Low 8DPSK-Middle 8DPSK-High ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 55 of 64 APPENDIXE ConductedOutofBandEmissions 1MbpsLow ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 56 of 64 1MbpsMiddle ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 57 of 64 1MbpsHigh ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 58 of 64 2MbpsLow ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 59 of 64 2MbpsMiddle 2MbpsHigh ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 60 of 64 3MbpsLow ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 61 of 64 3MbpsMiddle ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 62 of 64 3MbpsHigh ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 63 of 64 ReferenceNo.:WTX24X05113512W001 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 64 of 64 APPENDIXPHOTOGRAPHS Pleasereferto“ANNEX” *****ENDOFREPORT*****

Test Setup Photos

ReferenceNo.:WTX24X05113512W001/003Page20of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT4-TESTSETUPPHOTOGRAPHS ConductedEmissionTest Setup RadiationEmissionTest Setup(Below30MHz) ReferenceNo.:WTX24X05113512W001/003Page21of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(30MHzto1GHz) RadiationEmissionTest Setup(1GHzto18GHz) ReferenceNo.:WTX24X05113512W001/003Page22of22 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(Above18GHz) *****ENDOFREPORT*****