YR7SKR3000P9SKR 3000

P-53 Label information Label B Label Location (Back side) Notation dimensions (FCC ID / ISED No.) Label A Label B FCC ID:YR7SKR3000P9IC:1048H-SKR3000P9 Label A Units of measure: [mm] By testing based on the requirements of IEC60601-1, we have confirmed the durability of the peeling and the display over the expected period of equipment use.

Test Report No. 14926563S- A-R1 Page 1 of 36 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / Telephone: +81 463 50 6400 SAR Test Report Test Report No. 14926563S-A-R1 Customer KONICA MINOLTA, INC. Description of EUT SKR 3000 Model Number of EUT P-53 FCC ID YR7SKR3000P9 Test Regulation FCC 47CFR 2.1093 Test Result Complied Issue Date May 23, 2024 Remarks - Representative Test Engineer Approved By Hiroshi Naka Engineer Toyokazu Imamura Engineer CERTIFICATE 1266.03 The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan, Inc. There is no testing item of "Non-accreditation". Report Cover Page -Form-ULID-003532 (DCS:13-EM-F0429) Issue# 23.0 (SAR Revision-v23.3sar240122) Test Report No. 14926563S- A-R1 Page 2 of 36 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / Telephone: +81 463 50 6400 ANNOUNCEMENT REVISION HISTORY Original Test Report No.: 14926563S-A This report is a revised version of 14926563S-A. 14926563S-A is replaced with this report. Revision Test Report No. Date Page Revised Contents - (Original) 14926563S-A February 21, 2024 - -R1 14926563S-A-R1 May 23, 2024 (p5, clause 2.2) Corrected errors in Feature of EUT) “Model number: P-95~” (was) -> “Model number: P-53~ “(new) (p36, Appendix 3-4) Corrected errors in the attached calibration data file.  This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.  The results in this report apply only to the sample tested.  This sample tested is in compliance with the limits of the above regulation.  The test results in this test report are traceable to the national or international standards.  This test report must not be used by the customer to claim product certification, approval, or endorsement by the A2LA accreditation body.  This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable)  The all test items in this test report are conducted by UL Japan, Inc. Shonan EMC Lab.  The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan, Inc. has been accredited.  The information provided from the applicant for this report is identified in Section 1.  The laboratory is not responsible for information provided by the customer which can impact the validity of the results.  For test report(s) referred in this report, the latest version (including any revisions) is always referred. Test Report No. 14926563S- A-R1 Page 3 of 36 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN / Telephone: +81 463 50 6400 Reference : Abbreviations (Including words undescribed in this report) (radio_r0v09s06_230726) A2LA The American Association for Laboratory Accreditation JAB Japan Accreditation Board AC Alternating Current LAN Local Area Network AFH Adaptive Frequency Hopping LIMS Laboratory Information Management System AM Amplitude Modulation MCS Modulation and Coding Scheme Amp, AMP Amplifier MIMO Multiple Input Multiple Output (Radio) ANSI American National Standards Institute MRA Mutual Recognition Arrangement Ant, ANT Antenna MU-MIMO Multi-User Multiple Input Multiple Output (Radio) AP Access Point N/A Not Applicable, Not Applied APD Absorbed Power Density NII National Information Infrastructure (Radio) ASK Amplitude Shift Keying NIST National Institute of Standards and Technology Atten., ATT Attenuator NR New Radio AV Average NS No signal detect. BPSK Binar y Phase-Shift Keying NSA Normalized Site Attenuation B R Bluetooth Basic Rate OBW Occupied Band Width BT Bluetoot h OFDM Orthogonal Frequency Division Multiplexing BT L E Bluetooth Low Energy PD Power Density BW BandWidt h P/M Power meter Cal In t Calibration Interval PCB Printed Circuit Board CCK Complementar y Code Keying PER Packet Error Rate CDD C yclic Delay Diversity PHY Physical Layer CF R Code of Federal Regulations PK Peak Ch., CH Channel PN Pseudo random Nois e CISP R Comite International Special des Perturbations Radioelectriques PRBS Pseudo-Random Bit Sequence CW Continuous Wav e PSD Power Spectral Density DBPSK Differential BPSK QAM Quadrature Amplitude Modulatio n D C Direct Current QP Quasi-Peak D -factor Distance factor QPSK Quadrature Phase Shift Keying DF S Dynamic Frequency Selection RBW Resolution Band Width DQPSK Differential QPSK RD S Radio Data System DSS S Direct Sequence Spread Spectrum RE Radio Equipment DUT Device Under Tes t RF Radio Frequency ED R Enhanced Data Rate RMS Root Mean Square EIRP, e.i.r.p. Equivalent Isotropicall y Radiated Power RSS Radio Standards Specifications EM C ElectroMagnetic Compatibility RU Resource Unit EMI ElectroMa gnetic Interference Rx Receiving EN European Norm SA, S/ A Spectrum Analyzer ERP, e.r.p. Effective Radiated Powe r SAR Specific Absorption Rate ETSI European Telecommunications Standards Institut e SDM Space Division Multiplexing EU European Unio n SISO Single Input Single Output (Radio) EUT Equipment Under Tes t SG Signal Generator Fac. Facto r SPLSR SAR to Peak Location Separation Ratio FC C Federal Communications Commission SVSWR Site-Voltage Standing Wave Ratio FHS S Frequency Hopping Spread Spectrum TSL Tissue Simulation Liquid FM Frequenc y Modulation T/R Test Receiver Freq. Frequenc y Tx Transmitting FSK Frequenc y Shift Keying U-NII Unlicensed National Information Infrastructure (Radio) GFSK Gaussian Frequenc y-Shift Keying VBW Video BandWidth GNS S Global Navigation Satellite System Vert. Vertical GP S Global Positioning System VHT Very High Throughput (e.g. IEEE 802.11ac20VHT) H E High Efficiency (e.g. IEEE 802.11ax20HE) WLAN Wireless LAN HT Hi gh Throughput (e.g. IEEE 802.11n20HT) Wi-Fi, WiFi Wireless LAN, trademarked by Wi-Fi Alliance Hori. Horizontal ICE S Interference-Causing Equipment Standard IE C International Electr…

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Antenna list 2.4GHz5GHz Main AntennaA8CE780101B (AEP8P-100000)-1.95-0.98 Sub AntennaA8CE780201B (AEP8P-100001)-2.21-1.54 Each antenna gain shows a typical value in the assembled state. See Antenna specifications for details. Model nameMain/SubAntenna Product NO Antenna Gain [dBi] P-53

B2,No. 207, Sec.3, Beixin Rd., Xindian Dist.,New Taipei City 231, Taiwan, R.O.C TEL：886-2-8913-1939 FAX：886-2-8913-2538 Http：//www.acon.com WSFA160145-KS Rev.4 SPECIFICATION FOR APPROVAL CUSTOMER: Konica Minolta,Inc CUSTOMER P/N : A8CE780101B MODEL NAME:G-ANTENNA1 ACON P/N:AEP8P-100000 ACON Approved R&D Manager / Shawke.Hsiao Mechanical Manager / Shawke.Hsiao Q&R Manager / Fish Tong Project Engineer / Hengsen.Ding Product Manager / Yan.sun Customer Approval R&D Manager WLAN Antenna for Konica Minolta,Inc 1. Description------------------------------------------------------------------------------------------------------------------------ 1 1.1 Specifications----------------------------------------------------------------------------------------------------------- 1 1.2 Antenna Picture--------------------------------------------------------------------------------------------------------- 1 2. Electrical Specification--------------------------------------------------------------------------------------------------------- 2 2.1 Test Equipment--------------------------------------------------------------------------------------------------------- 2 2.2 Test Setup--------------------------------------------------------------------------------------------------------------- 2.2.1 Frequency Range----------------------------------------------------------------------------------------------- 2.2.2 VSWR-------------------------------------------------------------------------------------------------------------- 2.2.3 Radiation Pattern & Gain------------------------------------------------------------------------------------- 2 2 2 2 3. Performance Data--------------------------------------------------------------------------------------------------------------- 4 3.1 VSWR--------------------------------------------------------------------------------------------------------------------- 3.2 Radiation pattern ------------------------------------------------------------------------------------------------------ 3.3 Gain----------------------------------------------------------------------------------------------------------------------- 4 5 8 4. Mechanical Specification------------------------------------------------------------------------------------------------------ 4.1 Assembly Drawing----------------------------------------------------------------------------------------------------- 4.2 PackageDrawing------------------------------------------------------------------------------------------------------- 9 9 10 kapton tape WLAN Antenna for Konica Minolta,Inc Jul.20.2017 V.4Page 1 of 11 1 1 . . D D e e s s c c r r i i p p t t i i o o n n 1.1Specifications AntennasTypePIFAAntennaforWLAN802.11a/b/g/napplication ConnectorType1.37IPEX 20351-112R-37 CableTypeOD1.37RFCable Weigth2.5g Impedance50ΩTyp PolarizationLinear RadiationpatternOmni-directional VSWR 2.4~2.484GHz,2.5Max 5.15~5.85GHz,3.0Max Cablelength174mm,Black(ThecablelengthinfromtheedgeofPCBboardtotheconnector) Operatingtemperature0～60°C(20～90%RH) Storagetemperature-20～80°C(5～95%RH) maximumpermissible power 50mW 1.2AntennaPicture G-ANTENNA1 P/N: AEP8P-100000 *天 天天 天線 線線 線功 功功 功能 能能 能較 較較 較為 為為 為敏 敏敏 敏感 感感 感， ，， ，主 主主 主體 體體 體周 周周 周邊 邊邊 邊機 機機 機構 構構 構有 有有 有變 變變 變更 更更 更請 請請 請通 通通 通知 知知 知我 我我 我們 們們 們評 評評 評估 估估 估 Antenna function is very sensitive， ，， ，any changes arround of antenna， ，， ， please inform us to evaluation *PCB OSP、 、、 、銅 銅銅 銅箔 箔箔 箔表 表表 表面 面面 面氧 氧氧 氧化 化化 化（ （（ （黑 黑黑 黑斑 斑斑 斑） ）） ）是 是是 是正 正正 正常 常常 常現 現現 現象 象象 象， ，， ，并 并并 并不 不不 不影 影影 影響 響響 響功 功功 功能 能能 能特 特特 特性 性性 性 Surface oxidation (or black Spot) ia a normal phenomenon of the PCB(OSP) and Cu Foil,It won't affect the antenna function *銅 銅銅 銅箔 箔箔 箔表 表表 表面 面面 面氧 氧氧 氧化 化化 化（ （（ （黑 黑黑 黑斑 斑斑 斑） ）） ）是 是是 是正 正正 正常 常常 常現 現現 現象 象象 象， ，， ，并 并并 并不 不不 不影 影影 影響 響響 響功 功功 功能 能能 能特 特特 特性 性性 性 Surface oxidation (or black Spot) ia a normal phenomenon of the Cu Foil,It won't affect the antenna function WLAN Antenna for Konica Minolta,Inc Jul.20.2017 V.4Page 2 of 11 2. E E l l e e c c t t r r i i c c a a l l S S p p e e c c i i f f i i c c a a t t i i o o n n 2.1TestEquipment A. VSWR and input impedance: Agilent 8720/8753 Network Analyzer B. Antenna gain and efficiency: ETS three-dimensional anechoic chamber 2.2TestSetup 2.2.1 Frequency Range A.WLAN 802.11a: 2.4~2.484 GHz B.WLAN 802.11 a 5.15~5.85 GHz 2.2.2 VSWR Step 1: The antenna is arranged on the customer provided testfixture. Step 2: The VSWR of the antenna is measured via Agilent 8720/8753 Network Analyzer (see figure. 1). Figure.1 2.2.3 Radiation pattern and Gain A. The 3D chamber provides less than -40dB reflectivity from800MHz to 6GHz and a 40cm diameter spherical quiet zone. The measurement results are calibrated using both dipoles and standard gain horns (see figure. 3). B. The antenna under tested is arranged in the turned table and a decoupling sleeve is used to reduce feed line radiation (see figure. 4). C. The measured results of the radiation patterns and antenna gain are obtained from the control system and showed on the monitor (see figure. 5 and 6). WLAN Antenna for Konica Minolta,Inc Jul.20.2017 V.4Page 3 of 11 Figure. 3Figure. 4 Figure. 5Figure. 6 WLAN Antenna for Konica Minolta,Inc Jul.20.2017 V.4Page 4 of 11 3. Performance Data 3.1 VSWR G-ANTENNA1 WLAN Antenna for Konica Minolta,Inc Jul.20.2017 V.4Page 5 of 11 3.2Radiationpattern 3.2.1 G-ANTENNA1 d dd dB BB Bi ii iX XX XY YY Y- -- -P PP Pl ll la aa an nn ne ee e H HH H- -- -P PP Po oo ol ll l. .. .( (( (P PP Pe ee ea aa ak kk k. .. .) )) )- -- -1 11 12 22 2. .. .0 00 08 88 8 V VV V- -- -P PP Po oo ol ll l. .. .( (( (P PP Pe ee ea aa ak kk k. .. .) )) )- -- -1 11 11 11 1. .. .0 00 08 88 8 H HH H+ ++ +V VV V. .. .( (( (P PP Pe ee ea aa ak kk k. .. .) )) )- -- -9 99 9. .. .7 77 75 55 5 H HH H- -- -P PP Po oo ol ll l. .. .( (( (A AA Av vv vg gg g. .. .) )) )- -- -1 11 16 66 6. .. .6 66 67 77 7 V VV V- -- -P PP Po oo ol ll l. .. .( (( (A AA Av vv vg gg g. .. .) )) )- -- -1 11 14 44 4. .. .5…

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Test Report No. 14926560S-G Page 1 of 23 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 RADIO TEST REPORT Test Report No. 14926560S-G Customer KONICA MINOLTA, INC. Description of EUT SKR 3000 Model Number of EUT P-53 FCC ID YR7SKR3000P9 Test Regulation FCC Part 15 Subpart E Test Result Complied Issue Date March 1, 2024 Remarks WLAN (5 GHz band) part DFS test only (* Client without radar detection) Representative Test Engineer Approved By Shiro Kobayashi Engineer Toyokazu Imamura Engineer CERTIFICATE 1266.03 The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan, Inc. There is no testing item of "Non-accreditation". Report Cover Page - Form-ULID-003532 (DCS:13-EM-F0429) Issue# 23.0 Test Report No. 14926560S-G Page 2 of 23 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 ANNOUNCEMENT REVISION HISTORY Original Test Report No. 14926560S-G Revision Test Report No. Date Page Revised Contents - (Original) 14926560S-G March 1, 2024 - This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. The results in this report appl y only to the sample tested. (Laboratory was not involved in sampling.) This sampl e tested is in compliance with the limits of the above re gulation. The test results in this test report are traceable to the national or international standards. This test report must not be used by the customer to claim produc t certification, approval, or endorsement b y the A2LA accreditation body. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirement s. (if applicable) The all test items in this test repo rt are conducted b y UL Japan, Inc. Shonan EMC Lab. The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan, Inc. has been accredited. The information provided from the customer for this report is identified in Section 1.  For test report (s) referred in this report, the latest version (including any revisions) is always referred. Test Report No. 14926560S-G Page 3 of 23 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Reference: Abbreviations (Including words undescribed in this report) A2LA The American Association for Laboratory Accreditation ICES Interference-Causing Equipment Standard AC Alternating Current IEC International Electrotechnical Commission AFH Adaptive Frequency Hopping IEEE Institute of Electrical and Electronics Engineers AM Amplitude Modulation IF Intermediate Frequency Amp, AMP Amplifier ILAC International Laboratory Accreditation Conference ANSI American National Standards Institute ISED Innovation, Science and Economic Develo pment Canada Ant, ANT Antenna ISO International Organization for Standardization AP Access Point JAB Japan Accreditation Board ASK Amplitude Shift Keying LAN Local Area Network Atten., ATT Attenuator LIMS Laboratory Information Management System AV Average MCS Modulation and Coding Scheme BPSK Binary Phase-Shift Keying MRA Mutual Recognition Arrangement BR Bluetooth Basic Rate N/A Not Applicable BT Bluetooth NIST National Institute of Standards and Technology BT LE Bluetooth Low Energy NS No signal detect. BW BandWidth NSA Normalized Site Attenuation Cal Int Calibration Interval NVLAP National Voluntary Laboratory Accreditation Pro gram CCK Complementary Code Keying OBW Occupied Band Width Ch., CH Channel OFDM Orthogonal Frequency Division Multiplexing CISPR Comite International Special des Perturbations Radioelectri ques P/M Power meter CW Continuous Wave PCB Printed Circuit Board DBPSK Differential BPSK PER Packet Error Rate DC Direct Current PHY Physical Layer D-factor Distance factor PK Peak DFS Dynamic Frequency Selection PN Pseudo random Noise DQPSK Differential QPSK PRBS Pseudo-Random Bit Sequence DSSS Direct Sequence Spread Spectrum PSD Power Spectral Density EDR Enhanced Data Rate QAM Quadrature Amplitude Modulation EIRP, e.i.r.p. Equivalent Isotropically Radiated Power QP Quasi-Peak EMC ElectroMagnetic Compatibility QPSK Quadrature -Phase Shift Keying EMI ElectroMagnetic Interference RBW Resolution Band Width EN European Norm RDS Radio Data System ERP, e.r.p. Effective Radiated Power RE Radio Equipment EU European Union RF Radio Frequency EUT Equipment Under Test RMS Root Mean Square Fac. Factor RSS Radio Standards Specifications FCC Federal Communications Commission Rx Receiving FHSS Frequency Hopping Spread Spectrum SA, S/A Spectrum Analyzer FM Frequency Modulation SG Signal Generator Freq. Frequency SVSWR Site-Voltage Standing Wave Ratio FSK Frequency Shift Keying TR Test Receiver GFSK Gaussian Frequency-Shift Keying Tx Transmitting GNSS Global Navigation Satellite System VBW Video BandWidth GPS Global Positioning System Vert. Vertical Hori. Horizontal WLAN Wireless LAN Test Report No. 14926560S-G Page 4 of 23 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 CONTENTS PAGE SECTION 1: Customer Information ......................................................................................... 5 SECTION 2: Equipment Under Test (EUT) .............................................................................. 5 SECTION 3: Scope of Report ................................................................................................... 7 SECTION 4: Test specification, Procedures & Results ......................................................... 7 SECTION 5: Operation of EUT during testing ...................................................................... 12 SECTION 6: Channel Move Time, Channel Closing Transmission Time ........................... 18 SECTION 7: Non-Occupancy Period ....................................…

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Test Report No. 14926560S-F-R2 Page 1 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 RADIO TEST REPORT Test Report No. 14926560S-F-R2 Customer KONICA MINOLTA, INC. Description of EUT SKR 3000 Model Number of EUT P-53 FCC ID YR7SKR3000P9 Test Regulation FCC Part 15 Subpart E Test Result Complied Issue Date July 3, 2024 Remarks WLAN (5 GHz band) part Except for DFS test Representative Test Engineer Approved By Hiromasa Sato Engineer Toyokazu Imamura Engineer CERTIFICATE 1266.03 The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan, Inc. There is no testing item of "Non-accreditation". Report Cover Page - Form-ULID-003532 (DCS:13-EM-F0429) Issue# 23.0 Test Report No. 14926560S-F-R2 Page 2 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 ANNOUNCEMENT REVISION HISTORY Original Test Report No. 14926560S-F This report is a revised version of 14926560S-F-R1. 14926560S-F-R1 is replaced with this report . Revision Test Report No. Date Page Revised Contents - (Original) 14926560S-F March 1, 2024 - 1 14926560S-F-R1 June 27, 2024 P.5 Update of test date: From November 8 to November 21, 2023 to November 8, 2023 to June 21, 2024 P.10 Corrected Radiated Spurious Emission (Below 1 GHz) and Conducted Spurious Emission measurement mode from 11n-20 5580 MHz to 11n-20 5220 MHz P.76 Added 11n-20 5220 MHz results P.82 Removed results below 1 GHz for 11n-20 5580 MHz P.88 Modified tested frequency range: “26.5 GHz to GHz” =>“26.5 GHz to 40 GHz” P.90 Plot data was replaced with 11n-20 5220 MHz. P.91 Replaced tested frequency and data on Conducted Spurious Emission: “11n-20 5580 MHz” => “11n-20 5220 MHz” P.92 Add equipment used below 1 GHz P.93 Corrected measured photo below 1 GHz: From 3AC to 1AC 2 14926560S-F-R2 July 3, 2024 P.16 Added Conducted Spurious Emission P.76 Deleted old test date for above 1 GHz • This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. • The results in this report appl y only to the sample tested. (Laboratory was not involved in sampling.) • This sample tested is in compliance with the limits of the above re gulation. • The test results in this test report are traceable to the national or international standards. • This test report must not be used by the customer to claim product certification, approval, or endorsement b y the A2LA accreditation body. • This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable) • The all test items in this test report are conducted b y UL Japan, Inc. Shonan EMC Lab. • The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan, Inc. has been accredited. • The information provided from the customer for this report is identified in Section 1. • For test report (s) referred in this report, the latest version (including any revisions) is always referred. Test Report No. 14926560S-F-R2 Page 3 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Reference: Abbreviations (Including words undescribed in this report) A2LA The American Association for Laboratory Accreditation ICES Interference-Causing Equipment Standard AC Alternating Current IEC International Electrotechnical Commission AFH Adaptive Frequency Hopping IEEE Institute of Electrical and Electronics Engineers AM Amplitude Modulation IF Intermediate Frequency Amp, AMP Amplifier ILAC International Laboratory Accreditation Conference ANSI American National Standards Institute ISED Innovation, Science and Economic Development Canada Ant, ANT Antenna ISO International Organization for Standardization AP Access Point JAB Japan Accreditation Board ASK Amplitude Shift Keying LAN Local Area Network Atten., ATT Attenuator LIMS Laboratory Information Management System AV Average MCS Modulation and Coding Scheme BPSK Binary Phase-Shift Keying MRA Mutual Recognition Arrangement BR Bluetooth Basic Rate N/A Not Applicable BT Bluetooth NIST National Institute of Standards and Technology BT LE Bluetooth Low Energy NS No signal detect. BW BandWidth NSA Normalized Site Attenuation Cal Int Calibration Interval NVLAP National Voluntary Laboratory Accreditation Program CCK Complementary Code Keying OBW Occupied Band Width Ch., CH Channel OFDM Orthogonal Frequency Division Multiplexing CISPR Comite International Special des Perturbations Radioelectriques P/M Power meter CW Continuous Wave PCB Printed Circuit Board DBPSK Differential BPSK PER Packet Error Rate DC Direct Current PHY Physical Layer D-factor Distance factor PK Peak DFS Dynamic Frequency Selection PN Pseudo random Noise DQPSK Differential QPSK PRBS Pseudo-Random Bit Sequence DSSS Direct Sequence Spread Spectrum PSD Power Spectral Density EDR Enhanced Data Rate QAM Quadrature Amplitude Modulation EIRP, e.i.r.p. Equivalent Isotropically Radiated Power QP Quasi-Peak EMC ElectroMagnetic Compatibility QPSK Quadri-Phase Shift Keying EMI ElectroMagnetic Interference RBW Resolution Band Width EN European Norm RDS Radio Data System ERP, e.r.p. Effective Radiated Power RE Radio Equipment EU European Union RF Radio Frequency EUT Equipment Under Test RMS Root Mean Square Fac. Factor RSS Radio Standards Specifications FCC Federal Communications Commission Rx Receiving FHSS Frequency Hopping Spread Spectrum SA, S/A Spectrum Analyzer FM Frequency Modulation SG Signal Generator Freq. Frequency SVSWR Site-Voltage Standing Wave Ratio FSK Frequency Shift Keying TR Test Receiver GFSK Gaussian Frequency-Shift Keying Tx Transmitting GNSS Global Navigation Satellite System VBW Video BandWidth GPS Global Positioning System Vert. Vertical Hori. Horizontal WLAN Wireless LAN Test Report No. 14926560S-F-R2 Page 4 of 95 UL …

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Test Report No. 14926560S-F-R2 Page 49 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SISO) 11n-20(SISO), Antenna 1 5180 MHz 5260 MHz 5220 MHz 5300 MHz 5240 MHz 5320 MHz Test Report No. 14926560S-F-R2 Page 50 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SISO) 11n-20 (SISO), Antenna 1 5500 MHz 5580 MHz 5700 MHz Test Report No. 14926560S-F-R2 Page 51 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SISO) 11n-20 (SISO), Antenna 1 5745 MHz 5785 MHz 5825 MHz Test Report No. 14926560S-F-R2 Page 52 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SDM) 11n-20(SDM), Antenna 1 5180 MHz 5260 MHz 5220 MHz 5300 MHz 5240 MHz 5320 MHz Test Report No. 14926560S-F-R2 Page 53 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SDM) 11n-20 (SDM), Antenna 1 5500 MHz 5580 MHz 5700 MHz Test Report No. 14926560S-F-R2 Page 54 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SDM) 11n-20 (SDM), Antenna 1 5745 MHz 5785 MHz 5825 MHz Test Report No. 14926560S-F-R2 Page 55 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SDM) 11n-20(SDM), Antenna 2 5180 MHz 5260 MHz 5220 MHz 5300 MHz 5240 MHz 5320 MHz Test Report No. 14926560S-F-R2 Page 56 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SDM) 11n-20 (SDM), Antenna 2 5500 MHz 5580 MHz 5700 MHz Test Report No. 14926560S-F-R2 Page 57 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Maximum Power Spectral Density Test place Shonan EMC Lab. No.5 Shielded Room Date November 17, 2023 Temperature / Humidity 25 deg. C / 51 % RH Engineer Kouki Yamada Mode Tx 11n-20 (SDM) 11n-20 (SDM), Antenna 2 5745 MHz 5785 MHz 5825 MHz Test Report No. 14926560S-F-R2 Page 58 of 95 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 Japan / +81-463-50-6400 Radiated Spurious Emission Test place Shonan EMC Lab. Semi Anechoic Chamber SAC3 SAC3 SAC3 SAC3 Date November 11, 2023 November 14, 2023 November 15, 2023 November 16, 2023 Temperature / Humidity 22 deg.C, 44 %RH 22 deg.C, 35 %RH 22 deg.C, 38 %RH 22 deg.C, 38 %RH Engineer Hiromasa Sato Kouki Yamada Makoto Hosaka Hiromasa Sato ( 1 GHz to 10 GHz ) ( 10 GHz to 18 GHz ) ( 18 GHz to 26.5 GHz ) ( 26.5 GHz to 40 GHz ) Mode Tx 11a 5180 MHz (above 1 GHz Inside of the restricted band) (* PK: Peak, AV: Average, QP: Quasi-Peak) PolarityFrequencyDetectorReadingAnt.Fac.LossGainDistanceResultLimitMarginHeightAngleRemark [MHz][dBuV][dB/m][dB][dB]Factor [dB] [dBuV/m][dBuV/m][dB][cm][deg.] Hori.5150.000PK51.8132.1616.7843.071.8359.5173.914.3138106- Hori.15540.000PK47.2639.4811.8840.53-9.5448.5573.925.31500- Hori.5150.000AV37.5832.1616.7843.071.8345.2853.9 8.6 138106VBW:1 kHz Hori.15540.000AV33.0839.4811.8840.53-9.5434.3753.919.51500VBW:1 kHz, Floor noise Vert.5150.000PK50.8632.1616.7843.071.8358.5673.915.3210168- Vert.15540.000PK47.3039.4811.8840.53-9.5448.5973.925.31500- Vert.5150.000AV37.4332.1616.7843.071.8345.1353.98.7210168VBW:1 kHz Vert.15540.000AV33.1939.4811.8840.53-9.5434.4853.919.41500VBW:1 kHz, Floor noise Result [dBuV/m] = Reading + Ant.Fac. + Loss (Cable+(Attenuator or Filter)(below 18 GHz)) - Gain(Amplifier) + Distance factor *Other frequency noises omitted in this report were not seen or have enough margin (more than 20 dB). 10 GHz - 40 GHz : 20log (1.0 m / 3.0 m) = -9.54 dB (Calculation) (above 1 GHz Outside of the restricted band) (* PK: Peak, AV: Aver…

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