A3LSCWF200Cellular CDMA WLL Phone (Wireless Local Loop)

Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd.

Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd.

© 1998 PCTEST Engineering Lab., Inc. PCTEST Engineering Laboratory, Inc. 6660-B 6660-B DobbinDobbin Road Road •• Columbia, MD 21045 Columbia, MD 21045 •• U.S.A. U.S.A. TEL (410) 290-6652 TEL (410) 290-6652 •• FAX (410) 290-6654 FAX (410) 290-6654 http://www.pctestlab.comhttp://www.pctestlab.com CERTIFICATE OF COMPLIANCE (MPE EVALUATION) SAMSUNG ELECTRONICS CO., LTD.Dates of Tests: July 13-17, 1998 416 Maetan-3 Dong, Paldal-KuTest Report S/N: MPE.980706473.A3L Suwon City, Kyungki-Do 441-742, KOREATest Site: PCTEST Lab, Columbia MD Attention: D. H. KIM, General Manager FCC ID A3LSCWF200 APPLICANT SAMSUNG ELECTRONICS CO., LTD. EUT Type:Cellular CDMA WLL Phone (Wireless Local Loop) Tx Frequency:824.64 – 848.37 MHz Rx Frequency:869.64 – 893.37 MHz Max Output Power:0.32 Watts Trade Name/Model(s):SAMSUNG SCW-F200 FCC Classification:Non-Broadcast Station Transmitter (TNB) Application Type:Type Acceptance Serial Number:n/a (pre production) FCC Rule Part(s):22(E); ET Docket 96.326 This wireless portable device has been shown to be capable of compliance for localized maximum permissible exposure (MPE) for uncontrolled environment/general population exposure limits specified in ANSI/IEEE Std. C95.1-1992 and was tested in accordance with the measurement procedures specified in ANSI/IEEE Std. C95.3-1992. (See Test Report). I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. NVLAP accreditation does not constitute any product endorsement by NVLAP or any agency of the United States Government. PCTEST certifies that no party to this application has been denied the FCC benefits pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 853(a) 980706473.A3L MPE Measurement ReportFCC Part 22 Type Acceptance © 1998 PCTEST Labi Table of Contents SCOPE .............................................................................1 INTRODUCTION / RF HAZARDS ...........................................2 MPE DEFINITION ...............................................................3 MPE LIMITS ......................................................................4 FCC LIMITS FOR MPE ........................................................5 RF HUMAN EXPOSURE DATA & MEASUREMENT PROCEDURE ...... 6 TEST DATA SUMMARY ......................................................7 SPECIFICATIONS ...............................................................8 CONCLUSION / REFERENCES .............................................9 Test Report S/N: MPE.980706473.A3LFCC Part 22 Type Acceptance Test Dates: July 13-17, 1998MPE Measurement Report Cellular CDMA WLL Phone (Tx 824.64 – 848.37 MHz) © 1998 PCTEST LabSAMSUNG FCC ID: A3LSCWF200 (Model: SCW-F200)1 MPE MEASUREMENT REPORT Scope - Environmental evaluation measurements of Maximum Permissible Exposure (MPE) exposed to radiofrequency (RF) radiation from transmitter for compliance with the rules and regulations of the U.S. Federal Communications Commission (FCC). 1 Company Name:SAMSUNG ELECTRONICS CO., LTD. ADDRESS :416 Maetan-3 Dong, Paldal-Ku Suwon City Kyungki-Do 441-742, KOREA Attention :D. H. KIM, General Manager • EUT Type:Cellular CDMA WLL Phone (Wireless Local Loop) • Trade Name:SAMSUNG • FCC IDENTIFIER:A3LSCWF200 • Model:SCW-F200 • Tx Frequency Range: 824.64 – 848.37 MHz • Rx Frequency Range:869.64 – 893.37 MHz • Application Type: Type Acceptance • FCC Classification:Non-Broadcast Station Transmitter (TNB) • FCC Rule Part(s):§ 22(E); Docket 96-326 • Max. Power Rating:0.32 W • Channel(s):363 • Modulation :CDMA • Dates of Test(s):July 13-17, 1998 • Place of Test(s):PCTEST Engineering Lab. Columbia, MD, U.S.A. • Test Report S/N:MPE.980706473.A3L 1 IEEE/ANSI Std. C95.1-1992 limits are used to determine compliance with FCC ET-Docket 93-62. Lab Code 100431-0 Test Report S/N: MPE.980706473.A3LFCC Part 22 Type Acceptance Test Dates: July 13-17, 1998MPE Measurement Report Cellular CDMA WLL Phone (Tx 824.64 – 848.37 MHz) © 1998 PCTEST LabSAMSUNG FCC ID: A3LSCWF200 (Model: SCW-F200)2 1.1 INTRODUCTION The Federal Communications Commissions (FCC) has adopted the guidelines for evaluating the environmental effects of radiofrequency radiation in ET Docket 93-62 on Aug. 6, 1996 to protect the public from the potential hazards of RF emissions.[1] The safety limits used for the environmental evaluation measurements are based on the criteria published by the American National Standards Institute (ANSI) for localized specific absorption rate (SAR) and maximum permissible exposure (MPE) in IEEE/ANSI C95.1-1992 Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz. (c) 1992 by the Institute of Electrical and Electronics Engineers, Inc., New York, New York 10017.[2] The measurement procedure described in IEEE/ANSI C95.3-1992 Recommended Practice for the Measurement of Potentially Hazardous Electromagnetic Fields - RF and Microwave[3] is used for guidance in measuring SAR/MPE due to the RF radiation exposure from the Equipment Under Test (EUT). The new guidelines incorporate limits for Maximum Permissible Exposure (MPE) in terms of electric and magnetic field strength and power density for transmitters operating at frequencies between 300 kHz and 100 GHz. These criteria for SAR/MPE evaluation are similar to those recommended by the National Council on Radiation Protection and Measurements (NCRP) in Biological Effects and Exposure Criteria for Radiofrequency Electromagnetic Fields,” NCRP Report No. 86 (c) NCRP, 1986, Bethesda, MD 20814.[4] SAR is a measure of the rate of energy absorption due to exposure to an RF transmitting source. SAR values have been related to threshold levels for potential biological hazards. MPE is the rms and peak electric and magnetic strength, …

Text truncated - open the document above for the full version.

Test Report S/N: SAR.980910624.A3LSAR Measurement Report Test Date(s): October 12-13, 1998FCC Parts 22 Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: SAR.980910624.A3LSAR Measurement Report Test Date(s): October 12-13, 1998FCC Parts 22 Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd.

© 1998 PCTEST Engineering Lab., Inc. PCTEST Engineering Laboratory, Inc. 6660-B 6660-B DobbinDobbin Road Road •• Columbia, MD 21045 Columbia, MD 21045 •• U.S.A. U.S.A. TEL (410) 290-6652 TEL (410) 290-6652 •• FAX (410) 290-6654 FAX (410) 290-6654 http://www.pctestlab.comhttp://www.pctestlab.com CERTIFICATE OF COMPLIANCE (SAR EVALUATION) Samsung Electronics Co., Ltd.Dates of Tests: October 12-13, 1998 146 Maetun-3 Dong, Paldal-KuTest Report S/N: SAR.980910624.A3L Suwon City, Kyungki-Do, KOREA 441-742Test Site: PCTEST Lab, Columbia MD Attention: Ben Kim, Engineering Manager FCC ID A3LSCWF200 APPLICANTSAMSUNG ELECTRONICS CO., LTD. EUT Type:Cellular CDMA WLL Phone (Wireless Local Loop) Tx Frequency:824.64 – 848.37 MHz Rx Frequency:869.64 – 893.37 MHz Max Output Power:0.32 Watts Trade Name/Model(s):SAMSUNG SCW-F200 FCC Classification:Non-Broadcast Station Transmitter (TNB) Application Type:Type Acceptance Serial Number:n/a (pre production) FCC Rule Part(s):2.1093; ET Docket 96.326; 22(H) This wireless portable device has been shown to be capable of compliance for localized specific absorption rate (SAR) for uncontrolled environment/general population exposure limits specified in ANSI/IEEE Std. C95.1-1992 and had been tested in accordance with the measurement procedures specified in ANSI/IEEE Std. C95.3-1992. (See Test Report). I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. NVLAP accreditation does not constitute any product endorsement by NVLAP or any agency of the United States Government. PCTEST certifies that no party to this application has been denied the FCC benefits pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 853(a) 981009624.A3L SAR Measurement ReportFCC Part 22 Type Acceptance © 1998 PCTEST Labi Table of Contents SCOPE .............................................................................1 INTRODUCTION / SAR DEFINITION ......................................2 SAR MEASUREMENT SET-UP .............................................3 E-FIELD PROBE SYSTEM ...................................................4 PHANTOM & MUSCLE EQUIVALENT MATERIAL ...................7 SYSTEM SPECIFICATIONS ................................................. 8 MEASUREMENT PROCESS ................................................9 TEST POSITION OF THE PHONE .........................................10 ANSI/IEEE C95.1 RF EXPOSURE LIMITS ..............................11 MEASUREMENT UNCERTAINTIES ......................................12 TEST DATA SUMMARY ...................................................... 13 SAR TEST EQUIPMENT LIST .............................................. 14 CONCLUSION / REFERENCES ...........................................15 ATTACHMENT A – TEST PLOTS ATTACHMENT B – PHOTOGRAPHS Test Report S/N: SAR.980910624.A3LSAR Measurement Report Test Dates: October 12-13, 1998FCC Part 22 Type Acceptance SAMSUNG FCC ID: A3LSCWF200 Model: SCW-F200 © 1998 PCTEST LabCellular CDMA WLL Phone (Tx 824-849 MHz)1 SAR MEASUREMENT REPORT Scope - Environmental evaluation measurements of specific absorption rate 1 (SAR) distributions in simulated human head/body tissues exposed to radiofrequency (RF) radiation from wireless portable devices for compliance with the rules and regulations of the U.S. Federal Communications Commission (FCC). 2 Company Name:SAMSUNG ELECTRONICS CO., LTD. ADDRESS:146 Maetun-3 Dong, Paldal-ku Suwon City, Kyungki-Do, KOREA 441-7 Attention :Ben Kim, Engineering Manager • EUT Type:Cellular CDMA WLL Phone • Trade Name / Model(s):SAMSUNG SCW-F200 • FCC IDENTIFIER:A3LSCWF200 • S/N:Pre-production • Tx Frequency:824.040 - 848.970 MHz Rx Frequency:869.040 - 893.970 MHz • Application Type: Type Acceptance • FCC Classification:Non-Broadcast Station Tx (TNB) • FCC Rule Part(s):§ 2.1093, Docket 96-326; § 22(H) • Max. Output Power:0.32 W • Modulation:CDMA • Antenna:Helical (λ/2) • Antenna Dimensions:21.1 cm. (Length) • Dates of Tests:October 12-13, 1998 • Place of Tests:PCTEST Engineering Lab. Columbia, MD, U.S.A. • Report Serial No.:SAR.980910624.A3L 1 Specific Absorption Rate (SAR) is a measure of the rate of energy absorption due to exposure to an RF transmitting source (wireless portable device). 2 IEEE/ANSI Std. C95.1-1992 limits are used to determine compliance with FCC ET-Docket 93-62. Figure 1. SAR Test Set-up Test Report S/N: SAR.980910624.A3LSAR Measurement Report Test Dates: October 12-13, 1998FCC Part 22 Type Acceptance SAMSUNG FCC ID: A3LSCWF200 Model: SCW-F200 © 1998 PCTEST LabCellular CDMA WLL Phone (Tx 824-849 MHz)2 1.1 INTRODUCTION The FCC has adopted the guidelines for evaluating the environmental effects of radiofrequency radiation in ET Docket 93-62 on Aug. 6, 1996 to protect the public and workers from the potential hazards of RF emissions due to FCC-regulated portable devices.[1] The safety limits used for the environmental evaluation measurements are based on the criteria published by the American National Standards Institute (ANSI) for localized specific absorption rate (SAR) in IEEE/ANSI C95.1-1992 Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz. (c) 1992 by the Institute of Electrical and Electronics Engineers, Inc., New York, New York 10017.[2] The measurement procedure described in IEEE/ANSI C95.3-1992 Recommended Practice for the Measurement of Potentially Hazardous Electromagnetic Fields - RF and Microwave[3] is used for guidance in measuring SAR due to the RF radiation exposure from the Equipment Under Test (EUT). These criteria for SAR evaluation are similar to those recommended by the National Council on Radiation Protection and Measurements (NCRP) in Biological Effects and Exposure Criteria for Radiofrequency Elec…

Text truncated - open the document above for the full version.

File : c:/idx3/SYSTEM/SARMEAS3/data/Normal/98101519_ZOOM.VLT Start : 15-Oct-98 03:56:32 pm End : 15-Oct-98 04:06:55 pm Radio Type : Samsung Model Number : A3LSCWF200 Serial Number : 200 Frequency : 824.64 MHz Peak Trans. Pwr : 0.320 W Start Trans. Pwr: 0.320 W Antenna Type : Helical Antenna Posn. : Out Phantom Type : Head Phantom Posn. : Left Ear Scan Type : ZOOM/SAR Probe Name : PCTEST Field Type : E Field Orientation : 0 Degrees Mixture Type = Muscle Mixture Dielectric Constant = 56.200 Mixture Conductivity = 0.950 Comment : CHAN 1011 CDMA MODE SAMSUNG PHONE PCTEST ENGINEERING LABORATORY Robot : PCTEST Probe Offset = 0.25 cm Sensor Factor = 0.0108 Conversion Factor = 0.895 PCTEST Amplifier Channel Settings : 0.168 0.136 0.132 Diode Coefficients: Channel 1 An=-10.851 Bn=86.223 Cn=38.593 Dn=-0.016 Mn=0.026 Yn=0.000 Channel 2 An=-21.618 Bn=92.335 Cn=34.909 Dn=-0.019 Mn=0.029 Yn=0.000 Channel 3 An=-11.171 Bn=50.619 Cn=19.002 Dn=-0.025 Mn=0.052 Yn=0.001 Max Location : X = 3.000, Y = -0.250, Z = 0.000 (cm) Value = 12.269 Measured Values (volts) = 1.227E-002 7.291E-003 1.494E-003 -4.348E-004 -1.092E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 Calc. Voltage @ Surface (Vs) = 0.0165 Voltage @ 1.00 cm (Vt) = 0.0085 Ave. Voltage (Vs+Vt)/2 = 0.0125 Ave. SAR over 1 g (mW/g) = 1.0377 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 mW/g 012345678910 Z centimeters SAR Scan File : 98101519_ZOOM Start : 15-Oct-98 03:56:32 pm End : 15-Oct-98 04:06:55 pm Samsung/A3LSCWF200/200;824.64MHz;W;Helical/Out; Head/Left Ear;ZOOM/SAR;PCTEST/E Field/0 DegreesMuscle/56.200/0.950 File : 98101519_ZOOM Start : 15-Oct-98 03:56:32 pm End : 15-Oct-98 04:06:55 pm Samsung/A3LSCWF200/200;824.64MHz;W;Helical/Out; Head/Left Ear;ZOOM/SAR;PCTEST/E Field/0 DegreesMuscle/56.200/0.950 1.017 0.926 0.835 0.744 0.652 0.561 0.470 0.379 0.288 0.197 File : 98101519_ZOOM Start : 15-Oct-98 03:56:32 pm End : 15-Oct-98 04:06:55 pm Samsung/A3LSCWF200/200;824.64MHz;W;Helical/Out; Head/Left Ear;ZOOM/SAR;PCTEST/E Field/0 DegreesMuscle/56.200/0.950 1.017 0.926 0.835 0.744 0.652 0.561 0.470 0.379 0.288 0.197 File : c:/idx3/SYSTEM/SARMEAS3/data/Normal/98101518_ZOOM.VLT Start : 15-Oct-98 03:44:01 pm End : 15-Oct-98 03:54:35 pm Radio Type : Samsung Model Number : A3LSCWF200 Serial Number : 200 Frequency : 839.37 MHz Peak Trans. Pwr : 0.320 W Start Trans. Pwr: 0.320 W Antenna Type : Helical Antenna Posn. : Out Phantom Type : Head Phantom Posn. : Left Ear Scan Type : ZOOM/SAR Probe Name : PCTEST Field Type : E Field Orientation : 0 Degrees Mixture Type = Muscle Mixture Dielectric Constant = 56.200 Mixture Conductivity = 0.950 Comment : CHAN 0363 CDMA MODE SAMSUNG PHONE PCTEST ENGINEERING LABORATORY Robot : PCTEST Probe Offset = 0.25 cm Sensor Factor = 0.0108 Conversion Factor = 0.895 PCTEST Amplifier Channel Settings : 0.168 0.136 0.132 Diode Coefficients: Channel 1 An=-10.851 Bn=86.223 Cn=38.593 Dn=-0.016 Mn=0.026 Yn=0.000 Channel 2 An=-21.618 Bn=92.335 Cn=34.909 Dn=-0.019 Mn=0.029 Yn=0.000 Channel 3 An=-11.171 Bn=50.619 Cn=19.002 Dn=-0.025 Mn=0.052 Yn=0.001 Max Location : X = 3.750, Y = -0.750, Z = 0.000 (cm) Value = 10.957 Measured Values (volts) = 1.094E-002 6.734E-003 2.087E-003 -4.693E-004 -9.097E-004 -1.255E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 Calc. Voltage @ Surface (Vs) = 0.0137 Voltage @ 1.00 cm (Vt) = 0.0078 Ave. Voltage (Vs+Vt)/2 = 0.0107 Ave. SAR over 1 g (mW/g) = 0.8885 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 1.2 mW/g 012345678910 Z centimeters SAR Scan File : 98101518_ZOOM Start : 15-Oct-98 03:44:01 pm End : 15-Oct-98 03:54:35 pm Samsung/A3LSCWF200/200;839.37MHz;W;Helical/Out; Head/Left Ear;ZOOM/SAR;PCTEST/E Field/0 DegreesMuscle/56.200/0.950 File : c:/idx3/SYSTEM/SARMEAS3/data/Normal/98101520_ZOOM.VLT Start : 15-Oct-98 04:08:04 pm End : 15-Oct-98 04:18:28 pm Radio Type : Samsung Model Number : A3LSCWF200 Serial Number : 200 Frequency : 848.37 MHz Peak Trans. Pwr : 0.320 W Start Trans. Pwr: 0.320 W Antenna Type : Helical Antenna Posn. : Out Phantom Type : Head Phantom Posn. : Left Ear Scan Type : ZOOM/SAR Probe Name : PCTEST Field Type : E Field Orientation : 0 Degrees Mixture Type = Muscle Mixture Dielectric Constant = 56.200 Mixture Conductivity = 0.950 Comment : CHAN 0799 CDMA MODE SAMSUNG PHONE PCTEST ENGINEERING LABORATORY Robot : PCTEST Probe Offset = 0.25 cm Sensor Factor = 0.0108 Conversion Factor = 0.895 PCTEST Amplifier Channel Settings : 0.168 0.136 0.132 Diode Coefficients: Channel 1 An=-10.851 Bn=86.223 Cn=38.593 Dn=-0.016 Mn=0.026 Yn=0.000 Channel 2 An=-21.618 Bn=92.335 Cn=34.909 Dn=-0.019 Mn=0.029 Yn=0.000 Channel 3 An=-11.171 Bn=50.619 Cn=19.002 Dn=-0.025 Mn=0.052 Yn=0.001 Max Location : X = 3.000, Y = -0.250, Z = 0.000 (cm) Value = 10.974 Measured Values (volts) = 1.110E-002 6.688E-003 1.566E-003 -7.479E-004 -1.255E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 -1.267E-003 Calc. Voltage @ Surface (Vs) = 0.0146 Voltage @ 1.00 cm (Vt) = 0.0078 Ave. Voltage (Vs+Vt)/2 = 0.0112 Ave. SAR over 1 g (mW/g) = 0.9261 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 mW/g 012345678910 Z centimeters SAR Scan File : 98101520_ZOOM Start : 15-Oct-98 04:08:04 pm End : 15-Oct-98 04:18:28 pm Samsung/A3LSCWF200/200;848.37MHz;W;Helical/Out; Head/Left Ear;ZOOM/SAR;PCTEST/E Field/0 DegreesMuscle/56.200/0.950

© 1998 PCTEST Engineering Lab., Inc. PCTEST Engineering Laboratory, Inc. 6660-B 6660-B DobbinDobbin Road Road •• Columbia, MD 21045 Columbia, MD 21045 •• U.S.A. U.S.A. TEL (410) 290-6652 TEL (410) 290-6652 •• FAX (410) 290-6654 FAX (410) 290-6654 http://www.pctestlab.comhttp://www.pctestlab.com CERTIFICATE OF COMPLIANCE (Type Acceptance) SAMSUNG Electronics Co., Ltd.Dates of Tests: July 13-17, 1998 146 Maetun-3 Dong, Paldal-KuTest Report S/N: 22.980706472.A3L Suwon City, Kyungki-Do, Korea 441-742Test Site: PCTEST Lab, Columbia MD Attention: D.H. KIM, General Manager FCC ID A3LSCWF200 APPLICANT SAMSUNG ELECTRONICS CO., LTD. Classification:Non-Broadcast Station Transmitter (TNB) FCC Rule Part(s):§§§§22(E), 2.983, 2.987 EUT Type:Cellular CDMA WLL Phone (Wireless Local Loop) Trade Name/Model(s):SAMSUNG SCW-F200 Tx Frequency Range:824.64 ~ 848.37MHz Rx Frequency Range:869.64 ~ 893.37MHz Max Output Power:0.32 W Frequency Tolerance:0.00025% (2.5 ppm) This equipment has been shown to be capable of compliance with the applicable technical standards as indicated in the measurement report and was tested in accordance with the measurement procedures specified in §2.947 with the following remarks (Note Codes): * (BC) The output power is continuously variable from the value listed in this entry to 5%-10% of the value listed. I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. PCTEST certifies that no party to this application has been denied the FCC benefits pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 853(a) 980706472.A3L FCC Part 22Type Acceptance © 1998 PCTEST Engineering Laboratory, Inc.FCC Part 22 TABLE OF CONTENTS ATTACHMENT A: COVER LETTER(S) ATTACHMENT B: ATTESTATION STATEMENT(S) ATTACHMENT C: TEST REPORT SCOPE 1 INTRODUCTION 2 DESCRIPTION OF TESTS 3-6 EFFECTIVE RADIATED POWER OUTPUT 7 RADIATED MEASUREMENTS 8-10 FREQUENCY STABILITY 11-12 PLOTS OF EMISSIONS 13 LIST OF TEST EQUIPMENT 14 SAMPLE CALCULATIONS 15 RECOMMENDATION / CONCLUSION 16 ATTACHMENT D: TEST PLOTS ATTACHMENT E: FCC ID LABEL / LOCATION ATTACHMENT F: TEST SETUP PHOTOGRAPHS ATTACHMENT G: EXTERNAL PHOTOGRAPHS ATTACHMENT H: INTERNAL PHOTOGRAPHS ATTACHMENT I: BLOCK DIAGRAM(S) ATTACHMENT J: SCHEMATIC DIAGRAM(S) ATTACHMENT K: PARTS LIST/TUNE UP PROCEDURE ATTACHMENT L:OPERATIONAL DESCRIPTION ATTACHMENT M:USER’S MANUAL ATTACHMENT N:MPE MEASUREMENT REPORT ATTACHMENT O: MPE TEST SETUP PHOTOGRAPHS Test Report S/N: 22.980706472.A3LFCC Part 22 Test Dates: July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 (Tx 824-849MHz)1 SAMSUNG Cellular CDMA WLL Phone (Model: SCW-F200) MEASUREMENT REPORT Scope - Measurement and determination of electromagnetic emissions (EME) of radio frequency devices including intentional and/or unintentional radiators for compliance with the technical rules and regulations of the Federal Communications Commission. §2983(a) General Information Applicant Name:SAMSUNG ELECTRONICS CO., LTD. Address:416 Maetun-3 Dong, Paldal-Ku Suwon City, Kyungki-Do 441-742, KOREA Attention:D. H. KIM, General Manager • §2983(b) FCC ID:A3LSCWF200 • §2983(c) Quantity:Quantity production is planned • §2.983(d) Emission Designator:1M28F9W • §2.983(d) Tx Freq. Range:824.64 – 848.37 MHz Rx Freq. Range:869.64 – 893.37 MHz • Equipment Class:Non-Broadcast Station Transmitter (TNB) • Equipment Type:Cellular CDMA WLL Phone (Wireless Local Loop) • Modulation:CDMA • Frequency Tolerance:± 0.00025% (2.5 ppm) • §2.983(d) Max. Power:0.32W • FCC Rule Part(s):§§§§ 22(E), 2.983, 2.987 • AC/DC Charger:120VAC, 60Hz Model: DS-121190SS(QT) • Daeyuntongsang Ni-MH Battery:Model: 4HHR-170A 1700 mAh • §2.983(d) D.C. Voltage into Final RF Amplifier:4.8 VDC • Dates of Tests:July 13-17, 1998 • Place of Tests:PCTEST Lab, Columbia, MD U.S.A. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Dates: July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 (Tx 824-849MHz)2 SAMSUNG Cellular CDMA WLL Phone (Model: SCW-F200) 1.1 INTRODUCTION These measurement tests were conducted at PCTEST Engineering Laboratory, Inc. facility in New Concept Business Park, Guilford Industrial Park, Columbia, Maryland. The site address is 6660-B Dobbin Road, Columbia, MD 21045. The test site is one of the highest points in the Columbia area with an elevation of 390 feet above mean sea level. The site coordinates are 39° 11'15" N latitude and 76° 49'38" W longitude. The facility is 1.5 miles North of the FCC laboratory, and the ambient signal and ambient signal strength are approximately equal to those of the FCC laboratory. There are no FM or TV transmitters within 15 miles of the site. The detailed description of the measurement facility was found to be in compliance with the requirements of § 2.948 according to ANSI C63.4 on October 19, 1992. Measurement Procedure The radiated and spurious measurements were made outdoors at 3-meter test range (see Figure2). The equipment under test is placed on the turntable connected to a RF wattmeter and a dummy RF load, and then its power is adjusted to its rated output. A receiving antenna located 2 meters from the turntable picks up any signal radiated from the transmitter. The turntable containing the system was rotated; the receiving antenna height was varied 1 to 4 meters and stopped at the azimuth or height producing the maximum emission. The testing procedure is repeated for both horizontal and vertical polarization of the receiving antenna. The actual radiated signal strength is obtained by substitution method with a signal generator with a calibrated output. The signal generator is adjusted in output until its reading is identical to that obtained when the receiving antenna is connected to the receiver. Signal strength is then read directly fro…

Text truncated - open the document above for the full version.

Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: 22.980706472.A3LFCC Part 22 Test Date(s): July 13-17, 1998Type Acceptance © 1998 PCTEST LabFCC ID: A3LSCWF200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd.

Test Report S/N: MPE.980706473.A3LFCC Part 22 Type Acceptance Test Date(s): July 13-17, 1998MPE Measurement Report © 1998 PCTEST LabModel: SCW-F200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd. Test Report S/N: MPE.980706473.A3LFCC Part 22 Type Acceptance Test Date(s): July 13-17, 1998MPE Measurement Report © 1998 PCTEST LabModel: SCW-F200 NVLAP Lab Code: 100431-0 SAMSUNG Electronics Co., Ltd.