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Binatone Electronics International Ltd. Add: Floor 23A, 9 Des Voeux Road West, Sheung Wan, Hong Kong, China Tel: 00852-28027388 Fax: 00852-28028138 FCC Authorization Date: 2013-10-18 FEDERAL COMMUNICATIONS COMMISSIONS Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 Subject: Agent Authorization To whom it may concern: We, Binatone Electronics International Ltd., the undersigned, Hereby authorizes Bay Area Compliance Laboratories Corporation to act on its behalf in all matters relating to application for Equipment authorization, including the signing of all documents relating to these matters. All acts carried out by Bay Area Compliance Laboratories Corp. on our behalf shall have the same effect as our own action. We, the undersigned, hereby certify that we are not subject to a denial of federal benefits, that includes FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 853(a). This authorization is valid until further written notice from the applicant. Sincerely Yours, Signature: Patrick Cheung, Senior Product Manager

Binatone Electronics International Ltd. Add: Floor 23A, 9 Des Voeux Road West, Sheung Wan, Hong Kong, China Tel: 00852-28027388 Fax: 00852-28028138 FCC Confidential Authorization D ate: 2013-10-18 FEDERAL COMMUNICATIONS COMMISSIONS Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 Confidentiality Request regarding application for certification of FCC ID: VLJ-THEBRICK Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below:
Detailed Circuit Schematics of EUT--- (Long term)
Block Diagram--- (Long term)
Circuit Description--- (Long term) Tune up Procedure --- (Long term) Th e above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely Yours, Signature: P atrick Cheung, Senior Product Manager

EXHIBIT B - EUT EXTERNAL PHOTOGRAPHS The Brick Power: EUT – All View EUT – Top View EUT –Bottom View EUT –Left Side View EUT –Right Side View EUT –Port View EUT –Port View EUT –Charging Base Top View EUT –Charging Base Side View EUT – Adapter View EUT – Adapter Label View The Brick: EUT – Top View EUT – Bottom View EUT – Right Side View EUT – Left Side View EUT – Micro-USB Port View

EXHIBIT A - FCC ID LABELING AND LOCATION FCC ID Label Proposed FCC ID Label Location The label shown shall be permanently affixed at a conspicuous location on the device and be readily visible to the user at the time purchase (Labeling requirements per 2.925) Label Here

EXHIBIT B - EUT EXTERNAL PHOTOGRAPHS The Brick Power: EUT – Uncover View EUT – Uncover View EUT – Uncover View EUT – Uncover View EUT – Uncover View EUT –Main Board Top View EUT –Main Board Bottom View EUT –Main Board Bottom Without Shielding View EUT –GSM Antenna View EUT –BT Antenna View EUT –LED Display Top View EUT –LED Display Bottom View EUT –MIC Top View EUT –MIC Bottom View EUT –Speaker View EUT –GSM /BT Module View EUT –Battery Top View(2000mA) EUT –Battery Bottom View (2000mA) EUT –Battery Top View(5200mA) EUT –Battery Bottom View (5200mA) The Brick: EUT –Front Uncover View EUT – Main Board Bottom View EUT – Main Board Top With Shielding View EUT – Main Board Top Without Shielding View EUT – GSM/BT Module View EUT –Battery Top View(1000mA) EUT –Battery Bottom View (1000mA)

Note: This test report is prepared for the customer shown above and for the equipment described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. SAR EVALUATION REPORT For Binatone Electronics International Ltd. Floor 23A, 9 Des Voeux Road West, Sheung Wan, Hong Kong, China FCC ID: VLJ-THEBRICK Report Type: Original Report Product Type: GSM phone Test Engineer: Sandy Wang Report Number: R1DG130821008-20A Report Date: 2013-11-30 Reviewed By: Alvin Huang RF Leader Prepared By: Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian Free Trade Zone Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008 www.baclcorp.com.cn Bay Area Compliance Laboratories Corp. (Shenzhen) Report No: R1DG130821008-20A SAR Evaluation Report 2 of 94 Attestation of Test Results Company Name Binatone Electronics International Ltd. EUT Description GSM Phone FCC ID VLJ-THEBRICK Model Number The Brick, The Brick Power EUT Information Test Date 2013-07-26 to 2013-07-27 Frequency Max. SAR Level(s) Reported Limit(W/Kg) Cellular Band 0.083 W/kg 1g Head SAR 0.152 W/kg 1g Body SAR PCS Band 0.063 W/kg 1g Head SAR 0.275 W/kg 1g Body SAR Simultaneous 0.161 W/kg 1g Head SAR 0.301 W/kg 1g Body SAR 1. 6 ANSI / IEEE C95.1 : 2005 IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fileds,3 kHz to 300 GHz. ANSI / IEEE C95.3 : 2002 IEEE Recommended Practice for Measurements and Computations of Radio Frequency Electromagnetic Fields With Respect to Human Exposure to SuchFields,100 kHz—300 GHz. IEEE1528:2003 IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques Applicable Standards KDB procedures 447498 D01-Mobile and Portable Devices RF Exposure Procedures and Equipment Authorization Policies 648474 D04-SAR Evaluation Considerations for Wireless Handsets Note: This wireless device has been shown to be capable of compliance for localized specific absorption rate (SAR) for General Population/Uncontrolled Exposure limits specified in ANSI/IEEE Standards and has been tested in accordance with the measurement procedures specified in IEEE 1528-2003 and RF exposure KDB procedures. The results and statements contained in this report pertain only to the device(s) evaluated. Bay Area Compliance Laboratories Corp. (Shenzhen) Report No: R1DG130821008-20A SAR Evaluation Report 3 of 94 TABLE OF CONTENTS DOCUMENT REVISION HISTORY .........................................................................................................................5 EUT DESCRIPTION ....................................................................................................................................................6 TECHNICAL SPECIFICATION.........................................................................................................................................6 REFERENCE, STANDARDS, AND GUILDELINES ...............................................................................................7 SAR LIMITS.................................................................................................................................................................8 FACILITIES AND ACCREDITATION .....................................................................................................................9 DESCRIPTION OF TEST SYSTEM ........................................................................................................................10 EQUIPMENT LIST AND CALIBRATION .............................................................................................................17 EQUIPMENTS LIST & CALIBRATION INFORMATION....................................................................................................17 SAR MEASUREMENT SYSTEM VERIFICATION ..............................................................................................18 LIQUID VERIFICATION...............................................................................................................................................18 SYSTEM ACCURACY VERIFICATION...........................................................................................................................21 SAR SYSTEM VALIDATION DATA .....................................................................................................................22 EUT TEST STRATEGY AND METHODOLOGY .................................................................................................30 TEST POSITIONS FOR DEVICE OPERATING NEXT TO A PERSON’S EAR........................................................................30 CHEEK/TOUCH POSITION...........................................................................................................................................30 EAR/TILT POSITION...................................................................................................................................................31 TEST POSITIONS FOR BODY-WORN AND OTHER CONFIGURATIONS..............................................................................32 SAR EVALUATION PROCEDURE.................................................................................................................................32 CONDUCTED OUTPUT POWER MEASUREMENT ...........................................................................................33 PROVISION APPLICABLE............................................................................................................................................33 TEST PROCEDURE......................................................................................................................................................33 MAXIMUM OUTPUT POWER AMONG PRODUCTION UNITS.....................................…

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Note: This test report is prepared for the customer shown above and for the device described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. This report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP*, or any agency of the Federal Government. * This report may contain data that are not covered by the NVLAP accreditation and shall be marked with an asterisk “★” (Rev.2). This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0. FCC PART 22H, PART 24E MEASUREMENT AND TEST REPORT For Binatone Electronics International Ltd. Floor 23A, 9 Des Voeux Road West, Sheung Wan, Hong Kong, China Report Type: Original Report Product Type: GSM phone Test En gineer: Leon Chen Re port Number: R2DG130821008-00C Re port Date: 2013-10-30 Reviewed B y: Jerry Zhang EMC Manager Test Laboratory: Bay Area Compliance Laboratories Corp. (Dongguan) No.69 Pulongcun, Puxinhu Industrial Zone, Tangxia, Dongguan, Guangdong, China Tel: +86-769-86858888 Fax: +86-769-86858891 www.baclcorp.com.cn FCC ID: VLJ-THEBRICK Bay Area Compliance Laboratories Corp. (Dongguan) Report No.: R2DG130821008-00C FCC Part 22H/24E Page 2 of 31 TABLE OF CONTENTS GENERAL INFORMATION ....................................................................................................................................... 4 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ..................................................................................... 4 OBJECTIVE ................................................................................................................................................................... 4 RELATED SUBMITTAL(S)/GRANT(S) ............................................................................................................................. 4 TEST METHODOLOGY .................................................................................................................................................. 4 TEST FACILITY .........................................................................…

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