2AZP5-FST9301Smart Phone

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Reference No.: WTX21X04036754W-1/2/3/4 Page 2 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX21X04036754W-1/2/3/4 Page 3 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX21X04036754W-1/2/3/4 Page 4 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX21X04036754W-1/2/3/4 Page 5 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7

Reference No.: WTX21X04036754W-1/2/3/4 Page 1 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX21X04036754W-1/2/3/4 Page 6 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX21X04036754W-1/2/3/4 Page 7 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT Housing and Board View 3 EUT Housing and Board View 4 Reference No.: WTX21X04036754W-1/2/3/4 Page 8 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX21X04036754W-1/2/3/4 Page 9 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 3 Solder Board-Component View 4 Reference No.: WTX21X04036754W-1/2/3/4 Page 10 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 5 Solder Board-Component View 6 Reference No.: WTX21X04036754W-1/2/3/4 Page 11 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Reference No.: WTX21X04036754W-1/2/3/4 Page 12 of 15 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Antenna View Antenna View

Ref : ACR.154.4.15.SATU.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD. 1/F, BUILDING A, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD BAO'AN DISTRICT SHENZHEN (518101), CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: SN 09/13 EP168 Calibrated at MVG US 2105 Barrett Park Dr. - Kennesaw, GA 30144 05/22/2020 Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed in MVG USA using the CALISAR / CALIBAIR test bench, for use with a COMOSAR system only. All calibration results are traceable to national metrology institutions. COMOSAR E-Field Probe Calibration Report COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 2/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. NameFunction DateSignature Prepared by : Jérôme LUC Product Manager 5/22/2020 Checked by : Jérôme LUC Product Manager 5/22/2020 Approved by : Kim RUTKOWSKI Quality Manager 5/22/2020 Customer Name Distribution : Waltek Testing Group (Shenzhen) Co., Ltd. IssueDateModifications A 5/22/2020 Initial release COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 3/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Linearity ________________________________________________________________ 4 3.2 Sensitivity _______________________________________________________________ 5 3.3 Lower Detection Limit _____________________________________________________ 5 3.4 Isotropy _________________________________________________________________ 5 3.5 Boundary Effect __________________________________________________________ 5 4 Measurement Uncertainty .......................................................................................... 5 5 Calibration Measurement Results .............................................................................. 6 5.1 Sensitivity in air __________________________________________________________ 6 5.2 Linearity ________________________________________________________________ 7 5.3 Sensitivity in liquid ________________________________________________________ 7 5.4 Isotropy _________________________________________________________________ 8 6 List of Equipment ...................................................................................................... 9 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 4/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE ManufacturerMVG ModelSSE5 Serial Number SN 09/13 EP168 Product Condition (new / used) Used Frequency Range of Probe 0.7 GHz-3GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.224 M: Dipole 2: R2=0.234 M: Dipole 3: R3=0.229 M: A yearly calibration interval is recommended. 2PRODUCT DESCRIPTION 2.1GENERAL INFORMATION MVG¶V&2026$5(ILHOG3UREHVDUHEXLOWLQDFFRUGDQFHWRWKH,(((OET 65 Bulletin C and CEI/IEC 62209 standards. Figure 1±MVG COMOSAR Dosimetric E field Dipole Probe Length 330 mm Length of Individual Dipoles 4.5 mm Maximum external diameter 8 mm Probe Tip External Diameter 5 mm Distance between dipoles / probe extremity 2.7 mm 3MEASUREMENT METHOD The IEEE 1528, OET 65 Bulletin C, CENELEC EN50361 and CEI/IEC 62209 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their affect. All calibrations / measurements performed meet the fore mentioned standards. 3.1LINEARITY The evaluation of the linearity was done in free space using the waveguide, performing a power sweep to cover the SAR range 0.01W/kg to 100W/kg. COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.154.4.15.SATU.A Page: 5/9 This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 3.2SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards. 3.3LOWER DETECTION LIMIT The lower detection limit was assessed using the same measurement set up as used for the linearity measurement. The required lower detection limit is 10 mW/kg. 3.4ISOTROPY The axial isotropy was evaluated by exposing the probe to a reference wave from a standard dipole with the dipole mounted under the flat phantom in the test configuration suggested for system validations and checks. The probe was rotated along its main axis from 0 - 360 degrees in 15 degree steps. The hemispherical isotropy is determined by inserting the probe in a thin plastic box filled with tissue-equivalent liquid, with the plastic box illuminated with the fields …

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Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 96 TEST REPORT Reference No. .................... : WTX21X04036754W FCC ID ................................ : 2AZP5-FST9301 Applicant ........................... : DUO AMERICA, LLC Address ............................. : 8925 NW 26TH ST, DORAL,MIAMI, FL 33172 UNITED STATES OF AMERICA Product Name ................... : Smart Phone Test Model. ........................ : L285 Standards .......................... : FCC Part 2.1093 ANSI / IEEE C95.1 : 2005+A1:2010 ANSI / IEEE C95.3 : 2002(R2008) IEEE 1528 :2013 Date of Receipt sample .... : Apr.21, 2021 Date of Test........................ : Apr.21, 2021 to May.10, 2021 Date of Issue ..................... : May.12, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Hubrey Cai / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X04036754W Page 2 of 96 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 3 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 3 1.2 Test Standards .................................................................................................................................................... 6 1.3 Test Methodology ................................................................................................................................................ 6 1.4 Test Facility ......................................................................................................................................................... 6 2. Summary of Test Results .......................................................................................................................................... 7 3. Specific Absorption Rate (SAR) ................................................................................................................................ 8 3.1 Introduction .......................................................................................................................................................... 8 3.2 SAR Definition ..................................................................................................................................................... 8 4. SAR Measurement System ........................................................................................................................................ 9 4.1 The Measurement System .................................................................................................................................. 9 4.2 Probe ................................................................................................................................................................... 9 4.3 Probe Calibration Process ................................................................................................................................. 11 4.4 Phantom ............................................................................................................................................................ 12 4.5 Device Holder .................................................................................................................................................... 12 4.6 Test Equipment List ........................................................................................................................................... 13 5. Tissue Simulating Liquids ....................................................................................................................................... 14 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 14 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 15 5.3 Tissue Calibration Result ................................................................................................................................... 16 6. SAR Measurement Evaluation ................................................................................................................................ 17 6.1 Purpose of System Performance Check ............................................................................................................ 17 6.2 System Setup .................................................................................................................................................... 17 6.3 Validation Results .............................................................................................................................................. 19 7. EUT Testing Position ............................................................................................................................................... 20 7.1 Define Two Imaginary Lines on The Handset .................................................................................................... 20 7.2 Cheek Position ...............................................................................................................…

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 41 TEST REPORT Reference No. .................... : WTX21X04036754W-4 FCC ID ................................ : 2AZP5-FST9301 Applicant ........................... : DUO AMERICA, LLC Address ............................. : 8925 NW 26TH ST, DORAL,MIAMI, FL 33172 UNITED STATES OF AMERICA Product Name ................... : Smart Phone Test Model. ........................ : L285 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : Jan.10, 2020 Date of Test........................ : Jan.10, 2020 to Jan.15, 2020 Date of Issue ..................... : Jan.15, 2020 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X04036754W-4 Page 2 of 41 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................... 5 1.3 TEST METHODOLOGY ............................................................................................................................................. 5 1.4 TEST FACILITY ....................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ..................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENT ................................................................................................................................ 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 EVALUATION INFORMATION ................................................................................................................................ 11 4. POWER SPECTRAL DENSITY ........................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 12 4.3 TEST PROCEDURE ................................................................................................................................................. 12 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 12 5. DTS BANDWIDTH ................................................................................................................................................. 13 5.1 STANDARD APPLICABLE ....................................................................................................................................... 13 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 13 5.3 TEST PROCEDURE ................................................................................................................................................. 13 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 13 6. RF OUTPUT POWER ............................................................................................................................................ 14 6.1 STANDARD APPLICABLE ....................................................................................................................................... 14 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 14 6.3 TEST PROCEDURE ................................................................................................................................................. 14 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 14 7. FIELD STRENGTH OF SPURIOUS EMISSIONS ............................................................................................. 15 7.1 STANDARD APPLICABLE ......................…

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Reference No.: WTX21X04036754W-1/2/3/4 Page 12 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup* Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX21X04036754W-1/2/3/4 Page 13 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX21X04036754W-1/2/3/4 Page 14 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) * Means’ only test and setup for PART 15C . ***** END OF REPORT *****