2AHAF-MDT760GPS
TOPICON HK LIMITED
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Application Details
- Equipment Class
- DXX - Part 15 Low Power Communication Device Transmitter
- Date of Grant
- Jan 20, 2021
- Application Purpose
- Original Equipment
- Date of Application
- Jan 20, 2021
- Equipment Note
- GPS
- Frequency Range
- 13.56000000 - 13.56000000
- Company
- TOPICON HK LIMITED
- Country
- China
Documents & Files
Document Text
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
Users Manual
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External Photos
Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 2 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 2 - EUT EXTERNAL PHOTOGRAPHS Model: MDT760, MDT761, MDT740, MDT741, MDT770, OBC740, OBC760, MDT780 EUT View 1 EUT View 2 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 3 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 4 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 5 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7 EUT View 8 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 6 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 9 Model: M710A, M710AG, M710AB, M710AKB, M720A, M720AG, M720AB, M720AKB, MDT714D, MDT715D EUT View 1 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 7 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 2 EUT View 3 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 8 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 4 EUT View 5 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 9 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 6 EUT View 7 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 10 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 8 EUT View 9 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 11 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Model: MDT860, MDT840, MDT841, MDT860, MDT861, MDT870, MDT871, MDT880, MDTT881 EUT View 1 EUT View 2 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 12 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 3 EUT View 4 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 13 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 5 EUT View 6 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 14 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 7 EUT View 8 Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 15 of 28 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EUT View 9
ID Label/Location Info
Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 1 of 26 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AHAF-MDT760 Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location
Internal Photos
ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page14of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn EXHIBIT3-EUTINTERNALPHOTOGRAPHS Model:MDT760 EUTHousingand BoardView1 EUTHousingand BoardView2 ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page15of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn Solder Board-ComponentView 1 Solder Board-ComponentView 2 ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page16of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn Solder Board-ComponentView 3 Solder Board-ComponentView 4 ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page17of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn AntennaView Model:MDT860 EUTHousingandBoard View1 ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page18of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn Solder Board-ComponentView 1 Solder Board-ComponentView 2
Internal Photos
ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page19of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn Solder Board-ComponentView 3 Solder Board-ComponentView 4 ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page20of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn Solder Board-ComponentView 5 Solder Board-ComponentView 6 ReferenceNo.:WTX20X11088233W-1/2/3/4/5/6Page21of26 WaltekTestingGroup(Shenzhen)Co.,Ltd. http://www.semtest.com.cn AntennaView
Test Report
Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Page 1 of 30 TEST REPORT Reference No. .................... : WTX20X11088233W-6 FCC ID ................................ : 2AHAF-MDT760 Applicant ........................... : TOPICON HK LIMITED Address.............................. : Room 2314-2316, Tower C, Huangdu Plaza, Yitian Road, Futian District, Shenzhen, China Product Name ................... : GPS Test Model. ........................ : MDT760 Standards .......................... : FCC Part 15.225 Date of Receipt sample .... : Nov.20, 2020 Date of Test........................ : Nov.20, 2020 to Jan.04, 2021 Date of Issue ..................... : Jan.04, 2021 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Tested by: Reviewed By: Approved & Authorized By: Jason Su / Project Engineer Lion Cai / RF Manager Silin Chen / Manager Reference No.: WTX20X11088233W-6 Page 2 of 30 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ...............................................................................4 1.2 TEST STANDARDS ...................................................................................................................................................6 1.3 TEST METHODOLOGY .............................................................................................................................................6 1.4 TEST FACILITY .......................................................................................................................................................6 1.5 EUT SETUP AND TEST MODE .................................................................................................................................7 1.6 MEASUREMENT UNCERTAINTY ..............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS .....................................................................................................................8 2. SUMMARY OF TEST RESULTS ...........................................................................................................................9 3. ANTENNA REQUIREMENT ................................................................................................................................ 10 3.1 STANDARD APPLICABLE ....................................................................................................................................... 10 3.2 TEST RESULT........................................................................................................................................................ 10 4. RADIATED EMISSIONS ....................................................................................................................................... 11 4.1 STANDARD APPLICABLE ....................................................................................................................................... 11 4.2 TEST PROCEDURE ................................................................................................................................................. 11 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ............................................................................................ 13 4.4 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 14 5. OUT OF BAND EMISSIONS ................................................................................................................................. 19 5.1 STANDARD APPLICABLE ....................................................................................................................................... 19 5.2 TEST PROCEDURE ................................................................................................................................................. 19 5.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 19 6. FREQUENCY STABILITY ................................................................................................................................... 22 6.1 STANDARD APPLICABLE ....................................................................................................................................... 22 6.2 TEST PROCEDURE ................................................................................................................................................. 22 6.3 SUMMARY OF TEST RESULTS/PLOTS .................................................................................................................... 22 7. EMISSION BANDWIDTH ..................................................................................................................................... 23 7.1 APPLICABLE STANDARD ....................................................................................................................................... 23 7.2 TEST PROCEDURE ................................................................................................................................................. 23 7.3 SUMM…
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Test Setup Photos
Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 22 of 26 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn EXHIBIT 4 - TEST SETUP PHOTOGRAPHS Model: MDT760 Conducted Emission Test Setup* Radiation Emission Test Setup (Below 30MHz) Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 23 of 26 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (30MHz to 1GHz) Radiation Emission Test Setup (1GHz to 18GHz) Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 24 of 26 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Above 18GHz) Model: MDT860 Conducted Emission Test Setup* Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 25 of 26 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (Below 30MHz) Radiation Emission Test Setup (30MHz to 1GHz) Reference No.: WTX20X11088233W-1/2/3/4/5/6 Page 26 of 26 Waltek Testing Group (Shenzhen) Co., Ltd. http://www.semtest.com.cn Radiation Emission Test Setup (1GHz to 18GHz) Radiation Emission Test Setup (Above 18GHz) * Means’ only test and setup for PART 15C. ***** END OF REPORT *****
Contact Information
Applicant
keller sin(sales director)
Test Firm
Waltek Testing Group (Shenzhen) Co., Ltd.Jandy So
Technical Specifications
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 13.56 MHz - 13.56 MHz | - |
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