WG7MICARDLM01USB RFID Card Reader
NT-ware Systemprogrammierung GmbH
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Application Details
- Equipment Class
- DXX - Part 15 Low Power Communication Device Transmitter
- Date of Grant
- Dec 10, 2008
- Application Purpose
- Original Equipment
- Date of Application
- Dec 10, 2008
- Equipment Note
- USB RFID Card Reader
- Frequency Range
- 13.56000000 - 13.56000000
- Country
- Germany
Documents & Files
Document Text
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
External Photos
Annex B of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page1 of3 82825eut1.jpg: EUT, 3-D view Annex B of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page2 of3 82825eut11.jpg: EUT, 3-D view Annex B of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page3 of3 82825eut13.jpg: EUT, labelling
Internal Photos
Annex C of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page1 of5 82825eut2.jpg: EUT, internal view Annex C of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page2 of5 82825eut4.jpg: Main-PCB, front view Annex C of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page3 of5 82825eut5.jpg: Main-PCB, rear view Annex C of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page4 of5 82825eut7.jpg: RF-PCB, front view Annex C of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BlaskDate of issue: 01 December 2008page5 of5 82825eut8.jpg: RF-PCB, rear view
Test Report
Königswinkel 10 32825 Blomberg Germany Phone+49 5235 9500-0 Fax+49 5235 9500-10 TEST REPORT Test Report Reference: F082825E01 Equipment under Test:MiCardLegic/Mifare FCC ID: WG7MICARDLM01 IC:7900A-MICARDLM01 Serial Number: BDFF5CC325C93935 Applicant: NT-ware Systemprogrammierung GmbH Manufacturer:NT-ware Systemprogrammierung GmbH Test Laboratory (CAB) accredited by DATech in der TGA GmbH in compliance with DIN EN ISO/IEC 17025 under the Reg. No. DAT-P-105/99-21, recognizedby Bundesnetzagentur under the Reg.-No. BNetzA-CAB-02/21-104/1, CAB Designation Number DE0004, listed by FCC 31040/SIT1300F2 FCC Test site registration number 90877 Industry Canada Test site registration IC3469A-1 TEST REPORT REFERENCE: F082825E01 Examiner: Raimund BLASKDate of issue: 02 December 2008Page2 of31 Contents:Page 1 I DENTIFICATION.....................................................................................................................................3 1.1 APPLICANT.....................................................................................................................................3 1.2 MANUFACTURER..........................................................................................................................3 1.3 DATES.............................................................................................................................................3 1.4 TEST LABORATORY......................................................................................................................4 1.5 RESERVATION...............................................................................................................................4 1.6 NORMATIVE REFERENCES..........................................................................................................4 1.7 TEST RESULTS..............................................................................................................................4 2 TECHNICAL DATA OF EQUIPMENT......................................................................................................5 2.1 DEVICE UNDER TEST...................................................................................................................5 2.2 PERIPHERY DEVICES...................................................................................................................5 2.3 SPECIAL EMC MEASURES...........................................................................................................5 3 OPERATIONAL STATES AND PHYSICAL BOUNDARIES.....................................................................6 4 APPLICATION OVERVIEW.....................................................................................................................7 5 TEST RESULTS.......................................................................................................................................8 5.1 RADIATED EMISSIONS..................................................................................................................8 5.1.1 METHOD OF MEASUREMENT (RADIATED EMISSIONS)...............................................8 5.1.2TEST RESULTS (RADIATED EMISSIONS).......................................................................15 5.2 SPECTRUM MASK.........................................................................................................................21 5.2.1 METHOD OF MEASUREMENT (SPECTRUM MASK).......................................................21 5.2.2 TEST RESULTS (SPECTRUM MASK)...............................................................................22 5.3 OCCUPIED BANDWIDTH...............................................................................................................23 5.3.1 METHOD OF MEASUREMENT (OCCUPIED BANDWIDTH)............................................23 5.3.2 TEST RESULTS (OCCUPIED BANDWIDTH).................................................................... 24 5.4 FREQUENCY TOLERANCE...........................................................................................................25 5.4.1 METHOD OF MEASUREMENT (FREQUENCY TOLERANCE).........................................25 5.4.2 TEST RESULTS (FREQUENCY TOLERANCE)................................................................26 5.5CONDUCTED EMISSION MEASUREMENT POWER SUPPLY LINES.........................................27 5.5.1METHOD OF MEASUREMENT(CONDUCTED EMISSIONS)..........................................27 5.5.2 TEST RESULTS (CONDUCTED EMISSIONS ON POWER SUPPLY LINES)..................28 6 TEST EQUIPMENT AND ANCILLARIES USED FOR TESTS.................................................................30 7 LIST OF ANNEXES..................................................................................................................................31 TEST REPORT REFERENCE: F082825E01 Examiner: Raimund BLASKDate of issue: 02 December 2008Page3 of31 1 IDENTIFICATION 1.1APPLICANT Name:NT-ware Systemprogrammierung GmbH Address:Arkaden Strasse 5 49186Bad Iburg Country:Germany Name for contact purposes:Mr. Holger Bauszus Tel:+49-(0)-5403-7243-220 Fax:+49-(0)-5403-780103 e-mail address:[email protected] 1.2MANUFACTURER Name:NT-ware Systemprogrammierung GmbH Address:Arkaden Strasse 5 49186Bad Iburg Country:Germany Name for contact purposes:Mr. Holger Bauszus Tel:+49-(0)-5403-7243-220 Fax:+49-(0)-5403-780103 e-mail address:[email protected] 1.3DATES Date of receipt of test sample:18 November 2008 Start of test:18 November 2008 End of test:01 December 2008 TEST REPORT REFERENCE: F082825E01 Examiner: Raimund BLASKDate of issue: 02 December 2008Page4 of31 1.4TEST LABORATORY The tests were carried out at:PHOENIX TESTLAB GmbH Königswinkel 10 D-32825 BlombergPhone:+49 (0) 52 35 / 95 00-0 GermanyFax:+49 (0) 52 35 / 95 00-10 Test engineer:Raimund BLASK02 December 2008 NameSignatureDate Test report checked:Bernd STEINER02 December 2008 NameSignatureDate Stamp 1.5RESERVATION T h i s t e s t r e p o r t i s o n l y va l i…
Text truncated - open the document above for the full version.
Test Setup Photos
Annex A of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BLASKDate of issue: 01 December 2008page1 of6 82825emi2.jpgTest set-up fully anechoic chamber(E -Field) Annex A of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BLASKDate of issue: 01 December 2008page2 of6 82825emi5.jpgTest set-up fully anechoic chamber (H-Field) Annex A of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BLASKDate of issue: 01 December 2008page3 of6 82825emi8.jpgTest set-up open area test site (E-Field) Annex A of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BLASKDate of issue: 01 December 2008page4 of6 82825emi13.jpgTest set-up open area test site (H-Field) Annex A of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BLASKDate of issue: 01 December 2008page5 of6 82825clima2.jpgTest set-up climatic chamber Annex A of test report F082825E01 EUT: MiCard Legic/Mifare Manufacturer: NT-ware Systemprogrammierung GmbH Examiner: Raimund BLASKDate of issue: 01 December 2008page6 of6 82825emi13.jpgTest set-up conducted emissions
Contact Information
Applicant
Holger Bauszus(Hardware Developer)
Test Firm
PHOENIX TESTLAB GmbHHolger Bentje
Technical Specifications
| # | Rule Parts | Frequency Range | Power Output | Tolerance |
|---|---|---|---|---|
| 1 | 15C | 13.56 MHz - 13.56 MHz | - | 0.0100000000 % |
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