2AB7K-A7751Backlit Bluetooth Keyboard Case for iPad Air 2

SCS-F18:ProjectandProductCertificationRepresentativeAuthorizationLetterPage1of2Rev5.0 775MontagueExpressway Milpitas,CA95035 Tel:408-526-1188 Fax:408-526-1088 Email:[email protected] ProjectandProduct CertificationRepresentative AuthorizationLetter ReasonforAmendment(current/obsolete) RevisionHistory ApprovedDate FromTo InitialRelease(obsolete)1.01.0Nov-14-2006 Revisedwording(obsolete)1.02.0Sept–25-2007 Updatedcompanytemplate(obsolete)2.03.0Jan-31-2012 Updatedletterinformation(obsolete)3.04.0May-23-2014 AddedFCCIDfield(current)4.05.0Sept162014 SCS-F18:ProjectandProductCertificationRepresentativeAuthorizationLetterPage2of2Rev5.0 (AnkerTechnologyCo.,Limited) (2015-09-18) To:SIEMIC,INC. 775MontagueExpressway, Milpitas,CA95035 USA DearSir/Madam, Re:ProductCertificationRepresentativeAuthorizationLetter We,_____AnkerTechnologyCo.,Limited_____herebyauthorizeSIEMIC,Inc.toactasa CertificationBodyforcertifyingforthefollowingproject(s): Productdescription:BacklitBluetoothKeyboardCaseforiPadAir2 Modelname:A7751 FCCID:2AB7K-A7751 Sincerely, Client’ssignature SimonZhang/ProductManager CompanyName:AnkerTechnologyCo.,Limited Address:Room1318-19,HollywoodPlaza,610NathanRoad,Mongkok,Kowloon,Hongkong Email:[email protected]

SCS-F19:ConfidentialityRequestLetterPage 1 of 2 Rev4.0 775MontagueExpressway Milpitas,CA95035 Tel:408-526-1188 Fax:408-526-1088 Email:[email protected] Confidentiality RequestLetter ReasonforAmendment(current/obsolete) RevisionHistory ApprovedDate FromTo InitialRelease(obsolete)1.01.0Nov-14-2006 AddingCFR2.459(obsolete)1.02.0August–11-2008 Updatedcompanytemplate&Addedtextbox (obsolete) 2.03.0Jan-31-2012 AddedICconfidentialityletterform(current)3.04.0March-26-2015 SCS-F19:ConfidentialityRequestLetterPage 2 of 2 Rev4.0 (AnkerTechnologyCo.,Limited) (2015-09-18) To: FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD Subject:PermanentConfidentialityRequestforFCCID:2AB7K-A7751 Weherebyrequestconfidentialtreatmentofinformationaccompanyingthisapplicationasoutlinedbelow: -BlockDiagram -Schematics -OperationalDescription Theabovematerialscontaintradesecretsandproprietaryinformationnotcustomarilyreleasedtothepublic.The publicdisclosureofthesematerialsmaybeharmfultotheapplicantandprovideunjustifiedbenefitstoits competitors. TheapplicantunderstandsthatpursuanttoSection0.457&0.459oftheRules,disclosureofthisapplicationand allaccompanyingdocumentationwillnotbemadebeforethedateoftheGrantforthisapplication. Sincerely, Client’ssignature SimonZhang/ProductManager CompanyName:AnkerTechnologyCo.,Limited Address:Room1318-19,HollywoodPlaza,610NathanRoad,Mongkok,Kowloon,Hongkong Email:[email protected]

Figure1 TheEUT-OverallView Figure2 TheEUT-TopView Figure3 TheEUT-BottomView Figure4 TheEUT-FrontView Figure5 TheEUT-BackView Figure6 TheEUT-RightView Figure7 TheEUT-LeftView

ProductName:BacklitBluetoothKeyboardCaseforiPadAir2 ModelNo.:A7751 FCCID:2AB7K-A7751 ThisdevicecomplieswithPart15oftheFCCRules.Operation issubjecttothefollowingtwoconditions: (1)Thisdevicemaynotcauseharmfulinterference,and (2)Thisdevicemustacceptanyinterferencereceived,including interferencethatmaycauseundesiredoperation.

LabelLocationOnEUT

Figure8 TheEUT-InsideView Figure9 PCBoftheEUT-FrontView Figure10 PCBoftheEUT-BackView Figure11 PCBoftheEUT-FrontView Antenna Figure12 PCBoftheEUT-BackView

RFEXPOSUREEVALUATION FCCID ： 2AB7K-A7751 AccordingtoFCC1.1310:Thecriterialistedinthefollowingtableshallbeused toevaluatetheenvironmentimpactofhumanexposuretoradiofrequency(RF) Radiationasspecifiedin§1.1307(b): RoutineSARevaluationreferstothatspecificallyrequiredby§2.1093,using measurementsorcomputersimulation.WhenroutineSARevaluationisnot required,portabletransmitterswithoutputpowergreaterthantheapplicable lowthresholdrequireSARevaluationtoqualifyforTCBapproval. Mode:BDR Themaximumoutputpowerforlowchannelis:1.825dBm=1.522mW Tuneuptoleranceis:1.825 ± 1dBm TheMax.TuneupPower=2.825dBm=1.916mW Thecalculationresults=1.916/5*√2.402=0.594 ＜ 3 Themaximumoutputpowerformiddlechannelis:2.094dBm=1.620mW Tuneuptoleranceis:2.094 ± 1dBm TheMax.TuneupPower=3.094dBm=2.039mW Thecalculationresults=2.039/5*√2.441=0.637 ＜ 3 Themaximumoutputpowerforhighchannelis:2.484dBm=1.772mW Tuneuptoleranceis:2.484 ± 1dBm TheMax.TuneupPower=3.484dBm=2.230mW Thecalculationresults=2.230/5*√2.480=0.702 ＜ 3 Mode:EDR Themaximumoutputpowerforlowchannelis:1.748dBm=1.496mW Tuneuptoleranceis:1.748 ± 1dBm TheMax.TuneupPower=2.748dBm=1.883mW Thecalculationresults=1.883/5*√2.402=0.584 ＜ 3 Themaximumoutputpowerformiddlechannelis:1.553dBm=1.430mW Tuneuptoleranceis:1.553 ± 1dBm TheMax.TuneupPower=2.553dBm=1.800mW Thecalculationresults=1.800/5*√2.441=0.562 ＜ 3 Themaximumoutputpowerforhighchannelis:1.956dBm=1.569mW Tuneuptoleranceis:1.956 ± 1dBm TheMax.TuneupPower=2.956dBm=1.975mW Thecalculationresults=1.975/5*√2.480=0.622 ＜ 3 TestResults:PASS.

ShenzhenAnbotekComplianceLaboratoryLimited FCCID: 2AB7K-A7751Page1 of 51 ReportNo.: R011508392I ShenzhenAnbotekComplianceLaboratoryLimited Tel:(86)755-26066544Fax:(86)755-26014772www.anbotek.com FCCTESTREPORT for AnkerTechnologyCo., Limited BacklitBluetoothKeyboardCasefor iPadAir 2 ModelNo.: A7751 ReportNumber:R011508392I DateofTest:Aug.17~Sept.16,2015 DateofReport:Sept.16,2015 Preparedfor:AnkerTechnologyCo.,Limited Address:Room1318-19,HollywoodPlaza,610 NathanRoad,Mongkok, Kowloon,Hongkong PreparedBy:ShenzhenAnbotekComplianceLaboratoryLimited Address:1/F.,Building1, SECIndustrialPark,No.0409QianhaiRoad, NanshanDistrict,Shenzhen,Guangdong,China Tel:(86)755-26066544 Fax:(86)755-26014772 ShenzhenAnbotekComplianceLaboratoryLimited FCCID: 2AB7K-A7751Page2 of 51 ReportNo.: R011508392I ShenzhenAnbotekComplianceLaboratoryLimited Tel:(86)755-26066544Fax:(86)755-26014772www.anbotek.com TABLEOF CONTENTS Description Page Test Report 1. GENERALINFORMATION......................................................................................................5 1.1 Descriptionof Device(EUT).................................................................................................................5 1.2 AuxiliaryEquipmentUsedduringTest .................................................................................................6 1.3 Descriptionof Test Facility...................................................................................................................6 1.4 MeasurementUncertainty......................................................................................................................6 2. TESTPROCEDURE....................................................................................................................7 3. CONDUCTEDEMISSION.........................................................................................................8 3.1 BlockDiagramof Test Setup.................................................................................................................8 3.2 PowerLineConductedEmissionMeasurementLimits(15.207)..........................................................8 3.3 Configurationof EUTon Measurement................................................................................................8 3.4 OperatingConditionof EUT .................................................................................................................8 3.5 Test Procedure.......................................................................................................................................9 3.6 PowerLineConductedEmissionMeasurementResults.......................................................................9 4. RADIATIONINTERFERENCE..............................................................................................14 4.1 Requirements(15.247,15.209):...........................................................................................................14 4.2 Test Procedure.....................................................................................................................................14 4.3 Test Configuration...............................................................................................................................16 4.4 Test Results..........................................................................................................................................16 5. CHANNELSEPARATIONTEST............................................................................................25 5.1 MeasurementProcedure.......................................................................................................................25 5.2 Test SET-UP........................................................................................................................................25 5.3 Test Equipment....................................................................................................................................25 5.4 Test Results..........................................................................................................................................26 6. 20DBBANDWIDTHTEST.......................................................................................................28 6.1 MeasurementProcedure.......................................................................................................................28 6.2 Test SET-UP........................................................................................................................................28 6.3 Test Equipment....................................................................................................................................28 6.4 Test Results..........................................................................................................................................28 7. QUANTITYOF HOPPINGCHANNELTEST......................................................................30 7.1 MeasurementProcedure.......................................................................................................................30 7.2 Test SET-UP........................................................................................................................................30 7.3 Test Equipment....................................................................................................................................30 7.4 Test Results..........................................................................................................................................30 8. DWELLTIMETEST................................................................................................................32 8.1 MeasurementProcedure.......................................................................................................................32 8.2 Test SET-UP............................................................................................…

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1PhotoofPowerLineConductedEmissionMeasurement 2PhotoofRadiationEmissionTest