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  3. BCGA3460

BCGA3460Tablet Device

Apple Inc.

Application Details

Equipment Class
PCB - PCS Licensed Transmitter
Date of Grant
Mar 02, 2026
Application Purpose
Original Equipment
Equipment Note
Tablet Device
Frequency Range
171.00000000 - 1780.00000000
Company
Apple Inc.
Country
United States

Documents & Files

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Attestation Statements

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Cover Letter(s)

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ID Label/Location Info

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RF Exposure Info

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Test Report

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Test Report

FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 71 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-104. Occupied Bandwidth Plot (NR Band n41 - 15MHz CP-OFDM 64-QAM - Full RB) Plot 7-105. Occupied Bandwidth Plot (NR Band n41 - 15MHz CP-OFDM 256-QAM - Full RB) FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 72 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-106. Occupied Bandwidth Plot (NR Band n41 - 20MHz DFT-s-OFDM Ο€/2 BPSK - Full RB) Plot 7-107. Occupied Bandwidth Plot (NR Band n41 - 20MHz CP-OFDM QPSK - Full RB) FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 73 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-108. Occupied Bandwidth Plot (NR Band n41 - 20MHz CP-OFDM 16-QAM - Full RB) Plot 7-109. Occupied Bandwidth Plot (NR Band n41 - 20MHz CP-OFDM 64-QAM - Full RB) FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 74 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-110. Occupied Bandwidth Plot (NR Band n41 - 20MHz CP-OFDM 256-QAM - Full RB) Plot 7-111. Occupied Bandwidth Plot (NR Band n41 - 25MHz DFT-s-OFDM Ο€/2 BPSK - Full RB) FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 75 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-112. Occupied Bandwidth Plot (NR Band n41 - 25MHz CP-OFDM QPSK - Full RB) Plot 7-113. Occupied Bandwidth Plot (NR Band n41 - 25MHz CP-OFDM 16-QAM - Full RB) FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 76 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-114. Occupied Bandwidth Plot (NR Band n41 - 25MHz CP-OFDM 64-QAM - Full RB) Plot 7-115. Occupied Bandwidth Plot (NR Band n41 - 25MHz CP-OFDM 256-QAM - Full RB) FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 77 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-116. Occupied Bandwidth Plot (NR Band n41 - 30MHz DFT-s-OFDM Ο€/2 BPSK - Full RB) Plot 7-117. Occupied Bandwidth Plot (NR Band n41 - 30MHz CP-OFDM QPSK - Full RB) FCC ID: BCGA3460 PART 27 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 78 of 323 1C2509100080-10-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any …

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RF Exposure Info

YW 11/21/2024 Object: Date Issued: Page 1 of 3 D2300V2 – SN: 1064 11/14/2024 Certification of Calibration Object D2300V2 – SN: 1064 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: November 14, 2024 Description: SAR Validation Dipole at 2300 MHz. Calibration Equipment used: Measurement Uncertainty = Β±23% (k=2) Name Function Signature Calibrated By: Arturo Oliveros Compliance Engineer Approved By: Greg Snyder Executive VP of Operations Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Hewlett Packard 8753E RF Vector Network Analyzer 5/21/2024 Annual 5/21/2025 US38161081 Agilent E4438C ESG Vector Signal Generator 5/19/2024 Annual 5/19/2025 US41460739 Amplifier Research 15S1G6 Amplifier CBT N/A CBT 343972 Anritsu ML2496A Power Meter 7/15/2024 Annual 7/15/2025 1138001 Anritsu MA2411B Pulse Power Sensor 7/10/2024 Annual 7/10/2025 1126066 Anritsu MA2411B Pulse Power Sensor 7/1/2024 Annual 7/1/2025 1911105 Traceable 4040 90080-06 Therm./ Clock/ Humidity Monitor 1/15/2024 Annual 1/15/2025 160574418 Control Company 4352 Ultra Long Stem Thermometer 1/15/2024 Annual 1/15/2025 160508097 Agilent 85033E 3.5mm Standard Calibration Kit 7/31/2024 Annual 7/31/2025 MY53402352 Mini-Circuits VLF-6000+ Low Pass Filter DC to 6000 MHz CBT N/A CBT N/A Narda 4772-3 Attenuator (3dB) CBT N/A CBT 9406 Mini-Circuits ZHDC-16-63-S+ 50-6000MHz Bidirectional Coupler CBT N/A CBT N/A Pasternack NC-100 Torque Wrench 12/5/2022 Biennial 12/5/2024 N/A SPEAG DAK-3.5 Dielectric Assessment Kit 5/14/2024 Annual 5/14/2025 1070 SPEAG EX3DV4 SAR Probe 4/16/2024 Annual 4/16/2025 7546 SPEAG DAE4 Dasy Data Acquisition Electronics 4/10/2024 Annual 4/10/2025 1402 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 18855 Adams Ct, Morgan Hill, CA 95037 USA Tel. +1.408.538.5600 http://www.element.com Object: Date Issued: Page 2 of 3 D2300V2 – SN: 1064 11/14/2024 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. 3. The measurement of real or imaginary parts of impedance does not deviate more than 5Ξ© from the previous measurement. The following dipole was checked to pass the above 3 requirements to have 2-year calibration period from the calibration date: Calibration Date Extension Date Certificate Electrical Delay (ns) Certificate SAR Target Head (1g) W/kg @ 20.0 dBm Measured Head SAR (1g) W/kg @ 20.0 dBm Deviation 1g (%) Certificate SAR Target Head (10g) W/kg @ 20.0 dBm Measured Head SAR (10g) W/kg @ 20.0 dBm Deviation 10g (%) Certificate Impedance Head (Ohm) Real Measured Impedance Head (Ohm) Real Difference (Ohm) Real Certificate Impedance Head (Ohm) Imaginary Measured Impedance Head (Ohm) Imaginary Difference (Ohm) Imaginary Certificate Return Loss Head (dB) Measured Return Loss Head (dB) Deviation (%) 11/14/2023 11/14/2024 1.166 4.93 4.71 -4.46% 2.38 2.21 -7.14% 48.2 46.9 1.3 -3.3 -4.3 1.0 -28.3 -25.0 11.50% Object: Date Issued: Page 3 of 3 D2300V2 – SN: 1064 11/14/2024 Impedance & Return-Loss Measurement Plot for Head TSL Object: Date Issued: Page 1 of 3 D2300V2 – SN: 1064 11/14/2025 Certification of Calibration Object D2300V2 – SN: 1064 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: November 14, 2025 Description: SAR Validation Dipole at 2300 MHz. Calibration Equipment used: Measurement Uncertainty = Β±23% (k=2) Name Function Signature Calibrated By: Arturo Oliveros Compliance Engineer Approved By: Greg Snyder Executive VP of Operations Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Agilent 8753ES S-Parameter Vector Network Analyzer 1/6/2026 Annual 1/6/2026 MY40001472 Agilent E4438C ESG Vector Signal Generator 12/8/2024 Annual 12/8/2025 MY42081752 Amplifier Research 15S1G6 Amplifier CBT N/A CBT 343972 Anritsu ML2496A Power Meter 2/10/2025 Annual 2/10/2026 1351001 Anritsu MA2411B Pulse Power Sensor 2/10/2025 Annual 2/10/2026 1339027 Anritsu MA2411B Pulse Power Sensor 6/26/2025 Annual 6/26/2026 1339007 Control Company 4040 Therm./ Clock/ Humidity Monitor 1/10/2025 Annual 1/10/2026 160574418 Control Company 4353 Ultra Long Stem Thermometer 7/18/2025 Annual 7/18/2026 200645903 Agilent 85033E 3.5mm Standard Calibration Kit 9/12/2025 Annual 9/12/2026 MY53402352 Mini-Circuits VLF-6000+ Low Pass Filter DC to 6000 MHz CBT N/A CBT N/A Narda 4772-3 Attenuator (3dB) CBT N/A CBT 9406 Mini-Circuits ZHDC-16-63-S+ 50-6000MHz Bidirectional Coupler CBT N/A CBT N/A Pasternack PE5011-1 Torque Wrench 5/29/2025 Biennial 5/29/2026 N/A SPEAG DAK-3.5 Dielectric Assessment Kit 5/12/2025 Annual 5/12/2026 1070 SPEAG EX3DV4 SAR Probe 5/9/2025 Annual 5/9/2026 7416 SPEAG DAE4 Dasy Data Acquisition Electronics 5/9/2025 Annual 5/9/2026 701 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 18855 Adams Ct, Morgan Hill, CA 95037 USA Tel. +1.408.538.5600 http://www.element.com Object: Date Issued: Page 2 of 3 D2300V2 – SN: 1064 11/14/2025 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. 3. The measurement of real or imaginary parts of impedance does not deviate more than 5Ξ© from the previous measu…

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RF Exposure Info

A P P E N D I X C: C A L I B R A T I O N C E R T I F I C A T E S Object: Date Issued: Page 1 of 3 D835V2 – SN: 4d040 10/25/2025 Certification of Calibration Object D835V2 – SN: 4d040 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: October 25, 2025 Description: SAR Validation Dipole at 835 MHz. Calibration Equipment used: Measurement Uncertainty = Β±23% (k=2) Name Function Signature Calibrated By: Arturo Oliveros Compliance Engineer Approved By: Greg Snyder Executive VP of Operations Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Agilent 8753ES S-Parameter Vector Network Analyzer 1/6/2025 Annual 1/6/2026 MY40001472 Agilent E4438C ESG Vector Signal Generator 12/8/2024 Annual 12/8/2025 MY42081752 Amplifier Research 15S1G6 Amplifier CBT N/A CBT 343972 Anritsu ML2496A Power Meter 2/10/2025 Annual 2/10/2026 1351001 Anritsu MA2411B Pulse Power Sensor 2/10/2025 Annual 2/10/2026 1339027 Anritsu MA2411B Pulse Power Sensor 6/26/2025 Annual 6/26/2026 1339007 Control Company 4040 Therm./ Clock/ Humidity Monitor 1/10/2025 Annual 1/10/2026 160574418 Control Company 4353 Ultra Long Stem Thermometer 7/18/2025 Annual 7/18/2026 200645903 Agilent 85033E 3.5mm Standard Calibration Kit 9/12/2025 Annual 9/12/2026 MY53402352 Mini-Circuits VLF-6000+ Low Pass Filter DC to 6000 MHz CBT N/A CBT N/A Narda 4772-3 Attenuator (3dB) CBT N/A CBT 9406 Mini-Circuits ZHDC-16-63-S+ 50-6000MHz Bidirectional Coupler CBT N/A CBT N/A Pasternack PE5011-1 Torque Wrench 5/29/2025 Biennial 5/29/2027 N/A SPEAG DAK-3.5 Dielectric Assessment Kit 5/12/2025 Annual 5/12/2026 1070 SPEAG EX3DV4 SAR Probe 4/16/2025 Annual 4/16/2026 7551 SPEAG DAE4 Dasy Data Acquisition Electronics 4/15/2025 Annual 4/15/2026 1323 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 18855 Adams Ct, Morgan Hill, CA 95037 USA Tel. +1.408.538.5600 http://www.element.com Object: Date Issued: Page 2 of 3 D835V2 – SN: 4d040 10/25/2025 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. 3. The measurement of real or imaginary parts of impedance does not deviate more than 5Ξ© from the previous measurement. The following dipole was checked to pass the above 3 requirements to have 2-year calibration period from the calibration date: Calibration Date Extension Date Certificate Electrical Delay (ns) Certificate SAR Target Head (1g) W/kg @ 23.0 dBm Measured Head SAR (1g) W/kg @ 23.0 dBm Deviation 1g (%) Certificate SAR Target Head (10g) W/kg @ 23.0 dBm Measured Head SAR (10g) W/kg @ 23.0 dBm Deviation 10g (%) Certificate Impedance Head (Ohm) Real Measured Impedance Head (Ohm) Real Difference (Ohm) Real Certificate Impedance Head (Ohm) Imaginary Measured Impedance Head (Ohm) Imaginary Difference (Ohm) Imaginary Certificate Return Loss Head (dB) Measured Return Loss Head (dB) Deviation (%) 10/25/2024 10/25/2025 1.39 1.92 1.99 3.75% 1.25 1.31 4.80% 49.3 51.7 2.4 -4.1 -2.5 1.6 -27.6 -30.4 -10.00% Object: Date Issued: Page 3 of 3 D835V2 – SN: 4d040 10/25/2025 Impedance & Return-Loss Measurement Plot for Head TSL YW 12/13/2023 YW 11/19/2024 Object: Date Issued: Page 1 of 3 D1750V2 – SN: 1040 11/17/2023 Certification of Calibration Object D1750V2 – SN: 1040 Calibration procedure(s) Procedure for Calibration Extension for SAR Dipoles. Extension Calibration date: November 17, 2023 Description: SAR Validation Dipole at 1750 MHz. Calibration Equipment used: Measurement Uncertainty = Β±23% (k=2) Name Function Signature Calibrated By: Arturo Oliveros Compliance Engineer Approved By: Greg Snyder Executive VP of Operations Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Agilent 8753ES S-Parameter Vector Network Analyzer 6/2/2023 Annual 6/12/2024 MY40003841 Agilent E4438C ESG Vector Signal Generator 4/25/2023 Annual 4/25/2024 US41460739 Amplifier Research 15S1G6 Amplifier CBT N/A CBT 343972 Rohde & Schwarz NRX Power Meter 1/11/2023 Annual 1/11/2024 102583 Rohde & Schwarz NRP-Z81 Wide Band Power Sensor 1/19/2023 Annual 1/19/2024 106563 Rohde & Schwarz NRP-Z81 Wide Band Power Sensor 1/11/2023 Annual 1/11/2024 106564 Traceable 4040 90080-06 Therm./ Clock/ Humidity Monitor 5/11/2022 Biennial 5/11/2024 221514974 Control Company 4353 Ultra Long Stem Thermometer 10/24/2023 Annual 10/24/2024 200645916 Agilent 85033E 3.5mm Standard Calibration Kit 7/18/2023 Annual 7/18/2024 MY53402352 Mini-Circuits VLF-6000+ Low Pass Filter DC to 6000 MHz CBT N/A CBT N/A Narda 4772-3 Attenuator (3dB) CBT N/A CBT 9406 Mini-Circuits ZHDC-16-63-S+ 50-6000MHz Bidirectional Coupler CBT N/A CBT N/A Pasternack NC-100 Torque Wrench 12/5/2022 Biennial 12/5/2024 N/A SPEAG DAK-3.5 Dielectric Assessment Kit 5/9/2023 Annual 5/9/2024 1070 SPEAG EX3DV4 SAR Probe 11/9/2023 Annual 11/9/2024 7639 SPEAG DAE4 Dasy Data Acquisition Electronics 11/14/2023 Annual 11/14/2024 1403 ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 18855 Adams Ct, Morgan Hill, CA 95037 USA Tel. +1.408.538.5600 http://www.element.com Object: Date Issued: Page 2 of 3 D1750V2 – SN: 1040 11/17/2023 DIPOLE CALIBRATION EXTENSION Per KDB 865664 D01, calibration intervals of up to three years may be considered for reference dipoles when it is demonstrated that the SAR target, impedance and return loss of a dipole have remained stable according to the following requirements: 1. The measured SAR does not deviate more than 10% from the target on the calibration certificate. 2. The return-loss does not deviate more than 20% from the previous measurement and meets the required 20dB minimum return-loss requirement. …

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Test Report

FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 57 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-76. Conducted Spurious Plot (NR Band n14 - 10MHz DFT-s-OFDM QPSK - RB Size 1, RB Offset 0 - Mid Channel) Plot 7-77. Conducted Spurious Plot (NR Band n14 - 10MHz DFT-s-OFDM QPSK - RB Size 1, RB Offset 0 - Mid Channel) FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 58 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-78. Conducted Spurious Plot (NR Band n14 - 5MHz DFT-s-OFDM QPSK - RB Size 1, RB Offset 0 - High Channel) Plot 7-79. Conducted Spurious Plot (NR Band n14 - 5MHz DFT-s-OFDM QPSK - RB Size 1, RB Offset 0 - High Channel) FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 59 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Plot 7-80. Conducted Spurious Plot (NR Band n14 - 5MHz DFT-s-OFDM QPSK - RB Size 1, RB Offset 0 - High Channel) FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 60 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Band Edge Emissions at Antenna Terminal Β§2.1051 Β§90.691(a) Β§90.543(e) Test Overview All out of band emissions are measured with a spectrum analyzer connected to the antenna terminal of the EUT while the EUT is operating at maximum power, and at the appropriate frequencies. All data rates were investigated to determine the worst case configuration. All modes of operation were investigated and the worst case configuration results are reported in this section. All ports were tested and only the worst case data were reported. For LTE Band 26 and NR Band n26 operation under Part 90.691, the minimum permissible attenuation level of any spurious emission removed from the EA licensee’s frequency block by greater than 37.5 kHz is 43 + 10log10(P[Watts]), where P is the transmitter power in Watts. The minimum permissible attenuation level of any spurious emission removed from the EA licensee’s frequency block by up to and including 37.5 kHz is 50 + 10log10(P[Watts]), where P is the transmitter power in Watts. Test Procedure Used KDB 971168 D01 v03r01 – Section 6.0 Test Settings 1. Span was set large enough so as to capture all out of band emissions near the band edge 2. RBW = 100 kHz 3. VBW = 300 kHz 4. Detector = RMS 5. Trace mode = trace average 6. Sweep time = auto couple 7. The trace was allowed to stabilize Test Setup The EUT and measurement equipment were set up as shown in the diagram below. Figure 7-5. LTE Instrument & Measurement Setup Figure 7-6. FR1 Instrument & Measurement Setup FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 61 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Test Notes 1. Per Part 90, in the 100 kHz bands immediately outside and adjacent to the frequency block, a resolution bandwidth of 30 kHz may be employed to demonstrate compliance with the out-of-band emissions limit. The emission bandwidth is defined as the width of the signal between two points, one below the carrier center frequency and one above the carrier center. 2. For LTE Band 14 and NR Band n14 operation under Part 90.543, the power of any emission must be reduced below the mean output power (P) by at least 43 + 10log (P) dB measured in a 100 kHz bandwidth for frequencies less than 1 GHz, and in a 1 MHz bandwidth for frequencies greater than 1 GHz. 3. Additionally, for LTE Band 14 and NR Band n14 operation, on all frequencies between 769-775 MHz and 799-805 MHz, the power of any emission shall be att…

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Test Report

FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 1 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Applicant Name: Apple Inc. One Apple Park Way Cupertino, CA 95014 United States Date of Testing: 7/15/2025 - 11/4/2025 Test Report Issue Date: 1/16/2026 Test Site/Location: Element Materials Technology Morgan Hill, CA, USA Test Report Serial No.: 1C2509100080-12-R3.BCG FCC ID: Applicant Name: BCGA3460 Apple Inc. Application Type: Certification Model: A3460, A3463 EUT Type: Tablet Device FCC Classification: PCS Licensed Transmitter (PCB) FCC Rule Part: Β§2.1049, Β§90(S), Β§90(R) Test Procedure(s): ANSI C63.26-2015, TIA-603-E-2016, KDB 971168 D01 v03r01 This equipment has been shown to be capable of compliance with the applicable technical standards as indicated in the measurement report and was tested in accordance with the measurement procedures specified in Β§2.947. Test results reported herein relate only to the item(s) tested. This revised Test Report (S/N: 1C2509100080-12-R3-.BCG) supersedes and replaces the previously issued test report on the same subject device for the same type of testing as indicated. Please discard or destroy the previously issued test report(s) and dispose accordingly I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. ELEMENT MATERIALS TECHNOLOGY (formerly PCTEST) 18855 Adams Court, Morgan Hill, CA 95037 USA Tel. 408.538.5600 http://www.element.com MEASUREMENT REPORT PART 90 FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 2 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. Revision Summary Revision Date Comments Revised By - 12/8/2025 Initial release - R1 12/17/2025 Addressed TCB Comments in Overview Table, section 2.3, 5.0, 7.1, 7.2, 7.5, and 7.8 WKR0000007837 R2 12/23/2025 Addressed Client’s Comments in section 2.6 WKR0000007837 R3 12/31/2025 Addressed TCB Comments in Overview Table and section 7.5 WKR0000007837 FCC ID: BCGA3460 PART 90 MEASUREMENT REPORT Approved by: Technical Manager Test Report S/N: Test Dates: EUT Type: Page 3 of 109 1C2509100080-12-R3.BCG 7/15/2025 - 11/4/2025 Tablet Device V2.2 09/07/2023 Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from Element Materials Technology. If you have any questions about this or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact [email protected]. T A B L E O F C O N T E N T S 1.0 INTRODUCTION ..................................................................................................................................... 5 Scope .......................................................................................................................................................... 5 Element Materials Technology Test Location ................................................................................................ 5 Test Facility / Accreditations ......................................................................................................................... 5 2.0 PRODUCT INFORMATION ..................................................................................................................... 6 Equipment Description ................................................................................................................................. 6 Device Capabilities ...................................................................................................................................... 6 Antenna Description..................................................................................................................................... 7 Test Support Equipment............................................................................................................................... 7 Test Configuration ....................................................................................................................................... 7 Software and Firmware ................................................................................................................................ 7 EMI Suppression Device(s)/Modifications ..................................................................................................... 7 3.0 DESCRIPTION OF TESTS ...................................................................................................................... 8 Evaluation Procedure ................................................................................................................................... 8 Radiated Spurious Emissions ..................…

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Contact Information

Applicant

Abhishek Rala(Regulatory Compliance Manager)
[email protected]Fax: 408-996-0275

Technical Contact

Apple IncAbhishek Rala
[email protected]

One Apple Park Way Β· Cupertino, 95014 Β· United States

Test Firm

Element Materials Technology San Jose, CANima Molaei
[email protected]

Technical Specifications

#Rule PartsFrequency RangePower OutputEmissionTolerance
122H826.4 MHz - 846.6 MHz185.78 mW4M09F9W2.5ppm
2271.71 GHz - 1.75 GHz502.34 mW4M10F9W2.5ppm
324E1.85 GHz - 1.91 GHz492.04 mW4M09F9W2.5ppm
422H824 MHz - 849 MHz175.79 mW4M54G7W2.5ppm
522H824 MHz - 849 MHz169.04 mW9M05G7W2.5ppm
622H824 MHz - 849 MHz149.97 mW4M54D7W2.5ppm
722H824 MHz - 849 MHz147.23 mW9M06D7W2.5ppm
822H824 MHz - 849 MHz181.55 mW8M98G7W2.5ppm
922H824 MHz - 849 MHz176.20 mW19M0G7W2.5ppm
122H824 MHz - 849 MHz141.58 mW4M46D7W2.5ppm
1122H824 MHz - 849 MHz71.78 mW19M0D7W2.5ppm
1222H824 MHz - 849 MHz178.24 mW18M9G7W2.5ppm
1322H824 MHz - 849 MHz121.06 mW18M9D7W2.5ppm
1424E1.85 GHz - 1.92 GHz461.32 mW13M6G7W2.5ppm
1524E1.85 GHz - 1.92 GHz453.94 mW18M1G7W2.5ppm
1624E1.85 GHz - 1.92 GHz395.37 mW4M53D7W2.5ppm
1724E1.85 GHz - 1.92 GHz294.44 mW18M1D7W2.5ppm
1824E1.85 GHz - 1.92 GHz463.45 mW9M29G7W2.5ppm
1924E1.85 GHz - 1.92 GHz440.55 mW38M7G7W2.5ppm
224E1.85 GHz - 1.92 GHz344.35 mW4M47D7W2.5ppm
2124E1.85 GHz - 1.92 GHz277.97 mW38M7D7W2.5ppm
2227663 MHz - 698 MHz119.95 mW4M55G7W2.5ppm
2327663 MHz - 698 MHz117.76 mW18M0G7W2.5ppm
2427663 MHz - 698 MHz101.86 mW4M53D7W2.5ppm
2527663 MHz - 698 MHz100.00 mW18M0D7W2.5ppm
2627699 MHz - 716 MHz151.01 mW4M55G7W2.5ppm
2727699 MHz - 716 MHz145.88 mW9M04G7W2.5ppm
2827699 MHz - 716 MHz129.72 mW4M54D7W2.5ppm
2927699 MHz - 716 MHz98.17 mW9M06D7W2.5ppm
327777 MHz - 787 MHz168.27 mW4M55G7W2.5ppm
3127777 MHz - 787 MHz162.93 mW9M02G7W2.5ppm
3227777 MHz - 787 MHz145.88 mW4M54D7W2.5ppm
3327777 MHz - 787 MHz139.64 mW9M04D7W2.5ppm
3427663 MHz - 698 MHz121.06 mW9M34G7W2.5ppm
3527663 MHz - 698 MHz119.40 mW19M0G7W2.5ppm
3627663 MHz - 698 MHz92.05 mW9M33D7W2.5ppm
3727663 MHz - 698 MHz74.99 mW19M0D7W2.5ppm
3827699 MHz - 716 MHz153.46 mW4M48G7W2.5ppm
3927699 MHz - 716 MHz153.11 mW14M1G7W2.5ppm
427699 MHz - 716 MHz120.78 mW4M46D7W2.5ppm
4127699 MHz - 716 MHz114.29 mW14M2D7W2.5ppm
42271.71 GHz - 1.78 GHz495.45 mW4M54G7W2.5ppm
4327171 MHz - 1.78 GHz486.41 mW18M0G7W2.5ppm
44271.71 GHz - 1.78 GHz425.60 mW4M55D7W2.5ppm
45271.71 GHz - 1.78 GHz409.26 mW18M0D7W2.5ppm
46271.71 GHz - 1.78 GHz464.51 mW28M6G7W2.5ppm
47271.71 GHz - 1.78 GHz453.94 mW43M3G7W2.5ppm
48271.71 GHz - 1.78 GHz348.34 mW43M2D7W2.5ppm
4927171 MHz - 1.78 GHz282.49 mW43M3D7W2.5ppm
5271.70 GHz - 1.71 GHz399.94 mW8M90G7W2.5ppm
51271.70 GHz - 1.71 GHz393.55 mW14M1G7W2.5ppm
52271.70 GHz - 1.71 GHz320.63 mW14M1D7W2.5ppm
53271.70 GHz - 1.71 GHz274.16 mW14M2D7W2.5ppm
54272.31 GHz - 2.31 GHz217.77 mW4M54G7W2.5ppm
55272.31 GHz - 2.31 GHz207.49 mW9M07G7W2.5ppm
56272.31 GHz - 2.31 GHz187.07 mW4M54D7W2.5ppm
57272.31 GHz - 2.31 GHz181.55 mW9M07D7W2.5ppm
58272.50 GHz - 2.69 GHz859.01 mW18M1G7W2.5ppm
59272.50 GHz - 2.69 GHz774.46 mW9M06D7W2.5ppm
6272.50 GHz - 2.69 GHz734.51 mW18M1D7W2.5ppm
61272.50 GHz - 2.57 GHz598.41 mW4M54G7W2.5ppm
62272.50 GHz - 2.57 GHz597.03 mW18M0G7W2.5ppm
63272.50 GHz - 2.57 GHz514.04 mW4M55D7W2.5ppm
64272.50 GHz - 2.57 GHz510.50 mW18M0D7W2.5ppm
65272.31 GHz - 2.31 GHz218.78 mW8M98G7W2.5ppm
66272.31 GHz - 2.31 GHz216.27 mW9M29G7W2.5ppm
67272.31 GHz - 2.31 GHz166.73 mW9M31D7W2.5ppm
68272.50 GHz - 2.69 GHz864.97 mW77M2G7W2.5ppm
69272.50 GHz - 2.69 GHz814.70 mW97M4G7W2.5ppm
7272.50 GHz - 2.69 GHz685.49 mW27M8D7W2.5ppm
71272.50 GHz - 2.69 GHz338.84 mW97M6D7W2.5ppm
72272.50 GHz - 2.57 GHz622.30 mW28M7G7W2.5ppm
73272.50 GHz - 2.57 GHz592.93 mW48M2G7W2.5ppm
74272.50 GHz - 2.57 GHz465.59 mW38M6D7W2.5ppm
75272.50 GHz - 2.57 GHz461.32 mW48M3D7W2.5ppm
76272.50 GHz - 2.69 GHz1.051962 W37M5G7W2.5ppm
77272.50 GHz - 2.69 GHz734.51 mW37M5D7W2.5ppm
78272.50 GHz - 2.57 GHz608.13 mW37M6G7W2.5ppm
79272.50 GHz - 2.57 GHz425.60 mW37M6D7W2.5ppm
8273.45 GHz - 3.55 GHz707.95 mW8M59G7W2.5ppm
81273.45 GHz - 3.55 GHz685.49 mW97M4G7W2.5ppm
82273.45 GHz - 3.55 GHz555.90 mW27M9D7W2.5ppm
83273.45 GHz - 3.55 GHz278.61 mW97M7D7W2.5ppm
84273.70 GHz - 3.98 GHz794.33 mW58M1G7W2.5ppm
85273.70 GHz - 3.98 GHz779.83 mW97M6G7W2.5ppm
86273.70 GHz - 3.98 GHz623.74 mW23M3D7W2.5ppm
87273.70 GHz - 3.98 GHz308.32 mW97M7D7W2.5ppm
889788 MHz - 798 MHz169.82 mW4M54G7W2.5ppm
899788 MHz - 798 MHz162.93 mW9M03G7W2.5ppm
99788 MHz - 798 MHz147.23 mW4M55D7W2.5ppm
919788 MHz - 798 MHz109.40 mW9M04D7W2.5ppm
929788 MHz - 798 MHz165.96 mW4M49G7W2.5ppm
939788 MHz - 798 MHz157.76 mW9M28G7W2.5ppm
949788 MHz - 798 MHz126.18 mW4M48D7W2.5ppm
959788 MHz - 798 MHz100.00 mW9M32D7W2.5ppm
969814 MHz - 824 MHz355.63 mW2M72G7W2.5ppm
979814 MHz - 824 MHz342.77 mW9M04G7W2.5ppm
989814 MHz - 824 MHz269.77 mW9M05D7W2.5ppm
999814 MHz - 824 MHz354.81 mW4M45G7W2.5ppm
19814 MHz - 824 MHz349.94 mW9M29G7W2.5ppm
1019814 MHz - 824 MHz268.53 mW4M48D7W2.5ppm
1029814 MHz - 824 MHz219.79 mW9M35D7W2.5ppm
Confidentiality
Long Term
Grant Notes
Output power listed is ERP for Parts 22, 27, and 90 for frequencies below 1GHz and EIRP for Parts 24 and 27 for frequencies above 1GHz. Output power listed for Part 90 frequency band 814 - 824 MHz is conducted. This device supports bandwidths of 1.4/3/5/10 MHz for LTE Bands 12, 5, and 26, bandwidths of 5/10 MHz for LTE Bands 17, 13, 14, and 30, bandwidths of 1.4/3/5/10/15/20 MHz for LTE Bands 66, 4, 2, and 25, and bandwidths of 5/10/15/20 MHz for LTE Bands 71, 41, and 7. This device supports 2CC aggregate bandwidths up to 20MHz for LTE Band 5 and up to 40MHz for LTE Bands 41 and 7 This device supports bandwidths of 5/10 MHz for NR FR1 Bands n14 and n30, bandwidths of 5/10/15 MHz for NR FR1 Band n12 and n70, bandwidths of 5/10/15/20 MHz for NR FR1 Bands n71, n5, and n26, bandwidths of 5/10/15/20/25/30/35/40/45 for NR FR1 Band n66, bandwidths of 5/10/15/20/25/30/35/40 for NR FR1 Band n25 and n2, bandwidths of 5/10/15/20/25/30/35/40/50 for NR FR1 Band n7, bandwidths of 10/15/20/25/30/40/50/60/70/80/90/100 for NR FR1 Band n77, bandwidths of 10/15/20/25/30/35/40/45/50/60/70/80/90/100 for NR FR1 Band n41. The highest reported SAR for stand-alone and simultaneous transmission use conditions is 1.19 W/kg and 1.59 W/kg, respectively. This device also contains functions that are not operational in U.S. Territories. This filing is only applicable for US operations. Certification for 3GPP 5G NR band n77 operations is limited to the 3.7 GHz segment under Β§27.5(m) and the 3.5 GHz segment under Β§27.5(o).

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