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2AHAF-MDT880Tablet

TOPICON HK LIMITED

Application Details

Equipment Class
DXX - Part 15 Low Power Communication Device Transmitter
Date of Grant
Nov 28, 2025
Application Purpose
Original Equipment
Equipment Note
Tablet
Frequency Range
13.56000000 - 13.56000000
Company
TOPICON HK LIMITED
Country
China

Documents & Files

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Attestation Statements

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Cover Letter(s)

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ID Label/Location Info

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RF Exposure Info

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Test Report

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Document Text

Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.

Attestation Statements

TOPICONHKLIMITED Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict,Shenzhen,China Date:2025-11-17 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 Ref:AttestationStatementsPart2.911(d)(5)(i)Filing FCCID:2AHAF-MDT880 ToWhomItMayConcern: TOPICONHKLIMITEDcertifiesthattheequipmentforwhichauthorizationissoughtisnot“covered” equipmentprohibitedfromreceivinganequipmentauthorizationpursuanttosection2.903oftheFCCrules. TOPICONHKLIMITEDcertifiesthattheequipmentforwhichauthorizationissoughtdoesnotinclude cybersecurityoranti-virussoftwareproducedorprovidedbyKasperskyLab,Inc.oranyofitssuccessorsand assignees,includingequipmentwithintegratedKasperskyLab,Inc.(oranyofitssuccessorsandassignees) cybersecurityoranti-virussoftwarepursuanttoDA-24-886andKDB986446D01CoveredEquipment GuidancesectionB(2a). Deviceisinherentlycompliantbasedonhardwarelimitationsorsoftwarecontrols. or ASoftwareBillofMaterials(SBOM)isprovidedtotheTCBforreview,and Theend-userorthirdpartiescannotinstalladditionalsoftwareonthisdevice. Sincerely, Signatory [kellersin,salesdirector]

Attestation Statements

TOPICONHKLIMITED Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict,Shenzhen,China Date:2025-11-17 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA Ref:AttestationStatementsPart2.911(d)(5)(ii)Filing FCCID:2AHAF-MDT880 ToWhomItMayConcern: TOPICONHKLIMITEDcertifiesthat,asofthedateofthefilingoftheapplication,theapplicantisnotidentified ontheCoveredList(asaspecificallynamedentityoranyofitssubsidiariesoraffiliates)asanentityproducing “covered”equipment. Sincerely, Signatory [kellersin,salesdirector]

Attestation Statements

TOPICONHKLIMITED Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict,Shenzhen,China Date:2025-11-17 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 USA FCCID:2AHAF-MDT880 ApplicantFRN:0025168154 USAgent–AttestationStatement/Part2.911(d)(7) TOPICONHKLIMITEDcertifiesthat,asof2025-11-17,wehavedesignatedFCCUSAgent, LLCtoacceptserviceofprocessonourbehalfforFCCID:2AHAF-MDT880. TOPICONHKLIMITED,acceptstomaintainanagentofserviceofprocessintheUnited Statesfornolessthanoneyearaftereitherthegranteehaspermanentlyterminatedall marketingandimportationoftheapplicableequipmentwithintheU.S.,ortheconclusionofany Commission-relatedadministrativeorjudicialproceedinginvolvingtheequipment,whicheveris later. FCCUSAgent,LLC,acceptsasofthedateofthefilingofthisapplication,theobligationof beingthedesignatedagentforthepurposeofacceptingserviceofprocessonbehalfof TOPICONHKLIMITEDforFCCID:2AHAF-MDT880. DesignatedAgentInformation: CompanyName:FCCUSAgent,LLC U.S.AgentFRN:0033402884 Address:3722IllinoisAvenue,SaintCharles,IL,60174,USA ContactPerson:TimPayne Phone:708-571-3148 Email:[email protected] Sincerely, Company:TOPICONHKLIMITEDDesignatedAgent:FCCUSAgent,LLC CompanyRepresentative:kellersinDesignatedAgentRepresentative:TimPayne Signature:Signature:

Attestation Statements

TOPICONHKLIMITED Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict,Shenzhen,China Date:2025-11-17 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 SUBJECT:FCCApplicationforFCCID:2AHAF-MDT880 ToWhomItMayConcern: I,theundersigned,herebystatesthisequipmenthasbeentestedandfoundtocomplywiththelimitsfora ClassBdigitaldevice,pursuanttopart15oftheFCCRules,andwillapplytheSupplier'sDeclarationof ConformityproceduretothePart15ClassBDigitalandreceiversthatoperateintherangebetween30 and960MHzofthiscompositedevice.IunderstandthefollowingFCCrequirements: 1.DevicessubjecttotheSDoCprocedurearerequiredtobetestedtoshowcompliancewiththeFCC technicalregulationsbyarecognizedaccreditedtestinglaboratory.Thetestinglaboratorymustbe accreditedbyaCommissionapprovedaccreditationbodyordesignatedunderthetermsofa government-to-governmentMutualRecognitionAgreement(MRA).Alistingofthoseaccreditedtesting laboratoriesthathavebeenrecognizedbytheCommissionispublishedontheFCCWebpage: https://apps.fcc.gov/oetcf/eas/reports/TestFirmSearch.cfm(Selectthe"accredited"optiontosearchfor FCCrecognizedaccreditedtestfirms.) 2.Pt2.1077containsthelistofinformationthatmustbeincludedintheSupplier'sDeclarationof Conformity,whichmustbesuppliedwitheachproductsold.TheSDoCcomplianceinfoshallbeincluded intheUser’sManualorasaseparatesheet.Theinfomustcontainthename,address,andphone numberoftheresponsibleparty,whichmustbelocatedwithintheUnitedStates.Accordingto 2.909(b),theresponsiblepartyiseithertheManufactureroriftheproductisimportedtheImporter. Sincerely, Signatory [kellersin,salesdirector]

Cover Letter(s)

TOPICONHKLIMITED Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict,Shenzhen,China Date:2025-11-17 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCApplicationforFCCID:2AHAF-MDT880 ConfidentialityRequest Towhomitmayconcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,wearerequestingthe Commissiontowithholdthefollowingattachment(s)asconfidentialdocumentsfrompublicdisclosureindefinitely. ☒ BlockDiagram ☒ Tune-UpInformation ☒ OperationalDescription,SBOM ☐ SecurityInformation ☒ Schematics ☐ SoftwareDefinedRadio(SDR)Information ☒ PartsList Theabovematerialscontaintradesecretsandproprietaryinformationnotcustomarilyreleasedtothepublic.The publicdisclosureofthesematerialsmaybeharmfultotheapplicantandprovideunjustifiedbenefitstoits competitors. Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulationsinTitle47CFR §2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthatbusinesssensitiveinformation remainsconfidentialuntiltheactualmarketingofnewlyauthorizeddevices,werequestShortTermConfidentiality ofthefollowingattachment(s); ☒ ExternalPhotos ☒ TestSetupPhotos ☒ InternalPhotos ☒ UserManual ☐For45days,pursuanttoPublicNoticeDA04-1705. or ☒For180dayspursuanttoKDB726920D01. TheapplicantunderstandsthatpursuanttoSection0.457oftheRules,disclosureofthisapplicationandall accompanyingdocumentationwillnotbemadebeforethedateoftheGrantforthisapplication. Sincerely, Signatory [kellersin,salesdirector]

Cover Letter(s)

TOPICONHKLIMITED Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict,Shenzhen,China Date:2025-11-18 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCID:2AHAF-MDT880 ModelDeclarationLetter DearRegulatoryAuthority, Model(s):T880,T880-X,PacebladeMDT-805,OBC880,MDT881,MDT781,M880A,M880B,MDT880Dare sametothemodelMDT880,thesemodelsaresamePCBLayout,Schematics,BOM.Onlyfordifferentmodel name,brandname,appearancecolorandshellshape(non-metallicanddoesnotaffecttheelectricalstructure) fordifferentmarketrequire. Sincerely, Signatory [kellersin,salesdirector]

Cover Letter(s)

TOPICONHKLIMITED Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict,Shenzhen,China Date:2025-11-17 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCApplicationforFCCID:2AHAF-MDT880 POWEROFATTORNEY ToWhomItMayConcern: We,theundersigned,herebyauthorizeWaltekTestingGroup(Shenzhen)Co.,Ltd.JandySoonourbehalf,to applytotheFederalCommunicationsCommissiononourequipment.AnyandallactscarriedoutbyWaltek TestingGroup(Shenzhen)Co.,Ltd.JandySoonourbehalfshallhavethesameeffectasactsofourown. ThisistoadvisethatweareinfullcompliancewiththeAnti-DrugAbuseAct.We,TOPICONHKLIMITEDare notsubjecttoadenialoffederalbenefitspursuanttoSection5301oftheAnti-DrugActof1988,21USC853a, andnopartytotheapplicationissubjecttoadenialoffederalbenefitspursuanttothatsection. Sincerely, Signatory [kellersin,salesdirector]

ID Label/Location Info

Reference No.: WTX25X06171494W001/002/003/004/005/006/007/008 Page 1 of 14 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT 1 - PRODUCT LABELING Proposed FCC ID Label Format FCC ID: 2AHAF-MDT880 This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1)This device may not cause harmful interference, and (2)This device must accept any interference received, including interference that may cause undesired operation. Specifications: The label shall be securely affixed to a permanently attached part of the device, in a location where it is visible or easily accessible to the user, and shall not be readily detachable. The label shall be sufficiently durable to remain fully legible and intact on the device in all normal conditions of use throughout the device’s expected lifetime. Proposed Label Location on EUT FCC ID Label Location

RF Exposure Info

Page: 1/10 Ref : ACR.49.6.25.BES.A WALTEK TESTING GROUP (SHENZHEN) CO., LTD 1/F., ROOM 101, BUILDING 1, HONGWEI INDUSTRIAL PARK, LIUXIAN 2ND ROAD, BLOCK 70 BAO'AN DISTRICT, SHENZHEN, GUANGDONG, 518101 CHINA MVG COMOSAR DOSIMETRIC E-FIELD PROBE SERIAL NO.: 0725-EPGO-446 Calibrated at MVG Z.I. de la pointe du diable Technopôle Brest Iroise – 295 avenue Alexis de Rochon 29280 PLOUZANE - FRANCE Calibration date: 02/12/2025 Accreditations #2-6789 Scope available on www.cofrac.fr The use of the Cofrac brand and the accreditation references is prohibited from any reproduction. Summary: This document presents the method and results from an accredited COMOSAR Dosimetric E-Field Probe calibration performed at MVG, using the CALIPROBE test bench, for use with a MVG COMO SAR system only. The test results covered by accreditation are traceable to the International System of Units (SI). COMOSAR E-Field Probe Calibration Report             COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 2/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. Name Function Date Signature Prepared by : Pedro Ruiz Technical Manager 02/18/2025 Checked & approved by: Pedro Ruiz Technical Manager 02/18/2025 Authorized by: Geraldine Toutain Quality Manager Customer Name Distribution : WALTEK TESTING GROUP (SHENZHEN) CO., LTD Issue Name Date Modifications A Pedro Ruiz 2/18/2025 Initial release              COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 3/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. TABLE OF CONTENTS 1 Device Under Test ..................................................................................................... 4 2 Product Description ................................................................................................... 4 2.1 General Information _______________________________________________________ 4 3 Measurement Method ................................................................................................ 4 3.1 Sensitivity _______________________________________________________________ 4 3.2 Linearity ________________________________________________________________ 5 3.3 Isotropy _________________________________________________________________ 5 3.4 Boundary Effect __________________________________________________________ 5 3.5 Probe Modulation Response _________________________________________________ 6 4 Measurement Uncertainty .......................................................................................... 6 5 Calibration Results ..................................................................................................... 6 5.1 Calibration in air __________________________________________________________ 6 5.2 Calibration in liquid _______________________________________________________ 7 6 Verification Results ................................................................................................... 8 7 List of Equipment ...................................................................................................... 9             COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 4/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 1 DEVICE UNDER TEST Device Under Test Device Type COMOSAR DOSIMETRIC E FIELD PROBE Manufacturer MVG Model SSE2 Serial Number 0725-EPGO-446 Product Condition (new / used) New Frequency Range of Probe 0.15 GHz-7.5GHz Resistance of Three Dipoles at Connector Dipole 1: R1=0.248 M: Dipole 2: R2= 0.215 M: Dipole 3: R3=0.224 M: 2 PRODUCT DESCRIPTION 2.1 GENERAL INFORMATION MVG’s COMOSAR E field Probes are built in accordance to the IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards. Figure 1 – MVG COMOSAR Dosimetric E field Probe Probe Length 330 mm Length of Individual Dipoles 2 mm Maximum external diameter 8 mm Probe Tip External Diameter 2.5 mm Distance between dipoles / probe extremity 1 mm 3 MEASUREMENT METHOD The IEC/IEEE 62209-1528 and FCC KDB865664 D01 standards provide recommended practices for the probe calibrations, including the performance characteristics of interest and methods by which to assess their effect. All calibrations / measurements performed meet the fore-mentioned standards. 3.1 SENSITIVITY The sensitivity factors of the three dipoles were determined using a two step calibration method (air and tissue simulating liquid) using waveguides as outlined in the standards for frequency range 600- 7500MHz and using the calorimeter cell method (transfer method) as outlined in the standards for frequency 150-450 MHz.             COMOSAR E-FIELD PROBE CALIBRATION REPORT Ref: ACR.49.6.25.BES.A Page: 5/10 Template_ACR.DDD.N.YY.MVGB.ISSUE_COMOSAR Probe vM This document shall not be reproduced, except in full or in part, without the written approval of MVG. The information contained herein is to be used only for the purpose for which it is submitted and is not to be released in whole or part without written approval of MVG. 3.2 LINEARITY The evaluatio…

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RF Exposure Info

WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 160 TESTREPORT ReferenceNo.......................: WTX25X06171494W010 FCCID....................................: 2AHAF-MDT880 Applicant...............................: TOPICONHKLIMITED Address.................................: Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict, Shenzhen,China Manufacturer ........................ TOPICONHKLIMITED Address................................. Room2314-2316,TowerC,HuangduPlaza,YitianRoad,FutianDistrict, Shenzhen,China ProductName......................: Tablet ModelNo...............................: MDT880 Standards .............................. : FCCPart2.1093 IEEEStdC95.1:2019 IEEEC95.3:2021 DateofReceiptsample.....: 2025-08-20 DateofTest ........................... : 2025-08-21to2025-11-05 DateofIssue........................: 2025-11-05 TestReportFormNo. ......... :WTX_IEEE_1528W TestResult ............................ :Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbereproduced, exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithoutspecific stampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-755-33663308Fax.:+86-755-33663309Email:[email protected] Testedby:Approvedby: LilyYang/ProjectEngineerJasonSu/Manager ReferenceNo.:WTX25X06171494W010 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 2 of 160 TABLEOFCONTENTS 1.GeneralInformation........................................................................................................................................................4 1.1ProductDescriptionforEquipmentUnderTest(EUT).............................................................................................4 1.2TestStandards.........................................................................................................................................................8 1.3TestMethodology....................................................................................................................................................8 1.4TestFacility..............................................................................................................................................................8 2.SummaryofTestResults...............................................................................................................................................9 3.SpecificAbsorptionRate(SAR)..................................................................................................................................10 3.1Introduction............................................................................................................................................................10 3.2SARDefinition........................................................................................................................................................10 4.SARMeasurementSystem..........................................................................................................................................11 4.1TheMeasurementSystem.....................................................................................................................................11 4.2Probe.....................................................................................................................................................................11 4.3ProbeCalibrationProcess.....................................................................................................................................13 4.4Phantom.................................................................................................................................................................14 4.5DeviceHolder........................................................................................................................................................14 4.6TestEquipmentList...............................................................................................................................................15 5.TissueSimulatingLiquids...........................................................................................................................................16 5.1CompositionofTissueSimulatingLiquid...............................................................................................................16 5.2TissueDielectricParametersforHeadandBodyPhantoms.................................................................................17 5.3TissueCalibrationResult.......................................................................................................................................18 6.SARMeasurementEvaluation.....................................................................................................................................20 6.1PurposeofSystemPerformanceCheck................................................................................................................20 6.2SystemSetup.........................................................................................................................................................20 6.3ValidationResults..................................................................................................................................................21 7.EUTTestingPosition....................................................................................................................................................23 7.1BodyPosition.........................................................................................................................................................23 7.2EUTAntennaPosition......................................................................…

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Test Report

Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 28 TEST REPORT Reference No. .................... : WTX25X06171494W008 FCC ID ................................ : 2AHAF-MDT880 Applicant ........................... : TOPICON HK LIMITED Address ............................. : Room 2314-2316, Tower C, Huangdu Plaza, Yitian Road, Futian District, Shenzhen, China Manufacturer ..................... : The same as Applicant Address ............................. : The same as Applicant Product Name ................... : Tablet Model No... ......................... : MDT880 Standards .......................... : FCC Part 15.225 Date of Receipt sample .... : 2025-06-30 Date of Test........................ : 2025-07-14 to 2025-10-30 Date of Issue ..................... : 2025-11-06 Test Report Form No. ....... : WTX_Part 15_225W Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: [email protected] Tested by: Approved by: Dashan Chen/Project Engineer Jason Su/Manager Reference No.: WTX25X06171494W008 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 28 TABLE OF CONTENTS 1. GENERAL INFORMATION .................................................................................................................................... 4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ......................................................................... 4 1.2 TEST STANDARDS ................................................................................................................................................. 5 1.3 TEST METHODOLOGY ........................................................................................................................................... 5 1.4 TEST FACILITY ...................................................................................................................................................... 5 1.5 EUT SETUP AND TEST MODE .............................................................................................................................. 6 1.6 MEASUREMENT UNCERTAINTY ............................................................................................................................. 7 1.7 TEST EQUIPMENT LIST AND DETAILS ................................................................................................................... 8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 12 3. ANTENNA REQUIREMENT ................................................................................................................................. 13 3.1 STANDARD APPLICABLE ..................................................................................................................................... 13 3.2 TEST RESULT ...................................................................................................................................................... 13 4. RADIATED EMISSIONS ....................................................................................................................................... 14 4.1 STANDARD APPLICABLE ..................................................................................................................................... 14 4.2 TEST PROCEDURE .............................................................................................................................................. 14 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ........................................................................................... 16 4.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 17 5. OUT OF BAND EMISSIONS ................................................................................................................................ 20 5.1 STANDARD APPLICABLE ..................................................................................................................................... 20 5.2 TEST PROCEDURE .............................................................................................................................................. 20 5.3 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 20 6. FREQUENCY STABILITY .................................................................................................................................... 22 6.1 STANDARD APPLICABLE ..................................................................................................................................... 22 6.2 TEST PROCEDURE .............................................................................................................................................. 22 6.3 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 22 7. EMISSION BANDWIDTH ...................................................................................................................................... 23 7.1 APPLICABLE STANDARD ..................................................................................................................................... 23 7.2 TEST PROCEDURE ...................................................................…

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Contact Information

Applicant

keller sin(sales director)
[email protected]Fax: (86) 755-82549331

Test Firm

Waltek Testing Group (Shenzhen) Co., Ltd.Jandy So
[email protected]Fax: 86-755-33663309

Technical Specifications

#Rule PartsFrequency RangePower Output
115C13.56 MHz - 13.56 MHz-
Confidentiality
Long Term

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