Q78-ZTEMF50WCDMA uFi Hot Spot

Q78-ZTEMF50, label placement

Q78-ZTEMF50 internal photos

No.2011TAR577 Page 1 of 12 ©Copyright. All rights reserved by TMC Beijing. TEST REPORT No. 2011TAR577 for ZTE Corporation WCDMA uFi/Hotspot Model Name: MF50 with FCC ID : Q78-ZTEMF50 Hardware Version: d30B Software Version: EN_ZTE_MF50TVV1.0.0B01 Issued Date: 2011-10-26 Note: The test results in this test report relate only to the devices specified in this report. This report shall not be reproduced except in full without the written approval of TMC Beijing. Test Laboratory: DAR accreditation (DIN EN ISO/IEC 17025): No. DGA-PL-114/01-02 FCC 2.948 Listed: No.733176 IC O.A.T.S listed: No.6629A-1 TMC Beijing, Telecommunication Metrology Center of Ministry of Industry and Information Technology No. 52, Huayuan Bei Road, Haidian District, Beijing, P. R. China 100191 Tel:+86(0)10-62304633 , Fax:+86(0)10-62304633 Email:[email protected]. www.emcite.com No.2011TAR577 Page 2 of 12 ©Copyright. All rights reserved by TMC Beijing. CONTENTS 1. TEST LABORATORY ......................................................................................................................... 3 1.1. TESTING LOCATION .................................................................................................................... 3 1.2. TESTING ENVIRONMENT ........................................................................................................... 3 1.3. PROJECT DATA .............................................................................................................................. 3 1.4. SIGNATURE ..................................................................................................................................... 3 2. CLIENT INFORMATION ................................................................................................................... 4 2.1. APPLICANT INFORMATION ....................................................................................................... 4 2.2. MANUFACTURER INFORMATION ............................................................................................ 4 3. EQUIPMENT UNDER TEST (EUT) AND ANCILLARY EQUIPMENT (AE) ............................. 4 3.1. ABOUT EUT ..................................................................................................................................... 4 3.2. INTERNAL IDENTIFICATION OF EUT USED DURING THE TEST .................................... 4 4. REFERENCE DOCUMENTS ............................................................................................................. 5 4.1. REFERENCE DOCUMENTS FOR TESTING ............................................................................. 5 5. LABORATORY ENVIRONMENT ..................................................................................................... 6 6. SUMMARY OF TEST RESULTS ....................................................................................................... 7 7. TEST EQUIPMENTS UTILIZED ...................................................................................................... 8 ANNEX A: MEASUREMENT RESULTS .................................................................................................. 9 No.2011TAR577 Page 3 of 12 ©Copyright. All rights reserved by TMC Beijing. 1. Test Laboratory 1.1. Testing Location Company Name: TMC Beijing, Telecommunication Metrology Center of MIIT Address: No 52, Huayuan beilu, Haidian District, Beijing, P. R. China Postal Code: 100191 Telephone: 00861062304633 Fax: 00861062304633 1.2. Testing Environment Normal Temperature: 15-35°C Relative Humidity: 20-75% 1.3. Project data Testing Start Date: Sep 08, 2011 Testing End Date: Sep 25, 2011 1.4. Signature Liu Baodian (Prepared this test report) Sun Xiangqian (Reviewed this test report) Lu Bingsong Deputy Director of the laboratory (Approved this test report) No.2011TAR577 Page 4 of 12 ©Copyright. All rights reserved by TMC Beijing. 2. Client Information 2.1. Applicant Information Company Name: ZTE Corporation Address /Post: #68 Zijin Hua Road, Nanjing, Jiangsu Province, P. R. China City: Nan Jing Postal Code: 210012 Country: China Telephone: +86-25-52878232 Fax: +86-25-68897541 2.2. Manufacturer Information Company Name: ZTE Corporation Address /Post: #68 Zijin Hua Road, Nanjing, Jiangsu Province, P. R. China City: Nan Jing Postal Code: 210012 Country: China Telephone: +86-25-52878232 Fax: +86-25-68897541 3. Equipment Under Test (EUT) and Ancillary Equipment (AE) 3.1. About EUT Description WCDMA uFi/Hotspot Model Name MF50 FCC ID Q78-ZTEMF50 Frequency GSM 850MHz; PCS 1900MHz ;WCDMA850/1900MHz Antenna Internal Note: Components list, please refer to documents of the manufacturer; it is also included in the original test record of Telecommunication Metrology Center of MII of People’s Republic of China. 3.2. Internal Identification of EUT used during the test EUT ID* SN or IMEI HW Version SW Version EUT1 868380000005329 d30B EN_ZTE_MF50TVV1.0.0B01 *EUT ID: is used to identify the test sample in the lab internally. 3.3. Internal Identification of AE used during the test AE ID* Description SN Note AE1 Battery / / AE2 Travel Adapter / / AE3 USB Cable / / *AE ID: is used to identify the test sample in the lab internally. No.2011TAR577 Page 5 of 12 ©Copyright. All rights reserved by TMC Beijing. AE1 Model Li3715T42P3h654251 Manufacturer ZTE Capacitance 1500mAh Nominal Voltage 3.7V AE2 Model STC-A22O50I700USBA-Z Manufacturer RUIDE Length of DC line / AE3 Model / Manufacturer ZTE Length of headset line 120cm *AE ID: is used to identify the test sample in the lab internally. 4. Reference Documents 4.1. Reference Documents for testing The following documents listed in this section are referred for testing. Reference Title Version FCC Part 15, Subpart B Radio frequency devices July 10, 2008 Edition ANSI C63.4 Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz 2003 No.2011TAR577 Page 6 of 12 ©Copyright. All rights reserved…

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MF50 FCC test setup photo 1． Radiated Spurious Emission 2． Conducted Emission 3． Radiated Emission