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RIZUNV0310Electronic Ballast

ALKI Electronics Technology Corporation
Electronic Ballast - FCC ID RIZUNV0310 - ALKI Electronics Technology Corporation
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Application Details

Equipment Class
8CC - Part 18 Consumer Device
Date of Grant
Nov 04, 2003
Application Purpose
Original Equipment
Date of Application
Nov 04, 2003
Equipment Note
Electronic Ballast
Frequency Range
0.04000000 - 0.05000000
Company
ALKI Electronics Technology Corporation
Country
Taiwan

Documents & Files

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Users Manual

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External Photos

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ID Label/Location Info

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Internal Photos

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Schematics

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Test Report

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Test Setup Photos

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

External Photos

External Photos EUT of FEB-2-26-UNV-H-S-A - Front View Ballast of FEB-2-26-UNV-H-S-A - Rear View EUT of FEB-1-26-UNV-H-S-A - Front View Ballast of FEB-1-26-UNV-H-S-A – Rear View EUT of FEB-2-13-UNV-H-S-A - Front View EUT of FEB-2-13-UNV-H-S-A – Rear View EUT of FEB-1-13-UNV-H-S-A - Front View EUT of FEB-1-13-UNV-H-S-A – Rear View

ID Label/Location Info

ID Label Label FCC ID: RIZUNV0310FEB-2-26-UNV-H-S-A/ FEB-1-26-UNV-H-S-A/FEB-2-13-UNV-H-S-A/ FEB-1-13-UNV-H-S-A

ID Label/Location Info

ID Label/Location Label Location Information Specifications: Text is Black or white in color and is left justified. Labels are printed in indelible ink on permanent adhesive backing or silk-screened onto the EUT or shall be affixed at a conspicuous location on the EUT. Refer to the below arrow. FEB-2-26-UNV-H-S-A FEB-1-26-UNV-H-S-A FEB-2-13-UNV-H-S-A FEB-1-13-UNV-H-S-A

Internal Photos

Internal Photos EUT of FEB-2-26-UNV-H-S-A - Uncovered View EUT of FEB-2-26-UNV-H-S-A - PCB View (1) EUT of FEB-2-26-UNV-H-S-A - PCB View (2) EUT of FEB-1-26-UNV-H-S-A - Uncovered View EUT of FEB-1-26-UNV-H-S-A - PCB View (1) EUT of FEB-1-26-UNV-H-S-A - PCB View (2) EUT of FEB-2-13-UNV-H-S-A - Uncovered View EUT of FEB-2-13-UNV-H-S-A - PCB View (1) EUT of FEB-2-13-UNV-H-S-A - PCB View (2) EUT of FEB-1-13-UNV-H-S-A - Uncovered View EUT of FEB-1-13-UNV-H-S-A - PCB View (1) EUT of FEB-1-13-UNV-H-S-A - PCB View (2)

Test Report

Note: This test report is specially limited to the use of the above client company and the product model only. It may not be duplicated without prior written consent of Bay Area Compliance Laboratory Corporation. This report must not be used by the client to claim product endorsement by NVLAP or any agency of the U.S. Government. FCC ID TEST REPORT For ALKI Electronics Technology Corporation 7F, No 48, Lane 10, Ji-Hu Road, Nei-Hu Dist, Taipei, Taiwan, R. O. C FCC ID: RIZUNV0310FEB-2-26-UNV-H-S-A / FEB-1-26- UNV-H-S-A /FEB-2-13-UNV-H-S-A/FEB-1-13-UNV-H-S-A September 23, 2003 This Report Concerns: Original Report Equipment Type: Electronic Ballast Test Engineer: Jandy Su Report Number RSZ03090206 Test Date: September 22, 2003 Reviewed By: Prepared By: Bay Area Compliance Lab Corp. ShenZhen Suite C, 41-D Electronics Science & Technology Building, No. 2070 Shennanzhong Rd ShenZhen, Guandong 518031, P.R. China Tel: (755) 83296449 Fax: (755) 83273756 ALKI Electronics Technology Corporation FCC ID: RIZUNV0310FEB-2-26-UNV-H-S-A / FEB-1-26-UNV-H-S-A /FEB-2-13-UNV-H-S-A/FEB-1-13-UNV-H-S-A Report # RSZ03090206.doc Page 2 of 14 FCC ID Report TABLE OF CONTENTS 1 - GENERAL INFORMATION..................................................................................................................................3 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ..............................................................................3 1.2 OBJECTIVE.............................................................................................................................................................3 1.3 RELATED SUBMITTAL(S)/GRANT(S).......................................................................................................................3 1.4 TEST METHODOLOGY............................................................................................................................................3 1.5 TEST FACILITY.......................................................................................................................................................3 1.6 TEST EQUIPMENT LIST AND DETAILS.....................................................................................................................4 1.7 EQUIPMENT UNDER TEST (EUT) ...........................................................................................................................4 1.8 EXTERNAL I/O CABLING........................................................................................................................................4 2 - SYSTEM TEST CONFIGURATION.....................................................................................................................5 2.1 JUSTIFICATION.......................................................................................................................................................5 2.2 SCHEMATICS / BLOCK DIAGRAM...........................................................................................................................5 2.3 EQUIPMENT MODIFICATIONS.................................................................................................................................5 2.4 CONFIGURATION OF TEST SYSTEM.........................................................................................................................5 2.5 TEST SETUP BLOCK DIAGRAM...............................................................................................................................6 3 - CONDUCTED EMISSIONS TEST DATA............................................................................................................7 3.1 MEASUREMENT UNCERTAINTY..............................................................................................................................7 3.2 EUT SETUP............................................................................................................................................................7 3.3 SPECTRUM ANALYZER SETUP................................................................................................................................7 3.4 TEST PROCEDURE..................................................................................................................................................8 3.5 SUMMARY OF TEST RESULTS.................................................................................................................................8 3.6 CONDUCTED EMISSIONS TEST DATA.....................................................................................................................8 3.7 PLOT(S) OF CONDUCTED EMISSIONS TEST DATA.................................................................................................11 ALKI Electronics Technology Corporation FCC ID: RIZUNV0310FEB-2-26-UNV-H-S-A / FEB-1-26-UNV-H-S-A /FEB-2-13-UNV-H-S-A/FEB-1-13-UNV-H-S-A Report # RSZ03090206.doc Page 3 of 14 FCC ID Report 1 - GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) The ALKI Electronics Technology Corporation’s model FEB-2-26-UNV-H-S-A/ FEB-1-26-UNV-H-S-A/ FEB-2-13-UNV-H-S-A/ FEB-1-13-UNV-H-S-A or the β€œEUT” as referred to in this report is Electronic Ballast. They measure approximately 13.0cm L x 6.0cm W x 3.5cm H, rated input voltage: AC 120 V/60Hz. The test data was only good for the test sample. It may have deviation for other test sample. 1.2 Objective The following test report is prepared on behalf of ALKI Electronics Technology Corporation in accordance with Part 2, Subpart J, and Part 18, Subparts A, B, and C of the Federal Communication Commissions rules and regulations. The objective of the manufacturer is to demonstrate compliance with FCC Part 18 limit requirements for Industrial, Scientific, and Medical Equipment. 1.3 Related Submittal(s)/Grant(s) No Related Submittals. 1.4 Test Methodology All measurements contained in this report were conducted with ANSI C63.4 –2001, American National Standa…

Text truncated - open the document above for the full version.

Test Setup Photos

Test Setup Photos Conducted Emission of FEB-2-26-UNV-H-S-A – Front View Conducted Emission of FEB-2-26-UNV-H-S-A – Side View Conducted Emission of FEB-1-26-UNV-H-S-A – Front View Conducted Emission of FEB-1-26-UNV-H-S-A – Side View Conducted Emission of FEB-2-13-UNV-H-S-A – Front View Conducted Emission of FEB-2-13-UNV-H-S-A – Side View Conducted Emission of FEB-1-13-UNV-H-S-A – Front View Conducted Emission of FEB-1-13-UNV-H-S-A – Side View

Contact Information

Applicant

Jenny Hsu(Project Manager)
[email protected]886-2 2799-0889Fax: 886-2 2799-1196

Test Firm

Bay Area Compliance Laboratory Corp. (Shenzhen)John Chan
[email protected]86-755-8329-6449Fax: 86-8327-3756

Technical Specifications

#Rule PartsFrequency RangePower Output
1180.04 MHz - 0.05 MHz-

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