AZD260Digital Camera

Date: August 1, 2025 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 RE: CFR 47 §2.911 (d)(7) FCC US Agent Letter of Attestation FCC ID: AZD260 Grantee FRN: 0032593667 To whom it may concern: FCC US Agent Contact Person: Julie La Spina Company Name: Canon U.S.A., Inc. FRN: 0033431024 Company Address: One Canon Park Melville, NY 11747 United States Email: [email protected] This letter is to confirm that we have accepted the responsibility to act as US Agent on behalf of Canon Inc. (“the applicant”) for the above referenced FCC ID. We are aware of the requirements and responsibilities of the applicant’s agent for service of process as outlined in the FCC section §2.911(d)(7) and Report and Order FCC 22-84 paragraph 63. Sincerely yours, Signature: Julie La Spina Canon U.S.A., Inc.

canon CANON INC. HEADQUARTERS Tamagawa Office 16-1, Shimonoge 3-chome, Takatsu-ku, Kawasaki-shi, Kanagawa 213-8512, Japan PHONE: +81-3-3758-2111 Special Power of Attorney To whom it may concern: I, Genta Sato of Canon Inc. hereby appoint Sho Tanaka of Canon Inc. to represent me to act on my behalf to do any and all of the following: Sign the following documents on my behalf and apply to FCC for the products. -Letter of agency and anti-drug -Confidentiality cover letters -Any other application document that requires a signature by grantee. The rights, powers and authority in fact to exercise any and all of the rights and powers herein granted shall commence and be in full force and effective from April 9, 2025, unless specifically terminated by either party. Date: April 9, 2025 Place: Japan Genta Sato Canon Inc.

FCC ID GUI Some logos for technical standards the camera has met can be viewed on the screen by choosing MENU ► [ ] tab ► [Certification Logo Display]. DS126933 Manual It is listed on the GUI. Product Marketing Name(PMN) DS126933 Hardware Version Identification Number(HVIN) DS126933 On the bottom of the camera body Package FCC ID: AZD260

Test Report No. 15728190S- A-R1 Page 1 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 RF EXPOSURE TEST REPORT Test Report No. 15728190S-A-R1 Customer Canon Inc. Description of EUT Digital Camera Model Number of EUT DS126933 FCC ID AZD260 Test Regulation FCC 47CFR 2.1093 Test Result Complied Issue Date September 5, 2025 Remarks - Representative Test Engineer Approved By Akihiro Oda Engineer Toyokazu Imamura Engineer CERTIFICATE 1266.03 The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan, Inc. There is no testing item of "Non-accreditation". Report Cover Page -Form-ULID-003532 (DCS:13-EM-F0429) Issue# 24.0 Test Report No. 15728190S- A-R1 Page 2 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 ANNOUNCEMENT REVISION HISTORY Revision Test Report No. Date Page Revised Contents - (Original) 15728190S-A July 29, 2025 - -R1 15728190S-A-R1 September 5, 2025 P11 Section 4.2 WLAN 2.4 GHz 2480 -> 2462  This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.  The results in this report apply only to the sample tested. (Laboratory was not involved in sampling.)  This sample tested is in compliance with the limits of the above re gulation.  The test results in this test report are traceable to the national or international standards.  This test report must not be used by the customer to claim product certification, approval, or endorsement by the A2LA accreditation body.  This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable)  The all test items in this test report are conducted b y UL Japan, Inc. Shonan EMC Lab.  The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan, Inc. has been accredited.  The information provided b y the customer for this report is identified in SECTION 1.  The laboratory is not responsible for information provided by the customer which can impact the validity of the results.  For any test report referred in this report, the latest version (including any revisions) is always referred to.  If the latest version is a revision, it replaces the previous version. See the table below for revisions and versions. Test Report No. 15728190S- A-R1 Page 3 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Reference : Abbreviations (Including words undescribed in this report) A2LA The American Association for Laboratory Accreditation MRA Mutual Recognition Arrangement AC Alternating Current MU-MIMO Multi-User Multiple Input Multiple Output (Radio) AFH Adaptive Frequency Hopping N/A Not Applicable, Not Applied AM Amplitude Modulation NII National Information Infrastructure (Radio) Amp, AMP Amplifier NIST National Institute of Standards and Technology ANSI American National Standards Institute NR New Radio Ant, ANT Antenna NS Nerve Stimulation AP Access Point NSA Normalized Site Attenuation APD Absorbed Power Density NVLAP National Voluntary Laboratory Accreditation Program ASK Amplitude Shift Keying OBW Occupied Band Width Atten., ATT Attenuator OFDM Orthogonal Frequency Division Multiplexing AV Average OFDMA Orthogonal Frequency Division Multiple Access BPSK Binary Phase-Shift Keying PD Power Density BR Bluetooth Basic Rate psPD Peak spatial-average power density BT Bluetooth psPDn+ Surfac e-normal propagation-direction peak spatial-average power density BT LE Bluetooth Low Energy psPDtot+ Total propagating spatial-average peak power density BW BandWidth psPDmod+ Total peak spatial -average power density considering reactive nea r-field effects Cal Int Calibration Interval P/M Power meter CCK Complementary Code Keying PCB Printed Circuit Board CDD Cyclic Delay Diversity PER Packet Error Rate CFR Code of Federal Regulations PHY Physical Layer Ch., CH Channel PK Peak CISPR Comite International Special des Perturbations Radioelectriques PN Pseudo random Noise CW Continuous Wave PP Preamble Puncturing DBPSK Differential BPSK PRBS Pseudo-Random Bit Sequence DC Direct Current PSD Power Spectral Density D-factor Distance factor QAM Quadrature Amplitude Modulation DFS Dynamic Frequency Selection QP Quasi-Peak DQPSK Differential QPSK QPSK Quadrature Phase Shift Keying DSSS Direct Sequence Spread Spectrum RAT Radio Access Technology DUT Device Under Test RBW Resolution Band Width EDR Enhanced Data Rate RDS Radio Data System EIRP, e.i.r.p. Equivalent Isotropically Radiated Power RE Radio Equipment EMC ElectroMagnetic Compatibility RF Radio Frequency EMI ElectroMagnetic Interference RMS Root Mean Square EN European Norm RSS Radio Standards Specifications ERP, e.r.p. Effective Radiated Power RU Resource Unit ETSI European Telecommunications Standards Institute Rx Receiving EU European Union SA, S/A Spectrum Analyzer EUT Equipment Under Test SAR Specific Absorption Rate Fac. Factor SDM Space Division Multiplexing FCC Federal Communications Commission SISO Single Input Single Output (Radio) FHSS Frequency Hopping Spread Spectrum SG Signal Generator FM Frequency Modulation sPD Spatial-average power density Freq. Frequency sPDn+ Surfac e-normal propagation-direction spatial-average power density FSK Frequency Shift Keying sPDtot+ Total propagating spatial-average power density GFSK Gaussian Frequency-Shift Keying sPDmod+ Total spatial -average power density considering reactive nea r-field effects GNSS Global Navigation Satellite System SPLSR SAR to Peak Location Separation Ratio GPS Global Positioning System SVSWR Site-Voltage Standing Wave Ratio HE High Efficiency (e.g. IEEE 802.11ax20HE) TER Total Exposure Ratio HT High Throughput (e.g. IEEE 802.11n20HT) TSL Tissue Simulation Liquid Hori. Horizontal T/R Test Receiver …

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Test Report No. 15728190S- A-R1 Page 34 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Appendix 3-4: Calibration certificates LIMS ID Description Type/Model Serial Number Manufacture 146235 Dosimetric E-Field Probe EX3DV4 3907 SPEAG Test Report No. 15728190S- A-R1 Page 35 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 36 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 37 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 38 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 39 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 40 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 41 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 42 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 43 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 44 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 45 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 46 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 47 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 48 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 49 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 50 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 51 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 52 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 53 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 54 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 55 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 56 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 57 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 58 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 59 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 LIMS ID Description Type/Model Serial Number Manufacture 145090 Dipole Antenna (2.45 GHz) D2450V2 822 SPEAG Test Report No. 15728190S- A-R1 Page 60 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 61 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 62 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 63 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 64 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 65 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 LIMS ID Description Type/Model Serial Number Manufacture 145091 Dipole Antenna (5 GHz) D5GHzV2 1070 SPEAG Test Report No. 15728190S- A-R1 Page 66 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 67 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 68 of 79 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / +81 463 50 6400 Test Report No. 15728190S- A-R1 Page 69 of 79 UL Japan, Inc. Shonan EMC Lab…

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Confidential Antenna Model Name：2337333-x (“-x” is difference suffix of “cable length” and “matching parameter”) Antenna type：mono pole Antenna Gain：2.98dBi@2480MHz 4.94dBi@5350MHz Frequency：2400-2483.5MHz, 5150-5850MHz Cable length：10-200mm Antenna Specification Confidential Antenna Data Measure conditionAntenna 50[mm] XY : 0deg ZX : 90deg XY : 270deg YZ : 270deg ZX : 0deg YZ : 0deg 50[mm] 50x50x1.0[mm] 20[mm] 5[mm] L=10-200[mm] Confidential Antenna Data ：2337333-x＜2.4GHz＞ Liniar Polarization XY-PlaneYZ-PlaneZX-Plane Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] 2400MHzMAX 1.83 -5.16 -2.51 0.74 -0.74 0.94 AVG -3.83-11.44-6.88-3.92 -6.06 -2.70 2440MHzMAX 2.24 -4.37 -2.75 0.77 0.33 1.27 AVG -3.68 -10.71 -6.95 -3.87 -5.60 -2.56 2480MHzMAX 2.98-3.94 -2.48 1.53 1.03 1.67 AVG -3.11 -10.30 -6.70 -3.30 -5.06 -2.20 Peak Gain Frequency Confidential Liniar Polarization XY-PlaneYZ-PlaneZX-Plane Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] 5150MHzMAX 1.49 -0.66 -2.24 -2.08 4.41 1.61 AVG -4.87 -7.45 -6.56 -5.23 -2.76 -4.25 5250MHzMAX -1.34 -3.57 -4.95 -2.79 2.07 -1.15 AVG -7.69 -9.17 -8.82 -6.28 -5.09 -6.73 5350MHzMAX 0.10 -0.75 -2.37 -2.35 4.94 0.65 AVG -6.09 -7.20 -6.82 -5.73 -2.67 -5.14 5550MHzMAX -2.07 -2.17 -5.34 -4.01 2.89 -0.80 AVG -7.93 -8.41 -9.85 -6.93 -4.38 -6.72 5750MHzMAX 0.19 -1.73 0.03 4.70 1.78 1.81 AVG -6.04 -7.89 -5.56 -1.93 -3.90 -3.54 5850MHzMAX -2.01 -7.73 -1.96 -3.30 -0.12 -1.75 AVG -7.60 -12.27 -7.88 -6.83 -7.30 -7.36 Antenna Data ：2337333-x＜5GHz＞ Peak Gain Frequency Confidential Liniar Polarization XY-PlaneYZ-PlaneZX-Plane Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] 5250MHzMAX -1.34 -3.57 -4.95 -2.79 2.07 -1.15 AVG -7.69 -9.17 -8.82 -6.28 -5.09 -6.73 Antenna Data ：2337333-x＜5GHz W52＞ Confidential Liniar Polarization XY-PlaneYZ-PlaneZX-Plane Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] 5350MHzMAX 0.10 -0.75 -2.37 -2.35 4.94 0.65 AVG -6.09 -7.20 -6.82 -5.73 -2.67 -5.14 Antenna Data ：2337333-x＜5GHz W53 (peak)＞ Peak Gain Frequency Confidential Liniar Polarization XY-PlaneYZ-PlaneZX-Plane Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] 5550MHzMAX -2.07 -2.17 -5.34 -4.01 2.89 -0.80 AVG -7.93 -8.41 -9.85 -6.93 -4.38 -6.72 Antenna Data ：2337333-x＜5GHz W56＞ Confidential Liniar Polarization XY-PlaneYZ-PlaneZX-Plane Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] Hor. [dBi] Ver. [dBi] 5750MHzMAX 0.19 -1.73 0.03 4.70 1.78 1.81 AVG -6.04 -7.89 -5.56 -1.93 -3.90 -3.54 Antenna Data ：2337333-x＜5GHz W58＞ Specification Item (English) Test Date Sep 8, 2022 Test EngineerTyco Electronics Japan G.K. Tamura Calibrated Measuring InstrumentReference AntennaDual-Ridge horn antenna, SH600-154, MVG (Calibration Date: March 9, 2022) Measurement ProbeMulti-Probe Measurement system, SG24, MVG Measurement EquipmentENA Network Analyzer, E5071C, Keysight Measurement Software Automated Antenna and OTA Measurement Software Suite, Wave Studio, MVG Near-Field to Far-Field Transformation Software, MV-Sphere, MVG Measurement System / Test Setup Measurement MethodMeasurable Frequency Range: 400 MHz to 10000 MHz Quiet Zone: Spherical Space Diameter 0.84 m

Test Report No. 16037257S-C-R2 Page 1 of 53 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 RADIO TEST REPORT Test Report No. 16037257S-C-R2 CustomerCanon Inc. Description of EUT Digital Camera Model Number of EUT DS126933 FCC ID AZD260 Test Regulation FCC Part 15 Subpart C Test Result Complied Issue Date December 12, 2025 Remarks Wireless LAN (2.4 GHz band) and Bluetooth Low Energy part(s) Conducted Emission and Radiated Spurious Emission Only *Spot chec k This product employs a module that has been previously certified unde r FCC ID AZD241, as documented in Appendix 4. Representative Test Engineer Approved By Takayuki Kobayashi Engineer Toyokazu Imamura Engineer CERTIFICATE 1266.03 The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan, Inc. There is no testing item of "Non-accreditation". Repo rt Cover Page - Form-ULID-003532 (DCS:13-EM-F0429) Issue# 25.0 Test Report No. 16037257S-C-R2 Page 2 of 53 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 ANNOUNCEMENT REVISION HISTORY Revision Test Report No. Date Page Revised Contents - (Original)16037257S-C October 27, 2025 - 1 16037257S-C-R1 December 9, 2025 Update of Remarks on the cover page and the table in 4.1: From “Appendix” to “Appendix 4” Addition of “Supplied with the EUT when marketed” to Remarks of Cable No.1 and 3 in 4.2 2 16037257S-C-R2 December 12, 2025 Update of Appendix 4 This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.  The results in this report appl y only to the sample tested. (Laboratory was not involved in sampling.)  This sample tested is in compliance with the limits of the above re gulation. The test results in this test report are traceable to the national or international standards. This test report must not be used by the customer to claim produc t certification, approval, or endo rsement b y the A2LA accreditation body.  This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirement s. (if applicable)  The all test items in this test report are conducted b y UL Japan, Inc. Shonan EMC Lab. The opinions and the interpretations to the result of the description in this report are outside scope s whe re UL Japan, Inc. has been accredite d.  The information provided b y the customer for this report is identified in SECTION 1.  The laboratory is not responsible for information provided by the customer which can impa ct the validit y of the results. For any test report referred in this report, the latest version (including any revisions) is always referred to.  If the latest version is a revision, it replaces the previous version. See the table below for revision s and version s. Test Report No. 16037257S-C-R2 Page 3 of 53 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Reference: Abbreviations (Including words undescribed in this report) A2LA The American Association for Laboratory Accreditation IEC International Electrotechnical Commission AC Alternating Current IEEE Institute of Electrical and Electronics Engineers AFH Adaptive Frequency Hopping IF Intermediate Frequency AM Amplitude Modulation ILAC International Laboratory Accreditation Conference Amp, AMP Amplifier ISED Innovation, Science and Economic Development Canada ANSI American National Standards Institute ISO International Organization for Standardization Ant, ANT Antenna JAB Japan Accreditation Board AP Access Point LAN Local Area Network ASK Amplitude Shift Keying LIMS Laboratory Information Management System Atten., ATT Attenuator MCS Modulation and Coding Scheme AV Average MRA Mutual Recognition Arrangement BPSK Binary Phase-Shift Keying N/A Not Applicable BR Bluetooth Basic Rate NIST National Institute of Standards and Technology BT Bluetooth NS No signal detect. BT LE Bluetooth Low Energy NSA Normalized Site Attenuation BW BandWidth NVLAP National Voluntary Laboratory Accreditation Program Cal Int Calibration Interval OBW Occupied Band Width CCK Complementary Code Keying OFDM Orthogonal Frequency Division Multiplexing Ch., CH Channel OFDMA Orthogonal Frequency Division Multiple Access CISPR Comite International Special des Perturbations Radioelectriques P/M Power meter CW Continuous Wave PCB Printed Circuit Board DBPSK Differential BPSK PER Packet Error Rate DC Direct Current PHY Physical Layer D-factor Distance factor PK Peak DFS Dynamic Frequency Selection PN Pseudo random Noise DQPSK Differential QPSK PP Preamble Puncturing DSSS Direct Sequence Spread Spectrum PRBS Pseudo-Random Bit Sequence EDR Enhanced Data Rate PSD Power Spectral Density EIRP, e.i.r.p. Equivalent Isotropically Radiated Power QAM Quadrature Amplitude Modulation EMC ElectroMagnetic Compatibility QP Quasi-Peak EMI ElectroMagnetic Interference QPSK Quadri-Phase Shift Keying EN European Norm RBW Resolution Band Width ERP, e.r.p. Effective Radiated Power RDS Radio Data System EU European Union RE Radio Equipment EUT Equipment Under Test RF Radio Frequency Fac. Factor RMS Root Mean Square FCC Federal Communications Commission RSS Radio Standards Specifications FHSS Frequency Hopping Spread Spectrum Rx Receiving FM Frequency Modulation SA, S/A Spectrum Analyzer Freq. Frequency SG Signal Generator FSK Frequency Shift Keying SVSWR Site-Voltage Standing Wave Ratio GFSK Gaussian Frequency-Shift Keying TR Test Receiver GNSS Global Navigation Satellite System Tx Transmitting GPS Global Positioning System VBW Video BandWidth Hori. Horizontal Vert. Vertical ICES Interference-Causing Equipment Standard WLAN Wireless LAN Test Report No. 16037257S-C-R2 Page 4 of 53 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 CONTENTS PAGE SECTION 1: Customer…

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Test Report No. 16037257S-C-R2 Page 53 of 53 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 APPENDIX 4: Test report for Wireless LAN/Bluetooth Combo Module 13024969S-T_DT S_Module.pdf End of Report