RIIVCMRFV012.4G DIGITAL REVIEW CAMERA WITH MONITOR

Unifat Technology Limited

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Application Details

Equipment Class: DSS - Part 15 Spread Spectrum Transmitter
Date of Grant: Sep 24, 2012
Application Purpose: Original Equipment
Date of Application: Sep 24, 2012
Equipment Note: 2.4G DIGITAL REVIEW CAMERA WITH MONITOR
Frequency Range: 2414.00000000 - 2465.00000000
Company: Unifat Technology Limited
Country: Hong Kong

Documents & Files

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Users Manual

VCM43 2 3 4 5 6 7 8 9 10 15 16

Cover Letter(s)

Unifat Technology Limited Date:September 5, 2012 FCCID: RIIVCMRFV01 To whom may it concern: We declare that the models VCM43, VCM35, DWN30, BT53328F-1 and BT53872F-1 are identical except model number. Sincerely yours,

External Photos

Page 42 of 48 Report No.: WT12074922-S-S-O Waltek Services (Shenzhen) Co.,Ltd. http://www. waltek.com.cn 18 Photographs - Constructional Details 18.1 Camera-Appearance View Page 43 of 48 Report No.: WT12074922-S-S-O Waltek Services (Shenzhen) Co.,Ltd. http://www. waltek.com.cn 18.2 Camera – Open View ANT

ID Label/Location Info

Page 46 of 46 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 18 FCC Label This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable. Proposed Label Location on EUT EUT Back View/ proposed FCC Label Location FCC ID: RIIVCMRFV01 T his device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.

ID Label/Location Info

Page 46 of 47 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 18 FCC Label FCC ID sample for models: VCM43, VCM35, DWN30, BT53328F-1,BT53872F-1 FCC ID: RIIVCMRFV01 This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.

Internal Photos

Page 42 of 46 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 17.3 Camera – PCB View Page 43 of 46 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 17.4 Lens – Open View 17.5 Lens – PCB View Page 44 of 46 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 17.6 RF module for Camera - View ANT. Page 45 of 46 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Test Report

Page 1 of 13 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn TEST REPORT Reference No.................... : WT12075014-S-S-F Applicant .......................... : Unifat Technology Limited Address............................. : 7/Floor, Sui Hong Industrial Building, 547-549 Castle Peak Road, Kwai Chung, New Territories, HongKong Manufacturer ................... : DONGGUAN EASYFAT ELECTRONIC MFY.SIMA Address............................. : Sheima Sheung, Shueng ping chang, Dongguan China Product Name................... : 2.4G Digital review camera with monitor Model No. ......................... : VCM43, VCM35, DWN30, BT53328F-1, BT53872F-1 Standards ......................... : FCC PART15 SUBPART B 2010 Date of Receiving sample. : July 24, 2012 Date of Test ...................... : July 24~August 27, 2012 Date of Issue ..................... : August 28, 2012 Test Report Form No......... : FCC 15-2A Test Result ........................ : Pass * Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Services (Shenzhen) Co., Ltd. Address: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Testing location: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Tel :+86-755-83551033 Fax:+86-755-83552400 Compiled by: Approved by: Zero Zhou / Project Engineer Philo Zhong / Manager Reference No.: WT12075014-S-S-F Page 2 of 13 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 1 Test Summary Test Item Test Requirement Class Test Method Test Result Conducted Emission (150KHz to 30MHz) FCC PART 15, SUBPART B: 2010 Class B ANSI C63.4: 2003 N/A Radiated Emission (30MHz to 1GHz) FCC PART 15, SUBPART B: 2010 Class B ANSI C63.4: 2003 Pass Pass Test item meets the requirement N/A Test case does not apply to the test object Reference No.: WT12075014-S-S-F Page 3 of 13 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Contents Page COVER PAGE ································································································································ 1 1 TEST SUMMARY ...................................................................................................................................................................... 2 2 CONTENTS ................................................................................................................................................................................. 3 3 GENERAL INFORMATION .................................................................................................................................................... 4 3.1 GENERAL DESCRIPTION OF E.U.T.................................................................................................................................... 4 3.2 DETAILS OF E.U.T. ............................................................................................................................................................ 4 3.3 DESCRIPTION OF SUPPORT UNITS ..................................................................................................................................... 4 3.4 STANDARDS APPLICABLE FOR TESTING .......................................................................................................................... 4 3.5 TEST FACILITY .................................................................................................................................................................... 4 3.6 SUBCONTRACTED ............................................................................................................................................................... 4 3.7 ABNORMALITIES FROM STANDARD CONDITIONS............................................................................................................. 4 4 EQUIPMENT USED DURING TEST.................................................................................................................................... 5 4.1 MEASUREMENT UNCERTAINTY .......................................................................................................................................... 5 5 EMISSION TEST RESULTS ................................................................................................................................................. 6 5.1 RADIATION EMISSION DATA FOR 30MHZ TO 1000MHZ ............................................................................................. 6 5.1.1 E.U.T. Operation........................................................................................................................................................ 6 5.1.2 Block Diagram of Test Setup ................................................................................................................................ 6 5.1.3 Measurement Data .................................................................................................................................................... 6 5.1.4 Radiated Emission test datas, 30MHz to 1000MHz ....................................................................................... 7 6 PHOTOGRAPHS – TEST SETUP ....................................................................................................................................... 8 6.1 PHOTOGRAPH –RADIATED EMISSION TEST SETUP ........................................................................................................ 8 7 PHOTOGRAPHS – CONSTRUCTIONAL DETAILS ...................................................................................................... 9 7.1 EUT –EXTERNAL VIEW .........................................................................…

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Test Report

TEST REPORT Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn FCC ID : RIIVCMRFV01 Applicant : Unifat Technology Limited Address : 7/Floor, Sui Hong Industrial Building, 547-549 Castle Peak Road, Kwai Chung, New Territories, HongKong Manufacturer : DONGGUAN EASYFAT ELECTRONIC MFY.SIMA Address : Sheima Sheung, Shueng ping chang, Dongguan China Equipment Under Test (EUT) : Product Name : 2.4G Digital review camera with monitor Model No. : VCM43, VCM35, DWN30, BT53328F-1,BT53872F-1 Rules : FCC CFR47 Part 15 Subpart C: 2010, FCC CFR47 Part 1 Section 1.1307: 2010 Date of Test : August 21 ~ 29, 2012 Date of Issue : August 29, 2012 Test Result : PASS* Remark: * The sample described above has been tested to be in compliance with the requirements of ANSI C63.4:2003. The test results have been reviewed and comply with the rules listed above and found to meet their essential requirements. PERPARED BY: Waltek Services (Shenzhen) Co., Ltd. 1/F, Fukangtai Building, West of Baima Road., Songgang Street, Bao’an District, Shenzhen, China Tel: +86-755-83551033 Fax: +86-755-83552400 Compiled by: Approved by: Zero Zhou / Project Engineer Philo Zhong / Manager Page 2 of 46 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Test Summary Test Items Test Requirement Result Conducted Emissions 15.207 N/A Radiated Spurious Emissions 15.205(a) 15.209 15.247(d) PASS 20dB Bandwidth 15.247(a)(1) PASS Maximum Peak Output Power 15.247(b)(1) PASS Frequency Separation 15.247(a)(1) PASS Number of Hopping Frequency 15.247(a)(1) PASS Dwell time 15.247(a)(1)(iii) PASS Antenna Requirement 15.203 PASS Maximum Permissible Exposure (Exposure of Humans to RF Fields) 1.1307(b)(1) PASS Page 3 of 46 Report No.: WT12074920-S-S-F Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 3 Contents Page 1 COVER PAGE ................................................................................................................................ 1 2 TEST SUMMARY ......................................................................................................................................................................2 3 CONTENTS .................................................................................................................................................................................3 4 GENERAL INFORMATION.....................................................................................................................................................5 4.1 GENERAL DESCRIPTION OF E.U.T. ........................................................................................................................................ 5 4.2 DETAILS OF E.U.T................................................................................................................................................................... 5 4.3 CHANNEL LIST .......................................................................................................................................................................... 5 4.4 TEST FACILITY .......................................................................................................................................................................... 5 4.5 TEST LOCATION ........................................................................................................................................................................ 5 4.6 GENERAL CONDITION................................................................................................................................................................ 6 4.6.1 Environmental condition of test site ........................................................................................................................6 4.6.2 Test Mode ......................................................................................................................................................................6 5 EQUIPMENT USED DURING TEST ....................................................................................................................................7 5.1 EQUIPMENTS LIST ..................................................................................................................................................................... 7 5.2 MEASUREMENT UNCERTAINTY................................................................................................................................................ 7 5.3 TEST EQUIPMENT CALIBRATION.............................................................................................................................................. 7 6 CONDUCTED EMISSION .......................................................................................................................................................8 6.1 CONDUCTED EMISSION TEST RESULT .................................................................................................................................... 8 7 RADIATED SPURIOUS EMISSIONS .................................................................................................................................9 7.1 EUT OPERATION:..................................................................................................................................................................... 9 7.2 TEST SETUP ............................................................................................................................................................................ 10 7.3 SPECTRUM ANALYZER SETUP .............................................................................................................................................. 11 7.4 TEST PROCEDURE .................................................................................................................................................................. 12 7.5 CORRECTED AMPLITUDE & MARGIN CALCULATION ......................…

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Test Setup Photos

Page 40 of 48 Report No.: WT12074922-S-S-O Waltek Services (Shenzhen) Co.,Ltd. http://www. waltek.com.cn 17 Photographs –Test Setup 17.1 Radiation Spurious Emission Below 30M Hz From 30-1000M Hz Page 41 of 48 Report No.: WT12074922-S-S-O Waltek Services (Shenzhen) Co.,Ltd. http://www. waltek.com.cn Above 1GHz