2AXOX-X17Wireless Sport Earbuds with Bluetooth

Reference No.: WTD21X01001062W-1 Page 2 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTD21X01001062W-1 Page 3 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTD21X01001062W-1 Page 4 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTD21X01001062W-1 Page 5 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7 EUT View 8 Reference No.: WTD21X01001062W-1 Page 6 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 9 EUT View 10

Reference No.: WTD21X01001062W-1 Page 1 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AXOX-X17 Specifications: Due to the small size of the device, label will be placed on the packing box and at user manual to ensure that the label will be readily visible at the time of purchase Proposed Label Location on EUT FCC ID Label Location User Manual

Reference No.: WTD21X01001062W-1 Page 7 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTD21X01001062W-1 Page 8 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 2 Solder Board-Component View 3 Reference No.: WTD21X01001062W-1 Page 9 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 4 Antenna View

RF Exposure Requirements Product Description: Wireless Sport Earbuds Model No.: X17 FCC ID: 2AXOX-X17 According to the KDB 447498 D01 v06 section 4.3.1, for 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test exclusion thresholds are determined by the following: [(max. power of channel, including tune-up tolerance, mW)/(min. test separation distance, mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR and ≤ 7.5 for 10-g extremity SAR, where - f(GHz) is the RF channel transmit frequency in GHz - Power and distance are rounded to the nearest mW and mm before calculation - The result is rounded to one decimal place for comparison Calculation Result: Tx frequency range: 2402-2480MHz Min. test separation distance: 5mm Maximum Conducted Output Power: -1.49dBm Tune-Up output power: -1dBm RF channel transmit frequency: 2480MHz Result: 0.3 Limit: 3.0 The exclusion thresholds is 0.3 < 3, so the transmitter complies with the RF exposure requirements and the SAR is not required.

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 61 TEST REPORT Reference No. .................... : WTD21X01001062W-1 FCC ID ................................ : 2AXOX-X17 Applicant ........................... : Shenzhen See Me Here Electronic Co., Ltd Address.............................. : 1st Floor ,2nd Floor ,3rd Floor ,5th Floor ,Building B ,TongFuYu Industrial Park, No.32 Hangkong Road, Sanwei Community, Hangcheng Street, Bao'an district ,Shenzhen Cn Product Name ................... : Wireless Sport Earbuds Test Model. ........................ : X17 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Jan.06, 2021 Date of Test........................ : Jan.06, 2021 to Jan.21, 2021 Date of Issue ..................... : Jan.21, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jack Huang/ Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTD21X01001062W-1 Page 2 of 61 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION................................................................................................................................. 11 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS.................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 12 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 13 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 14 5.1 STANDARD APPLICABLE ....................................................................................................................................... 14 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 14 5.3 TEST PROCEDURE ................................................................................................................................................. 14 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 16 6.1 STANDARD APPLICABLE ....................................................................................................................................... 16 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 6.3 TEST PROCEDURE ................................................................................................................................................. 16 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 7. 20DB BANDWIDTH ............................................................................................................................................... 18 7.1 STANDARD APPLICABLE ....................................................................................................................................... 18 7.2 TEST SETUP…

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Reference No.: WTD21X01001062W-1 Page 10 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTD21X01001062W-1 Page 11 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTD21X01001062W-1 Page 12 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****