VUI-TS7A01Hardware wallet

SAR Test Report Report Format Version 8.0.0 Page No. : 1 of 23 Report No. : SFBEDV-WTW-P25080128 Issued Date : Oct. 14, 2025 SAR Test Report FCC Rule Part : CFR §2.1093 Standards : IEEE Std 1528:2013, KDB 865664 D01 v01r04, KDB 865664 D02 v01r02, KDB 447498 D01 v06 Report No. : SFBEDV-WTW-P25080128 Applicant : PEGATRON CORPORATION Address : 5F, NO.76, LIGONG ST., BEITOU DISTRICT, TAIPEI CITY 112, TAIWAN Product : Hardware wallet FCC ID : VUI-TS7A01 Brand : Trezor Model No. : T3W1 Sample Received Date : Aug. 21, 2025 Date of Testing : Sep. 22, 2025 Lab Address : No. 47-2, 14th Ling, Chia Pau Vil., Lin Kou Dist., New Taipei City, Taiwan Test Location : No. 19, Hwa Ya 2nd Rd., Wen Hwa Vil., Kwei Shan Dist., Taoyuan City, Taiwan FCC Accredited No. : TW0003 CERTIFICATION: The above equipment have been tested by Bureau Veritas Consumer Products Services (H.K.) Ltd., Taoyuan Branch–Lin Kou Laboratories, and found compliance with the requirement of the above standards. The test record, data evaluation & Equipment Under Test (EUT) configurations represented herein are true and accurate accounts of the measurements of the sample’s SAR characteristics under the conditions specified in this report. It should not be reproduced except in full, without the written approval of our laboratory. The client should not use it to claim product certification, approval, or endorsement by TAF or any government agencies. Prepared By : Vera Huang / Specialist Approved By : Gordon Lin / Manager This report is governed by, and incorporates by reference, the Conditions of Testing as posted at the date of issuance of this report at http://www.bureauveritas.com/home/about-us/our-business/cps/about-us/terms-conditions/ and is intended for your exclusive use. Any copying or replication of this report to or for any other person or entity, or use of our name or trademark, is permitted only with our prior written permission. This report sets forth our findings solely with respect to the test samples identified herein. The results set forth in this report are not indicative or representative of the quality or characteristics of the lot from which a test sample was taken or any similar or identical product unless specifically and expressly noted. Our report includes all of the tests requested by you and the results thereof based upon the information that you provided to us. Measurement uncertainty is only provided upon request for accredited tests. Statements of conformity are based on simple acceptance criteria without taking measurement uncertainty into account, unless otherwise requested in writing. You have 60 days from date of issuance of this report to notify us of any material error or omission caused by our negligence or if you require measurement uncertainty; provided, however, that such notice shall be in writing and shall specifically address the issue you wish to raise. A failure to raise such issue within the prescribed time shall constitute your unqualified acceptance of the completeness of this report, the tests conducted and the correctness of the report contents. SAR Test Report Report Format Version 8.0.0 Page No. : 2 of 23 Report No. : SFBEDV-WTW-P25080128 Issued Date : Oct. 14, 2025 Table of Contents Release Control Record ............................................................................................................................................................... 3 1. Test Reference Guidance ...................................................................................................................................................... 4 2. Summary of Maximum SAR Value ....................................................................................................................................... 4 3. Description of Equipment Under Test ................................................................................................................................. 5 4. SAR Measurement System ................................................................................................................................................... 6 4.1 Definition of Specific Absorption Rate (SAR) ............................................................................................................... 6 4.2 SPEAG DASY6 System ............................................................................................................................................... 6 4.2.1 Robot ............................................................................................................................................................... 7 4.2.2 Probes ............................................................................................................................................................. 8 4.2.3 Data Acquisition Electronics (DAE) .................................................................................................................. 8 4.2.4 Phantoms ......................................................................................................................................................... 8 4.2.5 Device Holder .................................................................................................................................................. 9 4.2.6 System Validation Dipoles ............................................................................................................................. 10 4.2.7 Power Source ................................................................................................................................................ 10 4.2.8 Tissue Simulating Liquids .............................................................................................................................. 11 4.3 SAR System Verification ............................................................................................................................................ 13 4.4 SAR Measurement Procedure ........…

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Plots of System Verification Appendix A. Plots of System Verification The plots for system verification are shown as follows. Report No.: SFBEDV-WTW-P25080128 Plots of System Verification Measurement Report S01 System Check_H2450_250922 Device under Test Properties Model, Manufacturer Dimensions [mm] IMEI DUT Type D2450V2-SN:737 10.0 x 10.0 x 290.0 Dipole Exposure Conditions Phantom Section, TSL Position, Test Distance [mm] Band Group, UID Frequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, , CW, 0-- 2450.000, 0 6.46 1.80 39.1 Hardware Setup Phantom TSL, Measured Date Probe, Calibration Date DAE, Calibration Date ELI V8.0 (20deg probe tilt) - 2188 H19T27N9 , 2025-09-22 EX3DV4 - SN7797, 2024-11-20 DAE4 Sn1589, 2025-04-17 Scan Setup Area Scan Zoom Scan Grid Extents [mm] 48.0 x 96.0 35.0 x 35.0 x 30.0 Grid Steps [mm] 12.0 x 12.0 5.0 x 5.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Measurement Results Area Scan Zoom Scan Date 2025-09-22 2025-09-22 psSAR1g [W/kg] 2.66 2.71 psSAR10g [W/kg] 1.25 1.28 Power Drift [dB] 0.16 -0.10 Report No.: SFBEDV-WTW-P25080128 Plots of System Verification Measurement Report S02 System Check_H13MHz_250922 Device under Test Properties Model, Manufacturer Dimensions [mm] IMEI DUT Type CLA13-SN:1018 240.0 x 240.0 x 95.0 Dipole Exposure Conditions Phantom Section, TSL Position, Test Distance [mm] Band Group, UID Frequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, FRONT, 0.00 Custom Band CW, 0-- 13.000, 15.75 0.741 54.2 Hardware Setup Phantom TSL, Measured Date Probe, Calibration Date DAE, Calibration Date ELI V8.0 (20deg probe tilt) - 2188 250MHz , 2025-09-22 EX3DV4 - SN7797, 2024-11-20 DAE4 Sn1589, 2025-04-17 Scan Setup Area Scan Zoom Scan Grid Extents [mm] 270.0 x 270.0 36.0 x 40.0 x 30.8 Grid Steps [mm] 10.0 x 10.0 4.0 x 4.0 x 1.4 Sensor Surface [mm] 3.0 1.4 Measurement Results Area Scan Zoom Scan Date 2025-09-22 2025-09-22 psSAR1g [W/kg] 0.031 0.026 psSAR10g [W/kg] 0.024 0.016 Power Drift [dB] 0.04 0.02 Report No.: SFBEDV-WTW-P25080128 Plots of Measurement Appendix B. Plots of Measurement The SAR plots for highest measured SAR in each exposure configuration, wireless mode and frequency band combination are shown as follows. Report No.: SFBEDV-WTW-P25080128 Plots of Measurement Measurement Report P01 BT_LE-1M_Front Face_0mm_Ch39_Ant 0 Device under Test Properties Model, Manufacturer Dimensions [mm] IMEI DUT Type T3W1 75.0 x 44.0 x 9.0 Exposure Conditions Phantom Section, TSL Position, Test Distance [mm] Band Group, UID Frequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Front Face, 0.00 ISM 2.4 GHz Band Bluetooth, 10670-AAA 2440.000, 39 6.46 1.80 39.1 Hardware Setup Phantom TSL, Measured Date Probe, Calibration Date DAE, Calibration Date ELI V8.0 (20deg probe tilt) - 2188 H19T27N9 , 2025-09-22 EX3DV4 - SN7797, 2024-11-20 DAE4 Sn1589, 2025-04-17 Scan Setup Area Scan Zoom Scan Grid Extents [mm] 120.0 x 156.0 Grid Steps [mm] 12.0 x 12.0 Sensor Surface [mm] 3.0 Measurement Results Area Scan Zoom Scan Date 2025-09-22 psSAR1g [W/kg] 0 psSAR10g [W/kg] 0 Power Drift [dB] 0.00 M2/M1 [%] Dist 3dB Peak [mm] Report No.: SFBEDV-WTW-P25080128 Plots of Measurement Measurement Report P02 NFC_ASK_Front Face_0mm_13.56MHz_Amphenol Device under Test Properties Model, Manufacturer Dimensions [mm] IMEI DUT Type T3W1 75.0 x 44.0 x 9.0 Exposure Conditions Phantom Section, TSL Position, Test Distance [mm] Band Group, UID Frequency [MHz], Channel Number Conversion Factor TSL Conductivity [S/m] TSL Permittivity Flat, Front Face, 0.00 Custom Band CW, 0-- 13.600, 15.75 0.744 53.9 Hardware Setup Phantom TSL, Measured Date Probe, Calibration Date DAE, Calibration Date ELI V8.0 (20deg probe tilt) - 2188 250MHz , 2025-09-22 EX3DV4 - SN7797, 2024-11-20 DAE4 Sn1589, 2025-04-17 Scan Setup Area Scan Zoom Scan Grid Extents [mm] 120.0 x 160.0 Grid Steps [mm] 10.0 x 10.0 Sensor Surface [mm] 3.0 Measurement Results Area Scan Zoom Scan Date 2025-09-22 psSAR1g [W/kg] 0 psSAR10g [W/kg] 0 Power Drift [dB] 0.00 M2/M1 [%] Dist 3dB Peak [mm] Report No.: SFBEDV-WTW-P25080128 Appendix C. Tissue & System Verification The measuring results for tissue simulating liquid and system check are shown as below. Note: 1. For Section 4.3, the dielectric properties of the tissue simulating liquid have been measured within 24 hours before the SAR testing and within ±10 % of the target values. Liquid temperature during the SAR testing has kept within ±2 °C. 2. For Section 4.4, The SAR measurement system was validated according to procedures in FCC KDB 865664 D0. The validation status in tabulated summary is as below. 3. For Section 4.5, Comparing to the reference SAR value provided by SPEAG in dipole calibration certificate, the deviation of system check results is within its specification of 10 %. The result indicates the system check can meet the variation criterion and the plots please refer to Appendix A of this report. Report No.: SFBEDV-WTW-P25080128 Plot No. Frequency (MHz) LiquidTemp. (°C) Conductivity (σ) Permittivity (εr) Targeted Conductivity (σ) Targeted Permittivity (εr) Deviation Conductivity (σ) Deviation Permittivity (εr) Sensitivity Range Probe Linearity Probe Isotropy Modulation Type Duty Factor PAR Date Frequency (MHz) Targeted 1g SAR (W/kg) Measured 1g SAR (W/kg) Normalized 1g SAR (W/kg) Deviation (%) Dipole S/N Probe S/N DAE S/N Output Power (dBm) S01 2450 21.7 1.80 39.1 1.80 39.2 0.00 -0.26 Pass Pass Pass GFSK N/A Pass Sep. 22, 2025 2450 52.90 2.71 54.07 2.21 737 7797 1589 17 S02 13 21.7 0.741 54.2 0.750 55 -1.20 -1.45 Pass Pass Pass N/A N/A N/A Sep. 22, 2025 13 0.534 0.026 0.519 -2.85 1018 7797 1589 17 Tissue Verification Validation for CW Validation for Modulation System Check Note Report No.: SFBEDV-WTW-P25080128 Appendix D. Maximum Target Conducted Power The maximum conducted average power (Unit: dBm) including tune-up tolerance is shown as below. Report No.: SFBEDV-WTW-P25080128…

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Doc.No.:3.8.05 Rev02 1 ANTENNA INFORMATION OEM ODM Pegatron Platform model name Intel platform (ex: Yes, No or NA) Platform type (ex: regular NB, convertible PC, AIO...etc) Wearable SAR minimum separation (mm) FCC (1g) ISED (1g) ISED (10g) Antenna manufacturer Company name Johanson Address 4001 Calle Tecate • Camarillo, CA 93012 Test location Company name Pegatron Address No. 11, Alley 120, Lide Rd., Beitou District, Taipei City 112, Taiwan Test Personnel Name(Full name) E-mail [email protected] Tel/Mobile Testing date 20250822 Antenna Part number Main 1416-00CB000 Antenna type (ex: PIFA, Dipole...etc) PIFA Antenna Peak gain w/ cable loss (dBi)* 2.4GHz 2400-2483.5 MHz 5.2GHz 5150-5250MHz 5.3GHz 5250-5350MHz 5.6GHz 5470-5725MHz 5.8GHz 5725-5850MHz 5.9GHz 5850-5895MHz 6.2GHz 5925-6425MHz 6.5GHz 6425-6525MHz 6.7GHz 6525-6875MHz 7.0 GHz 6875-7125MHz Main -13.5 NA NA NA NA NA NA NA NA NA Aux NA NA NA NA NA NA NA NA NA NA Cable Assembly Part Number and Information Cable PN Cable length(mm) Cable diameter(mm) Impedance(ohm) Connector type Main NA NA NA NA NA Aux NA NA NA NA NA * 3D Antenna Peak Gain required being test in system basis. Doc.No.:3.8.05 Rev02 2 Table of Contents Cover page.......................................................................................................................................................... 1 1. Document Revision History.................................................................................................................................... 3 2. Test & System Description 2.1 Measurement Method and System....................................................................................................................... 4 2.2 Test setup............................................................................................................................................................. 4 2.3 Equipment list....................................................................................................................................................... 5 3. Radiation characteristics of antenna loaded in Host Platform............................................................................ 6 Annex A. Photographs A.1 Setup Photo.......................................................................................................................................................... 7 A.2 Test sample................................................................................................................................................. 8 Doc.No.:3.8.05 Rev02 3 1. Document Revision History Revision # Revision Details Issued Date Rev. 00 First Issue 2025/08/22 Rev. 01 First Issue 2025/10/22 Doc.No.:3.8.05 Rev02 4 2. Test & System Description 2.1 Measurement Method and System This test report is prepared for host antenna testing under a Full Anechoic Chamber (Satimo Chamber SG24.Test software used MVG Wave Studio). 2.2 Test setup Doc.No.:3.8.05 Rev02 5 2.3 Equipment list Device Model Manufacturer Cal. Date Cal. Due Date 1 SATMIO Chamber SG24 MVG 2024/12/5 2025/12/4 2 Network Analyzer E5071C Agilent 2025/7/22 2026/7/21 Doc.No.:3.8.05 Rev02 6 3. Radiation characteristics of antenna loaded in Host Platform Main Antenna Max Antenna 3D Radiation Pattern 2400 – 2483.5 MHz Frequency (MHz) Peak Gain w/ Cable Loss (dBi) 2400-2483.5 -13.5

Report No.: RFBEDV-WTW-P25080128-1 Page No. 1 / 33 Report Format Version: 7.1.0 TEST REPORT CERTIFICATE OF CONFORMITY Standard: 47 CFR FCC Part 15, Subpart C (Section 15.225) Report No.: RFBEDV-WTW-P25080128-1 FCC ID: VUI-TS7A01 Product: Hardware wallet Brand: Trezor Model No.: T3W1 Received Date: 2025/8/21 Test Date: 2025/9/17 ~ 2025/9/18 Issued Date: 2025/10/14 Applicant: PEGATRON CORPORATION Address: 5F, NO.76, LIGONG ST., BEITOU DISTRICT, TAIPEI CITY 112, TAIWAN Issued By: Bureau Veritas Consumer Products Services (H.K.) Ltd., Taoyuan Branch Lin Kou Laboratories Lab Address: No. 47-2, 14th Ling, Chia Pau Vil., Lin Kou Dist., New Taipei City, Taiwan Test Location: No. 19, Hwa Ya 2nd Rd., Wen Hwa Vil., Kwei Shan Dist., Taoyuan City 33383, Taiwan FCC Registration / Designation Number: 788550 / TW0003 Approved by: , Date: 2025/10/14 Jeremy Lin / Project Engineer This test report consists of 33 pages in total. It may be duplicated completely for legal use with the approval of the applicant. It should not be reproduced except in full, without the written approval of our laboratory. The test results in the report only apply to the tested sample. The test results in this report are traceable to the national or international standards. Prepared by : Gina Liu / Specialist This report is governed by, and incorporates by reference, the Conditions of Testing as posted at the date of issuance of this report at http://www.bureauveritas.com/home/about-us/our- business/cps/about-us/terms-conditions/ and is intended for your exclusive use. Any copying or replication of this report to or for any other person or entity, or use of our name or trademark, is permitted only with our prior written permission. This report sets forth our findings solely with respect to the test samples identified herein. The results set forth in this report are not indicative or representative of the quality or characteristics of the lot from which a test sample was taken or any similar or identical product unless specifically and expressly noted. Our report includes all of the tests requested by you and the results thereof based upon the information that you provided to us. Measurement uncertainty is only provided upon request for accredited tests. Statements of conformity are based on simple acceptance criteria without taking measurement uncertainty into account, unless otherwise requested in writing. You have 60 days from date of issuance of this report to notify us of any material error or omission caused by our negligence or if you require measurement uncertainty; provided, however, that such notice shall be in writing and shall specifically address the issue you wish to raise. A failure to raise such issue within the prescribed time shall constitute your unqualified acceptance of the completeness of this report, the tests conducted and the correctness of the report contents. Report No.: RFBEDV-WTW-P25080128-1 Page No. 2 / 33 Report Format Version: 7.1.0 Table of Contents Release Control Record ....................................................................................................................................................... 3 1 Certificate .................................................................................................................................................................... 4 2 Summary of Test Results .......................................................................................................................................... 5 2.1 Measurement Uncertainty ........................................................................................................................................ 5 2.2 Supplementary Information ...................................................................................................................................... 5 3 General Information ................................................................................................................................................... 6 3.1 General Description .................................................................................................................................................. 6 3.2 Antenna Description of EUT ..................................................................................................................................... 7 3.3 Channel List .............................................................................................................................................................. 7 3.4 Test Mode Applicability and Tested Channel Detail .................................................................................................. 7 3.5 Test Program Used and Operation Descriptions ...................................................................................................... 8 3.6 Connection Diagram of EUT and Peripheral Devices .............................................................................................. 8 3.7 Configuration of Peripheral Devices and Cable Connections .................................................................................. 8 4 Test Instruments ........................................................................................................................................................ 9 4.1 AC Power Conducted Emissions ............................................................................................................................. 9 4.2 Radiated Emissions below 30 MHz ........................................................................................................................ 10 4.3 Radiated Emissions above 30 MHz ....................................................................................................................... 10 4.4 Frequency Stability ................................................................................................................................................. 11 4.5 20 dB Bandwidth ......…

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