MQ4FE1KMXErthernet PC LAN Card

Abocom Systems Inc

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Application Details

Equipment Class: JBP - Part 15 Class B Computing Device Peripheral
Date of Grant: Mar 26, 2000
Application Purpose: Original Equipment
Date of Application: Mar 07, 2000
Equipment Note: Erthernet PC LAN Card
Company: Abocom Systems Inc
Country: Taiwan

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

External Photos

QuieTek Corporation Page: 1 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Attachment 3 : EUT Detail Photographs (1) EUT Photo (2) EUT Photo QuieTek Corporation Page: 2 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (3) EUT Photo QuieTek Corporation Page: 3 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (4) EUT Photo QuieTek Corporation Page: 4 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 (5) EUT Photo

Test Report

QuieTek Corporation Page: 1 of 16 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Test Report For Applicant : AboCom Systems, Inc. Equipment Type : 10/100 Fast Ethernet PC Card Model : FE1KMX FCC ID : MQ4FE1KMX Report No. : 002H018FI QuieTek Corporation Page: 2 of 16 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Test Report Certification QuieTek Corporation No.75-1, Wang-Yeh Valley, Yung-Hsing, Chiung-Lin, Hsin-Chu County, Taiwan, R.O.C. Tel : 886-3-592-8858, Fax: 886-3-592-8859 E-Mail : [email protected] Accredited by NIST(NVLAP), VCCI, BSMI, DNV, TUV Applicant : AboCom Systems, Inc. Address : 1F, No.21, R&D Road II, Science-Based Industrial Park, Hsin-Chu , Taiwan, R.O.C. Equipment Type : 10/100 Fast Ethernet PC Card Model : FE1KMX FCC ID. : MQ4FE1KMX Measurement Standard : CISPR 22/1994 Measurement Procedure : ANSI C63.4 /1992 Operation Voltage : DC 5V Classification : Class B Test Result : Complied Test Date : February 18, 2000 Report No. : 002H018FI The Test Results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. This report must not be used to claim product endorsement by NVLAP any agency of the U.S. Government Documented by: Zoe Lee Test Engineer: Sean Chang Approved: Gene Chang QuieTek Corporation Page: 3 of 16 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 TABLE OF CONTENTS Description Page 1. GENERAL INFORMATION............................................................................................................................4 1.1 EUT Description.................................................................................................................................................4 1.2 Tested System Details..........................................................................................................................................5 1.3 EUT Configuration..............................................................................................................................................8 1.4 EUT Exercise Software.......................................................................................................................................9 1.5 Test performed....................................................................................................................................................9 1.6 Test Facility......................................................................................................................................................10 2. CONDUCTED EMISSION.............................................................................................................................11 2.1 Test Equipment List...........................................................................................................................................11 2.2 Test Setup.........................................................................................................................................................11 2.3 Limits...............................................................................................................................................................11 2.4 Test Procedure...................................................................................................................................................12 2.5 Test Results.......................................................................................................................................................12 3. RADIATED EMISSION.................................................................................................................................13 3.1 Test Equipment.................................................................................................................................................13 3.2 Test Setup.........................................................................................................................................................13 3.3 Limits...............................................................................................................................................................14 3.4 Test Procedure...................................................................................................................................................14 3.5 Test Results.......................................................................................................................................................14 4. EMI REDUCTION METHOD DURING COMPLIANCE TESTING..........................................................15 5. ATTACHMENT..............................................................................................................................................16 ATTACHMENT 1: SUMMARY OF TEST RESULTS ATTACHMENT 2: EUT TEST PHOTOGRAPHS ATTACHMENT 3: EUT DETAIL PHOTOGRAPHS QuieTek Corporation Page: 4 of 16 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 1. General Information 1.1 EUT Description Applicant : AboCom Systems, Inc. Address : 1F, No.21, R&D Road II, Science-Based Industrial Park, Hsin-Chu , Taiwan, R.O.C. Equipment Type : 10/100 Fast Ethernet PC Card Model : FE1KMX FCC ID : MQ4FE1KMX Operation Voltage : DC 5V Remark : 1. The EUT is a 10/100 Fast Ethernet PC Card. 2. QuieTek had verified both construction and function in typical operation, then shown in this test report. QuieTek Corporation Page: 5 of 16 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 1.2 Tested System Details The types for all equipment, plus descriptions of all cables used in the tested system (including inserted cards ) are: 1.2.1…

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Test Setup Photos

QuieTek Corporation Page: 1 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Attachment 2: EUT Test Setup Photos Front View of Conducted Test (Mode 1) Back View of Conducted Test (Mode 1) QuieTek Corporation Page: 2 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Front View of Conducted Test (Mode 2) Back View of Conducted Test (Mode 2) QuieTek Corporation Page: 3 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Front View of Radiated Test (Mode 1) Back View of Radiated Test (Mode 1) QuieTek Corporation Page: 4 of 4 FCC Report No.: 002H018FI Accredited Lab. of NVLAP(NIST) NVLAP Lab. Code : 200347-0 EMC Test Laboratory Rev.1 Front View of Radiated Test (Mode 2) Back View of Radiated Test (Mode 2)