Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
Label Placement This label has been verified to be difficult to remove when applied to the actual device.
T.YAMAJI BCONFIDENTIAL Refer to theRefer to the outside ofoutside of IT16 the frame A B C D E F All Rights Reserved SYM DATE E/C CONTENTS E/C NO.SIGN C MATERIAL FINISH SCALE SHEET DRWG NO. DESIGNED FOR F A3 12 3 45 6 7 8 A B C D E OMRON Corporation TOLERANCES UNLESS SPECIFIED DESIGNED CHECKED 1/1 A 2:1 APPROVED カコウズ,インサツ ラベル V640-HAM13 the frame 5842091-8 S2D4 PROCESS DRWG,PRINT LABEL 2026-Jan-23 [UNIT : mm] DIMENSION (mm) IT16 0<X≦3 ±0.300 3<X≦6 ±0.375 6<X≦10 ±0.450 10<X≦18 ±0.550 18<X≦30 ±0.650 30<X≦50 ±0.800 PARTS NO. / 品番PARTS NAME / 品名TYPE / 形式 5842309-7LABEL ASSY / ラベル アツシ-V640-HAM13 3.PART TO BE PRINTED IS SPECIFIED BELOW. 3.被印刷物は下記のとおりとする。 NOTE 1.PRINTED WITH A BRADY LABEL PRINTER (MODEL: BBP16). THE INK RIBBON IS DAI NIPPON PRINTING TR3370 (WHITE) OF PARTS NO. 3670552-8. 注1.ブレイディ社製ラベルプリンター BBP16 にて印刷のこと。 インクリボンは 大日本印刷社製 TR3370(白色) 品番:3670552-8 とする。 2. TYPEFACE SHALL BE SPECIFIED BELOW. 2.文字の書体は下表による。 CHARACTERS 文字 TYPEFACE 書体 CHARACTER HEIGHT 文字高さ OMRON DESIGNATED TYPEFACE 指定書体 h=1.6 V640-HAM13 OMRON ERGOTHIC B オムロンエルゴシック ボールド h=2.0 AMPLIFER UNIT OMRON ERGOTHIC R オムロンエルゴシック レギュラー h=1.35 SOURCE:24V 0.4A OMRON ERGOTHIC R オムロンエルゴシック レギュラー h=1.5 SEE IEC 60417-5031 (2002-10) IEC 60417-5031(2002-10)による MODEL:V640-HAM13 OMRON ERGOTHIC R NARROW 2 オムロンエルゴシック レギュラー 長体2 h=1.4 IC:850J-V64HAM13 OMRON ERGOTHIC R NARROW 2 オムロンエルゴシック レギュラー 長体2 h=1.4 FCC ID:E4EV640HAM13 OMRON ERGOTHIC R NARROW 2 オムロンエルゴシック レギュラー 長体2 h=1.4 NCC MARK NCCマーク DESIGNATED TYPEFACE 指定書体 h=3.0 CCABXXLPXXXXTX OMRON ERGOTHIC R オムロンエルゴシック レギュラー h=1.5 KC MARK KCマーク DESIGNATED TYPEFACE 指定書体 h=5.0 R-R-OMR-V64XXX OMRON ERGOTHIC R NARROW 2 オムロンエルゴシック レギュラー 長体2 h=1.5 LOT No. OMRON ERGOTHIC R オムロンエルゴシック レギュラー h=1.2 DDMYY OMRON ERGOTHIC R オムロンエルゴシック レギュラー h=2.4 CE MARK CEマーク DESIGNATED TYPEFACE 指定書体 h=5.0 UKCA MARK UKCAマーク DESIGNATED TYPEFACE 指定書体 h=5.0 CROSSED-OUT DUSTBIN MARK クロスドアウト・ダストピン・マーク DESIGNATED TYPEFACE 指定書体 h=7.0 OMRON Corporation DESIGNATED TYPEFACE 指定書体 h=1.1 Kyoto, 600-6530 JANPAN OMRON ERGOTHIC R NARROW 1 オムロンエルゴシック レギュラー 長体1 h=1.0 MADA IN JAPAN OMRON ERGOTHIC R NARROW 1 オムロンエルゴシック レギュラー 長体1 h=1.0 PARTS NO. 品番 PARTS NAME 品名 TYPE 形式 MATERIAL 材質 COLOR 色 LAMINATION ラミネート加工 5842224-4 LABEL ラベル V640-HAM13 T0.05 PET WHT BLACK 黒 YES あり 4.THE ABBREVIATION "HAM13" MUST BE DISPLAYED IN THE QR CODE AT THE INDICATED POSITION. THE CONTENTS OF THE DISPLAY SHALL BE “HAM13, ____________”. THE NUMBER OF DIGITS TO BE DISPLAYED SHOULD BE “5 DIGITS, 12 DIGITS”, AND BLANK AREAS SHOULD BE DISPLAYED WITH “_” (UNDERLINE). 4.QRコードで省略形式「HAM13」を図示の位置に表示すること。 表示内容は「HAM13,____________」とする。表示桁数は「5桁,12桁」とし、 空欄部は「_」(アンダーライン)で表示すること。 5.THE CONTENTS OF THE LOT NO. ARE AS FOLLOWS. DD: DAY (1~31 DAYS: 01~31) M: MONTH (JANUARY ~ SEPTEMBER: 1 ~ 9, OCTOBER : X, NOVEMBER : Y, DECEMBER : Z) YY: YEAR (LAST TWO DIGITS OF THE YEAR: 00~99) 5.LOT No.の内容は次のとおりとする。 DD:日(1~31日:01~31) M:月(1~9月:1~9、10月:X、11月:Y、12月:Z) YY:年(西暦下2桁:00~99) 6.THE TWO-DOTTED LINE INDICATES THE OUTLINE SHAPE OF THE PRINTING PARTS. 6.二点鎖線は被印刷物の外形形状を示す。 7.WHEN FINISHING, NO OUTLINE LINES REMAIN. 7.仕上リ時、外形線が残らないこと。 8.MATERIAL TO BE ADHERED: ABS+PC 8.被着体の材質は ABS+PCである。 9. THE PARTS NO. FOR LABEL ASSY IS BELOW. 9. ラベル アツシーのアッシー品番は下記のとおり。 (NOTE 6/注6) OUTLINE DUSTBIN MARK クロスドアウト・ダストピン・マーク UKCA MARK UKCAマーク 「:」を揃えること ALIGNING ":" 外形形状 CROSSED-OUT QR CODE/QRコード (NOTE 4/注4) LOT No. (NOTE 5/注5) (UK/イギリス) (KOREA/韓国) KCマーク KC MARK (TAIWAN/台湾) NCCマーク NCC MARK CE MARK CEマーク (EU/欧州) 0.3 10.9 0.3 30.4 48 3 8.2 23 5.5 35.75 41.9 3 27.5 22 41.5 1 47 3.6 4.7 18.5 17.8 17.8 20.4 8.6 14.4 15.1 17.9 11.8 4.7 23 8 6 4.5 10.2 1
UL Japan, Inc. Ise EMC Lab 4383-326 Asama-cho, Ise-shi, Mie 516-0021 Japan T:: +81.596.24.8999 / F:: +81.596.24.8124 / W:: japan.ul.com April 6, 2026 FCC ID: E4EV640HAM13 To whom it may concern, We, UL Japan, Inc, hereby declare that RFID Amplifier Unit, model: V640-HAM13 (FCC ID: E4EV640HAM13) of Omron Corporation is exempt from RF exposure SAR evaluation as its output power meets the exclusion limits stated in KDB 447498D01(v06). KDB 447498D01(v06) has the following exclusion for portable devices: The SAR test exclusion thresholds for below 100 MHz at test separation distances ≤ 50 mm are determined by step c) 2): c) For frequencies below 100 MHz, the following may be considered for SAR test exclusion: 1) For test separation distances > 50 mm and < 200 mm, the power threshold at the corresponding test separation distance at 100 MHz in step b) is multiplied by [1 + log(100 / f(MHz))] 2) For test separation distances ≤ 50 mm, the power threshold determined by the equation in c) 1) for 50 mm and 100 MHz is multiplied by ½ Numeric exemption threshold: Pth step c) [mW]: 2223.98 Radio specification and use-case for this deveice are below: f [MHz]:0.1342 d [mm]:200 *1) Maximum average output power [mW]:250 f [MHz]: Operating frequency d [mm]: Minimum separation distance Maximum average output power [mW]: burst-average power This is less than Pth step c), so SAR test is exemption for this device. *1) Although the separation distance from the antenna is 30 cm in the specifications of the product, it was calculated as 20 cm. Even taking into account the tolerance, this device can be satisfied with the limits. Thank you for your attention to this matter. Satofumi Matsuyama Engineer
Test Report No. 16230618H-A-R1 Page 1 of 25 UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 Japan / +81-596-24-8999 RADIO TEST REPORT Test Report No. 16230618H-A-R1 Customer Omron Corporation Description of EUT RFID Amplifier Unit Model Number of EUT Amplifier: V640-HAM13 Antenna: V640-HS63 FCC ID E4EV640HAM13 Test Regulation FCC Part 15 Subpart C Test Result Complied Issue Date April 15, 2026 Remarks - Representative test engineer Approved by Yuta Moriya Engineer Satofumi Matsuyama Engineer CERTIFICATE 5107.02 The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan, Inc. There is no testing item of "Non-accreditation". Report Cover Page - Form-ULID-003532 (DCS:13-EM-F0429) Issue# 26.0 Test Report No. 16230618H-A-R1 Page 2 of 25 UL Jap an, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 Japan / +81-596-24-8999 ANNOUNCEMENT REVISION HISTORY Revision Test Report No. Date Page Revised Contents -(Original) 16230618H-A April 1, 2026 - 1 16230618H-A-R1 April 15, 2026 Correction of the devic e name for V640-HS63 on the cover page and in Clause 2.1: from "Amplifier" to "Antenna" 1 16230618H-A-R1 April 15, 2026 Addition of the LIMS ID: 142008 to the equipment list of APPENDIX 2. This test report shall not be reproduced in full or partial, without the written approval of UL Jap an, Inc. The results in this report appl y only to the sample tested. (Laboratory was not involved in sampling.) This sample tested is in compliance with the limits of the above re gulation. The test results in this test report are traceable to the national or international standards. This test report must not be used by the customer to claim produc t certification, approval, or endo rsement b y the A2LA accreditation body. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirement s. (if applicable) The all test items in this test report are conducted b y UL Japan, Inc. Ise EMC Lab. The opinions and the interpretations to the result of the description in this report are outside scope s whe re UL Japan, Inc. has been accredite d. The information provided b y the customer for this report is identified in SECTION 1. The laboratory is not responsible for information provided by the customer which can impa ct the validit y of the results. For any test report referred in this report, the latest version (including any revisions) is always referred to. If the latest version is a revision, it replaces the previous version. See the table below for revision s and version s. Test Report No. 16230618H-A-R1 Page 3 of 25 UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 Japan / +81-596-24-8999 Reference: Abbreviations (Including words undescribed in this report) A2LA The American Association for Laboratory Accreditation IEC International Electrotechnical Commission AC Alternating Current IEEE Institute of Electrical and Electronics Engineers AFH Adaptive Frequency Hopping IF Intermediate Frequency AM Amplitude Modulation ILAC International Laboratory Accreditation Conference Amp, AMP Amplifier ISED Innovation, Science and Economic Develo pment Canada ANSI American National Standards Institute ISO International Organization for Standardization Ant, ANT Antenna JAB Japan Accreditation Board AP Access Point LAN Local Area Network ASK Amplitude Shift Keying LIMS Laboratory Information Management System Atten., ATT Attenuator MCS Modulation and Coding Scheme AV Average MRA Mutual Recognition Arrangement BPSK Binary Phase-Shift Keying N/A Not Applicable BR Bluetooth Basic Rate NIST National Institute of Standards and Technology BT Bluetooth NS No signal detect. BT LE Bluetooth Low Energy NSA Normalized Site Attenuation BW BandWidth NVLAP National Voluntary Laboratory Accreditation Pro gram Cal Int Calibration Interval OBW Occupied Band Width CCK Complementary Code Keying OFDM Orthogonal Frequency Division Multiplexing Ch., CH Channel P/M Power meter CISPR Comite International Special des Perturbations Radioelectriques PCB Printed Circuit Board CW Continuous Wave PER Packet Error Rate DBPSK Differential BPSK PHY Physical Layer DC Direct Current PK Peak D-factor Distance factor PN Pseudo random Noise DFS Dynamic Frequency Selection PRBS Pseudo-Random Bit Sequence DQPSK Differential QPSK PSD Power Spectral Density DSSS Direct Sequence Spread Spectrum QAM Quadrature Amplitude Modulation EDR Enhanced Data Rate QP Quasi-Peak EIRP, e.i.r.p. Equivalent Isotropically Radiated Power QPSK Quadri-Phase Shift Keying EMC ElectroMagnetic Compatibility RBW Resolution Band Width EMI ElectroMagnetic Interference RDS Radio Data System EN European Norm RE Radio Equipment ERP, e.r.p. Effective Radiated Power RF Radio Frequency EU European Union RMS Root Mean Square EUT Equipment Under Test RSS Radio Standards Specifications Fac. Factor Rx Receiving FCC Federal Communications Commission SA, S/A Spectrum Analyzer FHSS Frequency Hopping Spread Spectrum SG Signal Generator FM Frequency Modulation SVSWR Site-Voltage Standing Wave Ratio Freq. Frequency TR Test Receiver FSK Frequency Shift Keying Tx Transmitting GFSK Gaussian Frequency-Shift Keying VBW Video BandWidth GNSS Global Navigation Satellite System Vert. Vertical GPS Global Positioning System WLAN Wireless LAN Hori. Horizontal WPT Wireless Power Transfer ICES Interference-Causing Equipment Standard - - Test Report No. 16230618H-A-R1 Page 4 of 25 UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 Japan / +81-596-24-8999 CONTENTS PAGE SECTION 1: Customer Information ....................................................................................... 5 SECTION 2: Equipment Under Test (EUT) ........................................................................... 5 SECTION 3: Test Summary ....................................................................................…
Text truncated - open the document above for the full version.
2895 Greenspoint Pkwy Suite 200 · Hoffman Estates, Illinois, 60169 · United States
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 0.1342 MHz - 0.1342 MHz | - |

Carrier ID Reader/Writer (RFID)
Equipment Class
DXX - Part 15 Low Power Communication Device Transmitter
Carrier ID Reader/Writer (RFID)
Equipment Class
DXX - Part 15 Low Power Communication Device Transmitter
Radio Frequency Identification System (RFID System)
Equipment Class
DXX - Part 15 Low Power Communication Device Transmitter
Radio Frequency Identification System (RFID System)
Equipment Class
DXX - Part 15 Low Power Communication Device Transmitter
Radio Frequency Identification System (RFID System)
Equipment Class
DXX - Part 15 Low Power Communication Device Transmitter