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Reference No.: WTX23X09198384W/001/002/003/004/005 Page 2 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX23X09198384W/001/002/003/004/005 Page 3 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX23X09198384W/001/002/003/004/005 Page 4 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX23X09198384W/001/002/003/004/005 Page 5 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7 EUT View 8

Reference No.: WTX23X09198384W/001/002/003/004/005 Page 1 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: WF5-ST10 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX23X09198384W/001/002/003/004/005 Page 6 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX23X09198384W/001/002/003/004/005 Page 7 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 1 Solder Board-Component View 2 Reference No.: WTX23X09198384W/001/002/003/004/005 Page 8 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 3 Solder Board-Component View 4 Reference No.: WTX23X09198384W/001/002/003/004/005 Page 9 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Antenna View WIFI BT Antenna

Page: 1/13 Ref : ACR.104.1.23.SATU.A Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Iroise – 295 avenue Alexis de Rochon 29280 PLOUZANE - FRANCE Calibration date: 08/20/2023 Accreditations #2-6789 and #2-6814 Scope available on www.cofrac.fr The use of the Cofrac brand and the accreditation references is prohibited from any reproduction. Summary: This document presents the method and results from an accredited SAR reference dipole calibration performed in MVG using the COMOSAR test bench. All calibration results are traceable to nationa l metrology institutions. SAR Reference Dipole Calibration Report Waltek Testing Group (Shenzhen) Co., Ltd. 1/F, Building A, Hongwei Industrial Park, Liuxian 2 nd Road BAO'AN DISTRICT SHENZHEN, P.R.C. (518101) MVG COMOSAR REFERENCE DIPOLE FREQUENCY: 2450 MHZ SERIAL NO.: SN 13/15 DIP 2G450-364 SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 2/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. NameFunctionDateSignature Prepared by :Jérôme LucTechnical Manager 08/20/2023 Checked by :Jérôme LucTechnical Manager 08/20/2023 Approved by:Yann ToutainLaboratory Director 08/20/2023 Customer Name Distribution : IssueNameDateModifications AJérôme Luc 08/20/2023 Initial release 2023.08.20 11:56:55 +01'00' Waltek Testing Group (Shenzhen) Co., Ltd. SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 3/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Introduction ................................................................................................................ 4 2 Device Under Test ..................................................................................................... 4 3 Product Description ................................................................................................... 4 3.1 General Information _______________________________________________________ 4 4 Measurement Method ................................................................................................ 5 4.1 Return Loss Requirements __________________________________________________ 5 4.2 Mechanical Requirements ___________________________________________________ 5 5 Measurement Uncertainty .......................................................................................... 5 5.1 Return Loss ______________________________________________________________ 5 5.2 Dimension Measurement ___________________________________________________ 5 5.3 Validation Measurement ____________________________________________________ 5 6 Calibration Measurement Results .............................................................................. 6 6.1 Return Loss and Impedance In Head Liquid ____________________________________ 6 6.2 Return Loss and Impedance In Body Liquid ____________________________________ 6 6.3 Mechanical Dimensions ____________________________________________________ 7 7 Validation measurement ............................................................................................ 7 7.1 Head Liquid Measurement __________________________________________________ 8 7.2 SAR Measurement Result With Head Liquid ____________________________________ 8 7.3 Body Liquid Measurement _________________________________________________ 11 7.4 SAR Measurement Result With Body Liquid __________________________________ 12 8 List of Equipment .................................................................................................... 13 SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 4/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 INTRODUCTION This document contains a summary of the requirements set forth by the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards for reference dipoles used for SAR measurement system validations and the measurements that were performed to verify that the product complies with the fore mentioned standards. 2 DEVICE UNDER TEST Device Under Test Device Type COMOSAR 2450 MHz REFERENCE DIPOLE Manufacturer MVG Model SID2450 Serial Number SN 13/15 DIP 2G450-364 Product Condition (new / used) New 3 PRODUCT DESCRIPTION 3.1 GENERAL INF ORMATION MVG’s COMOSAR Validation Dipoles are built in accordance to the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards. The product is designed for use with the COMOSAR test bench only. Figure 1 – MVG COMOSAR Validation Dipole SAR REFERENCE DIPOLE CALIBRATION REPORT Ref: ACR.104.1.23.SATU.A Page: 5/13 Template_ACR.DDD.N.YY.MVGB.ISSUE_SAR Reference Dipole vJ This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 4 MEASUREMENT METHOD The IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards provide requirements for reference dipoles used for system validation measurements. The following measurements were performed to verify that the product complies with the fore mentioned standards. 4.1 RETURN LOSS REQUIREMENTS The dipole used for SAR system validati…

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 55 TEST REPORT Reference No. .................... : WTX23X09198384W FCC ID ................................ : WF5-ST10 Applicant ........................... : Aroot Co., Ltd. Address ............................. : 28-6, Gajangsaneopdong-ro, Osan-si, Gyeonggi-do, Republic of Korea Manufacturer ..................... Guangzhou Shangke Information Technology Co., LTD. Address ............................. Room 1205-1212, R&F To-Win Building, No.30 Huaxia Road, Tianhe District, Guangzhou, Guangdong Province,China Product Name ................... : Tablet PC Model No.. .......................... : ST10 Standards .......................... : FCC Part 2.1093, IEEE Std C95.1: 2019 IEEE Std C95.3: 2002 + Rev. 2008 Date of Receipt sample .... : 2023-09-08 Date of Test........................ : 2023-09-08 to 2023-09-21 Date of Issue ..................... : 2023-09-21 Test Report Form No. ....... : WTX_Part2_1093W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jack Sun Silin Chen Reference No.: WTX23X09198384W Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 55 TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 4 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 4 1.2 Test Standards .................................................................................................................................................... 6 1.3 Test Methodology ................................................................................................................................................ 6 1.4 Test Facility ......................................................................................................................................................... 6 2. Summary of Test Results .......................................................................................................................................... 7 3. Specific Absorption Rate (SAR) ................................................................................................................................ 8 3.1 Introduction .......................................................................................................................................................... 8 3.2 SAR Definition ..................................................................................................................................................... 8 4. SAR Measurement System ........................................................................................................................................ 9 4.1 The Measurement System .................................................................................................................................. 9 4.2 Probe ................................................................................................................................................................... 9 4.3 Probe Calibration Process ................................................................................................................................. 11 4.4 Phantom ............................................................................................................................................................ 11 4.5 Device Holder .................................................................................................................................................... 12 4.6 Test Equipment List ........................................................................................................................................... 13 5. Tissue Simulating Liquids ....................................................................................................................................... 14 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 14 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 15 5.3 Tissue Calibration Result ................................................................................................................................... 16 6. SAR Measurement Evaluation ................................................................................................................................ 17 6.1 Purpose of System Performance Check ............................................................................................................ 17 6.2 System Setup .................................................................................................................................................... 17 6.3 Validation Results .............................................................................................................................................. 18 7. EUT Testing Position ............................................................................................................................................... 19 7.1 Body Position .........................................................................................…

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 63 TEST REPORT Reference No. .................... : WTX23X09198384W004 FCC ID ................................ : WF5-ST10 Applicant ........................... : Aroot Co., Ltd. Address ............................. : 28-6, Gajangsaneopdong-ro, Osan-si, Gyeonggi-do, Republic of Korea Manufacturer ..................... : Guangzhou Shangke Information Technology Co., LTD. Address ............................. : Room 1205-1212, R&F To-Win Building, No.30 Huaxia Road, Tianhe District, Guangzhou, Guangdong Province,China Product Name ................... : Tablet PC Model No... ......................... : ST10 Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : 2023-09-08 Date of Test........................ : 2023-09-08 to 2023-09-22 Date of Issue ..................... : 2023-09-22 Test Report Form No. ....... : WTX_Part 15_247W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Mike Shi Silin Chen Reference No.: WTX23X09198384W004 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 63 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................. 6 1.3 TEST METHODOLOGY ........................................................................................................................................... 6 1.4 TEST FACILITY ...................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................. 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 13 3. ANTENNA REQUIREMENT ................................................................................................................................. 14 3.1 STANDARD APPLICABLE ..................................................................................................................................... 14 3.2 EVALUATION INFORMATION ................................................................................................................................ 14 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS .................................................................................... 15 4.1 STANDARD APPLICABLE ..................................................................................................................................... 15 4.2 FREQUENCY HOPPING SYSTEM ......................................................................................................................... 15 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE ............................................................................... 16 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION .................................................... 17 5.1 STANDARD APPLICABLE ..................................................................................................................................... 17 5.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 17 5.3 TEST PROCEDURE .............................................................................................................................................. 17 5.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 18 6. DWELL TIME OF HOPPING CHANNEL ........................................................................................................... 19 6.1 STANDARD APPLICABLE ..................................................................................................................................... 19 6.2 TEST SETUP BLOCK DIAGRAM ........................................................................................................................... 19 6.3 TEST PROCEDURE .............................................................................................................................................. 19 6.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 20 7. 20DB BANDWIDTH ............................................................................................................................................... 21 7.1 STANDARD APPLICABLE .....................................................................................................................…

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ShenzhenYishengbangTechnologyCo.,LTD 1 ShenzhenYishengbangTechnologyCo.,LTD Sampleacceptanceletter SPECIFICATIONFORAPPROVAL Companyname(to be filledin by customer)：GuangzhouCommercialScienceInformationCo.,LTD Materialcode(filledin by customer)：P20S/NJ20059 Gaugetypenumber(filledin by customer)： Acceptancedate(forcustomer)：： Nameof supplier(SLK)ShenzhenYishengbangTechnologyCo.,LTD For quotientgaugetypenumber(fillin SLK)：：WIFI+GPS:SLK-TD-3713K WIF +GPSPCBA：SLK-P40HD(GPSVI)-R-75III-B  Acknowledgethesignature  Acceptanceby supplier(SLKfield) GuangzhouCommercialScience InformationCo.,LTD engineer auditapproval engineer auditapproval ChenShilian Huangzhne Lin Meicai Sealand signSealandsign day 2023-09-26 day writteninstructionsor comments：□takein □conditionalacceptance Remarks(filledby customer): Supplier:ShenzhenYishengbangTechnologyCo.,LTD SupplierAddress: Workshop2 / F, No. 5 YinyuanStreet,Jiaoyitang,TangxiaTown,Dongguan City Telephone:0769-82553115Real:0769-82553116 Shenzhen Yishengbang Technology Co., LTD 2 WIFI+GPS 1. Explanation of Product number : S L K - T D - 3 7 1 3 K 12 Product Code: (1) Customer: TD:台电 (2) Project: SLK-TD-3713K SLK-P40HD(GPSV1)-R-75III-B 2. Features *Stable and reliable in performances *Compact size *RoHS compliance 3. Applications * IEEE802.11 (a/b/g/n) * Hand-held devices when WIFI (802.11a/b/g/n)GPS functions are needed ShenzhenYishengbangTechnologyCo.,LTD 3 4. Description Holybond’s FPCantennaseriesarespeciallydesignedforWIFI (802.11a/ b/g/n)GPSapplications.BasedonHolybond’s proprietarydesign andprocesses,thisFPCantennahasexcellentstabilityandsensitivityto consistentlyprovidehighsignalreceptionefficiency. 5. ElectricalSpecifications 5-1 CharacteristicsSpecificationsUnit OutlineDimensions 41.76x13.25x 0. 12 mm CenterFrequency 1.575-2.4-2.5+5.15-5.85 GHz Bandwidth(under-10dBreturnloss) 130minMHz VSWR 3max 5-2． VSWRS11 ShenzhenYishengbangTechnologyCo.,LTD 4 5-3.WIFI+BTAntennaGain/Efficiency/RadiationPatternof 3D ShenzhenYishengbangTechnologyCo.,LTD 5 6. AntennaDimensions(unit:mm) ShenzhenYishengbangTechnologyCo.,LTD 6 7.AntennaPicture WIFIantenna As shownin the picture: 1. Placea conductive bra on the motherboard shieldingcoverto groundthe screen,and thenattachtwo conductivefoamtopson the shieldingcoverto contactthe rear cover 2. Wrapthe screen cablewitha conductive cloth 3. Wrapthe camera cablewitha conductive cloth

Reference No.: WTX23X09198384W/001/002/003/004/005 Page 10 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX23X09198384W/001/002/003/004/005 Page 11 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX23X09198384W/001/002/003/004/005 Page 12 of 12 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) ***** END OF REPORT *****