2AXOX-F50Bluetooth Speaker

Reference N Waltek Tes http://www EXHIBI EUT EUT No.: WTD20X sting Group w.semtest.co T 1 - EUT View 1 View 2 X09062977W (Shenzhen) m.cn T EXTER W-1 Co., Ltd. RNAL PH Page 1 of 1 ANNEX HOTOGR 11 APHS Reference N Waltek Tes http://www EUT EUT No.: WTD20X sting Group w.semtest.co View 3 View 4 X09062977W (Shenzhen) m.cn W-1 Co., Ltd. Page 2 of 1 11 Reference N Waltek Tes http://www EUT EUT No.: WTD20X sting Group w.semtest.co View 5 View 6 X09062977W (Shenzhen) m.cn W-1 Co., Ltd. Page 3 of 1 11 Reference N Waltek Tes http://www EUT EUT No.: WTD20X sting Group w.semtest.co View 7 View 8 X09062977W (Shenzhen) m.cn W-1 Co., Ltd. Page 4 of 1 11

Reference No.: WTS20X09068167W Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT - PRODUCT LABELING Proposed FCC ID Label Format Shenzhen See Me Here Electronic Co., Ltd Product Name: Bluetooth Speaker Model No.: F50 FCC ID: 2AXOX-F50 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference N Waltek Tes http://www EXHIBI EUT Housi V i So Board-Com No.: WTD20X sting Group w.semtest.co T 2 - EUT ng and Boar iew 1 older mponent View 1 X09062977W (Shenzhen) m.cn T INTER rd w W-1 Co., Ltd. NAL PHO Page 5 of 1 OTOGRA 11 APHS Reference N Waltek Tes http://www S o Board-Com So Board-Com No.: WTD20X sting Group w.semtest.co older mponent View 2 older mponent View 3 X09062977W (Shenzhen) m.cn w w W-1 Co., Ltd. Page 6 of 1 11 Reference N Waltek Tes http://www S o Board-Com Batte No.: WTD20X sting Group w.semtest.co older mponent View 4 ry View X09062977W (Shenzhen) m.cn w W-1 Co., Ltd. Page 7 of 1 11 Reference N Waltek Tes http://www Ante n No.: WTD20X sting Group w.semtest.co nna View X09062977W (Shenzhen) m.cn W-1 Co., Ltd. Page 8 of 1 11

RF Exposure Requirements Product Description: Bluetooth Speaker Model No.: F50 FCC ID: 2AXOX-F50 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: 5.81dBm Tune-Up output power: -2dBm RF channel transmit frequency: 2402MHz Result: 1.2 Limit: 3.0 The exclusion thresholds is 1.2 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 61 TEST REPORT Reference No. .................... : WTD20X09062977W-1 FCC ID ................................ : 2AXOX-F50 Applicant ........................... : Shenzhen See Me Here Electronic Co., Ltd Address.............................. : 1st Floor, 2nd Floor, 3rd Floor, 5th Floor, Building B,TongFuYu Industrial Park, No.32 Hangkong Road, Sanwei Community, Hangcheng Street, Bao'an district, Shenzhen Cn Product Name ................... : Bluetooth Speaker Test Model. ........................ : F50 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Sep.04, 2020 Date of Test........................ : Sep.04, 2020 to Nov. 09, 2020 Date of Issue ..................... : Nov. 09, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang/ Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTD20X09062977W-1 Page 2 of 61 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION................................................................................................................................. 11 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS.................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 12 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 13 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 14 5.1 STANDARD APPLICABLE ....................................................................................................................................... 14 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 14 5.3 TEST PROCEDURE ................................................................................................................................................. 14 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 16 6.1 STANDARD APPLICABLE ....................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 6.3 TEST PROCEDURE ................................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 7. 20DB BANDWIDTH ............................................................................................................................................... 18 7.1 STANDARD APPLICABLE ....................................................................................................................................... 18 8.2 TEST SETUP BLO…

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Reference N Waltek Tes http://www EXHIBI Conduct e Test Radiation E Setup (Bel No.: WTD20X sting Group w.semtest.co T 3 - TES ed Emission t Setup Emission Tes low 30MHz) X09062977W (Shenzhen) m.cn ST SETUP st ) W-1 Co., Ltd. P PHOTO Page 9 of 1 OGRAPH 11 HS Reference N Waltek Tes http://www Radiation E Setup (30M Radiation E Setup (30M No.: WTD20X sting Group w.semtest.co Emission Te MHz to 1GHz Emission Te MHz to 1GHz X09062977W (Shenzhen) m.cn est z) est z) W-1 Co., Ltd. Page 10 of 11 Reference N Waltek Tes http://www Radiation E Setup (Ab No.: WTD20X sting Group w.semtest.co Emission Tes bove 18GHz) X09062977W (Shenzhen) m.cn st ) W-1 Co., Ltd. ***** EN Page 11 of ND OF REPO 11 ORT *****