A3LSH50P5PDP Monitor

SAMSUNG Confidential Eagle + SVP-EX Block D/G SVP-EX62 Audio Process MSP4440G CVBS K4S281632 Flash 28F128J K4S643232 K4S643232 TS ARM9 CPU S3C2800X HDMI PC EM6A9320 LVDS Rx Buffer LCX16244 SPDIF Mux 74HC157 Clock CY24204 Audio AMP TDA3004 OSC 33M CS5333 Display R Speaker L SPDIF out I2S SIF 1,2 Mon R/L out RGB 24 bit PC RGB YPbPr DTV CVBS PCI 2004. 09.30 Clock Mux VHC244 K4S281632 CIMAX Micom S3F866B Expender S3C9428 IR Control UART MAX232 AnynetDe-bug VSB NXT2004 NT VIF LA7657 Buffer Latch POD Module PCMCIA Slot Tuner-CVBS S-Video TS VIDEO 1 YPbPr I2S Mux VHC244 Monitor Out Audio SW 4052 Main Tuner QAM BCM3215 POD Option NIM Tuner Clock I2S SPDIF Buffer LCX245 Buffer LCX245 S5H2010X EAGLE+ Add./ Data Add. DATA I2S Add. SIF CVBS TS COMPONENT1 TAS5112 NSP6241 HDMI Rx SIL9993 MST9883 DNIe Lite LVDS Tx 24.0 Mhz 12.0 Mhz 18.432 Mhz 27 Mhz 6 Mhz 14.318180 Mhz 33 Mhz

FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 & §§ 15.19 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. (SEE NEXT PAGE)

Page : 1 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE050997 Equipment under Test Address 416 Maetan3-Dong,Yeongtong-Gu,Suwon-Si,Gyeonggi-Do, Korea,443-742 Product Name PDP Monitor Model Name SH50P5 Manufacturer Samsung Electronics Co., Ltd Brand Name SAMSUNG Variant Model See Page 3 FCC ID A3LSH50P5 Date of Test May 2 , 2005 ~ May 3, 2005 Issued Date May 3, 2005 Name/Position Signature Tested by Tae Young, Jang Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Seung Kyu, Cha Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. NVLAP LAB CODE 200623-0 Page : 2 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Test Configuration 1.4 EUT Operating Conditions 1.5 Applied Standard 1.6 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix A 4.1 Test Photography 4.2 EUT Photography Page : 3 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co., Ltd Model name SH50P5 Applicant Address 416 Maetan3- Dong, Yeongtong-Gu, Suwon-Si, Gyeonggi-Do, Korea, 443-742 Contact Person Chang Young, Choi Kind of product PDP Monitor Valiant list Manufacturer Samsung Electronics Co., Ltd 1.2 Detail Information related Product Specification Image Viewable Image Size 50 Inch Maximum Resolution 1360 X 768 Horizontal Frequency 47.712KHz Vertical Frequency 60.015Hz 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. Cables were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. - PC Analog In 1.4 Equipment Modifications No equipment modifications were required. Page : 4 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.5 Test Configuration Used EUT and Peripherals Seq Device Model Name Serial # Maker FCC ID A PDP Monitor SH50P5 - SAMSUNG A3LSH50P5 B Personal Computer MP11 A24692GT300039 SAMSUNG DoC C Printer ML-1750 BABX822977N SAMSUNG A3LML-1750 D PS/2 Keyboard SEM-DT35 51036635 SAMSUNG DoC E USB Mouse M-S48a 334648-007 COMPAQ JNI201213 Connect Cable Length [m] Shielded [Y/N] Remark 1 Power 1.8 No To the Mains 2 Power 1.8 No To the Mains 3 Power 1.8 No To the Mains 4 Monitor (PC Video Input) 1.7 Yes To the PC 5 Parallel (Printer) 1.8 Yes To the PC 6 PS/2 (Keyboard) 1.5 No To the PC 7 PS/2 (Mouse) 1.5 No To the PC 8 Component In 1 1.5 No Termination 9 Component In 2 1.5 No Termination 10 Audio In 1 1.5 No Termination 11 Audio In 2 1.5 No Termination 12 S-video In 1 1.5 No Termination 13 S-video In 2 1.5 No Termination 14 AV In 1 1.5 No Termination 15 AV IN 2 1.5 No Termination 16 Audio Out 1.5 No Termination 17 PC audio in 1.5 No To the PC 18 DVI Audio In 1.5 No Termination 19 HDMI In 1.5 No Termination Port Description Page : 5 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Block Diagram Page : 6 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.6 Applied Standards List Applied Standards Test Procedure FCC Part15 Subpart B ANSI C63.4 : 2003 1.7 Test Facility General Information The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 16-1, 16-2. This EMC Testing Lab. is accredited by Korea Laboratory Accreditation Scheme(KOLAS) which signed the International Laboratory Accreditation Cooperation (ILAC) Mutual Recognition Arrangement (MRA) for the above test item(s) and test method(s). This Lab. is operated as testing laboratory in accordance with the requirements of ISO/IEC 17025:1998. Accreditation and Listing Uncertainty Test Item Expanded Uncertainty Radiated Emission ±5.09 Conducted Emission ±1.64 (According to NAMAS Pub.NIS81) Page : 7 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. Summary of Test Results Result : PASS The equipment under test(EUT) has been found to comply with the applied standards. Test Name Applied Standard Result Electromagnetic Emission Test 3.1 Conducted Emission FCC Part15 Subpart B Complied 3.2 Radiated Emission FCC Part15 Subpart B Complied Page : 8 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 3. D…

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Page : 12 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix A 4.1 Test Photography Picture 1. Conducted Emission (Front view) Picture 2. Conducted Emission (Rear view) Page : 13 of 14 Samsung EMC Testing and Certification Laboratory Project NO. :LBE050997 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (Front view) Picture 4. Radiated Emission (Rear view)