2AXOX-A90Bluetooth Speaker

Reference No.: WTD21X01008718W-1 Page 2 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTD21X01008718W-1 Page 3 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 Reference No.: WTD21X01008718W-1 Page 4 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 4 EUT View 5 Reference No.: WTD21X01008718W-1 Page 5 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 6 EUT View 7

Reference No.: WTD21X01008718W-1 Page 1 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AXOX-A90 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTD21X01008718W-1 Page 6 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTD21X01008718W-1 Page 7 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT Housing and Board View 3 Solder Board-Component View 1 Reference No.: WTD21X01008718W-1 Page 8 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 2 Solder Board-Component View 3 Reference No.: WTD21X01008718W-1 Page 9 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 4 Solder Board-Component View 5 Reference No.: WTD21X01008718W-1 Page 10 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 6 Solder Board-Component View 7 Reference No.: WTD21X01008718W-1 Page 11 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View

RF Exposure Requirements Product Description: Bluetooth Speaker Model No.: A90, E9, E9-L FCC ID: 2AXOX-A90 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 5.66dBm Tune-Up output power: 6dBm RF channel transmit frequency: 2480MHz Result: 1.3 Limit: 3.0 The exclusion thresholds is 1.3 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 57 TEST REPORT Reference No. .................... : WTD21X01008718W-1 FCC ID ................................ : 2AXOX-A90 Applicant ........................... : Shenzhen See Me Here Electronic Co., Ltd Address.............................. : 1st Floor ,2nd Floor ,3rd Floor ,5th Floor ,Building B ,TongFuYu Industrial Park, No.32 Hangkong Road, Sanwei Community ,Hangcheng Street , Bao'an district ,Shenzhen China Product Name ................... : Bluetooth Speaker Test Model. ........................ : A90 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Jan.27, 2021 Date of Test........................ : Jan.27, 2021 to Feb.04, 2021 Date of Issue ..................... : Feb.04, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Mike Shi/ Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTD21X01008718W-1 Page 2 of 57 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................5 1.2 TEST STANDARDS ...................................................................................................................................................7 1.3 TEST METHODOLOGY .............................................................................................................................................7 1.4 TEST FACILITY .......................................................................................................................................................7 1.5 EUT SETUP AND TEST MODE .................................................................................................................................8 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................... 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. ANTENNA REQUIREMENT ................................................................................................................................ 13 3.1 STANDARD APPLICABLE ....................................................................................................................................... 13 3.2 EVALUATION INFORMATION................................................................................................................................. 13 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS.................................................................................... 14 4.1 STANDARD APPLICABLE ....................................................................................................................................... 14 4.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 14 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 15 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 16 5.1 STANDARD APPLICABLE ....................................................................................................................................... 16 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 5.3 TEST PROCEDURE ................................................................................................................................................. 16 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 18 6.1 STANDARD APPLICABLE ....................................................................................................................................... 18 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 18 6.3 TEST PROCEDURE ................................................................................................................................................. 18 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 19 7. 20DB BANDWIDTH ............................................................................................................................................... 20 7.1 STANDARD APPLICABLE ....................................................................................................................................... 20 7.2 TEST SETUP BL…

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Reference No.: WTD21X01008718W-1 Page 12 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTD21X01008718W-1 Page 13 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTD21X01008718W-1 Page 14 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****