PRDHS04Wireless gaming headset

Acrox Technologies Co., Ltd.

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Application Details

Equipment Class: DXX - Part 15 Low Power Communication Device Transmitter
Date of Grant: Mar 17, 2021
Application Purpose: Original Equipment
Date of Application: Mar 17, 2021
Equipment Note: Wireless gaming headset
Frequency Range: 2406.00000000 - 2478.00000000
Company: Acrox Technologies Co., Ltd.
Country: Taiwan

Documents & Files

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

External Photos

Reference No.: WTX21X02013098W Page 2 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX21X02013098W Page 3 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX21X02013098W Page 4 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTX21X02013098W Page 5 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7

ID Label/Location Info

Reference No.: WTX21X02013098W Page 1 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Internal Photos

Reference No.: WTX21X02013098W Page 6 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTX21X02013098W Page 7 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 2 Solder Board-Component View 3 Reference No.: WTX21X02013098W Page 8 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Solder Board-Component View 4 Solder Board-Component View 5 Reference No.: WTX21X02013098W Page 9 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Antenna View

Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 47 TEST REPORT Reference No. .................... : WTX21X02013098W FCC ID ................................ : PRDHS04 Applicant ........................... : Acrox Technologies Co., Ltd. Address.............................. : 4F., No.89, Minshan St., Neihu Dist.,Taipei City 114, Taiwan Product Name ................... : Wireless gaming headset Test Model. ........................ : 100025012/NHT Standards .......................... : FCC Part 15.249 Date of Receipt sample .... : Feb. 21, 2021 Date of Test........................ : Feb. 21, 2021 to Mar. 15, 2021 Date of Issue ..................... : Mar. 15, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Mike Shi / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX21X02013098W Page 2 of 47 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................5 1.3 TEST METHODOLOGY .............................................................................................................................................5 1.4 TEST FACILITY .......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE .................................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 10 3. ANTENNA REQUIREMENTS .............................................................................................................................. 11 3.1 STANDARD APPLICABLE ....................................................................................................................................... 11 3.2 TEST RESULT........................................................................................................................................................ 11 4. RADIATED EMISSIONS ....................................................................................................................................... 12 4.1 STANDARD APPLICABLE ....................................................................................................................................... 12 4.2 TEST PROCEDURE ................................................................................................................................................. 12 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 15 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 15 5. OUT OF BAND EMISSIONS ................................................................................................................................. 32 5.1 STANDARD APPLICABLE ....................................................................................................................................... 32 5.2 TEST PROCEDURE ................................................................................................................................................. 32 5.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 32 6. EMISSION BANDWIDTH ..................................................................................................................................... 41 6.1 STANDARD APPLICABLE ....................................................................................................................................... 41 6.2 TEST PROCEDURE ................................................................................................................................................. 41 6.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 41 7. CONDUCTED EMISSIONS .................................................................................................................................. 44 7.1 TEST PROCEDURE ................................................................................................................................................. 44 7.2 BASIC TEST SETUP BLOCK DIAGRAM ................................................................................................................... 44 7.3 TEST REC…

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Test Setup Photos

Reference No.: WTX21X02013098W Page 10 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX21X02013098W Page 11 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX21X02013098W Page 12 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****