PJUJN28002.4GHz Cordless Phone
Shenzhen Jingneng Telecom Technology Co Ltd
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Application Details
- Equipment Class
- DXX - Part 15 Low Power Communication Device Transmitter
- Date of Grant
- Apr 25, 2002
- Application Purpose
- Original Equipment
- Date of Application
- Apr 25, 2002
- Equipment Note
- 2.4GHz Cordless Phone
- Frequency Range
- 2474.00000000 - 2476.45000000
- Country
- China
Documents & Files
Document Text
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
External Photos
EUT EXTERNAL PHOTOGRAPHS Handset - Top View Handset - Bottom View Base - Top View Base - Bottom View Power Adapter - Top View Power Adapter - Bottom View
Internal Photos
EUT INTERNAL PHOTOGRAPHS Handset - Cover Off View Handset - Component View Handset - Solder View Base - Cover Off View Base - Component View Base - Solder View
Test Report
Note: This test report is specially limited to the above client company and the product model only. It may not be duplicated without prior written consent of Bay Area Compliance Laboratory Corporation. This report must not be used by the client to claim product endorsement by NVLAP or any agency of the U.S. Government. FCC PART 15 Subpart C EMI MEASUREMENT AND TEST REPORT For Shenzhen Jingneng Telecom Technology Co., Ltd. Baimenqian Industrial Zone, Shawan, Buji Town, Longgang District, Shenzhen City, P.R.China FCC ID: PJUJN2800 April 22, 2002 This Report Concerns: Original Report Equipment Type: 2.4GHz Cordless Telephone Test Engineer: John Chan Report No.: R02032512 Test Date: April 14, 2002 Reviewed By: John Y. Chan - Engineering Manager Prepared By: Bay Area Compliance Laboratory Corporation 230 Commercial Street Sunnyvale, CA 94085 Tel (408) 732-9162 Fax (408) 732-9164 Shenzhen Jingneng Telecom Technology Co., Ltd. FCC ID: PJUJN2800 Report # PJUJN2800_Rpt Page 2 of 16 FCC Part 15 Subpart C Test Report TABLE OF CONTENTS 1 - GENERAL INFORMATION..................................................................................................................................3 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ..............................................................................3 1.2 OBJECTIVE.............................................................................................................................................................3 1.3 RELATED SUBMITTAL(S)/GRANT(S) ......................................................................................................................3 1.4 TEST METHODOLOGY............................................................................................................................................3 1.5 TEST FACILITY.......................................................................................................................................................3 1.6 TEST EQUIPMENT LIST...........................................................................................................................................4 1.8 LOCAL SUPPORT EQUIPMENT LIST AND DETAILS...................................................................................................4 1.9 EXTERNAL I/O CABLING LIST AND DETAILS.........................................................................................................5 2 - SYSTEM TEST CONFIGURATION.....................................................................................................................6 2.1 DESCRIPTION OF TEST CONFIGURATION................................................................................................................6 2.2 CONFIGURATION OF TEST SYSTEM (BASE)............................................................................................................7 2.3 TEST SETUP BLOCK DIAGRAM...............................................................................................................................7 2.4 EQUIPMENT MODIFICATIONS.................................................................................................................................7 3 - CONDUCTED EMISSIONS TEST DATA............................................................................................................8 3.1 MEASUREMENT UNCERTAINTY..............................................................................................................................8 3.2 EUT SETUP............................................................................................................................................................8 3.3 SPECTRUM ANALYZER SETUP................................................................................................................................8 3.4 TEST PROCEDURE..................................................................................................................................................8 3.5 SUMMARY OF TEST RESULTS.................................................................................................................................9 3.6 CONDUCTED EMISSIONS TEST DATA.....................................................................................................................9 3.7 PLOT OF CONDUCTED EMISSIONS TEST DATA.......................................................................................................9 4 - RADIATED EMISSION DATA ...........................................................................................................................10 4.1 MEASUREMENT UNCERTAINTY............................................................................................................................10 4.2 EUT SETUP..........................................................................................................................................................10 4.3 SPECTRUM ANALYZER SETUP..............................................................................................................................10 4.4 TEST PROCEDURE.................................................................................................................................................11 4.5 CORRECTED AMPLITUDE & MARGIN CALCULATION...........................................................................................11 4.6 SUMMARY OF TEST RESULTS...............................................................................................................................11 4.7 RADIATED EMISSIONS TEST RESULT DATA.........................................................................................................12 5 - BAND EDGES TESTING .....................................................................................................................................15 5.1 TEST PROCEDURE..............................................................................................................................…
Text truncated - open the document above for the full version.
Test Setup Photos
TEST SETUP PHOTOGRAPHS Base Conducted Emission - Front View Base Conducted Emission - Rear View Base Radiated Emission - Front View Base Radiated Emission - Rear View Handset Radiated Emission - Front View Handset Radiated Emission - Rear View
Contact Information
Applicant
Zheng Caian(QA Manager)
Test Firm
Bay Area Compliance LaboratoryJohn Chan
Technical Specifications
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 2 | 15C | 2.47 GHz - 2.48 GHz | - |
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