DLAWM-5220Wireless Microphone

Page 1 of 1 KEC Ikoma Testing Laboratory 12128 Takayama-cho Ikoma-city Nara 630-0101 Japan 1. APPENDIX Photographs of EUT Model Number: WM-5220 External photograph

Page 1 of 2 KEC Ikoma Testing Laboratory 12128 Takayama-cho Ikoma-city Nara 630-0101 Japan 1. APPENDIX Photographs of EUT Model Number: WM-5220 Internal photographs Page 2 of 2 KEC Ikoma Testing Laboratory 12128 Takayama-cho Ikoma-city Nara 630-0101 Japan - Continued -

2000.07.17 ＴＯＡ株式会社 整理 番号 ページ 1 1 AB 仕様 CD 仕様 部品番号 属性 部品番号 属性 AF 基板 C3 113406760X 1608 16V 100NF X7R(K)B0603 TAP 113406760X1608 16V 100NF X7R(K)B0603 TAP C4 113406320X 1608 50V 22PF NPO(J)U0603 TAP 113406320X1608 50V 22PF NPO(J)U0603 TAP C5 113406441X 1608 50V 220PF NPO(J)U0603 TAP 113406441X1608 50V 220PF NPO(J)U0603 TAP C6 113407956X GRM21BB30J106KE18L TAPING 113407956XGRM21BB30J106KE18L TAPING C7 113407947X GRM185B30J105KE25D TAPING 113407947XGRM185B30J105KE25D TAPING C9 113407947X GRM185B30J105KE25D TAPING 113407947XGRM185B30J105KE25D TAPING C10 113407930X GRM188B30J475KE18D TAPING 113407930XGRM188B30J475KE18D TAPING C11 113406645X 1608 50V 10NF X7R(K)U0603 TAP 113406645X1608 50V 10NF X7R(K)U0603 TAP C12 113406645X 1608 50V 10NF X7R(K)U0603 TAP 113406645X1608 50V 10NF X7R(K)U0603 TAP C13 113407956X GRM21BB30J106KE18L TAPING 113407956XGRM21BB30J106KE18L TAPING C14 113406405X C 1608 50V 100PF CH J TAPING 113406405XC 1608 50V 100PF CH J TAPING C15 113134780X 267E 4V 47MF(M) TAPING 113134780X267E 4V 47MF(M) TAPING C16 113306655X ECH-U 16V 0.0047MF(J)B5 TAPING 113306655X ECH-U 16V 0.0047MF(J)B5 TAPING C17 113406405X C 1608 50V 100PF CH J TAPING 113406405XC 1608 50V 100PF CH J TAPING C18 113407967X GRM188B11A334KA61D TAPING 113407967XGRM188B11A334KA61D TAPING C21 113406441X 1608 50V 220PF NPO(J)U0603 TAP 113406441X1608 50V 220PF NPO(J)U0603 TAP C22 113406520X C 1608 50V 1000PF CH J TAPING 113406520XC 1608 50V 1000PF CH J TAPING C24 113406306X C 1608 50V 15PF CH J TAPING 113406306XC 1608 50V 15PF CH J TAPING C25 113406306X C 1608 50V 15PF CH J TAPING 113406306XC 1608 50V 15PF CH J TAPING C26 DUMMY DUMMY C27 113406520X C 1608 50V 1000PF CH J TAPING 113406520XC 1608 50V 1000PF CH J TAPING C92 113406645X 1608 50V 10NF X7R(K)U0603 TAP 113406645X1608 50V 10NF X7R(K)U0603 TAP C93 113406645X 1608 50V 10NF X7R(K)U0603 TAP 113406645X1608 50V 10NF X7R(K)U0603 TAP C94 DUMMY DUMMY C95 DUMMY DUMMY C96 113406645X 1608 50V 10NF X7R(K)U0603 TAP 113406645X1608 50V 10NF X7R(K)U0603 TAP C97 113406405X C 1608 50V 100PF CH J TAPING 113406405XC 1608 50V 100PF CH J TAPING C106 113407956X GRM21BB30J106KE18L TAPING 113407956XGRM21BB30J106KE18L TAPING C107 113406405X C 1608 50V 100PF CH J TAPING 113406405XC 1608 50V 100PF CH J TAPING C113 113407956X GRM21BB30J106KE18L TAPING 113407956XGRM21BB30J106KE18L TAPING C114 DUMMY DUMMY 基板部品一覧表 適 用 品 番 WM-5220 承 認 検 印 作 成 2000.07.17 ＴＯＡ株式会社 整理 番号 ページ 2 2 C125 DUMMY DUMMY C126 DUMMY DUMMY C129 113406405X C 1608 50V 100PF CH J TAPING 113406405XC 1608 50V 100PF CH J TAPING C130 113406320X 1608 50V 22PF NPO(J)U0603 TAP 113406320X1608 50V 22PF NPO(J)U0603 TAP CN20 123360942X ｺﾈｸﾀ AXN320C038P(ｿｹﾂﾄ)TAPING 123360942Xｺﾈｸﾀ AXN320C038P(ｿｹﾂﾄ)TAPING D8 111082399X SML-010MT(M,N) T86TAPING GREEN111082399XSML-010MT(M,N) T86TAPING GREEN D9 111082407X SML-010LT(M,N) T86TAPING RED 111082407XSML-010LT(M,N) T86TAPING RED M1 111068256X SA575DTBR2 (ON SEMI) TAPING 111068256XSA575DTBR2 (ON SEMI) TAPING M10 111104264X SN74LVC1GU04DCKR TAPING 111104264XSN74LVC1GU04DCKR TAPING M11 111104172X SN74LVC1G04DCKR TAPING 111104172XSN74LVC1G04DCKR TAPING M12 DUMMY DUMMY M13 DUMMY DUMMY M14 111104169X SN74LVC1G66DCKR TAPING 111104169XSN74LVC1G66DCKR TAPING M15 111068421X NJM2115V TE1 GL 111068421XNJM2115V TE1 GL M16 DUMMY DUMMY Q20 111024506X KTC4075(GR) TAPING 111024506XKTC4075(GR) TAPING R6 112803612X 1608 1K(J) TAPING 112803612X1608 1K(J) TAPING R7 112803894X 1608 15K(J) TAPING 112803894X1608 15K(J) TAPING R8 112803612X 1608 1K(J) TAPING 112803612X1608 1K(J) TAPING R10 112803931X 1608 22K(J) TAPING 112803931X1608 22K(J) TAPING R15 112803968X 1608 30K(J) TAPING 112803968X1608 30K(J) TAPING R16 112803968X 1608 30K(J) TAPING 112803968X1608 30K(J) TAPING R19 112803858X 1608 10K(J) TAPING 112803858X1608 10K(J) TAPING R20 112803894X 1608 15K(J) TAPING 112803894X1608 15K(J) TAPING R21 112803913X 1608 18K(J) TAPING 112803913X 1608 18K(J) TAPING R22 112803931X 1608 22K(J) TAPING 112803931X1608 22K(J) TAPING R23 112803630X 1608 1.2K(J) TAPING 112803630X1608 1.2K(J) TAPING R25 112803894X 1608 15K(J) TAPING 112803894X1608 15K(J) TAPING R26 112803894X 1608 15K(J) TAPING 112803894X1608 15K(J) TAPING R27 112803894X 1608 15K(J) TAPING 112803894X1608 15K(J) TAPING R29 112804514X 1608 10M(J) TAPING 112804514X1608 10M(J) TAPING R30 112804514X 1608 10M(J) TAPING 112804514X1608 10M(J) TAPING R31 112804217X 1608 330K(J) TAPING 112804217X1608 330K(J) TAPING R32 112803858X 1608 10K(J) TAPING 112803858X1608 10K(J) TAPING R33 112803003X 1608 ｼﾞﾔﾝﾊﾟ- TAPING 112803003X1608 ｼﾞﾔﾝﾊﾟ- TAPING R34 DUMMY DUMMY R128 112803612X 1608 1K(J) TAPING 112803612X1608 1K(J) TAPING R132 112804192X 1608 270K(J) TAPING 112804192X1608 270K(J) TAPING 2000.07.17 ＴＯＡ株式会社 整理 番号 ページ 3 3 R146 DUMMY DUMMY R147 DUMMY DUMMY R148 112803003X 1608 ｼﾞﾔﾝﾊﾟ- TAPING 112803003X1608 ｼﾞﾔﾝﾊﾟ- TAPING R153 112803003X 1608 ｼﾞﾔﾝﾊﾟ- TAPING DUMMY R154 DUMMY 112803003X1608 ｼﾞﾔﾝﾊﾟ- TAPING R200 112803931X 1608 22K(J) TAPING 112803931X 1608 22K(J) TAPING SW20 115122196X ｽﾗｲﾄﾞSW CMS-2202TA TAPING 115122196XｽﾗｲﾄﾞSW CMS-2202TA TAPING VR2 DUMMY DUMMY X1 DUMMY DUMMY X2 DUMMY DUMMY X3 115460511X SM-26F 32.768KHZ XTAL TAPING32.768k 115460511XSM-26F 32.768KHZ XTAL TAPING32.768k CPU 基板 C28 113407956X GRM21BB30J106KE18L TAPING 113407956XGRM21BB30J106KE18L TAPING C29 113407947X GRM185B30J105KE25D TAPING 113407947XGRM185B30J105KE25D TAPING C30 113406645X 1608 50V 10NF X7R(K)U0603 TAP 113406645X1608 50V 10NF X7R(K)U0603 TAP C31 DUMMY DUMMY C32 113406405X C 1608 50V 100PF CH J TAPING 113406405XC 1608 50V 100PF CH J TAPING C33 113406405X C 1608 50V 100PF CH J TAPING 113406405XC 1608 50V 100PF CH J TAPING C34 113406283X 1608 50V 10PF NPO(J)U0603 TAP 113406283X 1608 50V 10PF NPO(J)U0603 TAP C35 113406520X C 1608 50V 1000PF CH J TAPING 113406520XC 1608 50V 1000PF CH J TAPING C36 113406520X C 1608 50V 1000PF CH J TAPING 113406520XC 1608 50V 1000PF CH J TAPING C37 113406520X C 1608 50V 1000PF CH J TAPING 113406520XC 1608 50V 1000PF CH J TAPING C38 113406520X C 1608 50V 1000PF CH J TAPING 113406520XC 1608 5…

Text truncated - open the document above for the full version.

A-007-06-C Page 1 of 28 KEC Ikoma Testing Laboratory 12128 Takayama-cho Ikoma-city Nara 630-0101 Japan KANSAI ELECTRONIC INDUSTRY DEVELOPMENT CENTER HEAD OFFICE IKOMA TESTING LABORATORY 6-8-7 NISHITENMA 12128 TAKAYAMA-CHO KITA-KU OSAKA 530-0047 JAPAN IKOMA-CITY NARA 630-0101 JAPAN Corporate Juridical Person TEST REPORT Report No. A-007-06-C Date: 5 May 2006 This test report is to certify that the tested device properly complies with the requirements of: FCC Rules and Regulations Part 74 Subpart H : Low Power Auxiliary Stations. All the tests necessary to show compliance to the requirements were performed and these results met the specifications of requirement. The results of this report should not be construed to imply compliance of equipment other than that, which was tested. Unless the laboratory permission, this report should not be copied in part. 1. Applicant Company Name : TOA Corporation Mailing Address : 2-1 Takamatsu-cho, Takarazuka City, Hyogo Pref. 665-0043 Japan 2. Identification of Tested Device Type of Device : Low Power Auxiliary Stations Kind of Equipment Authorization : : DoC : Certification : Verification FCC ID : DLAWM-5220 Device Name : Wireless Microphone Trade Name : TOA Model Number : WM-5220 Serial Number : No.1 : Production : Pre-production : Prototype Date of Manufacture : February 2006 3. Test Items and Procedure : Measurement of RF Power Output (Substitution Method) : Modulation Characteristics : Emission Bandwidth : Measurement of Field Strength of Spurious Radiation (Substitution Method) : Measurement of Spurious Emission at Antenna Terminal : Frequency Stability Measurement Above all tests were performed under: FCC Part 2 Sec2.1046, Sec2.1047, Sec2.1049, Sec2.1051, Sec2.1053, Sec2.1055 and Sec2.1057. : without deviation, : with deviation (details are found inside of this report) 4. Date of Test Receipt of Test Sample : 7 February 2006 Condition of Test Sample : : Damage is not found on the set. : Damage is found on the set. (Details are described in this report) Test Completed on : 26 April 2006 Seiichi Izumi General Manager / Ikoma Testing Laboratory A-007-06-C Page 2 of 28 KEC Ikoma Testing Laboratory 12128 Takayama-cho Ikoma-city Nara 630-0101 Japan Table of Contents 0. LABORATORY ACCREDITATION AND MEASUREMENT UNCERTAINTY .............................. 3 0.1. Laboratory Accreditation............................................................................................................................. 3 0.2. Measurement Uncertainty ........................................................................................................................... 3 1. CERTIFICATION OF THE COMPLIANCE......................................................................................... 3 2. GENERAL INFORMATION ................................................................................................................... 4 2.1. Product Description..................................................................................................................................... 4 2.2. Description for Equipment Authorization ................................................................................................... 5 2.3. Test Facility ................................................................................................................................................. 5 3. TESTED SYSTEM .................................................................................................................................... 6 3.1. Test Mode .................................................................................................................................................... 6 3.2. Characterization and condition of EUT System .......................................................................................... 6 3.3. Block Diagram of EUT System................................................................................................................... 6 3.4. List of EUT System ..................................................................................................................................... 6 4. RF POWER OUTPUT .............................................................................................................................. 7 4.1. Reference Rule and Specification ............................................................................................................... 7 4.2. Test Procedure ............................................................................................................................................. 7 4.3. Test Configuration ....................................................................................................................................... 7 4.4. Test Results ................................................................................................................................................. 8 5. MODULATION CHARACTERISTICS ................................................................................................. 9 5.1. Reference Rule and Specification ............................................................................................................... 9 5.2. Test Results ................................................................................................................................................. 9 6. EMISSION BANDWIDTH..................................................................................................................... 12 6.1. Reference Rule and Specification ............................................................................................................. 12 6.2. Test Procedure ........................................................................................................................................... 12 6.3. Test Configuration ...............................................................................................................................…

Text truncated - open the document above for the full version.

A-007-06-C Page 1 of 1 1. APPENDIX Photographs of EUT System Configuration Tested Item ・Field Strength of Spurious Radiation X axis Y axis KEC Ikoma Testing Laboratory 12128 Takayama-cho Ikoma-city Nara 630-0101 Japan