A3LSMF976JPNPortable Handset

REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 141 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC 6415 MHz CHAIN 0 6415 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 142 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-6 (106+26T) 6435 MHz CHAIN 0 6435 MHz CHAIN 1 6475 MHz CHAIN 0 6475 MHz CHAIN 1 6515 MHz CHAIN 0 6515 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 143 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-7 (106+26T) 6535 MHz CHAIN 0 6535 MHz CHAIN 1 6695 MHz CHAIN 0 6695 MHz CHAIN 1 6855 MHz CHAIN 0 6855 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 144 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-8 (106+26T) 6875 MHz CHAIN 0 6875 MHz CHAIN 1 6995 MHz CHAIN 0 6995 MHz CHAIN 1 7115 MHz CHAIN 0 7115 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 145 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC 9.4.9. 802.11be EHT80 MRU MODE (WORST CASE) STANDARD POWER UNII-5 (484+242 (N)) 5985 MHz CHAIN 0 5985 MHz CHAIN 1 6145 MHz CHAIN 0 6145 MHz CHAIN 1 6385 MHz CHAIN 0 6385 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 146 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-7 (484+242T (C)) 6625 MHz CHAIN 0 6625 MHz CHAIN 1 6705 MHz CHAIN 0 6705 MHz CHAIN 1 6785 MHz CHAIN 0 6785 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 147 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC LOW POWER INDOOR UNII-5 (484+242 (N)) 5985 MHz CHAIN 0 5985 MHz CHAIN 1 6145 MHz CHAIN 0 6145 MHz CHAIN 1 6385 MHz CHAIN 0 6385 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 148 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-6 (242+484T (N)) 6465 MHz CHAIN 0 6465 MHz CHAIN 1 6545 MHz CHAIN 0 6545 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 149 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-7 (484+242T (C)) 6625 MHz CHAIN 0 6625 MHz CHAIN 1 6705 MHz CHAIN 0 6705 MHz CHAIN 1 6785 MHz CHAIN 0 6785 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 150 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-8 (484+242T (C)) 6865 MHz CHAIN 0 6865 MHz CHAIN 1 6945 MHz CHAIN 0 6945 MHz CHAIN 1 7025 MHz CHAIN 0 7025 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 151 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC VERY LOW POWER UNII-5 (484+242 (N)) 5985 MHz CHAIN 0 5985 MHz CHAIN 1 6145 MHz CHAIN 0 6145 MHz CHAIN 1 6385 MHz CHAIN 0 6385 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 152 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-6 (242+484T (N)) 6465 MHz CHAIN 0 6465 MHz CHAIN 1 6545 MHz CHAIN 0 6545 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 153 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-7 (484+242T (C)) 6625 MHz CHAIN 0 6625 MHz CHAIN 1 6705 MHz CHAIN 0 6705 MHz CHAIN 1 6785 MHz CHAIN 0 6785 MHz CHAIN 1 REPORT NO: R16238088-E16c DATE: 2026-06-03 FCC ID: A3LSMF976JPN Page 154 of 194 UL LLC 12 Laboratory Drive, Durham, NC 27713; USA TEL: (919) 549-1400 This report shall not be reproduced except in full, without the written approval of UL LLC UNII-8 (484+242T (C)) 6865 MHz CHAIN 0 6865 MHz CHAIN 1 6945 MHz CHAIN 0 6945 MHz CHAIN 1 7025 MHz CHAIN 0 7025 MHz CHAIN 1

FCC ID: A3LSMF976JPN SAR-001: SAR Test Report RevA Test Report SN: 2026.007.01 Page A1 of A27 Appendix A: SAR Test Plots RF SAFETY LABORATORY DUT: A3LSMF976JPN Folder Closed; SN: 1799M Test Conditions Exposure Condition Position, Test Distance [mm] Band Signal, UID Ant. Channel Number Frequency [MHz] ConvF (x,y,z) Body-worn Flat, BACK, 5.00 GSM 850 GSM: Voice, GMSK, 1 slot(s), 10021 A+C Ch. 128 824.200 9.48, 9.32,9.02 Test Setup Test Date Ambient Temp [°C] TSL Temp [°C] Measurement SW Phantom Type Cond. [S/m] TSL Perm. Probe, Cal. Date DAE, Cal. Date 2026-04-15 21.8 20.3 17.0.4.7034 Twin-SAM V8.0 - 2238 Head Simulating Liquid 0.873 43.8 EX3DV4 - SN7969, 2026-01-13 DAE4ip Sn1933, 2026-01-07 Scans Setup Area Scan Zoom Scan Grid Extents [mm] 120.0 x 210.0 30.0 x 30.0 x 31.2 Grid Steps [mm] 15.0 x 15.0 6.0 x 6.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Grading Ratio N/A 1.5 MAIA Y Y Measurement Results psSAR1g [W/Kg] 0.725 Power Drift [dB] -0.02 Peak SAR (Extrapolated) [W/kg] 1.38 M2/M1 [%] 78.3 Dist 3dB Peak [mm] 8.8 FCC ID: A3LSMF976JPN SAR-001: SAR Test Report RevA Test Report SN: 2026.007.01 Page A2 of A27 RF SAFETY LABORATORY DUT: A3LSMF976JPN Folder Open; SN: 1799M Test Conditions Exposure Condition Position, Test Distance [mm] Band Signal, UID Ant. Channel Number Frequency [MHz] ConvF (x,y,z) Body-worn Flat, BACK, 5.00 GSM 1900 GSM: Voice, GMSK, 1 slot(s), 10021 B Ch. 810 1909.800 7.59, 7.46,7.22 Test Setup Test Date Ambient Temp [°C] TSL Temp [°C] Measurement SW Phantom Type Cond. [S/m] TSL Perm. Probe, Cal. Date DAE, Cal. Date 2026-04-16 22.8 21.4 17.0.4.7034 Twin-SAM V8.0 - 2238 Head Simulating Liquid 1.42 41.9 EX3DV4 - SN7969, 2026-01-13 DAE4ip Sn1933, 2026-01-07 Scans Setup Area Scan Zoom Scan Grid Extents [mm] 180.0 x 210.0 36.0 x 32.0 x 31.2 Grid Steps [mm] 15.0 x 15.0 4.0 x 4.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Grading Ratio N/A 1.5 MAIA Y Y Measurement Results psSAR1g [W/Kg] 0.567 Power Drift [dB] 0.01 Peak SAR (Extrapolated) [W/kg] 1.22 M2/M1 [%] 79.6 Dist 3dB Peak [mm] 6.4 FCC ID: A3LSMF976JPN SAR-001: SAR Test Report RevA Test Report SN: 2026.007.01 Page A3 of A27 RF SAFETY LABORATORY DUT: A3LSMF976JPN Folder Closed; SN: 1799M Test Conditions Exposure Condition Position, Test Distance [mm] Band Signal, UID Ant. Channel Number Frequency [MHz] ConvF (x,y,z) Body- worn/Hotspot Flat, BACK, 5.00 UMTS Band 5 UMTS-FDD: Rel. 99, RMC, QPSK, 5.0 MHz, 10011 A Ch. 4183 836.600 9.05, 9.79,8.99 Test Setup Test Date Ambient Temp [°C] TSL Temp [°C] Measurement SW Phantom Type Cond. [S/m] TSL Perm. Probe, Cal. Date DAE, Cal. Date 2026-05-26 22.1 21.8 17.0.4.7034 Twin-SAM V8.0 - 2165 Head Simulating Liquid 0.874 44.5 EX3DV4 - SN7872, 2025-08-08 DAE4ip Sn1843, 2025-07-30 Scans Setup Area Scan Zoom Scan Grid Extents [mm] 120.0 x 210.0 32.0 x 32.0 x 31.2 Grid Steps [mm] 15.0 x 15.0 4.0 x 4.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Grading Ratio N/A 1.5 MAIA Y Y Measurement Results psSAR1g [W/Kg] 0.784 Power Drift [dB] 0.05 Peak SAR (Extrapolated) [W/kg] 1.66 M2/M1 [%] 76.6 Dist 3dB Peak [mm] 7.4 FCC ID: A3LSMF976JPN SAR-001: SAR Test Report RevA Test Report SN: 2026.007.01 Page A4 of A27 RF SAFETY LABORATORY DUT: A3LSMF976JPN Folder Open; SN: 1870M Test Conditions Exposure Condition Position, Test Distance [mm] Band Signal, UID Ant. Channel Number Frequency [MHz] ConvF (x,y,z) Body- worn/Hotspot Flat, BACK, 5.00 LTE Band 12 LTE-FDD: 10.0 MHz, QPSK, 1 RB (Low), 10175 A+C Ch. 23095 707.500 9.62, 9.46,9.15 Test Setup Test Date Ambient Temp [°C] TSL Temp [°C] Measurement SW Phantom Type Cond. [S/m] TSL Perm. Probe, Cal. Date DAE, Cal. Date 2026-04-13 21.1 20.8 17.0.4.7034 Twin-SAM V8.0 - 2238 Head Simulating Liquid 0.858 44.4 EX3DV4 - SN7969, 2026-01-13 DAE4ip Sn1933, 2026-01-07 Scans Setup Area Scan Zoom Scan Grid Extents [mm] 180.0 x 210.0 36.0 x 36.0 x 31.2 Grid Steps [mm] 15.0 x 15.0 6.0 x 6.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Grading Ratio N/A 1.5 MAIA Y Y Measurement Results psSAR1g [W/Kg] 0.595 Power Drift [dB] -0.06 Peak SAR (Extrapolated) [W/kg] 1.24 M2/M1 [%] 76.0 Dist 3dB Peak [mm] 8.1 FCC ID: A3LSMF976JPN SAR-001: SAR Test Report RevA Test Report SN: 2026.007.01 Page A5 of A27 RF SAFETY LABORATORY DUT: A3LSMF976JPN Folder Open; SN: 1870M Test Conditions Exposure Condition Position, Test Distance [mm] Band Signal, UID Ant. Channel Number Frequency [MHz] ConvF (x,y,z) Body- worn/Hotspot Flat, BACK, 5.00 LTE Band 13 LTE-FDD: 10.0 MHz, QPSK, 50% RB (Low), 10154 A+C Ch. 23230 782.000 9.62, 9.46,9.15 Test Setup Test Date Ambient Temp [°C] TSL Temp [°C] Measurement SW Phantom Type Cond. [S/m] TSL Perm. Probe, Cal. Date DAE, Cal. Date 2026-04-13 21.1 20.8 17.0.4.7034 Twin-SAM V8.0 - 2238 Head Simulating Liquid 0.885 44.1 EX3DV4 - SN7969, 2026-01-13 DAE4ip Sn1933, 2026-01-07 Scans Setup Area Scan Zoom Scan Grid Extents [mm] 180.0 x 210.0 30.0 x 30.0 x 31.2 Grid Steps [mm] 15.0 x 15.0 6.0 x 6.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Grading Ratio N/A 1.5 MAIA Y Y Measurement Results psSAR1g [W/Kg] 0.752 Power Drift [dB] 0.01 Peak SAR (Extrapolated) [W/kg] 1.53 M2/M1 [%] 79.4 Dist 3dB Peak [mm] 8.1 FCC ID: A3LSMF976JPN SAR-001: SAR Test Report RevA Test Report SN: 2026.007.01 Page A6 of A27 RF SAFETY LABORATORY DUT: A3LSMF976JPN Folder Open; SN: 1870M Test Conditions Exposure Condition Position, Test Distance [mm] Band Signal, UID Ant. Channel Number Frequency [MHz] ConvF (x,y,z) Body- worn/Hotspot Flat, BACK, 5.00 LTE Band 5 LTE-FDD: 10.0 MHz, QPSK, 50% RB (Low), 10154 A+C Ch. 20525 836.500 9.48, 9.32,9.02 Test Setup Test Date Ambient Temp [°C] TSL Temp [°C] Measurement SW Phantom Type Cond. [S/m] TSL Perm. Probe, Cal. Date DAE, Cal. Date 2026-04-13 21.1 20.8 17.0.4.7034 Twin-SAM V8.0 - 2238 Head Simulating Liquid 0.905 44.0 EX3DV4 - SN7969, 2026-01-13 DAE4ip Sn1933, 2026-01-07 Scans Setup Area Scan Zoom Scan Grid Extents [mm] 180.0 x 210.0 42.0 x 42.0 x 31.2 Grid Steps [mm] 15.0 x 15.0 6.0 x 6.0 x 1.5 Sensor Surface [mm] 3.0 1.4 Grading Ratio N/A 1.5 MAIA Y Y Measurement Results psSAR1g [W/Kg] 0.796 Power Drift …

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Next Generation Test Laboratory Inc. (RF Safety Laboratory, LLC) ) 5520 Research Park Drive, Suite 140, Catonsville, Maryland 21228 USA FCC Designation Number: US3274 ANAB 17025 Certificate Number: AT-3274 ☎+1 202 240 9240; [email protected] FCC ID: A3LSMF976U SAR-001: SAR Test Report RevA Test Report S/N: 2026.005.08 Rev1 Page 1 of 8 PART 0 RF EXPOSURE REPORT FCC ID: A3LSMF976U Model (s): SM-F976U, SM-F976U1 Device Type: Portable Handset Report Issue Date: May 27, 2026 Samsung Electronics Co., Ltd. 129, Samsung-ro, Yeongtong-gu, Suwon-si , Gyeonggi-do, 16677, Rep. of Korea Certification The measurement evaluations presented in this report are based on the maximum performance of the tested device(s), which has been shown to be capable of compliance for localized specific absorption rate (SAR) for uncontrolled environment/ general population exposure federal limits in 47CFR § 1.1310 and has been tested in accordance with the measurement procedures specified within this report. This document must be reproduced in its entirety without any alterations unless with written permission from RF Safety Laboratory, LLC. This document has been revised and replaces all previously issued versions of this document with the same Test Report S/N. Steve Liu President Next Generation Test Laboratory Inc. (RF Safety Laboratory, LLC) ) 5520 Research Park Drive, Suite 140, Catonsville, Maryland 21228 USA FCC Designation Number: US3274 ANAB 17025 Certificate Number: AT-3274 ☎+1 202 240 9240; [email protected] FCC ID: A3LSMF976U SAR-001: SAR Test Report RevA Test Report S/N: 2026.005.08 Rev1 Page 2 of 8 Table of Contents 1. DUT Specifics ................................................................................................................................................. 3 2. SAR Characterization ..................................................................................................................................... 4 3. SAR results .................................................................................................................................................... 7 4. Equipment List .............................................................................................................................................. 8 Next Generation Test Laboratory Inc. (RF Safety Laboratory, LLC) ) 5520 Research Park Drive, Suite 140, Catonsville, Maryland 21228 USA FCC Designation Number: US3274 ANAB 17025 Certificate Number: AT-3274 ☎+1 202 240 9240; [email protected] FCC ID: A3LSMF976U SAR-001: SAR Test Report RevA Test Report S/N: 2026.005.08 Rev1 Page 3 of 8 1. DUT Specifics 1.1. Device under Test The device under test is a wireless device, incorporating the technologies listed in Part 1 RF Exposure report. This device uses the Qualcomm® Gen2 Smart Transmit feature to control and manage transmitting at all times for WWAN/WLAN/BT operations. Additionally, this device support NFC/WPC/UWB technologies, but the output power of these modes are not controlled by the Smart Transmit algorithm. RF Exposure Part 1 report in this report refers to report SN: 2026.005.01 1.2. Time-Averaging Algorithm for RF Exposure Compliance This device is enabled with the Qualcomm® Smart Transmit Gen2 feature. This feature implements a time- averaging algorithm in real time to control and manage transmitting power and ensure the time-averaged RF exposure is in compliance with FCC requirements all the time. This Part 0 report shows SAR characterization of Smart Transmit enabled radios. Characterization is achieved by determining P Limit for those radios that corresponds to the exposure design targets after accounting for all device design related uncertainty. The SAR characterization is denoted as SAR Char in this report. 1.3. Nomenclature Technology Term Description Sub6 WWAN/WLAN/BT P limit Power level that corresponds to the exposure design target (SAR_design_target) after accounting for all device design related uncertainties P max Maximum tune-up output power SAR_design_target Target SAR level < FCC SAR limit after accounting for all device design related uncertainties SAR Char Table containing P limit for all technologies and bands Next Generation Test Laboratory Inc. (RF Safety Laboratory, LLC) ) 5520 Research Park Drive, Suite 140, Catonsville, Maryland 21228 USA FCC Designation Number: US3274 ANAB 17025 Certificate Number: AT-3274 ☎+1 202 240 9240; [email protected] FCC ID: A3LSMF976U SAR-001: SAR Test Report RevA Test Report S/N: 2026.005.08 Rev1 Page 4 of 8 2. SAR Characterization 2.1. DSI and SAR Determination This device uses different Device State Index (DSI) to configure different time averaged power levels based on certain exposure scenarios. Depending on the detection scheme implemented in the smartphone, the worst-case SAR was determined by measurements for the relevant exposure conditions for that DSI. Detailed descriptions of the detection mechanisms are included in the operational description. When 1g SAR and 10g SAR exposure comparison is needed, the worst-case was determined from SAR normalized to 1g or 10g SAR limit. The device state index (DSI) conditions used in Table 3-1 represent different exposure scenarios. Table 2-1 2.2. SAR design Target SAR_design_target is determined by ensuring that it is less than FCC SAR limit after accounting for total device designed related uncertainties specified by the manufacturer. Table 2-2 Scenario Description Head (DSI = 2) _ DUT Configuration is Folder Open _ Device positioned next to ear _ Receiver Active Head (DSI = 3) _ DUT Configuration is Folder Closed _ Device positioned next to ear _ Receiver Active Body-worn (DSI = 0 ) _ DUT Configuration is Folder Open _ Device being used with a body-worn accessory Hotspot (DSI = 0) _ DUT Configuration is Folder Open _ Device transmits in hotspot mode near body _ Hotspot Mode Active Phablet (DSI = 0 ) _ DUT Configuration is Folder Open _ Device is held to hand Body-worn (DSI = 1 …

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RF Safety Laboratory, LLC 5520 Research Park Drive, Suite 140 Catonsville, Maryland 21228 USA +1 202 240 9240 [email protected] Object: Date Issued: D2600V2 – SN: 1215 07/29/2025 Page 1 of 3 IN-HOUSE SAR VERIFICATION SOURCE CALIBRATION EXTENSION Object D2600V2 – SN: 1215 Description SAR Validation Dipole at 2600 MHz Procedure (s) Procedure for SAR Verification Source Calibration Extension In-house Check Date 07/29/2025 Equipment List CBT: Components calibrated before testing. Prior to testing, the measurement paths containing a cable, attenuator, coupler or filter were connected to a calibrated source (i.e. a signal generator, power sensor, or VNA) to determine the losses of the measurement path. The power meter offset was then adjusted to compensate for the measurement system losses. This level offset is stored within the power meter before measurements are made. This calibration verification procedure applies to the system verification and output power measurements. The calibrated reading is then taken directly from the power meter after compensation of the losses for all final power measurements. Measurement Uncertainty = ±27% (k=2) Name Function Signature Tested By: Yue Li Engineer Approved By: Phuong Nguyen Technical Manager ManufacturerModelDescriptionSerial Number Calibration Date Calibration Due CBT Rohde & SchwarzZNL20Vector Network Analyzer1012029/12/20249/12/2025 Rohde & SchwarzZN-Z135Calibration Kit5000-30919283910/31/2410/31/26 Control Company4040Ambient Thermometer2305816578/28/20238/28/2025 Control Company4040Ambient Thermometer2305816628/28/20238/28/2025 Control Company4352Long Stem Liquid Thermometer2306622239/28/20239/28/2025 Control Company4352Long Stem Liquid Thermometer2306622129/28/20239/28/2025 Micro-CoaxUFB205A-0-0240-30x30SMA M-F RF test Cable (DC - 18 GHz)-✓ Maury-Micro360D10dB RF Fixed Attenuator (DC - 18 GHz) + Short Circuit Termination779912/28/202412/28/2025 Huber+SuhnerSF126High Performance RF Cable570292/126✓ SPEAGDAE4ipData Acquisition Electrionics with Integ. Power18399/4/20249/4/2025 SPEAGDAK-3.5DAK-3.5 Dielectric Probe13499/2/20249/2/2025 SPEAGEX3DV4SAR Measurement Probe78369/12/20249/12/2025 SPEAGPowersource1Signal Generator43411/9/20251/9/2026 RF Safety Laboratory, LLC 5520 Research Park Drive, Suite 140 Catonsville, Maryland 21228 USA +1 202 240 9240 [email protected] Object: Date Issued: D2600V2 – SN: 1215 07/29/2025 Page 2 of 3 Per FCC KDB Publication 865664 D01, dipole can have longer calibration intervals of up to three years when it is demonstrated that the SAR target, impedance and return loss of the dipole have remained stable according to the following requirements: 1. Measured SAR does not deviate from the calibrated SAR value by more than 10%. 2. Return loss does not deviate by more than 20% from the previous measurement (i.e. value in dB x 0.2) and meet the required minimum return-loss. 3. Real and imaginary part of the impedance do not deviate by more than 5 Ω from the previous measurement. The following dipole was checked to pass the above 3 requirements to have an extended calibration interval: Dipole SN Freq (MHz) In-house Check Date Cal Date Head SAR target (1g) @ 30dBm (W/kg) Measured Head SAR (1g) @ 17dBm (W/kg) 1g SAR Dev (%) Head SAR target (10g) @ 30dBm (W/kg) Measured Head SAR (10g) @ 17dBm (W/kg) 10g SAR Dev(%) Cert Head Impedance (Ohm) - Real Previous Head Impedance (Ohm) - Real Measured Head Impedance (Ohm) - Real Head Impedance Deviation (Ohm) - Real Cert Head Impedance (Ohm) - Imaginary Previous Head Impedance (Ohm) - Imaginary Measured Head Impedance (Ohm) - Imaginary Head Impedance Deviation (Ohm) - Imaginary Cert Head Return Loss (dB) Previous Head Return Loss (dB) Measured Head Return Loss (dB) Return Loss Dev (%) PASS/FAILNote 1215260011/21/202411/15/202400.000.00%00.000.00%46.946.947.20.30.10.11.31.2-29.9-29.9-29.9-0.03%PASSIn-house check after Calibration 121526007/29/202511/15/202455.32.59-6.55%24.91.17-6.25%46.947.247.30.10.11.31.0-0.3-29.9-29.9-29.412.20%PASS- RF Safety Laboratory, LLC 5520 Research Park Drive, Suite 140 Catonsville, Maryland 21228 USA +1 202 240 9240 [email protected] Object: Date Issued: D2600V2 – SN: 1215 07/29/2025 Page 3 of 3 Impedance and Return-Loss Measurement Plot for Head TSL RF Safety Laboratory, LLC 5520 Research Park Drive, Suite 140 Catonsville, Maryland 21228 USA +1 202 240 9240 [email protected] Object: Date Issued: D750V3 – SN: 1235 11/8/2024 Page 1 of 3 IN-HOUSE SAR VERIFICATION SOURCE CALIBRATION EXTENSION Object D750V3 – SN: 1235 Description SAR Validation Dipole at 750 MHz Procedure (s) Procedure for SAR Verification Source Calibration Extension In-house Check Date 11/7/2024 E quipment List CBT: Components calibrated before testing. Prior to testing, the measurement paths containing a cable, attenuator, coupler or filter were connected to a calibrated source (i.e. a signal generator, power sensor, or VNA) to determine the losses of the measurement path. The power meter offset was then adjusted to compensate for the measurement system losses. This level offset is stored within the power meter before measurements are made. This calibration verification procedure applies to the system verification and output power measurements. The calibrated reading is then taken directly from the power meter after compensation of the losses for all final power measurements. Measurement Uncertainty = ±27% (k=2) Name Function Signature Tested By: Yue Li Engineer Approved By: Phuong Nguyen Technical Manager ManufacturerModelDescriptionSerial Number Calibration Date Calibration Due CBT Rohde & SchwarzZNL20Vector Network Analyzer1012029/12/20249/12/2025 Rohde & SchwarzZN-Z135Calibration Kit5000-30919283910/31/2410/31/26 Control Company4040Ambient Thermometer2305816578/28/20238/28/2025 Control Company4352Long Stem Liquid Thermometer2306622239/28/20239/28/2025 Micro-CoaxUFB205A-0-0240-30x30SMA M-F RF test Cable (DC - 18 GHz)-✓ Mini-CircuitsBW-N20W20+20dB RF Fixed Attenuator (DC - 18 GHz)-…

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Next Generation Test Laboratory Inc. (RF Safety Laboratory, LLC) ) 5520 Research Park Drive, Suite 140, Catonsville, Maryland 21228 USA FCC Designation Number: US3274 ANAB 17025 Certificate Number: AT-3274 ☎️+1 202 240 9240; [email protected] FCC ID: A3LSMF976JPN TAS-001: Time-Averaging Algorithm Validation Report RevA Test Report S/N: 2026.007.02 Page 1 of 42 Time-Averaging Algorithm Validation Report FCC ID: A3LSMF976JPN Model (s): SC-56G, SCG39 Device Type: Portable Handset Report Issue Date: June 01, 2026 Samsung Electronics, Co., Ltd. 129, Samsung-ro, Yeongtong-gu, Suwon-si Gyeonggi-do, 16677, Rep. of Korea Certification The measurement evaluations presented in this report are based on the maximum performance of the tested device(s), which has been shown to be capable of compliance for localized specific absorption rate (SAR) for uncontrolled environment/ general population exposure federal limits in 47CFR § 1.1310 and has been tested in accordance with the measurement procedures specified within this report. This document must be reproduced in its entirety without any alterations unless with written permission from RF Safety Laboratory, LLC. Steve Liu President FCC ID: A3LSMF976JPN TAS-001: Time-Averaging Algorithm Validation Report RevA Test Report SN: 2026.007.02 Page 2 of 42 Table of Contents 1. DUT Specifics ................................................................................................................................................... 3 3. TAS Evaluation Test Cases ............................................................................................................................... 6 4. Part 2 Test Results ........................................................................................................................................... 8 5. Background on Radiofrequency (RF) Exposure Limits .................................................................................. 27 6. Technology Specific Test Setup Requirements ............................................................................................. 28 7. Equipment List .............................................................................................................................................. 41 8. Conclusion ..................................................................................................................................................... 42 Appendix A: Test Setup Photos FCC ID: A3LSMF976JPN TAS-001: Time-Averaging Algorithm Validation Report RevA Test Report SN: 2026.007.02 Page 3 of 42 1. DUT Specifics 1.1. Time-Averaging Algorithm Verification This report demonstrates that the Qualcomm® Smart Transmit enabled device is compliant under Tx varying transmission scenarios per Qualcomm’s recommended test plan. Part 0 and Part 1 test reports complimenting this Time-Averaging Algorithm Validation Report are necessary for a comprehensive RF Exposure evaluation. 1.2. Device under Test The manufacturer has confirmed that the device is within operational tolerances expected for production units and has the same physical, mechanical, and thermal characteristics expected for production units. The serial number of the device used for each test is indicated alongside the results. 1.3. Time-Averaging Algorithm for RF Exposure Compliance This device is enabled with the Qualcomm® Smart Transmit Gen2 feature. This feature implements a time- averaging algorithm in real time to control and manage transmitting power and ensure the time-averaged RF exposure is in compliance with at all times. Note that NFC operations are not enabled with Smart Transmit for this device. The Smart Transmit algorithm maintains the time-averaged transmit power, in turn, time-averaged RF exposure of SAR_design_target, below the predefined time-averaged power limit (i.e., Plimit for sub-6 radio), for each characterized technology and band. Characterization is achieved by determining Plimit for WWAN sub-6/WLAN/BT that corresponds to the exposure design targets after accounting for all device design related uncertainties. The SAR characterization is denoted as SAR Char in this report. Smart Transmit allows the device to transmit at higher power instantaneously, as high as Pmax, when needed, but enforces power limiting to maintain time-averaged transmit power to Plimit. Below table shows Plimit EFS settings and maximum tune up output power Pmax configured for this EUT for various transmit conditions (Device State Index DSI). Table 1-1 SAR Design Calculations SAR_design_target SAR_design_target < SAR_regulatory_limit × 10 −푇표푡푎푙 푈푛푐푒푟푡푎푖푛푡푦 10 Head / Body 10g SAR Limbs 10g SAR Total Uncertainty 1.0 dB 1.0 dB SAR_regulatory_limit 1.6 W/kg 4.0 W/kg SAR_design_target 1.0 W/kg 2.5 W/kg FCC ID: A3LSMF976JPN TAS-001: Time-Averaging Algorithm Validation Report RevA Test Report SN: 2026.007.02 Page 4 of 42 Table 1-2 DSI Descriptions Scenario Description Head (DSI = 2) - DUT configuration is Folder Open. - Device positioned next to ear. - Receiver active. Head (DSI = 3) - DUT configuration is Folder Closed. - Device positioned next to ear. - Receiver active. Body-worn (DSI = 0) - DUT configuration is Folder Open. - Device being used with a body-worn accessory. Hotspot (DSI = 0) - DUT configuration is Folder Open. - Device transmits in hotspot mode near body - Hotspot Mode Active Phablet (DSI = 0) - DUT configuration is Folder Open. - Device held to hand. Body-worn (DSI = 1) - DUT configuration is Folder Closed. - Device being used with a body-worn accessory. Hotspot (DSI = 1) - DUT configuration is Folder Closed. - Device transmits in hotspot mode near body - Hotspot Mode Active Phablet (DSI = 1) - DUT configuration is Folder Closed. - Device held to hand. 1.4. Time-Averaging Algorithm Technical description includes detailed information regarding the implementation of the time-averaging algorithm and parameters used for this device. 1.5. Time-Averaging Algorithm Implementation For this device, a…

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FCC ID: A3LSMF976JPN SAR-002: SAR Test Report RevA Test Report SN: 2026.007.01 Page G1 of G4 Appendix G: Power Reduction Verification G.1. Procedures According to May 2017 TCBC Workshop notes, demonstration of proper functioning of the power reduction mechanisms is required to support the corresponding SAR configurations. The verification process includes evaluation of device state index (DSI) for individual or multiple triggering mechanisms. This device supports manufacturer’s proprietary mechanism which configure the DSI with different time averaged power levels based on certain exposure scenarios. Details of this mechanism can be found in the Operational Description. The power verification was performed using a base station simulator to establish a conducted RF connection for relevant modes and frequency bands. The DSI as displayed on the DUT was recorded before and after the mechanism was triggered. G.2. Power Reduction Verification Result Table G-1 Free-Spa…

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