2AUTE-4DT24AThermal Label Printer

08 09 20 22 23 24 25 25 26 Driver Installation for Windows & MacOS FAQ Overview Package Contents Machine Components Printer Connection LED Light Indicator Label Setup Feed Button Mode iPhone/Android Installation Pro Tips Printing Preferences Specifications Maintenance Safety Notices 01 02 03 04 05 06 30Support and Warranty Please take a moment to follow this user guide, as incorrect operation may result in unsatisfactory print quality, a poorer user experience, or even damage to your printer or injury. Congratulations on your purchase of Aobio Printer. Aobio is your loyal business partner offering commercial solutions to batch label printing.                           
                                   Before using the label printer, make sure to verify that all the following items are included in the package. If any of the items are missing or damaged, please don't hesitate to reach out and let us know. Press the Push Button on the right side to open the printer.
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XiamenHaninCo.,Ltd. Room305A,AngyeBuilding,PioneeringPark,TorchHigh-tech,Zone,Xiamen,China Date:2024-07-11 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 Ref:AttestationStatementsPart2.911(d)(5)(i)Filing SUBJECT:FCCApplicationforFCCID: 2AUTE-4DT24A ToWhomItMayConcern: XiamenHaninCo.,Ltd.certifiesthattheequipmentforwhichauthorizationissoughtisnot “covered”equipmentprohibitedfromreceivinganequipmentauthorizationpursuanttosection 2.903oftheFCCrules. Sincerely, Signatory [JeffWang,CertifiedEngineer]

XiamenHaninCo.,Ltd. Room305A,AngyeBuilding,PioneeringPark,TorchHigh-tech,Zone,Xiamen,China Date:2024-07-11 FederalCommunicationsCommission AuthorizationandEvaluationDivision 7435OaklandMillsRoad Columbia,MD21046 Ref:AttestationStatementsPart2.911(d)(5)(ii)Filing SUBJECT:FCCApplicationforFCCID: 2AUTE-4DT24A ToWhomItMayConcern: XiamenHaninCo.,Ltd.certifiesthat,asofthedateofthefilingoftheapplication,theapplicant isnotidentifiedontheCoveredList(asaspecificallynamedentityoranyofitssubsidiariesor affiliates)asanentityproducing“covered”equipment. Sincerely, Signatory [JeffWang,CertifiedEngineer]

Xiamen Hanin Co.,Ltd. Room 305A, Angye Building, Pioneering Park, Torch High-tech, Zone, Xiamen, China Date: 2024-07-15 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: 2AUTE-4DT24A Applicant FRN:0028895233 US Agent – Attestation Statement / Part 2.911(d)(7) Xiamen Hanin Co.,Ltd. certifies that, as of 2024-07-15, we have designated FCC US Agent, LLC to accept service of process on our behalf for FCC ID: 2AUTE-4DT24A. Xiamen Hanin Co.,Ltd. accepts to maintain an agent of service of process in the United States for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., orthe conclusion of any Commission-related administrative or judicial proceeding involving the equipment, whichever is later. FCC US Agent, LLC, accepts as of the date of the filing of this application, the obligation of being the designated agent for the purpose of accepting service of process on behalf of Xiamen Hanin Co.,Ltd. for FCC ID: 2AUTE-4DT24A. Designated Agent Information: Company Name: FCC US Agent, LLC U.S. Agent FRN: 0033402884 Address: 3722 Illinois Avenue, Saint Charles, IL, 60174, USA Contact Person: Tim Payne Phone: 708-571-3148 Email: [email protected] Sincerely, Company:Xiamen Hanin Co.,Ltd.Designated Agent: FCC US Agent, LLC Company Representative: Jeff WangDesignated Agent Representative: Tim Payne Signature: Signature:

XiamenHaninCo.,Ltd. Room305A,AngyeBuilding,PioneeringPark,TorchHigh-tech,Zone,Xiamen,China Date:2024-07-11 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCApplicationforFCCID: 2AUTE-4DT24A ConfidentialityRequest Towhomitmayconcern, PursuanttotheprovisionsoftheCommission’srulesTitle47Sections§0.457and§0.459,we arerequestingtheCommissiontowithholdthefollowingattachment(s)asconfidential documentsfrompublicdisclosureindefinitely. ☒ BlockDiagram ☐ Tune-UpInformation ☒ OperationalDescription ☐ SecurityInformation ☒ Schematics ☐ SoftwareDefinedRadio(SDR)Information ☐ PartsList Theabovematerialscontaintradesecretsandproprietaryinformationnotcustomarilyreleased tothepublic.Thepublicdisclosureofthesematerialsmaybeharmfultotheapplicantand provideunjustifiedbenefitstoitscompetitors. Inadditionaltoabovementioneddocuments,inordertocomplywiththemarketingregulationsin Title47CFR§2.803andtheimportationrulesinTitle47CFR§2.1204,whileensuringthat businesssensitiveinformationremainsconfidentialuntiltheactualmarketingofnewly authorizeddevices,werequestShortTermConfidentialityofthefollowingattachment(s); ☐ ExternalPhotos ☐ TestSetupPhotos ☐ InternalPhotos ☐ UserManual ☐For45days,pursuanttoPublicNoticeDA04-1705. or ☐For180dayspursuanttoKDB726920D01. TheapplicantunderstandsthatpursuanttoSection0.457oftheRules,disclosureofthis applicationandallaccompanyingdocumentationwillnotbemadebeforethedateoftheGrant forthisapplication. Sincerely, Signatory [JeffWang,CertifiedEngineer]

XiamenHaninCo.,Ltd. Room305A,AngyeBuilding,PioneeringPark,TorchHigh-tech,Zone,Xiamen,China Date:2024-07-11 FEDERALCOMMUNICATIONSCOMMISSION AUTHORIZATIONANDEVALUATIONDIVISION 7435OAKLANDMILLSROAD COLUMBIA,MD21046 SUBJECT:FCCApplicationforFCCID: 2AUTE-4DT24A POWEROFATTORNEY ToWhomItMayConcern: We,theundersigned,herebyauthorizeWaltekTestingGroup(Shenzhen)Co.,Ltd.JandySo onourbehalf,toapplytotheFederalCommunicationsCommissiononourequipment.Any andallactscarriedoutbyWaltekTestingGroup(Shenzhen)Co.,Ltd.JandySoonourbehalf shallhavethesameeffectasactsofourown. ThisistoadvisethatweareinfullcompliancewiththeAnti-DrugAbuseAct.We,Xiamen HaninCo.,Ltd.arenotsubjecttoadenialoffederalbenefitspursuanttoSection5301ofthe Anti-DrugActof1988,21USC853a,andnopartytotheapplicationissubjecttoadenialof federalbenefitspursuanttothatsection. Sincerely, Signatory [JeffWang,CertifiedEngineer]

ReferenceNo.:WTX24X04091176W001/002Page2of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT2-EUTEXTERNALPHOTOGRAPHS EUTView1 EUTView2 ReferenceNo.:WTX24X04091176W001/002Page3of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView3 EUTView4 ReferenceNo.:WTX24X04091176W001/002Page4of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView5 EUTView6 ReferenceNo.:WTX24X04091176W001/002Page5of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EUTView7

ReferenceNo.:WTX24X04091176W001/002Page1of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn ANNEX EXHIBIT1-PRODUCTLABELING ProposedFCCIDLabelFormat Specifications:Thelabelshallbesecurelyaffixedtoapermanentlyattachedpartofthedevice,inalocation whereitisvisibleoreasilyaccessibletotheuser,andshallnotbereadilydetachable.Thelabelshallbe sufficientlydurabletoremainfullylegibleandintactonthedeviceinallnormalconditionsofusethroughout thedevice’sexpectedlifetime. ProposedLabelLocationonEUT FCCIDLabel Location

Reference No.: WTX24X04091176W001/002Page 6 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn EXHIBIT 3 - EUT INTERNAL PHOTOGRAPHS EUT Housing and Board View 1 Solder Board-Component View 1 Reference No.: WTX24X04091176W001/002Page 7 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 2 Solder Board-Component View 3 Reference No.: WTX24X04091176W001/002Page 8 of 11 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Solder Board-Component View 4 Antenna View BTAnt.

1.RFExposureRequirements 1.1GeneralInformation ClientInformation Applicant:XiamenHaninCo.,Ltd. Addressofapplicant: Room305A,AngyeBuilding,PioneeringPark,TorchHigh-tech,Zone,Xiamen, China Manufacturer:ThesameasApplicant Addressofmanufacturer:ThesameasApplicant GeneralDescriptionofEUT: ProductName:ThermalLabelPrinter TradeName/ ModelNo.:X4BT AddingModel(s):X4,J500,J500BT,Q5,Q5BT,G4,G4BT,X4L,X4LBT,R4,R4BT RatedVoltage:DC24V BatteryCapacity:/ AdapterModel: AP111G-240150 Input:AC100-24050/60Hz1.5A Output:DC24V1.5A FCCID:2AUTE-4DT24A EquipmentType:Portabledevice TechnicalCharacteristicsofEUT: Bluetooth BluetoothVersion:V4.0(BR/LEmode) FrequencyRange:2402-2480MHz RFOutputPower:0.592dBm(Conducted) DataRate:1Mbps Modulation:GFSK QuantityofChannels:79/40 ChannelSeparation:1MHz/2MHz TypeofAntenna:PCBAntenna AntennaGain:0.09dBi 1.2RFExposureExemption Accordingto§1.1307(b)(3)andKDB447498D04InterimGeneralRFExposureGuidancev01,system operatingundertheprovisionsofthissectionshallbeoperatinginamannerthatthepublicisnotexposedto radiofrequencyenergylevelinexcesslimitformaximumpermissibleexposure. OptionA:FCCRulePart1.1307(b)(3)(i)(A):Theavailablemaximumtime-averagedpowerisnomorethan 1mW,regardlessofseparationdistance. OptionB:FCCRulePart1.1307(b)(3)(i)(B):Theavailablemaximumtime-averagedpoweroreffective radiatedpower(ERP),whicheverisgreater,islessthanorequaltothethresholdP th (mW)describedinthe followingformula.P th isgivenby: OptionC:FCCRulePart1.1307(b)(3)(i)(C):Theminimumseparationdistance(Rinmeters)fromthebodyof anearbypersonforthefrequency(finMHz)atwhichthesourceoperates,theERP(watts)isnomorethanthe calculatedvalueprescribedforthatfrequency.Rmustbeatleastλ/2π,whereλisthefree-spaceoperating wavelengthinmeters. SingleRFSourcesSubjecttoRoutineEnvironmentalEvaluation RFSourcefrequency(MHz)ThresholdERP(watts) 0.3-1.341,920R 2 1.34-303,450R 2 /f 2 30-3003.83R 2 300-1,5000.0128R 2 f 1,500-100,00019.2R 2 ForMultipleRFsources:FCCRulePart1.1307(b)(3)(ii): (A)Theavailablemaximumtime-averagedpowerofeachsourceisnomorethan1mWandthereisa separationdistanceoftwocentimetersbetweenanyportionofaradiatingstructureoperatingandthe nearestportionofanyotherradiatingstructureinthesamedevice,exceptifthesumofmultiplesourcesis lessthan1mWduringthetime-averagingperiod,inwhichcasetheymaybetreatedasasinglesource (separationisnotrequired). (B)InthecaseoffixedRFsourcesoperatinginthesametime-averagingperiod,orofmultiplemobileor portableRFsourceswithinadeviceoperatinginthesametimeaveragingperiod,ifthesumofthe fractionalcontributionstotheapplicablethresholdsislessthanorequalto1asindicatedinthefollowing equation. 1.3CalculatedResult Radio Access Technology Prediction Frequency Output Power Antenna Gain Duty Cycle Tune-Up Time-AveragedPower ERP (MHz)(dBm)(dBi)(%)(dBm)(dBm) Bluetooth24020.5920.091001.00-1.06 Frequency Option Min.DistanceMax.PowerExposureLimit Ratio Result (MHz)(cm)(dBm)(mW)(mW)Pass/Fail 2402B0.51.001.262.7880.45Pass Note:1.Time-AveragedPower=OutputPower*DutyCycle;ERP=Time-AveragedPower+Antenna gain-2.15dB 2.OptionA,BandCrefersasclause1.2. 3.ForoptionB,Max(time-averagedpower,effectiveradiatedpower(ERP))convertstoMax.Power.For optionC,ERPconvertstoMax.Power; 4.ForoptionB,P th (mW)convertstoExposureLimit(mW);ForoptionC,ERP(W)convertstoExposure Limit(mW). 5.Ratio=Tune-UpERP(mW)/ExposureLimit(mW) ModeforSimultaneousMulti-bandTransmission: RadioAccess Technology Ratio1Ratio2 Simultaneous Ratio Limit Result Pass/Fail ////// Result:Pass

WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 38 TESTREPORT ReferenceNo.......................:WTX24X04091176W002 FCCID....................................:2AUTE-4DT24A Applicant...............................:XiamenHaninCo.,Ltd. Address.................................: Room305A,AngyeBuilding,PioneeringPark,TorchHigh-tech, Zone,Xiamen,China Manufacturer........................:ThesameasApplicant Address.................................:ThesameasApplicant ProductName......................: ThermalLabelPrinter ModelNo...............................: X4BT Standards..............................:FCCPart15.247 DateofReceiptsample.....:2024-04-22 DateofTest...........................:2024-04-22to2024-04-30 DateofIssue........................:2024-04-30 TestReportFormNo.......... : WTX_Part15_247W TestResult............................:Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbe reproduced,exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithout specificstampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-755-33663308Fax.:+86-755-33663309Email:[email protected] Testedby:Approvedby: DashanChenJasonSu ReferenceNo.:WTX24X04091176W002 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 2 of 38 TABLEOFCONTENTS 1.GENERALINFORMATION.....................................................................................................................................4 1.1PRODUCTDESCRIPTIONFOREQUIPMENTUNDERTEST(EUT)........................................................................4 1.2TESTSTANDARDS.................................................................................................................................................5 1.3TESTMETHODOLOGY...........................................................................................................................................5 1.4TESTFACILITY.......................................................................................................................................................5 1.5EUTSETUPANDTESTMODE..............................................................................................................................6 1.6MEASUREMENTUNCERTAINTY.............................................................................................................................7 1.7TESTEQUIPMENTLISTANDDETAILS..................................................................................................................8 2.SUMMARYOFTESTRESULTS.........................................................................................................................11 3.ANTENNAREQUIREMENT.................................................................................................................................12 3.1STANDARDAPPLICABLE......................................................................................................................................12 3.2EVALUATIONINFORMATION................................................................................................................................12 4.POWERSPECTRALDENSITY...........................................................................................................................13 4.1STANDARDAPPLICABLE......................................................................................................................................13 4.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................13 4.3TESTPROCEDURE..............................................................................................................................................13 4.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................13 5.DTSBANDWIDTH..................................................................................................................................................14 5.1STANDARDAPPLICABLE......................................................................................................................................14 5.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................14 5.3TESTPROCEDURE..............................................................................................................................................14 5.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................14 6.RFOUTPUTPOWER............................................................................................................................................15 6.1STANDARDAPPLICABLE......................................................................................................................................15 6.2TESTSETUPBLOCKDIAGRAM...........................................................................................................................15 6.3TESTPROCEDURE..............................................................................................................................................15 6.4SUMMARYOFTESTRESULTS/PLOTS................................................................................................................15 7.FIELDSTRENGTHOFSPURIOUSEMISSIONS.............................................................................................16 7.1STANDARDAPPLICABLE......................................................................................................................................16 7.2TESTPROCEDURE.....................................................…

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WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 1 of 11 TESTREPORT ReferenceNo.......................:WTX24X04091176W Applicant...............................:XiamenHaninCo.,Ltd. Address .................................: Room305A,AngyeBuilding,PioneeringPark,TorchHigh-tech,Zone, Xiamen,China Manufacturer........................:ThesameasApplicant Address .................................: ThesameasApplicant ProductName ......................: BTAntenna ModelNo... ............................: X4 Standards..............................:ANSI/IEEE149-2021 DateofReceiptsample.....:2024-04-22 DateofTest...........................:2024-04-22to2024-05-14 DateofIssue........................:2024-05-14 TestReportFormNo. ......... : WTX_IEEE149 TestResult ............................: Pass Remarks: Theresultsshowninthistestreportreferonlytothesample(s)tested,thistestreportcannotbe reproduced,exceptinfull,withoutpriorwrittenpermissionofthecompany.Thereportwouldbeinvalidwithout specificstampoftestinstituteandthesignaturesofapprover. PreparedBy: WaltekTestingGroup(Shenzhen)Co.,Ltd. Address:1/F.,Room101,Building1,HongweiIndustrialPark,Liuxian2ndRoad, Block70Bao'anDistrict,Shenzhen,Guangdong,China Tel.:+86-755-33663308Fax.:+86-755-33663309Email:[email protected] Testedby:Approvedby: DashanChenJasonSu ReferenceNo.:WTX24X04091176W WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 2 of 11 TABLEOFCONTENTS 1.GENERALINFORMATION....................................................................................................................................4 1.1PRODUCTDESCRIPTIONFOREQUIPMENTUNDERTEST(EUT).............................................................................4 2.SUMMARYOFTESTRESULTS............................................................................................................................5 3.ANTENNATESTCONFIGURATIONS.................................................................................................................6 3.1TESTLOCATION......................................................................................................................................................6 3.2TESTENVIRONMENTS.............................................................................................................................................6 3.3TESTEQUIPMENTLIST...........................................................................................................................................6 3.4MEASUREMENTUNCERTAINTY..............................................................................................................................6 3.5TESTSETUP............................................................................................................................................................6 4.ANTENNATESTRESULT......................................................................................................................................7 4.1GAINANDEFFICIENCY..........................................................................................................................................7 4.2RADIATIONPATTERN2DVIEW...............................................................................................................................8 4.3RADIATIONPATTERN3DVIEW...............................................................................................................................9 EXHIBIT1-EUTPHOTOGRAPHS........................................................................................................................10 EXHIBIT2-TESTSETUPPHOTOGRAPHS........................................................................................................11 ReferenceNo.:WTX24X04091176W WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 3 of 11 Reportversion VersionNo.DateofissueDescription Rev.002024-05-14Original /// ReferenceNo.:WTX24X04091176W WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 4 of 11 1.GENERALINFORMATION 1.1ProductDescriptionforEquipmentUnderTest(EUT) GeneralDescriptionofEUT ProductName:BTAntenna TradeName:/ ModelNo.:X4 AddingModel(s):/ Note:Thetestdataisgatheredfromaproductionsample,providedbythemanufacturer. TechnicalCharacteristicsofEUT FrequencyRange:2400-2500MHz GainofAntenna:0.09dBi(Max.) TypeofAntenna:PCBAntenna Dimension: ReferenceNo.:WTX24X04091176W WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 5 of 11 2.SUMMARYOFTESTRESULTS StandardsDescriptionofTestItemResult ANSI/IEEE149-2021 IEEERecommendedPracticeforAntenna Measurements Compliant N/A:notapplicable ReferenceNo.:WTX24X04091176W WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 6 of 11 3.AntennaTestConfigurations 3.1TestLocation Name:ShenzhenMorlabCommunicationsTechnologyCo.,Ltd. Address: FL.1-3,BuildingA,FeiYangSciencePark,No.8LongChangRoad,Block67, BaoAnDistrict,ShenZhen,GuangDongProvince,P.R.China 3.2TestEnvironments EnvironmentsParameterTemperatureVoltageHumidit NTNV25C--50% 3.3TestEquipmentList DescriptionManufacturerModelSerialNumberCal.DateDue.Date NetworkAnalyzerAgilentE5071CMY461101402023-06-212024-06-20 OTAChamberETSAMS-8923-150TJ2235-Q17932022-11-302025-11-29 AntennaMeasurement System ETS EMQuestEMQ-100 V1.13Build21267 1685N/AN/A 3.4MeasurementUncertainty Theuncertaintyiscalculatedusingthemethodssuggestedinthe“GuidetotheExpressionofUncertaintyin Measurement"(GUM)publishedbyISO.Whenthetestresultisacriticalvalue,wewillusethemeasurement uncertaintygivethejudgmentresultbasedonthe95%Confidenceintervals. 3.5TestSetup ReferenceNo.:WTX24X04091176W WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cnPage 7 of 11 4.AntennaTestResult 4.1GainandEfficiency Frequency(MHz)Gain(dBi)Efficiency(%) 24000.0437.43 24100.0936.51 2420-0.0334.64 2430-0.0933.43 2440-0.1133.25 2450-0.1333.24 2460-0.0932.86 2470-0.2431.33 2480-0.4930.67 2490-0.8229.72 2500-1.0229.57 ReferenceNo.:WTX24X04091176W WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://ww…

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ReferenceNo.:WTX24X04091176W001/002Page9of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn EXHIBIT4-TESTSETUPPHOTOGRAPHS ConductedEmissionTest Setup RadiationEmissionTest Setup(Below30MHz) ReferenceNo.:WTX24X04091176W001/002Page10of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(30MHzto1GHz) RadiationEmissionTest Setup(1GHzto18GHz) ReferenceNo.:WTX24X04091176W001/002Page11of11 WaltekTestingGroup(Shenzhen)Co.,Ltd. Http://www.waltek.com.cn RadiationEmissionTest Setup(Above18GHz) *****ENDOFREPORT*****