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  3. 2AXOX-E7-L

2AXOX-E7-LBluetooth Speaker

Shenzhen See Me Here Electronic Co.,Ltd
Bluetooth Speaker - FCC ID 2AXOX-E7-L - Shenzhen See Me Here Electronic Co.,Ltd
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Application Details

Equipment Class
DSS - Part 15 Spread Spectrum Transmitter
Date of Grant
Nov 10, 2020
Application Purpose
Original Equipment
Date of Application
Nov 10, 2020
Equipment Note
Bluetooth Speaker
Frequency Range
2402.00000000 - 2480.00000000
Company
Shenzhen See Me Here Electronic Co.,Ltd
Country
China

Documents & Files

Select a file to view

Users Manual

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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Internal Photos

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RF Exposure Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

External Photos

Reference N Waltek Tes http://www EXHIBI EUT View 1 EUT View 2 No.: WTD20X sting Group w.semtest.co T 2 - EUT 1 2 X09062973W (Shenzhen) m.cn T EXTER W-1 Co., Ltd. RNAL PH HOTOGR APHS Reference N Waltek Tes http://www EUT View 3 EUT View 4 No.: WTD20X sting Group w.semtest.co 3 4 X09062973W (Shenzhen) m.cn W-1 Co., Ltd. Reference N Waltek Tes http://www EUT View 5 EUT View 6 No.: WTD20X sting Group w.semtest.co 5 6 X09062973W (Shenzhen) m.cn W-1 Co., Ltd. Reference N Waltek Tes http://www EUT View 7 EUT View 8 No.: WTD20X sting Group w.semtest.co 7 8 X09062973W (Shenzhen) m.cn W-1 Co., Ltd.

ID Label/Location Info

Reference N Waltek Tes http://www EXHIBI Proposed Specificatio n it is visible durable to r expected lif e Proposed No.: WTD20X sting Group w.semtest.co T 1 - PRO FCC ID La ns: The label or easily acc emain fully l etime. Label Loca X09062973W (Shenzhen) m.cn ODUCT L abel Forma Shenz Produ Model FCC I shall be secu cessible to th legible and in ation on EU W-1 Co., Ltd. LABELIN at hen See Me uct Name: B l No.: E7-L ID: 2AXOX urely affixed t he user, and ntact on the UT FCC NG e Here Elec Bluetooth S L X-E7-L to a permane shall not be device in al l ID Label Lo ctronic Co. Speaker ently attached readily detac l normal cond cation ., Ltd d part of the d chable. The l ditions of use device, in a lo label shall be e throughout ocation where e sufficiently t the device’s e y s

Internal Photos

Reference N Waltek Tes http://www EXHIBI EUT Housi n Solder Boa r No.: WTD20X sting Group w.semtest.co T 3 - EUT ng and Boar rd-Compone X09062973W (Shenzhen) m.cn T INTER rd View 1 ent View 1 W-1 Co., Ltd. NAL PHO OTOGRA APHS Reference N Waltek Tes http://www Solder Boa r Solder Boar No.: WTD20X sting Group w.semtest.co rd-Compone rd-Compone X09062973W (Shenzhen) m.cn ent View 2 ent View 3 W-1 Co., Ltd. Reference N Waltek Tes http://www Solder Boa r Solder Boar No.: WTD20X sting Group w.semtest.co rd-Compone rd-Compone X09062973W (Shenzhen) m.cn ent View 4 ent View 5 W-1 Co., Ltd.

Internal Photos

Reference N Waltek Tes http://www Solder Boa r Solder Boar No.: WTD20X sting Group w.semtest.co rd-Compone rd-Compone X09062973W (Shenzhen) m.cn ent View 6 ent View 7 W-1 Co., Ltd. Reference N Waltek Tes http://www Solder Boa r Solder Boa r No.: WTD20X sting Group w.semtest.co rd-Compone rd-Compone X09062973W (Shenzhen) m.cn ent View 8 ent View 9 W-1 Co., Ltd. Reference N Waltek Tes http://www Solder Boa r Antenna V i BT Ant No.: WTD20X sting Group w.semtest.co rd-Compone iew tenna X09062973W (Shenzhen) m.cn ent View 10 W-1 Co., Ltd.

RF Exposure Info

RF Exposure Requirements Product Description: Bluetooth Speaker Model No.: E7-L, E7 FCC ID: 2AXOX-E7-L According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≀ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] Β· [√f(GHz)] ≀ 3.0 for 1-g SAR and ≀ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 2.24dBm Tune-Up output power: 3dBm RF channel transmit frequency: 2480MHz Result: 0.6 Limit: 3.0 The exclusion thresholds is 0.6 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 64 TEST REPORT Reference No. .................... : WTD20X09062973W-1 FCC ID ................................ : 2AXOX-E7-L Applicant ........................... : Shenzhen See Me Here Electronic Co., Ltd Address.............................. : 1st Floor, 2nd Floor, 3rd Floor, 5th Floor, Building B, TongFuYu Industrial Park, No.32 Hangkong Road, Sanwei Community ,Hangcheng Street, Bao'an district, Shenzhen Cn Product Name ................... : Bluetooth Speaker Test Model. ........................ : E7-L Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Sept.04, 2020 Date of Test........................ : Sept.04, 2020 to Nov. 09, 2020 Date of Issue ..................... : Nov. 09, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTD20X09062973W-1 Page 2 of 64 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................5 1.2 TEST STANDARDS ...................................................................................................................................................6 1.3 TEST METHODOLOGY .............................................................................................................................................6 1.4 TEST FACILITY .......................................................................................................................................................6 1.5 EUT SETUP AND TEST MODE .................................................................................................................................7 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................8 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................9 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 11 3. RF EXPOSURE ....................................................................................................................................................... 12 3.1 STANDARD APPLICABLE ....................................................................................................................................... 12 3.2 TEST RESULT........................................................................................................................................................ 12 4. ANTENNA REQUIREMENT ................................................................................................................................ 13 4.1 STANDARD APPLICABLE ....................................................................................................................................... 13 4.2 EVALUATION INFORMATION................................................................................................................................. 13 5. FREQUENCY HOPPING SYSTEM REQUIREMENTS.................................................................................... 14 5.1 STANDARD APPLICABLE ....................................................................................................................................... 14 5.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 14 5.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 15 6. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 16 6.1 STANDARD APPLICABLE ....................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 6.3 TEST PROCEDURE ................................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 7. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 20 7.1 STANDARD APPLICABLE ....................................................................................................................................... 20 7.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 20 7.3 TEST PROCEDURE ...........................................................................................................................................…

Text truncated - open the document above for the full version.

Test Setup Photos

Reference N Waltek Tes http://www EXHIBI Conducted Radiation E No.: WTD20X sting Group w.semtest.co T 4 - TES Emission Te Emission Tes X09062973W (Shenzhen) m.cn ST SETUP est Setup st Setup (Belo W-1 Co., Ltd. P PHOTO ow 30MHz) OGRAPH HS Reference N Waltek Tes http://www Radiation E Radiation E No.: WTD20X sting Group w.semtest.co Emission Tes Emission Tes X09062973W (Shenzhen) m.cn st Setup (30M st Setup (1GH W-1 Co., Ltd. MHz to 1GHz Hz to 18GHz z) z) Reference N Waltek Tes http://www Radiation E No.: WTD20X sting Group w.semtest.co Emission Tes X09062973W (Shenzhen) m.cn st Setup (Abo W-1 Co., Ltd. ove 18GHz)

Contact Information

Applicant

Harvey Qin
[email protected]0755-61181399Fax: 0755-29101982

Test Firm

Waltek Testing Group (Shenzhen) Co., Ltd.Jandy So
[email protected]86 755 33663308Fax: 86-755-33663309

Technical Specifications

#Rule PartsFrequency RangePower Output
115C2.40 GHz - 2.48 GHz1.70 mW
Confidentiality
Long Term
Grant Notes
Output power is maximum Peak conducted.

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