
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
RKE Transmitter Model B52TH Locking/Unlocking the doors INSTRUCTIONS When you push the โLockโ button on the transmitter, all the doors can be locked from outsider the vehicle. Make sure all the doors are locked when you leave the vehicle. When you push the โUnlockโ button on the transmitter, all the doors can be unlocked from outside the vehicle. For vehicles sold in U.S.A.: NOTE This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. FCC WARNING Changes or modifications not expressly approved by the party responsible for compliance could void the userโs authority to operate the equipment.
RKE Transmitter Model B52TH External Photograph (Representative) Appearance (Front View) Appearance (Reverse View) 1/5 RKE Transmitter Model B52TH Appearance (Top View) Appearance (Bottom View) 2/5 RKE Transmitter Model B52TH Appearance (Side View) Appearance (Side View) 3/5
RKE Transmitter Model B52TH NAME RKE Transmitter MODEL B52TH Label Layout SCALE Free NOTE: The layout and design of the approval label may be change d.
RKE Transmitter Model B52TH Internal Photograph (Representative) PC board inside the case 4/5 RKE Transmitter Model B52TH PC board (Front View) ๏ผฒ๏ผฆ PATTERN ANTENNA PC board (Reverse View) 5/5
Test report No. : 32FE0237-HO-01-A-R1 Page : 1 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 RADIO TEST REPORT Test Report No. : 32FE0237-HO-01-A-R1 Applicant : Tokai Rika Co., Ltd. Type of Equipment : RKE Transmitter Model No. : B52TH Test regulation : FCC Part 15 Subpart C: 2012 FCC ID : MOZB52TH Test Result : Complied 1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. 2. The results in this report apply only to the sample tested. 3. This sample tested is in compliance with above regulation. 4. The test results in this report are traceable to the national or international standards. 5. This test report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP, NIST, or any agency of the Federal Government. 6. This report is a revised version of 32FE0237-HO-01-A. 32FE0237-HO-01-A is replaced with this report. Date of test: ______________________________ Tested by: ______________________________ Satofumi Matsuyama Engineer of WiSE Japan, UL Verification Service Approved by: ______________________________ Shinya Watanabe Leader of WiSE Japan, UL Verification Service 13-EM-F0429 May 13, 2010 NVLAP LAB CODE: 200572-0 This laboratory is accredited by the NVLAP LAB CODE 200572-0, U.S.A. The tests reported herein have been performed in accordance with its terms of accreditation. *As for the range of Accreditation in NVLAP, you may refer to the WEB address, http://www.ul.com/japan/jpn/pages/services/emc/about/ma rk1/index.jsp#nvlap Test report No. : 32FE0237-HO-01-A-R1 Page : 2 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 CONTENTS PAGE SECTION 1: Customer information ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 3 SECTION 2: Equipment under test (E.U.T.) ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 3 SECTION 3: Test specification, procedures & resultsยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 4 SECTION 4: Operation of E.U.T. during testing ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 7 SECTION 5: Radiated emission (Electric Field Strength of Fundamental and Spurious Emission) 8 SECTION 6: Automatically deactivate ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 9 SECTION 7: -20dB and 99% Occupied Bandwidth ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 9 APPENDIX 1: Photographs of test setup ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 10 Radiated emission ............................................................................................................................. 10 Worst case position ........................................................................................................................... 11 APPENDIX 2: Data of EMI test ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 12 Automatically deactivate................................................................................................................... 12 Radiated Emission (Electric Field Strength of Fundamental and Spurious Emission) ..................... 13 -20dB and 99% Occupied Bandwidth ............................................................................................... 14 Duty Cycle ........................................................................................................................................ 15 APPENDIX 3:Test Instruments ยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยทยท 18 Test report No. : 32FE0237-HO-01-A-R1 Page : 3 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 SECTION 1: Customer information Company Name : Tokai Rika Co., Ltd. Address : 260 Toyota 3-chome, Oguchi-cho, Niwa-gun, Aichi-ken 480-0195 Japan Telephone Number : +81-587-95-0093 Facsimile Number : +81-587-95-5471 Contact Person : Masahiro Kato SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment : RKE Transmitter Model No. : B52TH Serial No. : Refer to Clause 4.2 Rating : DC3.0V Receipt Date of Sample : May 11, 2010 Country of Mass-production : Japan Condition of EUT : Production prototype (Not for Sale: This sample is equivalent to mass-produced items.) Modification of EUT : No Modification by the test lab 2.2 Product Description Model No: B52TH (referred to as the EUT in this report) is the RKE Transmitter. Radio Specification Radio Type : Transmitter Frequency of Operation : 314.35MHz Modulation : AM Antenna type : Pattern Antenna Test report No. : 32FE0237-HO-01-A-R1 Page : 4 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 SECTION 3: Test specification, procedures & results 3.1 Test Specification Test Specification : FCC Part 15 Subpart C: 2012, final revised on February 1, 2012 Title : FCC 47CFR Part15 Radio Frequency Device Subpart C Intentional Radiators Section 15.231 Periodic operation in the band 40.66 - 40.70MHz and above 70MHz *The revision on February 1, 2012 does not affect the test specification applied to the EUT. 3.2 Procedures and results Item Test Procedure Specification Worst margin Results Remarks Conducted emission FCC: ANSI C63.4:2003 7. AC powerline conducted emission measurements FCC: Sectiโฆ
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Test report No. : 32FE0237-HO-01-A-R1 Page : 12 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 APPENDIX 2: Data of EMI test Automatically deactivate Test place Head Office EMC Lab. No.3 Semi Anechoic Chamber Report No. 32FE0237-HO-01 Date 05/13/2010 Temperature/ Humidity 22 deg.C/ 35% RH Engineer Satofumi Matsuyama Mode Normal use mode Time of Transmitting [sec] Limit [sec] Result 0.831 5.00 Pass Test report No. : 32FE0237-HO-01-A-R1 Page : 13 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 Radiated Emission (Electric Field Strength of Fundamental and Spurious Emission) Test place Head Office EMC Lab. No.3 Semi Anechoic Chamber Report No. 32FE0237-HO-01 Date 05/13/2010 Temperature/ Humidity 22 deg.C/ 35% RH Engineer Satofumi Matsuyama Mode Transmitting mode PK FrequencyDetectorAntLossGainDutyLimitRemark FactorFactorInside or Outside [MHz]HorVer[dB/m][dB][dB][dB]HorVer[dBuV/m ]HorVerof Restricted Bands 314.350 PK81.377.414.810.131.8-74.470.595.521.125.0 Carrier 628.700 PK54.053.619.812.032.0-53.853.475.521.722.1 Outside 943.050 PK39.838.422.813.530.8-45.343.975.530.231.6 Outside 1257.400 PK58.566.026.01.934.4-52.059.575.523.516.0 Outside 1571.750 PK52.054.027.12.133.6-47.649.673.926.324.3 Inside 1886.100 PK51.953.828.02.332.9-49.351.275.526.224.3 Outside 2200.450 PK49.549.128.02.532.6-47.447.073.926.526.9 Inside 2514.800 PK58.453.627.72.732.4-56.451.675.519.123.9 Outside 2829.150 PK51.848.528.62.932.2-51.147.873.922.826.1 Inside 3143.500 PK49.950.829.43.132.1-50.351.275.525.224.3 Outside Result = Reading + Ant Factor + Loss (Cable+Attenuator+Filter) - Gain(Amprifier) PK with Duty factor FrequencyDetectorAntLossGainDutyLimitRemark FactorFactor [MHz]HorVer[dB/m][dB][dB][dB]HorVer[dBuV/m ]HorVer 314.350 PK81.377.414.810.131.8-5.968.564.675.57.010.9 Carrier ใญใฃใชใขใQP 628.700 PK54.053.619.812.032.0-5.947.947.555.57.68.0 Outside ใญใฃใชใขใQP 943.050 PK39.838.422.813.530.8-5.939.438.055.516.117.5 Outside ใญใฃใชใขใQP 1257.400 PK58.566.026.01.934.4-5.946.153.655.59.41.9 Outside 1571.750 PK52.054.027.12.133.6-5.941.743.753.912.210.2 Inside 1886.100 PK51.953.828.02.332.9-5.943.445.355.512.110.2 Outside 2200.450 PK49.549.128.02.532.6-5.941.541.153.912.412.8 Inside 2514.800 PK58.453.627.72.732.4-5.950.545.755.55.09.8 Outside 2829.150 PK51.848.528.62.932.2-5.945.241.953.98.712.0 Inside 3143.500 PK49.950.829.43.132.1-5.944.445.355.511.110.2 Outside Result = Reading + Ant Factor + Loss (Cable+Attenuator+Filter) - Gain(Amprifier) + Duty factor (Refer to Duty factor data sheet) *Other frequency noises omitted in this report were not seen or had enough margin (more than 20dB). [dBuV][dBuV/m] Margin [dB] Margin [dB] ReadingResult Reading [dBuV] Result [dBuV/m] Test report No. : 32FE0237-HO-01-A-R1 Page : 14 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 -20dB and 99% Occupied Bandwidth Test place Head Office EMC Lab. No.3 Semi Anechoic Chamber Report No. 32FE0237-HO-01 Date 05/13/2010 Temperature/ Humidity 22 deg.C/ 35% RH Engineer Satofumi Matsuyama Mode Transmitting mode Bandwidth Limit : Fundamental Frequency 314.35MHz x 0.25% = 785.88kHz -20dB BandwidthResult [kHz] 50.14Pass 99% Occupied BandwidthResult [kHz] 133.51Pass [kHz] 785.88 Bandwidth Limit [kHz] 785.88 Bandwidth Limit Test report No. : 32FE0237-HO-01-A-R1 Page : 15 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 Duty Cycle Test place Head Office EMC Lab. No.3 Semi Anechoic Chamber Report No. 32FE0237-HO-01 Date 05/13/2010 Temperature/ Humidity 22 deg.C/ 35% RH Engineer Satofumi Matsuyama Mode Normal use mode ON time(One pulse)ON time(in 100ms) TypeTimes[ms][ms] A420.44018.48 B370.83530.895 C11.2401.24 *1)ON time(in 100ms) = Times * ON time(One pulse) *2)The train of pulses was exceeding 100msec, and that sampled 100msec was the worst case against the pulse train. Blank(a) is intentional OFF time. (Total) ON timeCycleDutyDuty [ms][ms](On time/Cycle)[dB] 50.62100.000.51-5.9 *3)ON time = Type A's ON time (in 100ms) + Type B's ON time (in 100ms) *4)Duty = 20log 10(ON time/Cycle) Test report No. : 32FE0237-HO-01-A-R1 Page : 16 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 Duty Cycle ๏ผ Type A ๏ผ Type B ๏ผ Type C Cycle(1) Cycle(2) Cycle(3) Cycle(4) Blank(a) Test report No. : 32FE0237-HO-01-A-R1 Page : 17 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 Duty Cycle Cycle(1) Cycle(2) Cycle(3) Cycle(4) Test report No. : 32FE0237-HO-01-A-R1 Page : 18 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 APPENDIX 3:Test Instruments EMI test equipment Control No. Instrument Manufacturer Model No Serial No Test Item Calibration Date * Interval(month) MAEC-03 Semi Anechoic Chamber(NSA) TDK Semi Anechoic Chamber 3m DA-10005 RE 2010/02/01 * 12 MOS-13 Thermo-Hygrometer Custom CTH-180 - RE 2010/02/09 * 12 MJM-06 Measuโฆ
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Test report No. : 32FE0237-HO-01-A-R1 Page : 10 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 APPENDIX 1: Photographs of test setup Radiated emission Photo 1 Photo 2 Test report No. : 32FE0237-HO-01-A-R1 Page : 11 of 18 Issued date : February 8, 2012 Revised date : February 27, 2012 FCC ID : MOZB52TH UL Japan, Inc. Head Office EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8116 Facsimile : +81 596 24 8124 Worst case position (Horizontal: X-axis/Vertical : Y-axis) X-axis Y-axis Z-axis
4383-326 Asama-cho, Ise ยท Mie-ken ยท Japan
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15.231 | 314.35 MHz - 314.35 MHz | - |
RKE Transmitter
Equipment Class
DSC - Part 15 Security/Remote Control Transmitter
Receiver
Equipment Class
CYY - Communications Receiver used w/Pt 15 Transmitter
RKE Transmitter
Equipment Class
DSC - Part 15 Security/Remote Control Transmitter
Smart Key Box
Equipment Class
DSC - Part 15 Security/Remote Control Transmitter
RECEIVER
Equipment Class
CYY - Communications Receiver used w/Pt 15 Transmitter