QH7SUB-1GUSB FLASH

- - - - - - - - - - - - - - - - - - - - THI SDEVICE COMPLIE SWITH PART 15 OF THE FCC RULE S.OPERATION I S SUBJECT TO THE FOLLOWING TWO CONDITION S:(1) THI SDEVICE SMAY NOT CAU SE HARMFUL INTERFERENCE, AND(2) THI SDEVICE MU ST ACCEPT ANY INTERFERENCE, RECEIVED, INCLUDING INTERFERENCE THAT MAY CAUSE UNDESIREDOPERATION. Note : This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. Theselimits are designed to provide reasonable protection against harmfulinterference in a residential installation.This equipment generates, uses and can radiate radio frequency energyand, if not installed and used in accordance with the instructions, maycause harmful interference to radio communications. However, there isno guarantee that interference will not occur in a particular installation.If this equipment does cause harmful interference to radio or televisionreception, which can be determined by turning the equipment off andon, the user is encouraged to try to correct the interference by one ormore of the following measures : - Reorient or relocate the receiving antenna.- Increase the separation between the equipment and receiver.- Connect the equipment into an outlet on a circuit different from that to which the receiver is connected. - Consult the dealer or an experienced radio/TV technician for help.NOTE : THE MANUFACTURER IS NOT RESPONSIBLE FOR ANY RADIO OR TV INTERFERENCE CAUSED BY UNAUTHORIZEDMODIFICATION STO THI SEQUIPMENT. SUCH MODIFICATION SCOULD VOID THE USER'S AUTHORITY TO OPERATE THEEQUIPMENT. 1

USB FLASH DRIVE BLOCK DIAGRAM SYSTEM USB PORT USB CONNECTOR CONTROLLER OTI002168 FLASH RAM FLASH RAM 3.3VREGULATOR 12MHz X-TAL ... Cable or Connector WORKING LED(RED) RESET HANA MICRON CONFIDENTIAL--------------------------------------- -------------------------------------------------------------

Photograph of EUT

Label location of EUT

Label sample HANA Micron Inc. Model No :SUB-1G FCC ID :QH7SUB-1G

Inner Photograph of EUT

The test results in this report relate only to the following EUT, and this report shall not be reproduced except in full, without the written approval of the laboratory. EMC TEST REPORT Page 1 of 13 Emission of electromagnetic disturbance Test Report No. : ERI-FCC05-0049 Equipment : USB Flash Drive Name of basic model : SUB-1G Family model : SUB-512MB, SUB-256MB, SUB-128MB Manufacturer : HANA MICRON Inc. Applicant : HANA MICRON Inc. Date of receipt EUT : 10. NOV 2005 Tested date : 14 ~ 28. Nov 2005 Issued date : 29. Nov, 2005 Test results : PASS Test Standards : FCC Part 15 Subpart B (Class B) / Class B digital devices, peripherals EMC Research Institute President 29. NOV 2005 Affirmation Measurements performed by Name : Sang-ik, Lee (signature) Approved by Title : Manager Name : Uk-Cho, Rim (signature) EMC Research Institute File No. ERI-FCC05-0049 Page 2 of 13 E R I, 66-6, Jeil-ri, Yangji-myun, Yongin-si, Gyeonggi-do, Korea Tel: +82-31-336-1186~7 Fax: +82-31-336-1184 CONTENTS 1. CLIENT INFORMATION 2. LABORATORY INFORMATION 3. EQUIPMENT UNDER TEST INFORMATION(EUT) 3.1 Identification of the EUT 3.2 Additional information about the EUT 3.3 Peripheral equipment 4. TEST SPECIFICATIONS 4.1 Standards 5. TEST RESULTS SUMMARY 5.1 Test results 5.2 Measurement uncertainty 6 TEST RESULTS 6.1 CONTINUOUS DISTURBANCE VOLTAGE, MAIN TERMINAL 6.1.1 Operating environment 6.1.2 Test set-up and test procedures 6.1.3 Test instrument 6.1.4 Test results 6.2 RADIATED DISTURBANCE : 30MHz – 1000MHz 6.2.1 Operating environment 6.2.2 Test set-up 6.2.3 Test conditions 6.2.4 Test instrument 6.2.5 Test results 7. PRODURCT PHOTOGRAPHS 7.1 Front Photograph of EUT 7.2 Rear Photograph of EUT Appendix (None) EMC Research Institute File No. ERI-FCC05-0049 Page 3 of 13 E R I, 66-6, Jeil-ri, Yangji-myun, Yongin-si, Gyeonggi-do, Korea Tel: +82-31-336-1186~7 Fax: +82-31-336-1184 1. CLIENT INFORMATION The EUT has been tested by request of : Company : HANA MICRON Inc. Address :#902 Ssangyong IT Twin-Tower 1,442-17 Sangdaewon1-Dong, Joongwon-Gu, Seongnam-City, Gyeonggi-Fo, 462-807, Korea Name of contact : Mr. JungWoo Lee Telephone : +82-31-608-5510 Facsimile : +82-31-608-5400 2. LABORATORY INFORMATION The 10m semi-anechoic chamber and/or EMC facilities are used for these testing. These facilities were accredited by KOLAS, EK, MIC of Korea, FCC of USA. and VCCI of Japan. Address ELECTROMAGNETIC RESEARCH INSTITUTE. 66-6, Jeil-ri, Yangji-myun, Youngin-si, Gyeonggi-do, Korea. Telephone No. : +82-31-336-1186~7 Facsimile No. : +82-31-336-1184 Registered No. KOLAS : 111 EK : J MIC : KR0030 FCC Filing No. : 302567 VCCI Reg. No. : C-2363, R-2183 3. EQUIPMENT UNDER TEST INFORMATION(EUT) 3.1 Identification of the EUT Type of equipment: USB Flash Drive Model name : SUB-1G Brand name : NONE Manufacturer : HANA MICRON Inc. Address :#902 Ssangyong IT Twin-Tower 1,442-17 Sangdaewon1-Dong, Joongwon-Gu, Seongnam-City, Gyeonggi-Fo, 462-807, Korea Telephone : +82-31-608-5510 Facsimile : +82-31-608-5400 Power Rating: : DC 5.0V to PC Country of origin : KOREA EMC Research Institute File No. ERI-FCC05-0049 Page 4 of 13 E R I, 66-6, Jeil-ri, Yangji-myun, Yongin-si, Gyeonggi-do, Korea Tel: +82-31-336-1186~7 Fax: +82-31-336-1184 3.2 Additional information about the EUT Class B, Family Models List: Basic Model Family Model Different Point SUB-1G SUB-512MB SUB-256MB SUB-128MB Difference of Memory Size 3.3 Peripheral equipment Equipment needed for correct operation of the EUT is given below. Description Model No. Serial No. Manufacture Monitor PN15VT PSZS91S Cheong wha elec. PC MTC2 FSZS91S DELL Printer C6427A CN13V1B1RY HP Keyboard SK-8115 CN-0J4636-71616-57B- OYSL YET Foundate Ltd. Mouse SMH-120C TAKY413157H Monterey International Corp. 4. TEST SPECIFICATIONS 4.1 Standards The standard for a EUT is given below. Standard Remark ANSI 63.4: 2003 Methods of Measurement of Radio-Noise Emission from Low-Voltage Electrical and Electronic Equipment in the range of 9 kHz to 40 GHz EMC Research Institute File No. ERI-FCC05-0049 Page 5 of 13 E R I, 66-6, Jeil-ri, Yangji-myun, Yongin-si, Gyeonggi-do, Korea Tel: +82-31-336-1186~7 Fax: +82-31-336-1184 5. TEST RESULTS SUMMARY 5.1 Test Results Standards Test items / Frequency Result 1. Main Terminal disturbance voltage(150kHz~30MHz) Pass ANSI 63.4: 2003 2. Radiated disturbance(30MHz ~ 1000MHz) Pass 5.2 Measurement Uncertainty Although the measured emissions indicate that the EUT complies with required limits, some measurements are close to these limits. When the uncertainty of measurement is considered, there is some possibility that the EUT may not be compliant Compliance or non-compliance with a disturbance limit shall be determined in the following manner. If U lab is less than or equal to U cispr - compliance is deemed to occur if no measured disturbance exceeds the disturbance limit; - non-compliance is deemed to occur if any measured disturbance exceeds the disturbance limit If U lab is greater than U cispr - compliance is deemed to occur if no measured disturbance, increased by (U lab -U cispr ), exceeds the disturbance limit; - non-compliance is deemed to occur if any measured disturbance, increased by (U lab - U cispr ), exceeds the disturbance limit; z Measurement uncertainty for Test Items - Conducted disturbance(150 kHz ~ 30 MHz) : ± 3.0 dB(k=2) - Radiated disturbance( 30 MHz ~ 300 MHz) : ± 4.6 dB(k=2) - Radiated disturbance ( 300 MHz ~ 1 000 MHz) : ± 4.7 dB(k=2) EMC Research Institute File No. ERI-FCC05-0049 Page 6 of 13 E R I, 66-6, Jeil-ri, Yangji-myun, Yongin-si, Gyeonggi-do, Korea Tel: +82-31-336-1186~7 Fax: +82-31-336-1184 6, TEST RESULTS 6.1 CONTINUOUS DISTURBANCE VOLTAGE, MAIN TERMINAL : Frequency range 0.15 MHz to 30 MHz 6.1.1 Operating environment Temperature : 22.0 °C ± 0.7 °C Relative Humidity : 35.0 % ± 4.5 % Atmospheric pressure : 998 hpa ± 0.25 hpa Test location : Shield room 6.1.2 Test set-up and test procedures - Photograph - AC Main LISN LISN Printer KeyboardMouse EUT PC EMC Research Institut…

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Conducted Disturbance<Front> Conducted Disturbance<Rear> Radiated Disturbance<Front> Radiated Disturbance<Rear>