2AXUI-T10Tablet

SmartPad_T10 ȕ 濉濇澶 1 x Tablet BYYBUO1 x charger1 x documentation kit1 x USB  FCC ID: 2AXUI-T10Model: BYYBUO_SmartPad_T10INPUT: 5V3A Chitech Shenzhen Technology Co.,LtdMADE IN PRC . BYYBUO_SmartPad_T10 Designed by BYYBUO,Assembled in PRC This device complies with Part 15 of the FCC Rules. Operationis subject to the following two conditions: (1) this device maynot cause harmful interference, and (2) this device must acceptany interference received, including interference that may caus e undesired operation.changes or modifications not expressly approved by the party responsible for compliance could void the user's authority to operate the equipment.NOTE: This equipment has been tested and found to comply with t he limits for aClass B digital device, pursuant to Part 15 of the FCC Rules. T hese limits aredesigned to provide reasonable protection against harmful inter fer- ence in aresidential installation. This equipment generates, uses and ca n radiate radiofrequency energy and, if not installed and used in accordance w ith theinstructions, may cause harmful interference to radio communica - tions. However,there is no guarantee that interference will not occur in a par ticular installation.If this equipment does cause harmful interference to radio or television reception,which can be determined by turning the equipment off and on, th e user isencouraged to try to correct the interference by one or more of the followingmeasures:-- Reorient or relocate the receiving antenna.-- Increase the separation between the equipment and receiver.-- Connect the equipment into an outlet on a circuit differentfrom that to which the receiver is connected.-- Consult the dealer or an experienced radio/TV technician for help. FCC ID:2AXUI-T10 

CHITECH SHENZHEN TECHNOLOGY CO.,LTD Family models difference declaration Tablet Model: T10,T11, T12, T13, F118W Difference declaration: All models are the same circuit and RF module, except the model name. Regards, Signature Lydia Deng / Manager Date/City: 2022-01-18 / Shenzhen Phone: 86-0755-21380496 Fax: 86-0755-21380496 E-mail: [email protected]

CHITECH SHENZHEN TECHNOLOGY CO.,LTD Agent Authorization Letter (2022-01-18) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: LETTER OF AGENT AUTHORIZATION To Whom It May Concern: We, the undersigned, hereby authorize Shenzhen NTEK Testing Technology Co., Ltd. 1/F, Building E, Fenda Science Park Sanwei, Xixiang, Bao'an District, Shenzhen, Guangdong, China Alex.li [email protected] to act on our behalf in all matters relating to application for equipment authorization, including the signing of all documents relating to these matters. We also hereby certify that no party to the application authorized hereunder is subject to the denial of benefits, including FCC benefits, pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C.853(a). This agreement expires one year from the current date. Sincerely, Lydia Deng / Manager Date/City: 2022-01-18 / Shenzhen Phone: 86-0755-21380496 Fax: 86-0755-21380496 E-mail: [email protected]

CHITECH SHENZHEN TECHNOLOGY CO.,LTD Long Term Confidentiality Request Letter (2022-01-18) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: CONFIDENTIALITY REQUEST FOR Product: Tablet Model No.: T10, T11, T12, T13, F118W FCC ID: 2AXUI-T10 To Whom It May Concern: This letter serves as an official request for confidentiality under sections 0.457 and 0.459 of CFR 47. We have requested that the  Schematic Diagram  Block Diagram  Operational Description  FCC Software Configuration Control Declaration  FCC Software Security Requirements for UNII devices Required to be submitted with this application be permanently withheld from public review. Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. It is our understanding that all measurement test reports, FCC ID label format and correspondent during certification review process cannot be granted as confidential documents and those information will be available for public review once the grant of equipment authorization is issued. Please contact me if there is any information you may need. Sincerely, Lydia Deng / Manager Date/City: 2022-01-18 / Shenzhen Phone: 86-0755-21380496 Fax: 86-0755-21380496 E-mail: [email protected]

CHITECH SHENZHEN TECHNOLOGY CO.,LTD Short Term Confidentiality Request Letter (2022-01-18) Eurofins Electrical and Electronic Testing NA, Inc. 914 West Patapsco Avenue Baltimore, MD 21230 RE: Short Term Confidentiality Request For Product: Tablet Model No.: T10, T11, T12, T13, F118W FCC ID: 2AXUI-T10 To Whom It May Concern: In accordance with sections 0.457 and 0.459 of CFR 47, < CHITECH SHENZHEN TECHNOLOGY CO.,LTD >. requests short-term Confidentiality of following sections of this application for a period of 180 days after grant is issued. Test setup photos External photos Internal photos User’s manual These documents contain detailed system and equipment descriptions and related information about the product, which < CHITECH SHENZHEN TECHNOLOGY CO.,LTD > considers to be proprietary, confidential, and a custom design and otherwise, would not release to the general public. Since this design is a basis from which future technological products will evolve, < CHITECH SHENZHEN TECHNOLOGY CO.,LTD > feels that this information would be of benefit to its competitors, and that the disclosure of the information in these documents would give our competitors an unfair advantage in the market. Please contact me if there is any information you may need. Sincerely, Lydia Deng / Manager Date/City: 2022-01-18 / Shenzhen Phone: 86-0755-21380496 Fax: 86-0755-21380496 E-mail: [email protected]

ATTACHMENT PHOTOGRAPHS OF EUT Photo 1 Photo 2 Photo 3 Photo 4 Photo 5 Photo 6 Photo 7 Photo 8

50mm 30mm This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. INPUT: 5V 3A Made in China Model: T10FCC ID: 2AXUI-T10

Photo 9 Photo 10 Photo 11 Photo 12 Photo 13 Photo 14 Photo 15 Photo 16 WIFI ANT Photo 17

Report No.: STR211223001003E Version.1.3 Page 1 of 80 FCC RADIO TEST REPORT FCC ID: 2AXUI-T10 Product: Tablet Trade Mark: BYYBUO Model No.: T10 Family Model: T11, T12, T13, F118W Report No.: STR211223001003E Issue Date: Nov 09, 2021 Prepared for CHITECH SHENZHEN TECHNOLOGY CO.,LTD 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Prepared by Shenzhen NTEK Testing Technology Co., Ltd. 1/F, Building E, Fenda Science Park, Sanwei Community, Xixiang Street Bao’an District, Shenzhen P.R. China Tel. 400-800-6106, 0755-2320 0050, 0755-2320 0090 Website:http://www.ntek.org.cn Report No.: STR211223001003E Version.1.3 Page 2 of 80 TABLE OF CONTENTS 1 TEST RESULT CERTIFICATION ...................................................................................................................... 3 2 SUMMARY OF TEST RESULTS ......................................................................................................................... 4 3 FACILITIES AND ACCREDITATIONS ............................................................................................................. 5 3.1 FACILITIES..................................................................................................................................................... 5 3.2 LABORATORY ACCREDITATIONS AND LISTINGS ................................................................................. 5 3.3 MEASUREMENT UNCERTAINTY ............................................................................................................... 5 4 GENERAL DESCRIPTION OF EUT .................................................................................................................. 6 5 DESCRIPTION OF TEST MODES ..................................................................................................................... 8 6 SETUP OF EQUIPMENT UNDER TEST ......................................................................................................... 10 6.1 BLOCK DIAGRAM CONFIGURATION OF TEST SYSTEM ..................................................................... 10 6.2 SUPPORT EQUIPMENT ............................................................................................................................... 11 6.3 EQUIPMENTS LIST FOR ALL TEST ITEMS .............................................................................................. 12 7 TEST REQUIREMENTS .................................................................................................................................... 14 7.1 CONDUCTED EMISSIONS TEST ............................................................................................................... 14 7.2 RADIATED SPURIOUS EMISSION ............................................................................................................ 17 7.3 6DB BANDWIDTH ....................................................................................................................................... 27 7.4 DUTY CYCLE ............................................................................................................................................... 29 7.5 MAXIMUM OUTPUT POWER .................................................................................................................... 30 7.6 POWER SPECTRAL DENSITY ................................................................................................................... 32 7.7 CONDUCTED BAND EDGE MEASUREMENT......................................................................................... 34 7.8 SPURIOUS RF CONDUCTED EMISSIONS ................................................................................................ 36 7.9 ANTENNA APPLICATION .......................................................................................................................... 37 8 TEST RESULTS ................................................................................................................................................... 38 8.1 MAXIMUM CONDUCTED OUTPUT POWER ....................................................................................................... 38 8.2 OCCUPIED CHANNEL BANDWIDTH .................................................................................................................. 39 8.3 MAXIMUM POWER SPECTRAL DENSITY LEVEL ............................................................................................... 52 8.4 BAND EDGE .................................................................................................................................................... 59 8.5 CONDUCTED RF SPURIOUS EMISSION ............................................................................................................. 68 Report No.: STR211223001003E Version.1.3 Page 3 of 80 1 TEST RESULT CERTIFICATION Applicant’s name ......................... : CHITECH SHENZHEN TECHNOLOGY CO.,LTD Address ....................................... : 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Manufacturer's Name .................. : CHITECH SHENZHEN TECHNOLOGY CO.,LTD Address ....................................... : 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Product description Product name .............................. : Tablet Model and/or type reference ..... : T10 Family Model ............................... : T11, T12, T13, F118W Measurement Procedure Used: APPLICABLE STANDARDS APPLICABLE STANDARD/ TEST PROCEDURE TEST RESULT FCC 47 CFR Part 2, Subpart J FCC 47 CFR Part 15, Subpart C ANSI C63.10-2013 KDB 558074 D01 15.247 Meas Guidance v05r02 Complied This device described above has been tested by Shenzhen NTEK Testing Technology Co., Ltd., and the test results show that the equipment under test (EUT) is in compliance with the FCC requirements. And it is applicable only to the tested sample identified in the report. This report shall not be reproduced except in full, without the written appr…

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Page 1 of 74 Report No.: STR211223001006E FCC SAR EVALUATION REPORT In accordance with the requirements of FCC 47 CFR Part 2(2.1093), ANSI/IEEE C95.1-1992 and IEEE Std 1528-2013 Product Name： Tablet Trademark： BYYBUO Model Name： T10 Family Model： T11, T12, T13, F118W Report No.： STR211223001006E FCC ID： 2AXUI-T10 Prepared for CHITECH SHENZHEN TECHNOLOGY CO.,LTD 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Prepared by Shenzhen NTEK Testing Technology Co., Ltd. 1/F, Building E, Fenda Science Park, Sanwei Community, Xixiang Street, Bao'an District, Shenzhen 518126 P.R.China. Tel. 400-800-6106, 0755-2320 0050, 0755-2320 0090 Website: http://www.ntek.org.cn Page 2 of 74 Report No.: STR211223001006E TEST RESULT CERTIFICATION Applicant’s name .................. : CHITECH SHENZHEN TECHNOLOGY CO.,LTD Address .................................. : 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Manufacturer's Name ........... : CHITECH SHENZHEN TECHNOLOGY CO.,LTD Address .................................. : 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Product description Product name ......................... : Tablet Trademark ............................ : BYYBUO Model Name ......................... : T10 Family Model .......................... : T11, T12, T13, F118W Standards .............................. : FCC 47 CFR Part 2(2.1093) ANSI/IEEE C95.1-1992 IEEE Std 1528-2013 Published RF exposure KDB procedures This device described above has been tested by Shenzhen NTEK. In accordance with the measurement methods and procedures specified in IEEE Std 1528-2013 and KDB 865664 D01. Testing has shown that this device is capable of compliance with localized specific absorption rate (SAR) specified in FCC 47 CFR Part 2(2.1093) and ANSI/IEEE C95.1-1992. The test results in this report apply only to the tested sample of the stated device/equipment. Other similar device/equipment will not necessarily produce the same results due to production tolerance and measurement uncertainties. This report shall not be reproduced except in full, without the written approval of Shenzhen NTEK, this document may be altered or revised by Shenzhen NTEK, personal only, and shall be noted in the revision of the document. Date of Test Date (s) of performance of tests ............. : Dec. 31, 2021 ~ Jan. 06, 2022 Date of Issue ........................................... : Jan. 14, 2022 Test Result............................................... : Pass Prepared By (Test Engineer) : (Jacob Chen) Approved By (Lab Manager) : (Alex Li) Page 3 of 74 Report No.: STR211223001006E ※ ※ Revision History ※ ※ REV. DESCRIPTION ISSUED DATE REMARK Rev.1.0 Initial Test Report Release Jan. 14, 2022 Jacob Chen Page 4 of 74 Report No.: STR211223001006E TABLE OF CONTENTS 1. General Information ............................................................................................ 6 1.1. RF exposure limits .................................................................................... 6 1.2. Statement of Compliance ........................................................................ 7 1.3. EUT Description ....................................................................................... 7 1.4. Test specification(s) .................................................................................. 8 1.5. Ambient Condition ................................................................................... 8 2. SAR Measurement System ................................................................................... 9 2.1. SATIMO SAR Measurement Set-up Diagram ............................................ 9 2.2. Robot ..................................................................................................... 10 2.3. E-Field Probe .......................................................................................... 11 2.3.1. E-Field Probe Calibration ................................................................. 11 2.4. SAM phantoms ...................................................................................... 12 2.4.1. Technical Data .................................................................................. 13 2.5. Device Holder ........................................................................................ 14 2.6. Test Equipment List ................................................................................ 15 3. SAR Measurement Procedures .......................................................................... 17 3.1. Power Reference ................................................................................... 17 3.2. Area scan & Zoom scan .......................................................................... 17 3.3. Description of interpolation/extrapolation scheme .............................. 19 3.4. Volumetric Scan ..................................................................................... 19 3.5. Power Drift ............................................................................................ 19 4. System Verification Procedure .......................................................................... 20 4.1. Tissue Verification ................................................................................. 20 4.1.1. Tissue Dielectric Parameter Check Results ...................................... 21 4.2. System Verification Procedure .............................................................. 22 4.2.1. System Verification Results .............................................................. 23 5. SAR Measurement variability and uncertainty .................................................. 24 5.1. SAR measurement variability ................................................................. 24 5.2. SAR measurement uncertainty .............................................................. 24 6. RF Exposure Positions ............................................................…

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Report No.: STR211223001002E Version.1.3 Page 1 of 47 RADIO TEST REPORT FCC ID: 2AXUI-T10 Product: Tablet Trade Mark: BYYBUO Model No.: T10 Family Model: T11, T12, T13, F118W Report No.: STR211223001002E Issue Date: Jan 12, 2022 Prepared for CHITECH SHENZHEN TECHNOLOGY CO.,LTD 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Prepared by Shenzhen NTEK Testing Technology Co., Ltd. 1/F, Building E, Fenda Science Park, Sanwei Community, Xixiang Street Bao’an District, Shenzhen 518126 P.R. China Tel. 400-800-6106, 0755-2320 0050, 0755-2320 0090 Website: http://www.ntek.org.cn Report No.: STR211223001002E Version.1.3 Page 2 of 47 TABLE OF CONTENTS 1 TEST RESULT CERTIFICATION ...................................................................................................................... 3 2 SUMMARY OF TEST RESULTS ......................................................................................................................... 4 3 FACILITIES AND ACCREDITATIONS ............................................................................................................. 5 3.1 FACILITIES..................................................................................................................................................... 5 3.2 LABORATORY ACCREDITATIONS AND LISTINGS ................................................................................. 5 3.3 MEASUREMENT UNCERTAINTY ............................................................................................................... 5 4 GENERAL DESCRIPTION OF EUT .................................................................................................................. 6 5 DESCRIPTION OF TEST MODES ..................................................................................................................... 8 6 SETUP OF EQUIPMENT UNDER TEST ........................................................................................................... 9 6.1 BLOCK DIAGRAM CONFIGURATION OF TEST SYSTEM ....................................................................... 9 6.2 SUPPORT EQUIPMENT ............................................................................................................................... 10 6.3 EQUIPMENTS LIST FOR ALL TEST ITEMS .............................................................................................. 11 7 TEST REQUIREMENTS .................................................................................................................................... 13 7.1 CONDUCTED EMISSIONS TEST ............................................................................................................... 13 7.2 RADIATED SPURIOUS EMISSION ............................................................................................................ 16 7.3 6DB BANDWIDTH ....................................................................................................................................... 25 7.4 DUTY CYCLE ............................................................................................................................................... 26 7.5 PEAK OUTPUT POWER .............................................................................................................................. 28 7.6 POWER SPECTRAL DENSITY ................................................................................................................... 29 7.7 CONDUCTED BAND EDGE MEASUREMENT......................................................................................... 31 7.8 SPURIOUS RF CONDUCTED EMISSIONS ................................................................................................ 32 7.9 ANTENNA APPLICATION .......................................................................................................................... 33 8 TEST RESULTS ................................................................................................................................................... 34 8.1 MAXIMUM CONDUCTED OUTPUT POWER ....................................................................................................... 34 8.2 OCCUPIED CHANNEL BANDWIDTH .................................................................................................................. 36 8.3 MAXIMUM POWER SPECTRAL DENSITY LEVEL ............................................................................................... 40 8.4 BAND EDGE .................................................................................................................................................... 42 8.5 CONDUCTED RF SPURIOUS EMISSION ............................................................................................................. 44 Report No.: STR211223001002E Version.1.3 Page 3 of 47 1 TEST RESULT CERTIFICATION Applicant’s name ......................... : CHITECH SHENZHEN TECHNOLOGY CO.,LTD Address ....................................... : 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Manufacturer's Name .................. : CHITECH SHENZHEN TECHNOLOGY CO.,LTD Address ....................................... : 101,NO.48,Xiashijia Road,Gongming Town,Guangming Dist.,Shenzhen,China Product description Product name .............................. : Tablet Model and/or type reference ...... : T10 Family Model ............................... : T11, T12, T13, F118W Measurement Procedure Used: APPLICABLE STANDARDS APPLICABLE STANDARD/ TEST PROCEDURE TEST RESULT FCC 47 CFR Part 2, Subpart J FCC 47 CFR Part 15, Subpart C ANSI C63.10-2013 KDB 558074 D01 15.247 Meas Guidance v05r02 Complied This device described above has been tested by Shenzhen NTEK Testing Technology Co., Ltd., and the test results show that the equipment under test (EUT) is in compliance with the FCC requirements. And it is applicable only to the tested sample identified in the report. This report shall not be reproduced except in full, without th…

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Radiated Measurement Photos Conducted Measurement Photos

Test Positions Front Side (Separation distance of 0mm) Back Side (Separation distance of 0mm) To p Side (Separation distance of 0mm) N/A N/A END