OEOTLSR9528ADK88DB92 Development Board

Telink Proprietary and Confidential 1 TLSR9528ADK88D-User Guide Telink Proprietary and Confidential 2 Product introduction General introduction The TLSR9528ADK88D supports standards and industrial alliance specifications including Bluetooth 5.3 basic rate (BR), enhanced data rate (EDR), low energy (LE), indoor positioning, Bluetooth LE Mesh coexistence interface. The TLSR9528 combines the features and functions needed for high quality wireless audio and wearable. Package Material list 1x TLSR9528ADK88D 1x Burning EVK for TLSR9528ADK88D, Including the Dupont line 1x USB cable 1x 2.4G rod antenna Telink Proprietary and Confidential 3 TLSR9528ADK88D Introduction Keyfeature Clock sources: 24 MHz & 32.768 kHz crystals and 24 MHz & 32 kHz embedded RC oscillators Up to 12 GPIOs (QFN24)/6 GPIOs (WLCSP). All digital IOs can be used as GPIOS. SPI/I2C/UART with hardware flow control and 7816 protocol support 4-channel DMIC (Digital Mic) and 2-channel AMIC (Analog Mic) 2-channel I2S with 24-bit 48 kHz sample rate SoC: TLSR9528A USB Crystal FLASH MIC Reset Audio KEY Telink Proprietary and Confidential 4 TLSR9528ADK88D Introduction-Continued POWER and SWS connection TDO GND TDI 3V3 GND GND BEVK SWS VBUS TCK TMS NC 3V3 SWS GND 3V3 GND SWM Telink Proprietary and Confidential 5 TLSR9528ADK88D Introduction -Continued RF port The TLSR9528ADK88D RF interface is a 3.5mm SMA plug. Therefore, it can be directly connected to the instrument for RF performance testing, and it can also be connected to the 2.4G rubber duckantenna for radiation testing RF SMA Telink Proprietary and Confidential 6 TLSR9528ADK88D Introduction -Continued Reset button Reset Telink Proprietary and Confidential 7 TLSR9528ADK88D Introduction -Continued Button Key Telink Proprietary and Confidential 8 TLSR9528ADK88D Introduction -Continued LED light LED Caution Any Changes or modifications not expressly approved by the party responsible for compliance could void the user’s authority to operate the equipment. This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) This device must accept any interference received, including interference that may cause undesired operation. Note: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications. However, there is no guarantee that interference will not occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be determined by turning the equipment off and on, the user is encouraged to try to correct the interference by one or more of the following measures: —Reorient or relocate the receiving antenna. —Increase the separation between the equipment and receiver. —Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. —Consult the dealer or an experienced radio/TV technician for help. FCC Radiation Exposure Statement: This equipment complies with FCC radiation exposure limits set forth for an uncontrolled environment .This equipment should be installed and operated with minimum distance 20cm between the radiator& your body.

Attestation Letter Telink Semiconductor (Shanghai) Co., Ltd. ADD: Bldg 3, No. 1500, Zuchongzhi Rd, Zhangjiang Hi-tech Park, Shanghai, China TEL: +862120281118 FAX: +862150388081 E-mail: [email protected] FEDERAL COMMUNICATIONS COMMISSION Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 Date: 2023-04-0 6 To Whom It May Concern, The chip installed in our product B92 Development Board (model name: TLSR9528ADK88D, FCC ID: OEOTLSR9528ADK88D), which supports Bluetooth 5.3 basic rate (BDR), enhanced data rate (EDR), low energy (LE), ZigBee, 6LoWPAN, 2.4 GHz proprietary and Wi-Fi functions. But for this product, it only activates BDR/EDR(π/4 DQPSK)/BLE(1Mbps and 2Mbps) functions, the other functions are disabled by using the software. Please contact me if there is need for any additional clarification or information. Best Regards, Sincerely Yours, Signature: Typed or Printed Name: Xiang Li Title: Manager

Telink Semiconductor (Shanghai) Co., Ltd. CFR 47 §2.911(d)(5)(i)(ii) Attestation Letter Attestation Letter Date: 04/06/2023 FEDERAL COMMUNICATIONS COMMISSIONS Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 Ref: Attestation Statements CFR 47 §2.911(d)(5)(i)(ii) Filing FCC ID: OEOTLSR9528ADK88D Telink Semiconductor (Shanghai) Co., Ltd. (“the applicant”) certifies that the equipment for which authorization is sought is not “covered” equipment prohibited from receiving an equipment authorization pursuant to section 2.903 of the FCC rules. Telink Semiconductor (Shanghai) Co., Ltd. (“the applicant”) certifies that as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, Signature Contact Person: Xiang Li Title: Manager Company Name & Address: Telink Semiconductor (Shanghai) Co., Ltd./ Bldg 3, No. 1500, Zuchongzhi Rd, Zhangjiang Hi-tech Park, Shanghai, China

QA-FR-170-B Telink Semiconductor (Shanghai) Co., Ltd. ADD: Bldg 3, No. 1500, Zuchongzhi Rd, Zhangjiang Hi-tech Park, Shanghai, China TEL: +862120281118 FAX: +862150388081 E-mail: [email protected] FCC Authorization Date: 2023-04-06 FEDERAL COMMUNICATIONS COMMISSION Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 Subject: Agent Authorization To whom it may concern: We , Telink Semiconductor (Shanghai) Co., Ltd., Hereby authorizes China Certification ICT Co., Ltd (Dongguan) to act on its behalf in all matters relating to application for Equipment authorization, including the signing of all documents relating to these matters. All acts carried out by China Certification ICT Co., Ltd (Dongguan) on our behalf shall have the same effect as our own action. We, the undersigned, hereby certify that we are not subject to a denial of federal benefits, that includes FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 862. This authorization is valid until further written notice from the applicant. Sincerely Yours, Client’s signature Printed Name: Xiang Li Title: Manager

QA-FR-171-A Telink Semiconductor (Shanghai) Co., Ltd. ADD: Bldg 3, No. 1500, Zuchongzhi Rd, Zhangjiang Hi-tech Park, Shanghai, China TEL: +862120281118 FAX: +862150388081 E-mail: [email protected] FCC Confidential Authorization Date: 2023-04-0 6 FEDERAL COMMUNICATIONS COMMISSIONS Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 Subject: Confidentiality Request regarding application for certification of FCC ID: OEOTLSR9528ADK88D In accordance with Sections 0.457 and 0.459 of the Commission’s Rules, (Telink Semiconductor (Shanghai) Co., Ltd.) hereby requests long-term confidential treatment of information accompanying this application as outlined below: Block Diagram Schematics Operation Description The above materials contain proprietary and confidential information not customarily released to the public. The public disclosure of these materials provides unjustified benefits to its competitors in the market. Sincerely, Signature: Printed Name: Xiang Li Title: Manager

EXHIBIT B - EUT EXTERNAL PHOTOGRAPHS EUT

FCC ID：OEOTLSR9528ADK88D

EXHIBIT C - EUT INTERNAL PHOTOGRAPHS Uncover Chip ANT

China Certification ICT Co., Ltd (Dongguan) Report No.: CR230416675-00B Page 52 of 52 5. RF EXPOSURE EVALUATION 5.1 Applicable Standard FCC §15.247 (i) Systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy levels in excess of the Commission's guidelines. See §1.1307(b)(1) of this chapter. 5.2 Procedure According to §1.1307(b)(3)(i) (C) Or using Table 1 and the minimum separation distance (R in meters) from the body of a nearby person for the frequency (f in MHz) at which the source operates, the ERP (watts) is no more than the calculated value prescribed for that frequency. For the exemption in Table 1 to apply, R must be at least λ/2π, where λ is the free-space operating wavelength in meters. If the ERP of a single RF source is not easily obtained, then the available maximum time-averaged power may be used in lieu of ERP if the physical dimensions of the radiating structure(s) do not exceed the electrical length of λ/4 or if the antenna gain is less than that of a half-wave dipole (1.64 linear value). Table 1 to § 1.1307(b)(3)(i)(C) - Single RF Sources Subject to Routine Environmental Evaluation RF Source frequency (MHz) Threshold ERP (watts) 0.3-1.34 1,920 R 2 . 1.34-30 3,450 R 2 /f 2 . 30-300 3.83 R 2 . 300-1,500 0.0128 R 2 f. 1,500-100,000 19.2R 2 . 5.3 Measurement Result Radio Frequency (MHz) λ/2 Π (mm) Distance (mm) Exemption ERP (mW) Maximum Conducted Power including Tune-up Tolerance (dBm) Antenna Gain (dBi) ERP dBm mW BLE 2402-248019.88 200 768 2 1.4 1.25 1.33 BDR/EDR 2402-248019.88 200 768 8 1.4 7.25 5.31 Result: The device compliant the MPE-Based Exemption at 20cm distances. ===== END OF REPORT =====

SPECIFICATION FOR APPROVAL 2.4G rubber duck Antenna KXWX-2.4G-Z Customer: Telink Product description: Uni Link’s part number: Issue Date: Note: 2019/11/07 2 400-2500MHz,SMA male Product parameters Model KXWX-433E-4 Main Technical Specifications Frequency Range（MHz） 2400-2500 Bandwidth（MHz） 100 VSWR ≤1.5 Gain（dBi） 1.4 Max Input power（W） 50 Input Impedance（Ω） 50 Polarization Type Vertical Antenna Size（mm） 110+/-3 Connector Type SMA MALE Specifications 1.Electrical Characteristic ITEM TEST CONDITION SPECIFICATION 1 VSWR Using PROTEK A333 networking analyzer to measure Antenna S1 VSWR characteristics PIC 1 2 Smith Chart Using PROTEK A333 networking analyzer to measure Antenna S1 Smith Chart characteristics PIC 2 3 Gain Response Using PROTEK A333 networking analyzer to measure Antenna S1 Gain Response characteristics 2. MECHANICAL CHARACTERISTICS 1 BENDING TEST Put load 120g at the end of the wire, fixed joints, swaying test at an angle of 60 degrees , test features after 1000 times No sign of damage 2 STRENG TEST 15 pounds of static load applied to the bottom of the actinomycetes end for one minute. No sign of damage 3 PULLING FORCE Pull test with a tension meter between connector and wire . No sign of damage 4 VIBRATION TEST the X-axis direction for 120 minutes, and the Y-axis direction 120 minutes, the Z-axis direction 240 minutes as vibration testing of 1.1mm amplitude and 33.30Hz/sec of frequency No sign of damage 3. DURABILIT 1 SAIT SPRAY TEST All characteristic range is 30% of the initial value 2 HEAT TEST 50 +/- 2 °C for 96 hours, after keep in normal condition for 30mim the to test. 3 HUMIDITY TEST 40+2°C 90-95%RH for 96hours, after keep in normal condition for 30mim the to test. 4 COLD TEST -40+2°C for 96hours, after keep in normal condition for 30mim the to test. PIC 1 4.Antenna parameters Frequency ID 1 2 3 4 5 6 7 8 9 10 11 Frequency (MHz) 2400. 0 2410. 0 2420. 0 2430. 0 2440. 0 2450. 0 2460. 0 2470. 0 2480. 0 2490. 0 2500. 0 Efficiency (dBi) -2.12-2.14-2.18-2.36-2.49-2.48-2.50-2.44-2.25-2.01-1.81 Gain (dBi) 1.33 1.40 1.331.06 0.75 0.44 0.43 0.57 0.78 0.99 1.26 Efficiency (%) 61.44 61.13 60.51 58.05 56.37 56.54 56.24 56.96 59.58 62.95 65.89 Directivity (dB) 3.45 3.54 3.51 3.42 3.24 2.92 2.93 3.01 3.03 3.00 3.07 Peak Gain Position (Theta) 86.00 86.00 87.00 83.00 84.00 84.00 63.00 68.00 69.00 72.00 74.00 Peak Gain Position (Phi) 339.00 340.00 340.00 87.00 89.00 90.00 92.00 298.00 246.00 299.00 302.00 Efficiency ThetaPol (%) 60.67 60.39 59.78 57.32 55.62 55.78 55.52 56.27 58.90 62.23 65.12 Efficiency PhiPol (%) 0.77 0.73 0.73 0.74 0.75 0.75 0.72 0.68 0.68 0.72 0.77 Upper Hem. Efficiency (%) 38.07 37.52 36.95 35.45 34.44 34.64 34.41 34.71 36.02 37.78 39.23 Lower Hem. Efficiency (%) 23.37 23.60 23.56 22.61 21.93 21.90 21.83 22.25 23.56 25.16 26.66 VER7 T90(H)Roundness 0.97 0.90 0.93 0.94 0.91 0.96 0.98 0.97 1.01 1.06 1.09 Gain 15deg (dBi) E1(XZ)Width of the lobes 59.00 57.00 63.00 63.00 65.00 66.00 66.00 65.00 65.00 66.00 69.00 E1(XZ)Front to back ratio 7.79 7.90 7.78 7.51 7.00 6.45 6.23 6.04 5.70 5.32 5.12 E2(YZ)Width of the lobes 58.00 57.00 56.00 56.00 58.00 61.00 61.00 61.00 63.00 62.00 61.00 E2(YZ)Front to back ratio 6.66 6.87 6.87 6.63 6.20 5.72 5.64 5.63 5.54 5.58 5.80 Maximum benefit axial ratio (P) 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 Elevation 10 degrees worst (big) axis ratio (P) 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 1.50 Hc(XY)Width of the lobes 360.00 360.00 360.00 360.00 360.00 360.00 360.00 360.00 360.00 360.00 360.00 Hc(XY)Front to back ratio 0.68 0.70 0.72 0.70 0.69 0.65 0.50 0.41 0.39 0.43 0.47 Empty 2440.0MHz Total(E1-XZ ), Max= 0.34dBi 2440.0MHz Total(E2-YZ ), Max= 0.75dBi Total(H-XY ), Max= 0.58dBi, CirD=0.91 2480.0MHz Total(E1-XZ ), Max= 0.46dBi 2480.0MHz Total(E2-YZ ), Max= 0.69dBi Total(H-XY ), Max= 0.21dBi, CirD=1.01 2400.0MHz Total(E1-XZ), Max= 0.67dBi 2400.0MHz Total(E2-YZ), Max= 0.94dBi Total(H-XY), Max= 1.25dBi, CirD=0.97

TEST REPORT Applicant: Telink Semiconductor (Shanghai) Co., Ltd. Address: Bldg 3, No. 1500, Zuchongzhi Rd, Zhangjiang Hi-tech Park, Shanghai, China FCC ID: OEOTLSR9528ADK88D Product Name: B92 Development Board Standard(s): 47 CFR Part 15, Subpart C(15.247) ANSI C63.10-2013 KDB 558074 D01 15.247 Meas Guidance v05r02 The above equipment has been tested and found compliant with the requirement of the relative standards by China Certification ICT Co., Ltd (Dongguan) Report Number: CR230416675-00B Date Of Issue: 2023/5/11 Reviewed By: Sun Zhong Title: Manager Test Laboratory: China Certification ICT Co., Ltd (Dongguan) No. 113, Pingkang Road, Dalang Town, Dongguan, Guangdong, China Tel: +86-769-82016888 China Certification ICT Co., Ltd (Dongguan) Report No.: CR230416675-00B Page 2 of 52 Test Facility The Test site used by China Certification ICT Co., Ltd (Dongguan) to collect test data is located on the No. 113, Pingkang Road, Dalang Town, Dongguan, Guangdong, China. The lab has been recognized as the FCC accredited lab under the KDB 974614 D01 and is listed in the FCC Public Access Link (PAL) database, FCC Registration No. : 442868, the FCC Designation No. : CN1314. The lab has been recognized by Innovation, Science and Economic Development Canada to test to Canadian radio equipment requirements, the CAB identifier: CN0123. Declarations China Certification ICT Co., Ltd (Dongguan) is not responsible for the authenticity of any test data provided by the applicant. Data included from the applicant that may affect test results are marked with a triangle symbol “▲”. Customer model name, addresses, names, trademarks etc. are not considered data. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This report cannot be reproduced except in full, without prior written approval of the Company. This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0. This report may contain data that are not covered by the accreditation scope and shall be marked with an asterisk “★”. China Certification ICT Co., Ltd (Dongguan) Report No.: CR230416675-00B Page 3 of 52 CONTENTS T EST FACILITY .......................................................................................................................................... 2 DECLARATIONS .......................................................................................................................................... 2 DOCUMENT REVISION HISTORY .......................................................................................... 5 1. GENERAL INFORMATION .................................................................................................... 6 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ....................................................... 6 1.2 DESCRIPTION OF TEST CONFIGURATION ........................................................................................... 7 1.2.1 EUT Operation Condition: ............................................................................................................................. 7 1.2.2 Support Equipment List and Details .............................................................................................................. 7 1.2.3 Support Cable List and Details ...................................................................................................................... 7 1.2.4 Block Diagram of Test Setup ......................................................................................................................... 8 1.3 MEASUREMENT UNCERTAINTY .......................................................................................................... 9 2. SUMMARY OF TEST RESULTS .......................................................................................... 10 3. REQUIREMENTS AND TEST PROCEDURES .................................................................. 11 3.1 AC LINE CONDUCTED EMISSIONS .................................................................................................... 11 3.1.1 Applicable Standard ..................................................................................................................................... 11 3.1.2 EUT Setup.................................................................................................................................................... 12 3.1.3 EMI Test Receiver Setup ............................................................................................................................. 12 3.1.4 Test Procedure ............................................................................................................................................. 13 3.1.5 Corrected Amplitude & Margin Calculation ................................................................................................ 13 3.2 RADIATED SPURIOUS EMISSIONS ...................................................................................................... 14 3.2.1 Applicable Standard ..................................................................................................................................... 14 3.2.2 EUT Setup.................................................................................................................................................... 14 3.2.3 EMI Test Receiver & Spectrum Analyzer Setup ......................................................................................... 15 3.2.4 Test Procedure ............................................................................................................................................. 15 3.2.5 Corrected Amplitude & Margin Calculation ................................................................................................ 15 3.3 20 DB EMISSION BANDWIDTH ...................................................................................................…

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EXHIBIT D - TEST SETUP PHOTOGRAPHS Conducted Emissions Front View Conducted Emissions Side View Radiated Emission Below 1GHz View Radiated Emission Above 1GHz View