A3LYP80UO80" PDP Monitor

SAMSUNG Confidential SAMSUNG Confidential SiI9993 IC1106 DEC SUB TC90103 (B2h) TMDS D_SUB GF9350 Xilinx(CPLD) IC1002 DEC MAIN TC90103 (B0h) ADC AD9888 (98h) ADC AD9981 (9Ah) GSPI OSD (16MB) X 2 Program (2MB) DDR(32MB) X 7 DNIe4 (C8h) RGB/YUV 24bit Sub YUV24bit or RGB 24bit Main YUV 30bit LVDS RGB 60bit RGB 72bit CVBS 1 Y/C 2 Main 656 10bit Sub 656 10bit Sub 30bit VARIABLE TO PANEL MONITOR OUT SDA6001 M2 (CPU) MAIN Y/C SUB Y/C MAIN CVBS SUB CVBS CVBS 2 Y/C 1 Video Switch Block COMP S/W CXA2171 (84h) COMP S/W BA7657 COMP S/W BA7657 COMPONENT1COMPONENT2 RGB(Main) RGB(Sub) RGB(PC) COMPONENT1 YPbPr(Sub) SCART2 MONITOR OUTMONITOR OUT MONITOR OUT SiI169 DVI RGB/YUV 24bit IC1901 IPC SDP51 (CEh) SDRAM(64MB) SDRAM(64MB) SCART1 Main 30bit VARIABLE New ICExistingMemory MAX232 UART SDRAM(8MB) X 2 Program(4MB) Service1 232C Out Service2 MAX232 UART MBC In Main 30bit VARIABLE COMPONENT2 74.25MHz 74.25MHz 27MHz SAMSUNG Confidential SAMSUNG Confidential MSP4440 IC801 INPUT MUX TEA6422 (9Ah) NSP6241 V1V2 COMP1COMP1 PC DVI AMP TAS5112 DSP56371 HDMI SPDIF (DIG1_SPDIF) CS5333 L/R 4440 L/R 56371_MCLKO56371_SCLKO56371_LRCLKO 5333_SDO 56371_SDO 4440_SDO 4440_AUD_CLK4440_SCLKO4440_LRCLKO TL062 WOOFER 74LS157 S/W OPTIC ASSY WOOFER 56371_PCMO SPDIF_OPTIC SPDIF_COAX MONITOR OUT IC2904 INPUT MUX TEA6422 (98h) L/R Monitor out(AV2_SL/R_OUT) SPDIFO_PCMO_SEL (High Fix) Monitor out(AV1_SL/R_OUT)

FCC ID SAMPLE LABEL & LOCATION LABELLING REQUIREMENTS PER §§ 2.925 & §§ 15.19 The Label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time of purchase. (SEE NEXT PAGE)

Page : 1 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. EMC Test Report According to FCC Part 15 Subpart B Project No. LBE052358 Equipment under Test Address 416 Maetan3-Dong,Yeongtong-Gu,Suwon-Si,Gyeonggi-Do, Korea,443-742 Product Name PDP Monitor Model Name YP80UO Manufacturer Samsung Electronics Co., Ltd. Brand Name SAMSUNG Variant Model See Page 3 FCC ID A3LYP80UO Date of Test September 22 ~ 25, 2005 Issued Date October 4, 2005 Name/Position Signature Tested by Tae Young, Jang Test Engineer Reviewed by No Cheon, Park Manager of EMC Lab. Authorized by Seung Kyu, Cha Chief of EMC Lab. 1. This test reports does not constitute an endorsement by NIST/NVLAP or U.S Government. 2. This test report is to certify that the tested device properly complies with the requirements of FCC Rules and Regulations Part 15 Subpart B Unintentional Radiators. All tests necessary to show compliance to the requirements were and these results met the specifications requirement. This laboratory is registered by the NIST/NVLAP, U.S.A. The test reported herein have been performed in accordance with its terms of registration. Page : 2 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Table of Contents 1. General Information 1.1 Basic Information related Product 1.2 Detail Information related Product 1.3 Test Configuration 1.4 EUT Operating Conditions 1.5 Applied Standard 1.6 Test Facility 2. Summary of Test Results 3. Description of individual tests 3.1 Conducted Emission 3.2 Radiated Emission 4. Appendix A 4.1 Test Photography 4.2 EUT Photography Page : 3 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1. General Information 1.1 Basic Information related Product Applicant Samsung Electronics Co., Ltd. Model name YP80UO Applicant Address Samsung Electronics Co., Ltd. 416 Maetan3- Dong, Yeongtong-Gu, Suwon-Si, Gyeonggi-Do, Korea, 443-742 Contact Person Chang Young, Choi Kind of product PDP Monitor Valiant list None Manufacturer Samsung Electronics Co., Ltd. 1.2 Detail Information related Product Specification Item(s) Description Maximum Resolution 1920 x 1080 @ 60Hz Horizontal Frequency 31.5 ~ 80 kHz Vertical Frequency 56 ~ 75 Hz 1.3 Operating Mode and Condition The system was configured for testing in typical fashion use. Cables were attached to each of the available I/O Ports. Where applicable, peripherals were attached to the I/O cables. The mode of operation utilized for testing was selected to best simulate typical EUT use. - PC Video in - DVI Video in 1.4 Equipment Modifications No equipment modifications were required. Page : 4 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.5 Test Configuration Used EUT and Peripherals Seq Device Model Name Serial # Maker FCC ID A PDP Monitor YP80UO - SAMSUNG A3LYP80UO B Personal Computer MP22 D66892KTA00010 SAMSUNG DoC C Printer ML-1750 BABX822977N SAMSUNG A3LML-1750 D PS/2 Keyboard TKB-3000 C0501066811 TRUTIONDoC E PS/2 Mouse Wheel mouse 3.0 - SAMSUNGDoC Port Description Connect Cable Length [m] Shielded [Y/N] Remark 1 Power 1.5 No For EUT 2 Power 1.5 No For PC 3 Power 1.5 No For Printer 4 PS/2 Cable 1.5 No For Keyboard 5 PS/2 Cable 1.5 No For Mouse 6 Parallel Cable 1.5 Yes To the PC 7 Component 1 in 1.5 Yes Termination 8 Component 2 in 1.5 Yes Termination 9 AV out 1.5 NoTermination 10 AV in 1.5 No Termination 11 PC video in 1.5 NoTo the PC 12 DVI Video in 1.5 NoTo the PC Page : 5 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Block Diagram 1.6 Applied Standards List Applied Standards Test Procedure FCC Part15 Subpart B ANSI C63.4: 2003 Page : 6 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 1.7 Test Facility General Information The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 16-1, 16-2. This EMC Testing Lab. is accredited by Korea Laboratory Accreditation Scheme(KOLAS) which signed the International Laboratory Accreditation Cooperation (ILAC) Mutual Recognition Arrangement (MRA) for the above test item(s) and test method(s). This Lab. is operated as testing laboratory in accordance with the requirements of ISO/IEC 17025:1998. Accreditation and Listing Uncertainty Test Item Expanded Uncertainty Radiated Emission 5.09 Conducted Emission 1.64 (According to NAMAS Pub.NIS81) Page : 7 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 2. Summary of Test Results Result : PASS The equipment under test(EUT) has been found to comply with the applied standards. Test Name Applied Standard Result Electromagnetic Emission Test 3.1 Conducted Emission FCC Part15 Subpart B Complied 3.2 Radiated Emission FCC Part15 Subpart B Complied Page : 8 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 3. Description of Individual Tests 3.1 Conducted Emission Test Information Test Engineer Tae Young, JANG Test Date September 26, 2005 Climate Condition Ambient Temperature : 20.5 Relative Humidity : 48% Test Place Shield Room #5 Test Equipments Calibration Equipment Modal Name Manufacturer Serial No. Next Date Interval L.I.S.N ESH3-Z5 R&S 100261 2006-07-13 12 Test Software EP5CE TOYO None N/A N/A Field strength meter ESI 26 R&S 832692/002 2006-02-26 12 TV Signal Generator PM5418-TDSI PHILIPS LO612437 2005-09-23 12 Field strength meter ESS-30 R&S 844661/005 2006-01-11 12 RF Relais Matrix PSU R&S 861206/024 N/A N/A EUT Test Setup The EUT…

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Page : 14 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. 4. Appendix A 4.1 Test Photography Picture 1. Conducted Emission Picture 2. Radiated Emission (front view) Page : 15 of 16 Project NO. :LBE052358 This report shall not be reproduced except in full, without the written approval of SEC EMC Testing laboratory. Picture 3. Radiated Emission (rear view)