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MQ4CFE100Ethernet PC LAN Card

Abocom Systems Inc
Ethernet PC LAN Card - FCC ID MQ4CFE100 - Abocom Systems Inc
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Application Details

Equipment Class
JBC - Part 15 Class B Computing Device/Personal Computer
Date of Grant
Jan 17, 2000
Application Purpose
Original Equipment
Date of Application
Dec 28, 1999
Equipment Note
Ethernet PC LAN Card
Company
Abocom Systems Inc
Country
Taiwan

Documents & Files

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Users Manual

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Block Diagram

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Cover Letter(s)

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External Photos

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ID Label/Location Info

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

External Photos

QuieTek CorporationPage: 1 of 6 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Attachment 3 : EUT Detail Photographs (1)EUT Photo (2)EUT Photo QuieTek CorporationPage: 2 of 6 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 (3)EUT Photo (4)EUT Photo QuieTek CorporationPage: 3 of 6 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 (5)EUT Photo (6)EUT Photo QuieTek CorporationPage: 4 of 6 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 (7)EUT Photo (8)EUT Photo QuieTek CorporationPage: 5 of 6 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 (9)EUT Photo (10)EUT Photo QuieTek CorporationPage: 6 of 6 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 (11)EUT Photo (12)EUT Photo

Test Report

QuieTek CorporationPage: 1 of 15 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Test Report For Applicant: AboComSystems,Inc. Equipment Type: CompactFlash Size 10/100 Fast Ethernet LAN Card Model: CFE100 FCC ID: MQ4CFE100 Report No. : 99CH010FI QuieTek CorporationPage: 2 of 15 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Test Report Certification Q u i e Te k C o r p o r a t i o n No.75-1, Wang-Y eh Valley, Yung-Hsing, Chiung-Lin, Hsin-Chu County, Taiwan, R.O.C. Tel : 886-3-592-8858, Fax: 886-3-592-8859 E- Mail : [email protected] Accredited by NIST(NVLAP), VCCI, BSMI, DNV, TUV Applicant:AboCom Systems, Inc. Address:1F, No.21, R&D Road II, Science-Based Industrial Park, Hsin-Chu , Taiwan, R.O.C. Equipment Type:CompactFlash Size 10/100 Fast Ethernet LAN Card Model:CFE100 FCC ID.:MQ4CFE100 Measurement Standard:CISPR 22/1994 Measurement Procedure:ANSI C63.4 /1992 Operation Voltage:DC 3.3V/ 5V Classification:Class B Test Result:Complied Test Date:December 6, 1999 Report No.:99CH010FI The Test Results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. This report must not be used to claim product endorsement by NVLAP any agency of the U.S. Government Documented by: Erin LanTest Engineer: Sean ChangApproved: Gene Chang QuieTek CorporationPage: 3 of 15 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 TA B L E O F C O N T E N T S DescriptionPage 1.GENERAL INFORMATION..................................................................................................................................4 1.1EUT Description........................................................................................................................................................4 1.2Tested System Details.................................................................................................................................................5 1.3EUT Configur ation.....................................................................................................................................................7 1.4EUT Exercise Software..............................................................................................................................................8 1.5Test performed............................................................................................................................................................8 1.6Test Facility................................................................................................................................................................9 2.CONDUCTED EMISSION ...................................................................................................................................10 2.1Test Equipment List..................................................................................................................................................10 2.2Test Setup.................................................................................................................................................................10 2.3Limits.......................................................................................................................................................................10 2.4Test Procedure..........................................................................................................................................................11 2.5Test Results..............................................................................................................................................................11 3.RADIATED EMISSION ........................................................................................................................................12 3.1Test Equipment.........................................................................................................................................................12 3.2Test Setup.................................................................................................................................................................12 3.3Limits.......................................................................................................................................................................13 3.4Test Procedure..........................................................................................................................................................13 3.5Test Results..............................................................................................................................................................13 4.EMI REDUCTION METHODDURING COMPLIANCE TESTING.............................................................14 5.ATTACHMENT.....................................................................................................................................................15 ATTACHMENT 1: SUMMARY OF TEST RESULTS ATTACHMENT 2: EUT TEST PHOTOGRAPHS ATTACHMENT 3: EUT DETAILED PHOTOGRAPHS QuieTek CorporationPage: 4 of 15 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 1.General Information 1.1EUT Description Applicant: AboCom Systems,Inc. Address: 1F, No.21, R&DRoadII,Science-BasedIndustrialPark, Hsin-Chu , Taiwan, R.O.C. Equipment Type: CompactFlash Size 10/100 Fast Ethernet LAN Card Model: CFE100 FCC ID: MQ4CFE100 Operation Voltage: DC 3.3V/ 5V Remark : 1. The EUT is a CompactFlash Size 10/100 Fast Ethernet LAN Card. 2. Both transmission speed were tested individually. 3. QuieTek had verified both construction and function in typical operation, then shown in this test report. QuieTek CorporationPage: 5 of 15 FCC Report No.: …

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Test Report

QuieTek CorporationPage: 1 of 9 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Attachment 1 : Summary of Test Results The test results in the emission were performed according tothe requirements of measurement standardand process. QuieTek Corporationis assumed full responsibilityfor the accuracyand completeness of these measurements. The test data of the emission are listed as the attached data. All the tests were carried out with the EUT in normal operation, which was defined as: Mode 1 : 100Mbps Mode 2 : 10Mbps The EUT passed all the tests. The uncertainty is calculated in accordance with NAMAS NIS 81, The total uncertainty for this test is as follows: ΓΏ Emission Test β€’ Uncertainty in the Conducted Emission Test:< Β± 2.0 dB β€’ Uncertainty in the field strength measured: < Β± 4.0 dB QuieTek CorporationPage: 2 of 9 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 CONDUCTED EMISSION DATA Date of Test:December 6, 1999EUT :Fast Ethernet LAN Card Test Mode :Mode 1Detect Mode :Quasi-Peak & Average Frequency Cable LISN Reading Level Measurement Level Limits Loss Factor Line1 Line1 MHz dB dB dBuV dBuV dBuV ======================================================================== *0.201 0.02 0.10 54.46 54.58 63.55 0.270 0.03 0.10 49.72 49.85 61.13 0.338 0.04 0.10 49.15 49.29 59.26 0.471 0.06 0.10 45.71 45.87 56.50 4.787 0.20 0.17 36.32 36.69 56.00 15.921 0.33 0.37 36.09 36.79 60.00 Average: 0.201 0.02 0.10 43.40 43.52 53.57 0.269 0.03 0.10 42.60 42.73 51.15 0.338 0.04 0.10 38.80 38.94 49.25 0.471 0.06 0.10 38.70 38.86 46.50 4.787 0.20 0.17 31.40 31.77 46.00 15.921 0.33 0.37 33.00 33.70 50.00 Remarks : 1. β€œ * ” means that this data is the worst emission level. QuieTek CorporationPage: 3 of 9 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 CONDUCTED EMISSION DATA Date of Test:December 6, 1999EUT :Fast Ethernet LAN Card Test Mode :Mode 1Detect Mode :Quasi-Peak & Average Frequency Cable LISN Reading Level Measurement Level Limits Loss Factor Line2 Line2 MHz dB dB dBuV dBuV dBuV ======================================================================== *0.202 0.02 0.10 56.23 56.35 63.54 0.271 0.03 0.10 50.07 50.20 61.08 0.472 0.06 0.10 46.19 46.35 56.47 0.6070.07 0.10 39.49 39.66 56.00 4.855 0.20 0.17 36.81 37.18 56.00 16.186 0.33 0.38 36.86 37.57 60.00 Average: 0.202 0.02 0.10 44.00 44.12 53.53 0.271 0.03 0.10 42.40 42.53 51.09 0.472 0.06 0.10 38.70 38.86 46.48 0.607 0.07 0.10 35.50 35.67 46.00 4.855 0.20 0.17 31.90 32.27 46.00 16.186 0.33 0.38 33.40 34.11 50.00 Remarks : 1. β€œ * ” means that this data is the worst emission level. QuieTek CorporationPage: 4 of 9 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 CONDUCTED EMISSION DATA Date of Test:December 6, 1999EUT :Fast Ethernet LAN Card Test Mode :Mode 2Detect Mode :Quasi-Peak & Average Frequency Cable LISN Reading Level Measurement Level Limits Loss Factor Line1 Line1 MHz dB dB dBuV dBuV dBuV ======================================================================== *0.204 0.02 0.10 53.67 53.79 53.45 0.271 0.03 0.10 50.74 50.87 51.09 0.406 0.05 0.10 46.58 46.73 47.74 0.540 0.07 0.10 40.07 40.24 46.00 3.974 0.19 0.16 36.64 36.99 46.00 16.174 0.33 0.37 35.50 36.20 50.00 Average: 0.204 0.02 0.10 41.90 42.02 53.45 0.271 0.03 0.10 42.30 42.43 51.09 0.4060.05 0.10 37.90 38.05 47.73 0.540 0.07 0.10 32.80 32.97 46.00 3.974 0.19 0.16 29.20 29.55 46.00 16.174 0.33 0.37 32.70 33.40 50.00 Remarks : 1. β€œ * ” means that this data is the worst emission level. QuieTek CorporationPage: 5 of 9 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 CONDUCTED EMISSION DATA Date of Test:December 6, 1999EUT :Fast Ethernet LAN Card Test Mode :Mode 2Detect Mode :Quasi-Peak & Average Frequency Cable LISN Reading Level Measurement Level Limits Loss Factor Line2 Line2 MHz dB dB dBuV dBuV dBuV ======================================================================== *0.203 0.02 0.10 56.19 56.31 63.47 0.268 0.03 0.10 51.10 51.23 61.18 0.337 0.04 0.10 50.48 50.62 59.27 0.404 0.05 0.10 47.12 47.27 57.78 0.473 0.06 0.10 46.68 46.84 56.47 15.907 0.33 0.37 35.47 36.17 60.00 Average: 0.203 0.02 0.10 42.90 43.02 53.49 0.268 0.03 0.10 42.70 42.83 51.18 0.337 0.04 0.10 38.60 38.74 49.28 0.404 0.05 0.10 38.90 39.05 47.77 0.473 0.06 0.10 38.30 38.46 46.46 15.908 0.33 0.37 32.30 33.00 50.00 Remarks : 1. β€œ * ” means that this data is the worst emission level. QuieTek CorporationPage: 6 of 9 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 RADIATED EMISSION DATA Date of Test:December 6, 1999EUT :Fast Ethernet LAN Card Test Mode :Mode 1Test Site : No.2 Open Test Site Freq. Cable Probe PreAMP Reading Measurement Margin Limit Ant Turn Loss Factor Level Horizontal MHz dB dB/m dB dBuV dBuV/m dB dBuV/m cm deg ======================================================================== 125.000 2.07 11.84 0.00 1.99 15.90 14.10 30.00 401 135 150.000 2.31 10.72 0.00 5.3618.39 11.61 30.00 401 184 *175.000 2.55 9.76 0.00 11.01 23.32 6.68 30.00 401 142 200.000 2.78 9.30 0.00 10.56 22.64 7.36 30.00 401 142 225.000 3.03 9.83 0.00 8.42 21.28 8.72 30.00 401 83 300.000 3.76 13.36 0.00 12.35 29.46 7.54 37.00 401 54 Remarks: 1.All Readings below 1GHz are Quasi-Peak, above are average value. 2.β€œ * ”, means this data is the worst emission level. 3.Emission Level = Reading Level + Antenna Factor + Cable loss QuieTek CorporationPage: 7 of 9 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 RADIATED EMISSION DATA Date of Test:December 6, 1999EUT :Fast Ethernet LAN Card Test Mode :Mode 1Test Site : No.2 Open Test Site Freq. Cable Probe PreAMP Reading Measurement Margin Limit Ant Turn Loss Factor Level Vertical MHz dB d…

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Test Setup Photos

QuieTek CorporationPage: 1 of 4 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Attachment 2: EUT Test Setup Photos Front View of Conducted Test (Mode 1) Back View of Conducted Test (Mode 1) QuieTek CorporationPage: 2 of 4 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Front View of Conducted Test (Mode 2) Back View of Conducted Test (Mode 2) QuieTek CorporationPage: 3 of 4 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Front View of Radiated Test (Mode 1) Back View of Radiated Test (Mode 1) QuieTek CorporationPage: 4 of 4 FCC Report No.: 99CH010FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test LaboratoryRev.1 Front View of Radiated Test (Mode 2) Back View of Radiated Test (Mode 2)

Contact Information

Applicant

Harry Huang(Manager)
[email protected]886-3-758-0777Fax: 886-3-758-0099

Technical Contact

Safety & Compliance ConsultingRichard Mullen
[email protected](973) 728-5141

29 Sweetman Lane Β· West Milford, New Jersey Β· United States

Test Firm

DEKRA Testing and Certification Co., Ltd.Sky Hsu
[email protected]886-2-86013788Fax: 886-2-86013789

Technical Specifications

#Rule PartsFrequency RangePower Output
115B--

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