YHLBLUJ6SSmart Phone

-1- J6S Android 8.1is the Operating System for your Touch Screen3909. -2- INTRODUCTION Thanks for choosing j6s, Single SIM Android, 3G smart phone based on 1.3GHz Quad Core Processor.This smartphone is running on Android 8.1OS.If you’d like your phone to live a long and fruitful life, please read this guide carefully and keep it for future reference. You never know when you might need it. And don’t worry if the pictures we use to demonstrate your phone’s functions look a little different from what you see on its screen. It’s the functions that matter. -3- Table of Contents 1 Safety ...................................................................... 4 1.1 Safety Precautions ............................................. 4 1.2 Using your phone safely ................................... 4 2 Understanding your Phone ................................. 7 2.1 Your Phone ......................................................... 7 Here need to add your own pictures ........................ 7 2.2 Description Icons ............................................... 7 2.3 Charging the battery .......................................... 8 2.4 Power ON/OFF ................................................... 8 2.5 Enter Main Menu ................................................ 8 2.6 Enter Sub Menu ................................................. 8 2.7 Use Notification Panel ....................................... 9 2.8 Move icons on the main interface ................... 9 2.9 Delete icons on the main interface .................... 9 2.10 Change wallpapers ............................................ 9 2.11 Recent tasks ....................................................... 9 2.12 Install APK through File Manager ................... 9 3 Using your Phone ................................................. 11 3.1 Main Menu & Its Functions ............................... 11 3.2 Wi-Fi ..................................................................... 14 4 Inputting Text ......................................................... 15 5 Maintenance .......................................................... 16 6 Taking Care of your Device ................................. 16 -4- 1 Safety 1.1 Safety Precautions Please read through the following briefings carefully and act in accordance with these rules, so as to prevent causing anydanger or violating any law. SAR Value  W/kg@1g(Head) W/kg@1g(Body)  Use cell phone when the signal strength is good. Keep your calls short or instead use headset or send a text message. This advice applies especially to children, adolescents and pregnant women.  If you are using a Bluetooth headset device, please make sure it has a low power emitter. ROHS Declaration Declaration of Conformity with the requirements of the e-waste Management Rules, 2011 (adopted by Notification S.O.1035 (E) of Ministry of Environment and Forests)  The Product is in conformity with the requirements of Rule 13 of the e-waste Rules. The content of hazardous substance with the exemption of the applications listed in SCHEDULE II of the e-waste Rules: a. Lead (Pb) – not over 0.1% by weight; b. Cadmium (Cd) – not over 0.01% by weight; c. Mercury (Hg) – not over 0.1% by weight; d. Hexavalent chromium (Cr6+) – not over 0.1% by weight; e. Polybrominated biphenyls (PBBs) – not over 0.1% by weight; f. Polybrominateddiphenyl ethers (PBDEs) – not over 0.1% by weight. 1.2 Using your phone safely On The Road Using a phone while driving is illegal in many countries. Please follow local laws and drive safely at all times. Near Sensitive Electronics Don’t use your phone near sensitive electronic equipment – particularly medical devices such as pacemakers – as it could cause them to malfunction. It can also interfere with the operation of fire detectors and other automatic-control equipment. -5- For more information about how your phone affects pacemakers or other electronic equipment, please contact the manufacturer or your local distributor. Your phone may cause interference when used near TVs, radios or automated office equipment. While Flying Your phone can cause interference with aircraft equipment. So it’s essential you follow airline regulations. And if airline personnel ask you to switch off your phone, or disable its wireless functions, please do as they say. In Hospital Your phone may interfere with the normal operation of medical equipment. Follow all hospital regulations and turn it off when you’re asked to by posted warnings or medical staff. At a Petrol Station Don’t use your phone at petrol stations. In fact, it’s always best to switch off whenever you’re near fuels, chemicals or explosives. Around Water Keep your phone away from water (or any other liquid). It’s not a waterproof model. Making Repairs Never take your phone apart. Please leave that to the professionals. Unauthorised repairs could break the terms of your warranty. Broken Antenna Don’t use your phone if the antenna is damaged, as it could cause injury. Around Children Keep your mobile out of children’s reach. It should never be used as a toy and it might not -6- be good for their health. Original Accessories Only use the original accessories supplied with your phone or those approved by the manufacturer. Using unapproved accessories may affect performance, make the warranty void, break national regulations on the use of mobile phones, or even cause injury. Near Explosives Turn off your phone in or near areas where explosive materials are used. Always obey local laws and turn off your phone when requested. Emergency Calls To make an emergency call your phone must be turned on and in an area where there’s network coverage. Dial the national emergency number and press ‘send’. Explain exactly where you are and don’t hang up until help has arrived. Working Temperature The working temperature for the phone is between 0 Degree and 40 Degree Celcius. Please don’t use the phone outside the range. Using the phone under too high or too low temperature…

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BLU Products, Inc. 10814 NW 33rd St # 100 Doral, FL 33172, United States --------------------------------------------------------------------------------------------------------------------- Date: 2022-05-30 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: YHLBLUJ6S Confidentiality Request To whom it may concern, Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of the information accompanying this application as outlined below: ܈ Block Diagram ܈ Tune-Up Information ܈ Operational Description ܈ Security Information ܈ Schematics ܆ Software Defined Radio (SDR) Information ܈ Parts List The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, BLU Products, Inc. ------------------------------- Wei Zeng/Senior Manager

BLU Products, Inc. 10814 NW 33rd St # 100 Doral, FL 33172, United States -------------------------------------------------------------------------------- (FCC ID：YHLBLUJ6S) POWER OF ATTORNEY DATE: 2022-05-30 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Testing Group (Shenzhen) Co., Ltd. Jandy So on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Testing Group (Shenzhen) Co., Ltd. Jandy So on our behalf shall have the same effect as acts of our own. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, BLU Products, Inc. are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, BLU Products, Inc. ------------------------------- Wei Zeng/Senior Manager

Reference No.: WTX22X04081956W001/002/003/004 Page 2 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS EUT View 1 EUT View 2 Reference No.: WTX22X04081956W001/002/003/004 Page 3 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 3 EUT View 4 Reference No.: WTX22X04081956W001/002/003/004 Page 4 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 5 EUT View 6 Reference No.: WTX22X04081956W001/002/003/004 Page 5 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT View 7

Reference No.: WTX22X04081956W001/002/003/004 Page 1 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

Reference No.: WTX22X04081956W001/002/003/004 Page 6 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 EUT Housing and Board View 2 Reference No.: WTX22X04081956W001/002/003/004 Page 7 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EUT Housing and Board View 3 Solder Board-Component View 1 Reference No.: WTX22X04081956W001/002/003/004 Page 8 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 2 Solder Board-Component View 3

Reference No.: WTX22X04081956W001/002/003/004 Page 9 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 4 Solder Board-Component View 5 Reference No.: WTX22X04081956W001/002/003/004 Page 10 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 6 Antenna View

Page: 1/10 Ref : ACR.197.12.21.BES.B Cancel and replace the report ACR.197.12.21.BES.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD 1/F., ROOM 101, BUILDING 1, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD, BLOCK 70 BAO’AN DISTRICT, SHENZHEN, GUANGDONG , CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: SN 18/21 EPGO356 Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Iroise – 295 avenue Alexis de Rochon 29280 PLOUZANE - FRANCE Calibration date: 07/16/2021 Accreditations #2-6789 Scope available on www.cofrac.fr Summary: This document presents the method and results from an accredited COMOSAR E-Field Probe calibration performed at MVG, using the CALIPROBE test bench, for use with a MVG COMOSAR system only. The test results covered by accreditation are traceable to the International System of Units (SI). COMOSAR E-Field Probe Calibration Report COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.197.12.21.BES.B Page: 2/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vI This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Jérôme Le Gall Measurement Responsible 7/16/2021 Checked by : Jérôme Luc Technical Manager 7/16/2021 Approved by : Yann Toutain Laboratory Director 8/23/2021 Customer Name Distribution : Waltek Testing Group (Shenzhen) Co., Ltd Issue Name Date Modifications A Jérôme Luc 7/16/2021 Initial release B Jérôme Luc 8/16/2021 Change customer name/address COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.197.12.21.BES.B Page: 3/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vI This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Linearity ________________________________________________________________ 4 3.2 Sensitivity _______________________________________________________________ 5 3.3 Lower Detection Limit _____________________________________________________ 5 3.4 Isotropy _________________________________________________________________ 5 3.1 Boundary Effect __________________________________________________________ 5 4 Measurement Uncertainty .......................................................................................... 6 5 Calibration Measurement Results .............................................................................. 6 5.1 Sensitivity in air __________________________________________________________ 6 5.2 Linearity ________________________________________________________________ 7 5.3 Sensitivity in liquid ________________________________________________________ 8 5.4 Isotropy _________________________________________________________________ 9 6 List of Equipment .................................................................................................... 10 COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.197.12.21.BES.B Page: 4/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vI This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number SN 18/21 EPGO356 Product Condition (new / used) New Frequency Range of Probe 0.15 GHz-6GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.221 M Dipole 2: R2=0.197 M Dipole 3: R3=0.195 M 2 PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEEE 1528, FCC KDB865664 D01, CENELEC EN62209 and CEI/IEC 62209 standards. Figure 1 – MVG COMOSAR Dosimetric E field Dipole Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEEE 1528, FCC KDB865664 D01, CENELEC EN62209 and CEI/IEC 62209 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their affect. All calibrations / measurements performed meet the fore mentioned standards. 3.1 LINEARITY The evaluation of the linearity was done in free space using the waveguide, performing a power sweep to cover the SAR range 0.01W/kg to 100W/kg. COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.197.12.21.BES.B Page: 5/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vI This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 3.2 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards. 3.3 LOWER DETECTION LIMIT The lower detection limit was assessed using the same measurement set up as used for the linearity measurement. The required lower detection lim…

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 84 TEST REPORT Reference No. .................... : WTX22X04081956W FCC ID ................................ : YHLBLUJ6S Applicant ........................... : BLU Products, Inc. Address ............................. : 10814 NW 33rd St # 100 Doral, FL 33172,USA Manufacturer ..................... The same as Applicant Address ............................. The same as Applicant Product Name ................... : Smart Phone Model No.. .......................... : J6S Standards .......................... : FCC Part 2.1093 IEEE Std C95.1: 2019 IEEE Std C95.3: 2002 + Rev. 2008 IEC/IEEE 62209-1528:2020 Date of Receipt sample .... : 2022-04-28 Date of Test........................ : 2022-04-28 to 2022-05-14 Date of Issue ..................... : 2022-05-21 Test Report Form No. ....... : WTX_Part2_1093W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jack Sun Silin Chen Reference No.: WTX22X04081956W Page 2 of 84 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn TABLE OF CONTENTS 1. General Information ................................................................................................................................................... 4 1.1 Product Description for Equipment Under Test (EUT) ......................................................................................... 4 1.2 Test Standards .................................................................................................................................................... 7 1.3 Test Methodology ................................................................................................................................................ 7 1.4 Test Facility ......................................................................................................................................................... 7 2. Summary of Test Results .......................................................................................................................................... 8 3. Specific Absorption Rate (SAR) ................................................................................................................................ 9 3.1 Introduction .......................................................................................................................................................... 9 3.2 SAR Definition ..................................................................................................................................................... 9 4. SAR Measurement System ...................................................................................................................................... 10 4.1 The Measurement System ................................................................................................................................ 10 4.2 Probe ................................................................................................................................................................. 10 4.3 Probe Calibration Process ................................................................................................................................. 12 4.4 Phantom ............................................................................................................................................................ 13 4.5 Device Holder .................................................................................................................................................... 13 4.6 Test Equipment List ........................................................................................................................................... 14 5. Tissue Simulating Liquids ....................................................................................................................................... 15 5.1 Composition of Tissue Simulating Liquid ........................................................................................................... 15 5.2 Tissue Dielectric Parameters for Head and Body Phantoms ............................................................................. 16 5.3 Tissue Calibration Result ................................................................................................................................... 17 6. SAR Measurement Evaluation ................................................................................................................................ 18 6.1 Purpose of System Performance Check ............................................................................................................ 18 6.2 System Setup .................................................................................................................................................... 18 6.3 Validation Results .............................................................................................................................................. 19 7. EUT Testing Position ............................................................................................................................................... 20 7.1 Define Two Imaginary Lines on The Handset .................................................................................................... 20 7.2 Cheek Position ....................................................…

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Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 67 TEST REPORT Reference No. .................... : WTX22X04081956W003 FCC ID ................................ : YHLBLUJ6S Applicant ........................... : BLU Products, Inc. Address ............................. : 10814 NW 33rd St # 100 Doral, FL 33172,USA Manufacturer ..................... : The same as Applicant Address ............................. : The same as Applicant Product Name ................... : Smart Phone Model No... ......................... : J6S Standards .......................... : FCC Part 15.247 Date of Receipt sample .... : 2022-04-27 Date of Test........................ : 2022-04-27 to 2022-05-24 Date of Issue ..................... : 2022-05-24 Test Report Form No. ....... : WTX_Part 15_247W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Jason Su Silin Chen Reference No.: WTX22X04081956W003 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 67 TABLE OF CONTENTS 1. GENERAL INFORMATION ................................................................................................................................... 5 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ............................................................................... 5 1.2 TEST STANDARDS ................................................................................................................................................... 6 1.3 TEST METHODOLOGY ............................................................................................................................................. 6 1.4 TEST FACILITY ....................................................................................................................................................... 6 1.5 EUT SETUP AND TEST MODE ................................................................................................................................. 7 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................. 9 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................... 10 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. ANTENNA REQUIREMENT ................................................................................................................................ 13 3.1 STANDARD APPLICABLE ....................................................................................................................................... 13 3.2 EVALUATION INFORMATION ................................................................................................................................ 13 4. FREQUENCY HOPPING SYSTEM REQUIREMENTS ................................................................................... 14 4.1 STANDARD APPLICABLE ....................................................................................................................................... 14 4.2 FREQUENCY HOPPING SYSTEM............................................................................................................................. 14 4.3 EUT PSEUDORANDOM FREQUENCY HOPPING SEQUENCE .................................................................................... 15 5. QUANTITY OF HOPPING CHANNELS AND CHANNEL SEPARATION ................................................... 16 5.1 STANDARD APPLICABLE ....................................................................................................................................... 16 5.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 16 5.3 TEST PROCEDURE ................................................................................................................................................. 16 5.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 17 6. DWELL TIME OF HOPPING CHANNEL .......................................................................................................... 18 6.1 STANDARD APPLICABLE ....................................................................................................................................... 18 6.2 TEST SETUP BLOCK DIAGRAM ............................................................................................................................. 18 6.3 TEST PROCEDURE ................................................................................................................................................. 18 6.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 19 7. 20DB BANDWIDTH ............................................................................................................................................... 20 7.1 STANDARD APPLICABLE ....................................................................................................................................... 20 7.2 TEST SETUP BLOCK DIAGRAM ........................................…

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Reference No.: WTX22X04081956W001/002/003/004 Page 11 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Conducted Emission Test Setup* Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX22X04081956W001/002/003/004 Page 12 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX22X04081956W001/002/003/004 Page 13 of 13 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Radiation Emission Test Setup (Above 18GHz) * Means’ only test and setup for PART 15C . ***** END OF REPORT *****