
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
QuieTek Corporation Page: 5 of 9 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Attachment 3: EUT Detailed Photographs M/N: DUOSCAN T2500 HiD (1) EUT Photo (2) EUT Photo QuieTek Corporation Page: 6 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (3) EUT Photo (4) EUT Photo QuieTek Corporation Page: 7 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (5) EUT Photo (6) EUT Photo QuieTek Corporation Page: 8 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (7) EUT Photo (8) EUT Photo QuieTek Corporation Page: 9 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (9) EUT Photo (10) EUT Photo QuieTek Corporation Page: 10 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (11) EUT Photo (12) EUT Photo QuieTek Corporation Page: 11 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (13) EUT Photo QuieTek Corporation Page: 12 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (14) EUT Photo QuieTek Corporation Page: 13 of 13 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 M/N: MRS-2500DLF (15) EUT Photo (16) EUT Photo
QuieTek Corporation Page: 1 of 16 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Test Report For Applicant : MICROTEK INTERNATIONAL INC. Equipment Type : Image Scanner Model : DUOSCAN T2500 HiD, MRS-2500DLF FCC ID : EF9DUOSCANT2500HID Report No. : 004H059FI QuieTek Corporation Page: 2 of 16 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Test Report Certification QuieTek Corporation No.75-1, Wang-Yeh Valley, Yung-Hsing, Chiung-Lin, Hsin-Chu County, Taiwan, R.O.C. Tel : 886-3-592-8858, Fax: 886-3-592-8859 E-Mail : [email protected] Accredited by NIST(NVLAP), VCCI, BSMI, DNV, TUV Applicant : MICROTEK INTERNATIONAL INC. Address : No.6, Industry East Rd.3, Science-Based Industrial Park, Hsin-Chu, Taiwan, R.O.C. Equipment Type : Image Scanner Model : DUOSCAN T2500 HiD, MRS-2500DLF Measurement Standard : CISPR 22/1994 Measurement Procedure : ANSI C63.4 /1992 FCC ID : EF9DUOSCANT2500HID Operation Voltage : 120VAC/60Hz Classification : Class B Test Result : Complied Test Date : May 30, 2000 Report No. : 004H059FI The Test Results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. This report must not be used to claim product endorsement by NVLAP any agency of the U.S. Government Documented by: Zoe Lee Test Engineer: Peter Wu Approved: Kevin Wang QuieTek Corporation Page: 3 of 16 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 TABLE OF CONTENTS Description Page 1. GENERAL INFORMATION........................................................................................................................................4 1.1 EUT Description................................................................................................................................................................4 1.2 Tested System Details........................................................................................................................................................5 1.3 EUT Configuration............................................................................................................................................................8 1.4 EUT Exercise Software.....................................................................................................................................................9 1.5 Test performed...................................................................................................................................................................9 1.6 Test Facility......................................................................................................................................................................10 2. CONDUCTED EMISSION..........................................................................................................................................11 2.1 Test Equipment List.........................................................................................................................................................11 2.2 Test Setup.........................................................................................................................................................................11 2.3 Limits................................................................................................................................................................................11 2.4 Test Procedure..................................................................................................................................................................12 2.5 Test Results......................................................................................................................................................................12 3. RADIATED EMISSION...............................................................................................................................................13 3.1 Test Equipment................................................................................................................................................................13 3.2 Test Setup.........................................................................................................................................................................13 3.3 Limits................................................................................................................................................................................14 3.4 Test Procedure..................................................................................................................................................................14 3.5 Test Results......................................................................................................................................................................14 4. EMI REDUCTION METHOD DURING COMPLIANCE TESTING................................................................15 5. ATTACHMENT.............................................................................................................................................................16 ATTACHMENT 1: SUMMARY OF TEST RESULTS ATTACHMENT 2: EUT TEST PHOTOGRAPHS ATTACHMENT 3: EUT DETAILED PHOTOGRAPHS REFERENCE LABORATORY OF LICENSE QuieTek Corporation Page: 4 of 16 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 1. General Information 1.1 EUT Description Applicant : MICROTEK INTERNATIONAL INC. Address : No.6, Industry East Rd.3, Science-Based Industrial Park, Hsin-Chu, Taiwan, R.O.C. Equipment Type : Image Scanner Model : DUOSCAN T2500 HiD, MRS-2500DLF FCC ID : EF9DUOSCANT2500HID Maximum Resolution : 2500dpi*2500dpi Data Cable : (1) 1394 Cable, Shielde…
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QuieTek Corporation Page: 1 of 4 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Attachment 2: EUT Test Setup Photos Front View of Conducted Test (Mode 1—Link PC, W/SCSI Cable) Back View of Conducted Test (Mode 1—Link PC, W/SCSI Cable) QuieTek Corporation Page: 2 of 4 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Front View of Conducted Test (Mode 2—Link PC, W/1394 Cable) Back View of Conducted Test (Mode 2—Link PC, W/1394Cable) QuieTek Corporation Page: 3 of 4 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Front View of Radiated Test (Mode 1—Link PC, W/SCSI Cable) Back View of Radiated Test (Mode 1—Link PC, W/SCSI Cable) QuieTek Corporation Page: 4 of 4 FCC Report No.: 004H059FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Front View of Radiated Test (Mode 2—Link PC, W/1394 Cable) Back View of Radiated Test (Mode 2—Link PC, W/1394 Cable)
29 Sweeteman Lane · West Milford, New Jersey · United States
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15B | - | - |

Image Scanner
Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Image Scanner
Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Video Sender
Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Image Scanner
Equipment Class
JBP - Part 15 Class B Computing Device Peripheral
Image Scanner With USB & 1994 Interface
Equipment Class
JBP - Part 15 Class B Computing Device Peripheral